JPS60174959A - 電磁波測定装置 - Google Patents

電磁波測定装置

Info

Publication number
JPS60174959A
JPS60174959A JP59030921A JP3092184A JPS60174959A JP S60174959 A JPS60174959 A JP S60174959A JP 59030921 A JP59030921 A JP 59030921A JP 3092184 A JP3092184 A JP 3092184A JP S60174959 A JPS60174959 A JP S60174959A
Authority
JP
Japan
Prior art keywords
air
electromagnetic wave
tent
antenna
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59030921A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0327073B2 (cg-RX-API-DMAC10.html
Inventor
Tetsuji Miura
三浦　哲司
Sumio Umibuchi
住男 海渕
Tamotsu Tsukahara
塚原　保
Hideaki Ishii
秀明 石井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kashima Industries Co
Nippon Valqua Industries Ltd
Taiyo Kogyo Co Ltd
Nihon Valqua Kogyo KK
Original Assignee
Kashima Industries Co
Nippon Valqua Industries Ltd
Taiyo Kogyo Co Ltd
Nihon Valqua Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kashima Industries Co, Nippon Valqua Industries Ltd, Taiyo Kogyo Co Ltd, Nihon Valqua Kogyo KK filed Critical Kashima Industries Co
Priority to JP59030921A priority Critical patent/JPS60174959A/ja
Publication of JPS60174959A publication Critical patent/JPS60174959A/ja
Publication of JPH0327073B2 publication Critical patent/JPH0327073B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Details Of Aerials (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
JP59030921A 1984-02-21 1984-02-21 電磁波測定装置 Granted JPS60174959A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59030921A JPS60174959A (ja) 1984-02-21 1984-02-21 電磁波測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59030921A JPS60174959A (ja) 1984-02-21 1984-02-21 電磁波測定装置

Publications (2)

Publication Number Publication Date
JPS60174959A true JPS60174959A (ja) 1985-09-09
JPH0327073B2 JPH0327073B2 (cg-RX-API-DMAC10.html) 1991-04-12

Family

ID=12317151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59030921A Granted JPS60174959A (ja) 1984-02-21 1984-02-21 電磁波測定装置

Country Status (1)

Country Link
JP (1) JPS60174959A (cg-RX-API-DMAC10.html)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62123366A (ja) * 1985-11-22 1987-06-04 Tohoku Metal Ind Ltd 電波測定用オ−プンサイト
JPS62111666U (cg-RX-API-DMAC10.html) * 1985-12-28 1987-07-16
JPS63103980A (ja) * 1986-10-21 1988-05-09 Tokin Corp 電子機器より発生する妨害電波の測定方法
JPS63285474A (ja) * 1987-05-18 1988-11-22 Keiyo Seiki Kk 放射妨害電波測定装置
JPS6465465A (en) * 1987-09-05 1989-03-10 Tokin Corp Radiation noise measuring instrument
JP2002532689A (ja) * 1998-12-07 2002-10-02 タレス ネーデルラント ベスローテン フェンノートシャップ テスト室
WO2007062839A1 (de) * 2005-11-30 2007-06-07 Astrium Gmbh Hochfrequenzmesshalle zur vermessung von grossen messobjekten

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62123366A (ja) * 1985-11-22 1987-06-04 Tohoku Metal Ind Ltd 電波測定用オ−プンサイト
JPS62111666U (cg-RX-API-DMAC10.html) * 1985-12-28 1987-07-16
JPS63103980A (ja) * 1986-10-21 1988-05-09 Tokin Corp 電子機器より発生する妨害電波の測定方法
JPS63285474A (ja) * 1987-05-18 1988-11-22 Keiyo Seiki Kk 放射妨害電波測定装置
JPS6465465A (en) * 1987-09-05 1989-03-10 Tokin Corp Radiation noise measuring instrument
JP2002532689A (ja) * 1998-12-07 2002-10-02 タレス ネーデルラント ベスローテン フェンノートシャップ テスト室
WO2007062839A1 (de) * 2005-11-30 2007-06-07 Astrium Gmbh Hochfrequenzmesshalle zur vermessung von grossen messobjekten
US7992348B2 (en) 2005-11-30 2011-08-09 Astrium Gmbh High-frequency measuring enclosure for measuring large test objects

Also Published As

Publication number Publication date
JPH0327073B2 (cg-RX-API-DMAC10.html) 1991-04-12

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