JPS6465465A - Radiation noise measuring instrument - Google Patents
Radiation noise measuring instrumentInfo
- Publication number
- JPS6465465A JPS6465465A JP22122287A JP22122287A JPS6465465A JP S6465465 A JPS6465465 A JP S6465465A JP 22122287 A JP22122287 A JP 22122287A JP 22122287 A JP22122287 A JP 22122287A JP S6465465 A JPS6465465 A JP S6465465A
- Authority
- JP
- Japan
- Prior art keywords
- antenna
- receivers
- wave
- equipment
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
PURPOSE:To enable high-accuracy, high-speed measurement by distributing and supplying a noise signal to receivers and putting the receivers in charge of frequency bands obtained by dividing a specific measurement area. CONSTITUTION:Electronic equipment 1 is placed on a turntable 2 and a receiving antenna 4 is installed at a distance D from the equipment 1. The antenna 4 receives the composite wave of two waves, i.e. a direct wave 6 traveling to the antenna 4 and a floor surface reflected wave 7 among noises radiated by the equipment 1. The antenna 4 and table 2 are moved until the direct wave 6 and reflected wave 7 of the composite wave received at this time are in phase with each other. The phases of the direct wave 6 and reflected wave 7 vary with frequency, so the antenna 4 is moved to make a phase adjustment and the largest reception intensity is guided from the antenna 4 to the receivers 9. Here, plural receivers 9 are used and given the frequency bands obtained by dividing the specific measurement range. Thus, the frequency sweep widths of the receivers 9 are determined to make a fast sweep, thereby enabling the high-accuracy, high-speed measurement.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62221222A JPH077031B2 (en) | 1987-09-05 | 1987-09-05 | Radiation noise measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62221222A JPH077031B2 (en) | 1987-09-05 | 1987-09-05 | Radiation noise measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6465465A true JPS6465465A (en) | 1989-03-10 |
JPH077031B2 JPH077031B2 (en) | 1995-01-30 |
Family
ID=16763380
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62221222A Expired - Lifetime JPH077031B2 (en) | 1987-09-05 | 1987-09-05 | Radiation noise measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH077031B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05340981A (en) * | 1992-06-12 | 1993-12-24 | Fuji Elelctrochem Co Ltd | Noise measuring system |
US6326783B1 (en) | 1998-03-31 | 2001-12-04 | Advantest Corporation | Method of measuring axially symmetric electromagnetic fields |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS595974A (en) * | 1982-07-01 | 1984-01-12 | Mitsubishi Electric Corp | Apparatus for testing interference noise |
JPS60174959A (en) * | 1984-02-21 | 1985-09-09 | Kashima Kogyo Kk | Method and apparatus for measuring electromagnetic wave |
-
1987
- 1987-09-05 JP JP62221222A patent/JPH077031B2/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS595974A (en) * | 1982-07-01 | 1984-01-12 | Mitsubishi Electric Corp | Apparatus for testing interference noise |
JPS60174959A (en) * | 1984-02-21 | 1985-09-09 | Kashima Kogyo Kk | Method and apparatus for measuring electromagnetic wave |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05340981A (en) * | 1992-06-12 | 1993-12-24 | Fuji Elelctrochem Co Ltd | Noise measuring system |
US6326783B1 (en) | 1998-03-31 | 2001-12-04 | Advantest Corporation | Method of measuring axially symmetric electromagnetic fields |
Also Published As
Publication number | Publication date |
---|---|
JPH077031B2 (en) | 1995-01-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080130 Year of fee payment: 13 |