JPS6465465A - Radiation noise measuring instrument - Google Patents

Radiation noise measuring instrument

Info

Publication number
JPS6465465A
JPS6465465A JP22122287A JP22122287A JPS6465465A JP S6465465 A JPS6465465 A JP S6465465A JP 22122287 A JP22122287 A JP 22122287A JP 22122287 A JP22122287 A JP 22122287A JP S6465465 A JPS6465465 A JP S6465465A
Authority
JP
Japan
Prior art keywords
antenna
receivers
wave
equipment
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22122287A
Other languages
Japanese (ja)
Other versions
JPH077031B2 (en
Inventor
Yoshio Sato
Tomohiko Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokin Corp
Original Assignee
Tokin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokin Corp filed Critical Tokin Corp
Priority to JP62221222A priority Critical patent/JPH077031B2/en
Publication of JPS6465465A publication Critical patent/JPS6465465A/en
Publication of JPH077031B2 publication Critical patent/JPH077031B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To enable high-accuracy, high-speed measurement by distributing and supplying a noise signal to receivers and putting the receivers in charge of frequency bands obtained by dividing a specific measurement area. CONSTITUTION:Electronic equipment 1 is placed on a turntable 2 and a receiving antenna 4 is installed at a distance D from the equipment 1. The antenna 4 receives the composite wave of two waves, i.e. a direct wave 6 traveling to the antenna 4 and a floor surface reflected wave 7 among noises radiated by the equipment 1. The antenna 4 and table 2 are moved until the direct wave 6 and reflected wave 7 of the composite wave received at this time are in phase with each other. The phases of the direct wave 6 and reflected wave 7 vary with frequency, so the antenna 4 is moved to make a phase adjustment and the largest reception intensity is guided from the antenna 4 to the receivers 9. Here, plural receivers 9 are used and given the frequency bands obtained by dividing the specific measurement range. Thus, the frequency sweep widths of the receivers 9 are determined to make a fast sweep, thereby enabling the high-accuracy, high-speed measurement.
JP62221222A 1987-09-05 1987-09-05 Radiation noise measuring device Expired - Lifetime JPH077031B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62221222A JPH077031B2 (en) 1987-09-05 1987-09-05 Radiation noise measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62221222A JPH077031B2 (en) 1987-09-05 1987-09-05 Radiation noise measuring device

Publications (2)

Publication Number Publication Date
JPS6465465A true JPS6465465A (en) 1989-03-10
JPH077031B2 JPH077031B2 (en) 1995-01-30

Family

ID=16763380

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62221222A Expired - Lifetime JPH077031B2 (en) 1987-09-05 1987-09-05 Radiation noise measuring device

Country Status (1)

Country Link
JP (1) JPH077031B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05340981A (en) * 1992-06-12 1993-12-24 Fuji Elelctrochem Co Ltd Noise measuring system
US6326783B1 (en) 1998-03-31 2001-12-04 Advantest Corporation Method of measuring axially symmetric electromagnetic fields

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS595974A (en) * 1982-07-01 1984-01-12 Mitsubishi Electric Corp Apparatus for testing interference noise
JPS60174959A (en) * 1984-02-21 1985-09-09 Kashima Kogyo Kk Method and apparatus for measuring electromagnetic wave

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS595974A (en) * 1982-07-01 1984-01-12 Mitsubishi Electric Corp Apparatus for testing interference noise
JPS60174959A (en) * 1984-02-21 1985-09-09 Kashima Kogyo Kk Method and apparatus for measuring electromagnetic wave

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05340981A (en) * 1992-06-12 1993-12-24 Fuji Elelctrochem Co Ltd Noise measuring system
US6326783B1 (en) 1998-03-31 2001-12-04 Advantest Corporation Method of measuring axially symmetric electromagnetic fields

Also Published As

Publication number Publication date
JPH077031B2 (en) 1995-01-30

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