JPS60142278A - Inspecting device of led level meter unit - Google Patents

Inspecting device of led level meter unit

Info

Publication number
JPS60142278A
JPS60142278A JP58250161A JP25016183A JPS60142278A JP S60142278 A JPS60142278 A JP S60142278A JP 58250161 A JP58250161 A JP 58250161A JP 25016183 A JP25016183 A JP 25016183A JP S60142278 A JPS60142278 A JP S60142278A
Authority
JP
Japan
Prior art keywords
circuit
difference
article
inspected
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58250161A
Other languages
Japanese (ja)
Inventor
Takashi Hara
孝 原
Tadao Shichijo
七條 忠夫
Chikahito Hosokawa
細川 哉人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP58250161A priority Critical patent/JPS60142278A/en
Publication of JPS60142278A publication Critical patent/JPS60142278A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE:To inspect automatically a display function at a high speed by detecting the power consumption of an article to be inspected and a standard non- defective article, comparing a current difference of a corresponding display LED, and discriminating whether said article is good or not. CONSTITUTION:A standard non-defective article 2 of the same structure as an article to be inspected 1 is prepared, and both the articles are made to execute the same display driving by a power source circuit 3. Current detecting circuits 4, 5 detect the current consumption of both the articles, respectively, detect the difference of both currents by a differential circuit 6, and this value is held by a sample holding circuit 7. A differential circuit 8 detects the difference of the holding contents of the circuit 7 and an output of the differential circuit 6. A comparing circuit 9 compares the output voltage of the differential circuit 8 and a reference voltage 10, and when both the voltages coincide with each other, a coincidence detecting signal is sent out.

Description

【発明の詳細な説明】 く技術分野〉 本発明は棒グラフを表示J′るため複数個のL F、 
D(固体発生ダイオード)を配列した表示器と、そ0)
1ライフ用ICを同一ノに板上にマウントしてなるL 
E Dレベルメーターr−ニットの検査装置1W Lご
関し、特に、容器内に収納された完成品の検イ↑t−,
’W置に関する。
[Detailed Description of the Invention] Technical Field> The present invention uses a plurality of L F,
Display device with D (solid state generation diodes) arrayed and its 0)
L made by mounting 1-life IC on the same board
E D Level Meter r-Knit inspection device 1W Regarding L, especially inspection of finished products stored in containers ↑t-,
'Regarding W placement.

く解決課題〉 未だケースに収納される前の状(占、ずなわら表示器と
トライソ川ICが基4に土にマウントされた状態のもの
に対しては 例えC5Lプリント配線パターン上にプロ
ーブ用ラントを設り、これにゾU−ブコンタクトピンを
当ζL E I)の醋i−J”fIi位を基板外に導出
して各種の検査を行うことかi+J能Cある。。
Problems to be solved〉 For those that have not yet been stored in the case (with the Zunawara display and Triso River IC mounted on the ground on the base 4), it is difficult to use the probe on the C5L printed wiring pattern. It is possible to perform various inspections by providing a runt and using a contact pin to lead out the position of the current ζL E I) to the outside of the board.

しかし、完成品をそのガバーケースを取り外さないまま
検査しようとずれは−1−記の方法を採用することかで
きない。
However, even if the finished product is inspected without removing the cover case, the method described in -1- cannot be used to detect the deviation.

()L来は、検査台か11視にて1. I(、l)の点
刻、不産月を判別していたか、検査者の視覚か追従しフ
る程度の表示の切換えをしな&Jれはならないので所要
時間がkくなり、しかも誤認識のおそれがあるため伝頼
性に問題があった。
() After L, I looked at the examination table and 11. The display must be changed to the extent that the stippling of I (, l) can be used to determine the month of miscarriage, or the examiner's vision can be tracked.The time required will be increased, and moreover, there will be erroneous recognition. There was a problem with reliability because there was a risk of

〈発明の目的〉 本発明の目的は、完成品のカバーケースを外すことなく
 、 1l−F速度で、表示機能を自動的に検査する公
電′を提供することにある。
<Object of the Invention> The object of the present invention is to provide a public power station which automatically tests the display function at a speed of 11-F without removing the cover case of the finished product.

〈発明の構成〉 本発明のI−、JE +)レベルメークユニットの検査
装置は、被検査品と同一構造の標準良品と、上記被検査
品と標準良品の消費電力を検出する電流検出回路と、そ
の両電流検出回路の出力差を検出する一L段と、その差
かあらかしめ定められた範囲内にあ・6か否かを判別す
る比較手段を合し、上記被検査品と上記標準良品の各L
 F、 I)のうらRに対応しノこものを1.I、己j
さ・lたときの両電流差を比較して被検査品の良否を判
別するよう構成されたことによりll)徴づ6ノられる
<Configuration of the Invention> The I-, JE +) level make unit inspection device of the present invention includes a standard non-defective product having the same structure as the product to be inspected, and a current detection circuit that detects the power consumption of the product to be inspected and the standard non-defective product. , one L stage that detects the output difference between the two current detection circuits, and a comparison means that determines whether the difference is within a predetermined range or not. Each L of good quality
1. Corresponding to the back R of F, I). I, myself
The present invention is configured to compare the difference between the two currents at the time of 1) and 1) to determine whether the product to be inspected is good or bad.

〈実施例〉 1B1図に本発明実施例のシステムブロック図を小ず。<Example> Figure 1B1 shows a small system block diagram of an embodiment of the present invention.

被検百晶lと同一構造の標〆(ち良品2を用7Q:し、
デバイス用電源回路3により両市に同一表示H51g勅
を行わ−Uる。電流検出回路4,5は被検査品■と1票
準良品2の消費電流をそれぞれ検出し、差動回il′6
6が両電流の差を検出する。ザンプルボールド回(洛7
はごの差動回1/8 fiの出力を保(、冒Jイ)。
A mark with the same structure as the test sample 1 (using good quality product 2 7Q:
The same display H51g was issued to both cities using the device power supply circuit 3. The current detection circuits 4 and 5 detect the current consumption of the inspected product ■ and the 1-vote semi-defective product 2, respectively, and the differential circuit il'6
6 detects the difference between both currents. Sample Bold episode (Raku 7)
The differential rotation of the ladder maintains the output of 1/8 fi.

第2の差動回路8はリーンプルボールド回路7の保持内
容と、差動回路6の出力の差を検出する。比較回路9は
差動回1188の出力と基1(t−X前圧]0を比較し
、両電圧か一致ずれば一致検出他号を出力する。システ
ム制御11部11は装置全体を制御している。
The second differential circuit 8 detects the difference between the contents held by the lean-pull bold circuit 7 and the output of the differential circuit 6. The comparison circuit 9 compares the output of the differential circuit 1188 and the base 1 (t-X front pressure) 0, and outputs a coincidence detection signal if the two voltages do not match.The system control section 11 controls the entire device. ing.

第2図に」−記システムによる作用のソローナヤートを
i4< ’J−0まずS TI 6j−(全り、 E 
+、)を;:a t]さ−14る。このときの被検査品
1の電流をIcc(s)。
In Figure 2, the action of the system shown in ``-'' is shown as i4<'J-0.
+,);:at] is -14. The current of the inspected product 1 at this time is Icc (s).

+4N〆((良品2の電流をI C(: (M )とす
る。ザンプルボールト回路7はこの両IM流の差 ΔIC(: (Ilold)−1cc (s ) Ic
e U )を(呆1ろする(ST2)。
+4N〆((The current of good product 2 is I C (: (M). The sample vault circuit 7 calculates the difference between these two IM currents ΔIC (: (Ilold) - 1cc (s) Ic
e U ) to (lol) (ST2).

次ビご、被検1!「品1及び標(1(良品2の人カ妬1
子へ印加する人力霜月−Vinを逐次変化さ−lてゆく
。この入力端子Vinの大きさに応して当月1.. E
 1.) (1り 1161数が変化する。4) L、
 I、ト〕IJの不良のために産月ず・\きときに産月
しノ五いものが2らると1古・、な状態に比べて消費電
流値が減少ずろ。まずはU7めに第11ノI・の1. 
l’: 1.)のめを点灯するように入力電圧Vinが
印加される。Cのときの第1の差動回路6の出力は Δl (:C1= lcc (s ) −1cc (M
 )ごある。第2の差動回路6はごのΔIcc1 とボ
ールド電j「ΔI cc、 (llold)の差Δic
c】 −Δ1cc1−Δl cc (flood)を検
出する(S′r5)。次に比較回路により、ご゛のΔ!
 cc’lか所定の許容範囲内にあるが台がが判14J
「される( S T6 ) 、 flfijlftl内
にあれば、Y E S (7,)ゾランナへ進めS T
:3へ戻って入力端子Vinが次の値に変化し、同様の
検査が繰返される。ずべ′ζ0旧2ノI・についこの検
存が終rlるとS T 7がらY E S−、進め全検
査が終rする。判断ステツプsT6に才几”(j’l容
範囲内に、入っ(いないと判14Iiされ〕こときはS
 Tl+ ”、進み、”NoGO”が表示され、検f1
か終1゛′Jる。
Next question, test subject 1! "Goods 1 and marks (1 (good products 2 people's jealousy 1
The human power level Vin applied to the child is sequentially changed. 1 of the current month according to the size of this input terminal Vin. .. E
1. ) (1 ri 1161 number changes.4) L,
[I, G] When the IJ is defective, the current consumption value will decrease compared to the old condition. First of all, let's start with the 11th No. 1 for U7.
l': 1. ) The input voltage Vin is applied so as to light up the eyes. The output of the first differential circuit 6 when C is Δl (:C1= lcc (s) −1cc (M
) There is. The second differential circuit 6 is the difference Δic between the current ΔIcc1 and the bold electric current ΔIcc, (llold).
c] -Δ1cc1-Δl cc (flood) is detected (S'r5). Next, the comparison circuit calculates the Δ!
cc'l is within the specified tolerance range, but the stand is 14J
``Yes (ST6), if it is in flfijlftl, proceed to Zoranna (7,) ST
:3, the input terminal Vin changes to the next value, and the same test is repeated. When this inspection is completed for ZUBE'ζ0 old 2 no I, ST7 is YES, and the entire inspection is completed. In judgment step sT6, if the talent is within the range (j'l is judged as 14Ii), then S
Tl+”, advance, “NoGO” is displayed, test f1
Or end 1゛'Jru.

第3図に本発明の実施例の回路図を示−4゜被検査品1
番、1.12 f1MIθ月−E l) I) +−0
12が一列に配列され、ドライバーICQIの出刃端子
0UT1−OUTl 2に接続されている。各LEDは
Vref端子に印加された電圧を基準電圧として、V 
jr++4子に印加された入力端子Vinに応して点灯
する。LEDに流れる電流は抵抗Rにより一定電流値に
なるよう制御される。電流検出回路4,5はデバイス印
加用電源3とレベルメータユニット1.2の間に接続さ
れる。第1及び第2の差動回路6.8は演算増幅器Q3
.Q5により構成されている。AN、Dゲート回路Q6
は制御部11の同期信号に同期して比較回路9の不一致
イa′+ずなゎらNoGo’”信号を出力する。
Figure 3 shows a circuit diagram of an embodiment of the present invention -4゜Inspected product 1
No., 1.12 f1MIθ month-E l) I) +-0
12 are arranged in a line and connected to the blade terminals 0UT1-OUTl2 of the driver ICQI. Each LED uses the voltage applied to the Vref terminal as a reference voltage, and
It lights up in response to the input terminal Vin applied to the jr++4 child. The current flowing through the LED is controlled by a resistor R to have a constant current value. Current detection circuits 4, 5 are connected between device application power source 3 and level meter unit 1.2. The first and second differential circuits 6.8 are operational amplifiers Q3
.. It is composed of Q5. AN, D gate circuit Q6
In synchronization with the synchronization signal of the control section 11, the comparator circuit 9 outputs a mismatch "a'+zunawara NoGo'" signal.

〈発明の効果〉 本発明によれば、目視検査に1イ1らずずべての表示状
態を完全に自動検査できるので、検査粘度と信頼性が向
」二する。また、iI′IJ速度に表示状態を切換える
ことができるので検査時間が短縮される。
<Effects of the Invention> According to the present invention, each and every display state can be completely automatically inspected by visual inspection, so that the inspection viscosity and reliability are improved. Furthermore, since the display state can be switched to iI'IJ speed, inspection time is shortened.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明実施例のブじlツクjΔ、第2図は上記
実施例の作用を示すフローチャー1・、第3図は上記実
施例の回路図である。 1 彼検ヂを晶 2−標準良品 4.5−−’iii流検出流路 出回路動回路 9−比較回路 1 () ノ、(11仁711月ニ ド)ft出願人 シャープ株式会社 代 理 人 弁理士内 1)新 手*−yi−?c市正凹:(自発) 2. 発明の名称 L E 1つレベルメータユニットの検査語Fit3、
補止をする者 氏名 (504)シャープ株式会社 代表者 佐伯 旭 4、代理人 住所 大阪市北区兎我野町15番13号6、?di正の
対象 明、fn+書
FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is a flowchart 1 showing the operation of the embodiment described above, and FIG. 3 is a circuit diagram of the embodiment described above. 1. Tested by him 2-Standard non-defective product 4.5--'iii flow detection flow path output circuit 9-Comparison circuit 1 Within the patent attorney 1) New hand *-yi-? c city positive concave: (spontaneous) 2. Name of the invention L E Test word for one level meter unit Fit3,
Name of person making the correction (504) Sharp Corporation Representative Saeki Asahi 4, Agent address 15-13-6, Usagano-cho, Kita-ku, Osaka, ? di positive object bright, fn + book

Claims (1)

【特許請求の範囲】[Claims] 複数111+Iの1−、 EI)を所定パターンに配列
し入力信号に応した個数のL E I’)を産月する装
置の検査装置であっζ、被検査品と同一構造の標準良品
と、1=記破+*査晶と標準良品の消g電力を検出する
電流検出回路と、その両rh流検出回路の出力差を検出
する手段と、その差があらかしめ定められた範囲内にあ
るか否かを判別する比較手段を有し、上記被検査品と−
に記標準良品の各L E l)のうらJl−に対)応し
たものを点幻させたときの両’jli流差を比較し7て
被検査品の食台を判別するよ・)構成されたL E L
)レベルメータユニットのM 介装FR0
This is an inspection device for a device that arranges a plurality of 111 + 1-, EI) in a predetermined pattern and produces a number of LE I') corresponding to the input signal. = record failure + * A current detection circuit that detects the extinguishing power of the crystal and the standard non-defective product, a means for detecting the output difference between both rh flow detection circuits, and whether the difference is within a predetermined range. It has a comparison means for determining whether the above-mentioned inspected product and -
Compare the difference in flow between each L E l) corresponding to the back Jl- of the standard non-defective product described in 7, and determine the food table of the inspected product. L E L
) Level meter unit M interposition FR0
JP58250161A 1983-12-28 1983-12-28 Inspecting device of led level meter unit Pending JPS60142278A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58250161A JPS60142278A (en) 1983-12-28 1983-12-28 Inspecting device of led level meter unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58250161A JPS60142278A (en) 1983-12-28 1983-12-28 Inspecting device of led level meter unit

Publications (1)

Publication Number Publication Date
JPS60142278A true JPS60142278A (en) 1985-07-27

Family

ID=17203724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58250161A Pending JPS60142278A (en) 1983-12-28 1983-12-28 Inspecting device of led level meter unit

Country Status (1)

Country Link
JP (1) JPS60142278A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008288231A (en) * 2007-05-15 2008-11-27 Citizen Electronics Co Ltd Light-emitting device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008288231A (en) * 2007-05-15 2008-11-27 Citizen Electronics Co Ltd Light-emitting device

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