JPS60166808A - 形状測定装置 - Google Patents
形状測定装置Info
- Publication number
- JPS60166808A JPS60166808A JP2153784A JP2153784A JPS60166808A JP S60166808 A JPS60166808 A JP S60166808A JP 2153784 A JP2153784 A JP 2153784A JP 2153784 A JP2153784 A JP 2153784A JP S60166808 A JPS60166808 A JP S60166808A
- Authority
- JP
- Japan
- Prior art keywords
- light
- diffracted light
- order diffracted
- detector
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2153784A JPS60166808A (ja) | 1984-02-10 | 1984-02-10 | 形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2153784A JPS60166808A (ja) | 1984-02-10 | 1984-02-10 | 形状測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60166808A true JPS60166808A (ja) | 1985-08-30 |
| JPH047803B2 JPH047803B2 (pm) | 1992-02-13 |
Family
ID=12057711
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2153784A Granted JPS60166808A (ja) | 1984-02-10 | 1984-02-10 | 形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60166808A (pm) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0269602A (ja) * | 1988-09-05 | 1990-03-08 | Canon Inc | 位置合わせ装置 |
| JPH0326908A (ja) * | 1989-06-26 | 1991-02-05 | Mitsui Petrochem Ind Ltd | 光ディスク用スタンパー検査装置 |
| JPH07302441A (ja) * | 1994-04-30 | 1995-11-14 | Nec Corp | 溝形状測定装置 |
| US7515253B2 (en) | 2005-01-12 | 2009-04-07 | Kla-Tencor Technologies Corporation | System for measuring a sample with a layer containing a periodic diffracting structure |
| US7859659B2 (en) | 1998-03-06 | 2010-12-28 | Kla-Tencor Corporation | Spectroscopic scatterometer system |
| CN109945805A (zh) * | 2019-04-09 | 2019-06-28 | 北方民族大学 | 一种高精度角度传感器 |
-
1984
- 1984-02-10 JP JP2153784A patent/JPS60166808A/ja active Granted
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0269602A (ja) * | 1988-09-05 | 1990-03-08 | Canon Inc | 位置合わせ装置 |
| JPH0326908A (ja) * | 1989-06-26 | 1991-02-05 | Mitsui Petrochem Ind Ltd | 光ディスク用スタンパー検査装置 |
| JPH07302441A (ja) * | 1994-04-30 | 1995-11-14 | Nec Corp | 溝形状測定装置 |
| US7859659B2 (en) | 1998-03-06 | 2010-12-28 | Kla-Tencor Corporation | Spectroscopic scatterometer system |
| US7898661B2 (en) | 1998-03-06 | 2011-03-01 | Kla-Tencor Corporation | Spectroscopic scatterometer system |
| US7515253B2 (en) | 2005-01-12 | 2009-04-07 | Kla-Tencor Technologies Corporation | System for measuring a sample with a layer containing a periodic diffracting structure |
| CN109945805A (zh) * | 2019-04-09 | 2019-06-28 | 北方民族大学 | 一种高精度角度传感器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH047803B2 (pm) | 1992-02-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |