JPS60168076U - Hybrid IC delay time measurement circuit - Google Patents

Hybrid IC delay time measurement circuit

Info

Publication number
JPS60168076U
JPS60168076U JP5479284U JP5479284U JPS60168076U JP S60168076 U JPS60168076 U JP S60168076U JP 5479284 U JP5479284 U JP 5479284U JP 5479284 U JP5479284 U JP 5479284U JP S60168076 U JPS60168076 U JP S60168076U
Authority
JP
Japan
Prior art keywords
hybrid
delay time
time measurement
measurement circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5479284U
Other languages
Japanese (ja)
Inventor
三郎 梅田
戸内 孝治
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to JP5479284U priority Critical patent/JPS60168076U/en
Publication of JPS60168076U publication Critical patent/JPS60168076U/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1、第2図は遅延波形図、第3図は本考案の一実施例
の回路ブロック図である。 1・・・被測定混成・・・IC,2・・・信号発生回路
、3・・・検出回路、4・・・カウンタ、5・・・強制
信号発生回路。
1 and 2 are delay waveform diagrams, and FIG. 3 is a circuit block diagram of an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1...Mixed object to be measured...IC, 2...Signal generation circuit, 3...Detection circuit, 4...Counter, 5...Forced signal generation circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 信号発生回路に被測定混成ICを接続し、該ICの人出
側に波形の立上りあるいは立下り時を検出する検出回路
を配し、各々の信号を入力とするカウンタより成る遅延
時間測定において、該IC出力側に所定−間経過後強制
的に信号送出する回路を設けたことを特徴とする混成I
Cの遅延時間測定回路。
In delay time measurement, a hybrid IC under test is connected to a signal generation circuit, a detection circuit for detecting the rise or fall of a waveform is arranged on the output side of the IC, and a counter is configured to input each signal. A hybrid I characterized in that a circuit for forcibly sending a signal after a predetermined period of time is provided on the output side of the IC.
C delay time measurement circuit.
JP5479284U 1984-04-16 1984-04-16 Hybrid IC delay time measurement circuit Pending JPS60168076U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5479284U JPS60168076U (en) 1984-04-16 1984-04-16 Hybrid IC delay time measurement circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5479284U JPS60168076U (en) 1984-04-16 1984-04-16 Hybrid IC delay time measurement circuit

Publications (1)

Publication Number Publication Date
JPS60168076U true JPS60168076U (en) 1985-11-07

Family

ID=30576867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5479284U Pending JPS60168076U (en) 1984-04-16 1984-04-16 Hybrid IC delay time measurement circuit

Country Status (1)

Country Link
JP (1) JPS60168076U (en)

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