JPS55144534A - Measuring device for radio wave scattering characteristic - Google Patents

Measuring device for radio wave scattering characteristic

Info

Publication number
JPS55144534A
JPS55144534A JP5266979A JP5266979A JPS55144534A JP S55144534 A JPS55144534 A JP S55144534A JP 5266979 A JP5266979 A JP 5266979A JP 5266979 A JP5266979 A JP 5266979A JP S55144534 A JPS55144534 A JP S55144534A
Authority
JP
Japan
Prior art keywords
antenna
specimen
guide
wave
tray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5266979A
Other languages
Japanese (ja)
Inventor
Tetsuji Inui
Isao Kagatani
Naoyuki Ogasawara
Ryoichi Ueno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP5266979A priority Critical patent/JPS55144534A/en
Publication of JPS55144534A publication Critical patent/JPS55144534A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the scattering characteristics of radio wave by a specimen without being affected by direct wave by slidably providing transmitting and receiving antennas along a circular-arc guide and elevationally adjustably providing a specimen tray under the guide. CONSTITUTION:A specimen F is placed on the upper surface of a specimen tray 15, and transmitting and receiving antennas 3 and 4 are moved along the guide 2 to adjust the relative position and angle to the specimen F to the antennas. Electromagnetic wave of predetermined frequency is irradiated from the antenna 3 toward the specimen F and the reflected wave is received by the antenna 4 to measure the complex reflectivity thereof. The direct wave incident from the antenna 3 to the antenna 4 adversely affects to lower the tray 15 and varies the optical path length from the antenna 3 to the antenna 4. This affection is eliminated by measuring the complex reflectivities corresponding to the respective optical path lengths and removing them therefrom.
JP5266979A 1979-04-27 1979-04-27 Measuring device for radio wave scattering characteristic Pending JPS55144534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5266979A JPS55144534A (en) 1979-04-27 1979-04-27 Measuring device for radio wave scattering characteristic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5266979A JPS55144534A (en) 1979-04-27 1979-04-27 Measuring device for radio wave scattering characteristic

Publications (1)

Publication Number Publication Date
JPS55144534A true JPS55144534A (en) 1980-11-11

Family

ID=12921268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5266979A Pending JPS55144534A (en) 1979-04-27 1979-04-27 Measuring device for radio wave scattering characteristic

Country Status (1)

Country Link
JP (1) JPS55144534A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2623288A1 (en) * 1987-11-17 1989-05-19 Dassault Electronique Installation for experimentation on a model, in particular for bistatic back-scattering measurement
US5119105A (en) * 1989-06-23 1992-06-02 Electronic Space Systems Corporation M&A for performing near field measurements on a dish antenna and for utilizing said measurements to realign dish panels
JP2006053010A (en) * 2004-08-11 2006-02-23 Tokimec Inc Electromagnetic field pattern measuring apparatus
JP4669092B1 (en) * 2010-09-10 2011-04-13 サンヨー食品株式会社 Noodle wire lump loosening device
CN109269441A (en) * 2018-11-26 2019-01-25 北京无线电计量测试研究所 A kind of error detection method of segmental support system geometrical performance

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2623288A1 (en) * 1987-11-17 1989-05-19 Dassault Electronique Installation for experimentation on a model, in particular for bistatic back-scattering measurement
US5119105A (en) * 1989-06-23 1992-06-02 Electronic Space Systems Corporation M&A for performing near field measurements on a dish antenna and for utilizing said measurements to realign dish panels
JP2006053010A (en) * 2004-08-11 2006-02-23 Tokimec Inc Electromagnetic field pattern measuring apparatus
JP4669092B1 (en) * 2010-09-10 2011-04-13 サンヨー食品株式会社 Noodle wire lump loosening device
CN109269441A (en) * 2018-11-26 2019-01-25 北京无线电计量测试研究所 A kind of error detection method of segmental support system geometrical performance
CN109269441B (en) * 2018-11-26 2020-06-05 北京无线电计量测试研究所 Error detection method for geometrical performance of bow-shaped frame system

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