JPS60164269A - 半導体装置 - Google Patents

半導体装置

Info

Publication number
JPS60164269A
JPS60164269A JP59019782A JP1978284A JPS60164269A JP S60164269 A JPS60164269 A JP S60164269A JP 59019782 A JP59019782 A JP 59019782A JP 1978284 A JP1978284 A JP 1978284A JP S60164269 A JPS60164269 A JP S60164269A
Authority
JP
Japan
Prior art keywords
differential amplifier
voltage
transistor
integrated circuit
node
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59019782A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0452905B2 (enrdf_load_stackoverflow
Inventor
Takayasu Sakurai
貴康 桜井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59019782A priority Critical patent/JPS60164269A/ja
Publication of JPS60164269A publication Critical patent/JPS60164269A/ja
Publication of JPH0452905B2 publication Critical patent/JPH0452905B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Amplifiers (AREA)
JP59019782A 1984-02-06 1984-02-06 半導体装置 Granted JPS60164269A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59019782A JPS60164269A (ja) 1984-02-06 1984-02-06 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59019782A JPS60164269A (ja) 1984-02-06 1984-02-06 半導体装置

Publications (2)

Publication Number Publication Date
JPS60164269A true JPS60164269A (ja) 1985-08-27
JPH0452905B2 JPH0452905B2 (enrdf_load_stackoverflow) 1992-08-25

Family

ID=12008893

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59019782A Granted JPS60164269A (ja) 1984-02-06 1984-02-06 半導体装置

Country Status (1)

Country Link
JP (1) JPS60164269A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6197581A (ja) * 1984-10-19 1986-05-16 Fujitsu Ltd 論理集積回路及び論理集積回路システム
JPS6276802A (ja) * 1985-09-30 1987-04-08 Toshiba Corp 反転増幅器
JPH0552780U (ja) * 1991-12-20 1993-07-13 横河電機株式会社 Ｉｃテスタ
JPH08166429A (ja) * 1994-12-15 1996-06-25 Advantest Corp ドライバ回路
KR100292702B1 (ko) * 1997-08-12 2001-06-15 다니구찌 이찌로오, 기타오카 다카시 내부전압을외부에서모니터할수있는반도체집적회로장치

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6197581A (ja) * 1984-10-19 1986-05-16 Fujitsu Ltd 論理集積回路及び論理集積回路システム
JPS6276802A (ja) * 1985-09-30 1987-04-08 Toshiba Corp 反転増幅器
JPH0552780U (ja) * 1991-12-20 1993-07-13 横河電機株式会社 Ｉｃテスタ
JPH08166429A (ja) * 1994-12-15 1996-06-25 Advantest Corp ドライバ回路
KR100292702B1 (ko) * 1997-08-12 2001-06-15 다니구찌 이찌로오, 기타오카 다카시 내부전압을외부에서모니터할수있는반도체집적회로장치
US6339357B1 (en) 1997-08-12 2002-01-15 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device capable of externally monitoring internal voltage
US6486731B2 (en) 1997-08-12 2002-11-26 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device capable of externally monitoring internal voltage

Also Published As

Publication number Publication date
JPH0452905B2 (enrdf_load_stackoverflow) 1992-08-25

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