JPS60142245A - 四重極質量分析計 - Google Patents

四重極質量分析計

Info

Publication number
JPS60142245A
JPS60142245A JP58246603A JP24660383A JPS60142245A JP S60142245 A JPS60142245 A JP S60142245A JP 58246603 A JP58246603 A JP 58246603A JP 24660383 A JP24660383 A JP 24660383A JP S60142245 A JPS60142245 A JP S60142245A
Authority
JP
Japan
Prior art keywords
mass
resolution
resolving power
data
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58246603A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0562424B2 (enExample
Inventor
Tsunezo Takeda
武田 常蔵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP58246603A priority Critical patent/JPS60142245A/ja
Publication of JPS60142245A publication Critical patent/JPS60142245A/ja
Publication of JPH0562424B2 publication Critical patent/JPH0562424B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/421Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215Quadrupole mass filters

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP58246603A 1983-12-29 1983-12-29 四重極質量分析計 Granted JPS60142245A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58246603A JPS60142245A (ja) 1983-12-29 1983-12-29 四重極質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58246603A JPS60142245A (ja) 1983-12-29 1983-12-29 四重極質量分析計

Publications (2)

Publication Number Publication Date
JPS60142245A true JPS60142245A (ja) 1985-07-27
JPH0562424B2 JPH0562424B2 (enExample) 1993-09-08

Family

ID=17150862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58246603A Granted JPS60142245A (ja) 1983-12-29 1983-12-29 四重極質量分析計

Country Status (1)

Country Link
JP (1) JPS60142245A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6098840A (en) * 1997-02-26 2000-08-08 Kabushiki Kaisha Nippon Conlux Inclining slide for card dispensing device
JP2007323838A (ja) * 2006-05-30 2007-12-13 Shimadzu Corp 四重極型質量分析装置
JP2012104424A (ja) * 2010-11-12 2012-05-31 Hitachi High-Technologies Corp 質量分析装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6098840A (en) * 1997-02-26 2000-08-08 Kabushiki Kaisha Nippon Conlux Inclining slide for card dispensing device
US6231042B1 (en) 1997-02-26 2001-05-15 Kabushiki Kaisha Nippon Conlux Inclining slide for card dispensing device
US6267370B1 (en) 1997-02-26 2001-07-31 Kabushiki Kaisha Nippon Conlux Inclining slide for card dispensing device
JP2007323838A (ja) * 2006-05-30 2007-12-13 Shimadzu Corp 四重極型質量分析装置
JP2012104424A (ja) * 2010-11-12 2012-05-31 Hitachi High-Technologies Corp 質量分析装置

Also Published As

Publication number Publication date
JPH0562424B2 (enExample) 1993-09-08

Similar Documents

Publication Publication Date Title
CN103069540A (zh) 四极型质量分析装置
JPS63318062A (ja) 質量分析計から負イオンを検出するための方法及び装置
KR100516201B1 (ko) 전자유량계
JPS60142245A (ja) 四重極質量分析計
DE112015006384T5 (de) Elektronische Waage
EP0840272B1 (en) Circuit apparatus for measuring the cathode drive current of a display device and for driving and biasing the display device
JPS62133363A (ja) 目盛付き陰極線管の自動較正装置
JPH0542106B2 (enExample)
JP5829745B1 (ja) 放射線測定装置
US11513098B2 (en) Spectrometry system
Hayes et al. Interpretation of the results obtained with the cambridge univector ac polarograph unit
JP3411254B2 (ja) ひずみ校正器
US8754361B1 (en) Systems and methods for adjusting a mass spectrometer output
JPH05217548A (ja) 四重極型質量分析計
US4694169A (en) Mass spectrometer
JP6973323B2 (ja) 電子線マイクロアナライザー、データ処理方法及びデータ処理プログラム
CA1262372A (en) Method for the measurement of capacitances, in particular of low capacitances, wherein two references are used
RU2625440C2 (ru) Детектор элементов каркаса со схемой регулирования
JP3068977B2 (ja) 電力乗算回路
JPH0750134B2 (ja) 熱電型交直流変換器の交直差比較装置
RU2556301C2 (ru) Измеритель параметров многоэлементных rlc-двухполюсников
CN1211999C (zh) 截止电平调整装置、方法及带截止电平调整装置的显示设备
RU2545318C1 (ru) Кулонометрическая установка с контролируемым потенциалом
Asselman et al. Effect of neutral and charged particles on the line shape of the 577 and 491.6 nm mercury lines: Application to mercury pressure determination in high‐pressure Hg lamps
SU1204973A1 (ru) Устройство дл измерени магнитных характеристик магнитожестких покрытий

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees