JPS60125814A - Focusing detector - Google Patents

Focusing detector

Info

Publication number
JPS60125814A
JPS60125814A JP23462483A JP23462483A JPS60125814A JP S60125814 A JPS60125814 A JP S60125814A JP 23462483 A JP23462483 A JP 23462483A JP 23462483 A JP23462483 A JP 23462483A JP S60125814 A JPS60125814 A JP S60125814A
Authority
JP
Japan
Prior art keywords
light
receiving element
focus
optical system
element array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23462483A
Other languages
Japanese (ja)
Inventor
Asao Hayashi
林 朝男
Junichi Nakamura
淳一 中村
Yuji Imai
右二 今井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP23462483A priority Critical patent/JPS60125814A/en
Publication of JPS60125814A publication Critical patent/JPS60125814A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28Systems for automatic generation of focusing signals
    • G02B7/36Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

Abstract

PURPOSE:To detect a correct in-focus state by utilizing lateral deviation of an image, to facilitate adjusting operation, and to attain size and cost reduction by providing a light shield member which is a stripe mask shape and has a reflection preventing function at the photodetection surface side of a photodetecting element array. CONSTITUTION:The photodetecting element array 11 is arranged for an optical photography system 2 on a surface conjugate to a film 6, and the light shield member 12 in the stripe mask shape is arranged at is photodetection surface side; and openings 17 are so formed that luminous flux passed through the upper side of an exit pupil surface about the optical axis of the optical photography system 2 is incident on photodetecting elements 14A-1-14A-n and luminous flux passed through the lower side is incident on photodetecting elements 14B-1- 14B-n. Illuminance distributions of images formed on those photodetecting element groups 14A and 14B coincide with each other in a focusing state and deviate in the opposite directions in an out-of-focus state according to the out-of- focus direction, so the lateral deviation direction of the image is detected to detect an in-focus, a front-focus, and a rear-focus state respectively.

Description

【発明の詳細な説明】 (技術分野) 本発明は、カメラ、顕微鏡、高密度光学的記録再生装置
等の焦点状態を検出する合焦検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention relates to a focus detection device for detecting a focus state of a camera, a microscope, a high-density optical recording/reproducing device, etc.

(従来技術) 結像光学系によって形成される物体像の焦点状態を検出
する方法として、従来機ずれ検出方法が知られている。
(Prior Art) A conventional device shift detection method is known as a method for detecting the focal state of an object image formed by an imaging optical system.

第1図はかかる横すれ検出方法を実施する合焦検出装置
な−・眼レフレックスカメラに適用した場合の構成を示
す図である。被写体1の像は撮影光学系2およびクイッ
クリターン式の可動反射ミラー3を経てピント板4、ペ
ンタプリズム5等を具える観察光学系に導びかれると共
に、上記可動反射ミラー3をはね上げることによりフィ
ルム6に投影される。合焦検出装置は、上記ミラー3の
中央部をハーフミラ−7とし、このハーフミラ−7を透
過する光束を上記ミラー3の裏面に設けた全反射ミラー
8で反射させ、この光束を上記撮影光学系2の予定焦平
面の近傍、すなわちフィルム6とほぼ共役な面に配置し
たレンチキュラーレンズ等の微少な補助光学系9を介し
て、この補助光学系9に対する上記撮影光学系2の射出
瞳面と光学的にほぼ共役な面に配置した受光素子列匹に
入射させている。この受光素子列凹は第2図に示すよう
に受光素子群鳥、唾を具え、これら受光素子群出、囮の
各受光素子I 0A−1”−10A−nおよび10B−
1〜10B−nはそれぞれ対応する1個ずつが受光素子
対(10A−4、10B−1);・・弓(10A−n 
、 10B−n )を形成し、コレラノ全テノ受光素子
が一直線上に位置するように配列されている。また、上
記補助光学系9は上記受光素子対(10A−1、10B
−1);−・弓(10A−n 、 10B−n ) K
対応してn個あり、各受光素子対を構成する2個の受光
素子が、上記撮影光学系2のほぼ射出瞳面上で、受光素
子の配列方向に垂直でこの撮影光学系2の光軸を含む平
面(第1図では光軸な含む紙面に垂直な面)を境として
それぞれの側に位置する部分、すなわち第1図では光軸
を境とする射出瞳の上側および下側部分の像を受光する
ように配置されている。
FIG. 1 is a diagram illustrating the configuration of a focus detection device that implements such a lateral deviation detection method, when applied to an eye reflex camera. The image of the subject 1 is guided through a photographing optical system 2 and a quick-return type movable reflective mirror 3 to an observation optical system comprising a focusing plate 4, a pentaprism 5, etc., and the movable reflective mirror 3 is flipped up. is projected onto the film 6. The focus detection device has a half mirror 7 in the center of the mirror 3, and reflects a light beam passing through the half mirror 7 on a total reflection mirror 8 provided on the back surface of the mirror 3, and directs this light beam to the photographing optical system. Through a minute auxiliary optical system 9 such as a lenticular lens arranged near the predetermined focal plane of 2, that is, on a plane substantially conjugate with the film 6, the exit pupil plane of the photographing optical system 2 and the optical The light is incident on a row of light-receiving elements arranged on a plane that is substantially conjugate to the light beam. As shown in FIG. 2, this light-receiving element array recess is provided with a light-receiving element group and a decoy light-receiving element I0A-1''-10A-n and 10B-.
1 to 10B-n each correspond to a pair of light receiving elements (10A-4, 10B-1);
. Further, the auxiliary optical system 9 includes the light receiving element pair (10A-1, 10B).
-1);-・Bow (10A-n, 10B-n) K
The two light receiving elements constituting each light receiving element pair are located approximately on the exit pupil plane of the photographing optical system 2, perpendicular to the arrangement direction of the light receiving elements, and aligned with the optical axis of the photographing optical system 2. (in Fig. 1, the plane perpendicular to the plane containing the optical axis), that is, the images of the upper and lower parts of the exit pupil bordering on the optical axis in Fig. 1. is arranged to receive light.

かかる構成において、上記撮影光学系2および補助光学
系9を経て上記被写体1の像の少くとも一部を上記受光
素子列置に投影すると、上記受光素子群1[IAKはこ
の撮影光学系2の図において下側部分を透過した光束の
みが入射し、上記受光素子群側には反対に上側部分を透
過した光束の&が入射することになり、上記受光素子群
IOAおよびl0BK投影される像の照度分布は、合焦
時において一致し、非合焦時においては、そのずれの方
向に応じて互いに反対方向に横ずれする。第1図に示す
合焦検出装置においては、上記受光累子群鳥および」の
出力を適当に処理して像の横ずれ方向を検出し、これに
基いて前ビン、後ビンおよび合焦の各焦点状態を検出し
ている。
In this configuration, when at least a part of the image of the subject 1 is projected onto the light receiving element array through the photographing optical system 2 and the auxiliary optical system 9, the light receiving element group 1 [IAK is the image of the photographing optical system 2]. In the figure, only the light flux that has passed through the lower part is incident, and on the contrary, & of the light flux that has passed through the upper part is incident on the above-mentioned light-receiving element group. The illuminance distributions match when in focus, and when out of focus, they shift laterally in opposite directions depending on the direction of the shift. The focus detection device shown in FIG. Detecting focus state.

しかし、第1図に示す従来の合焦検出装置においては、
上記レンチキュラーレンズ等の微少な上記補助光学系9
の製作が困難で、これがため装置全体が高価でかつ大き
くなる等の欠点b℃あるとともに、各補助光学系とこれ
と対応する受光素子対との光学的調整が困難な欠点があ
る。
However, in the conventional focus detection device shown in FIG.
The minute auxiliary optical system 9, such as the lenticular lens, etc.
It is difficult to manufacture the device, which makes the entire device expensive and large, which is a drawback.In addition, it is difficult to optically adjust each auxiliary optical system and its corresponding light-receiving element pair.

(目的) 本発明の目的は、ストライプマスク状の遮光部材を用い
ることKより上記従来の欠点を除去し、かつこの遮光部
材を使用することによって生ずる光反射の問題を、遮光
部材に反射防止機能をもたせることにより解消した、像
の横ずれを利用して正しい焦点状態を検出するようにし
だ合焦検出装置を提供することKある。
(Objective) The purpose of the present invention is to eliminate the above-mentioned conventional drawbacks by using a striped mask-like light shielding member, and to solve the problem of light reflection caused by using this light shielding member, by providing the light shielding member with an anti-reflection function. It is an object of the present invention to provide a focus detection device which detects a correct focus state by utilizing the lateral shift of an image, which is solved by having a lateral shift of an image.

(概要) 本発明の合焦検出装置は、結像光学系の予定焦平面また
はその近傍に配置した受光素子列と、この受光素子列と
上記結像光学系との間の光路中に配置され一受光来子列
中の相、陰る?−+w子Wト紀結像光学系の光軸を含む
面を境とする第1および第2の領域からの光をそれぞれ
主として入射させるように形成した開口を有し、かつ不
必要な光線を吸収する機能をもった遮光部材とを具え、
上記受光素子列の上記結像光学系の第1の領域からの光
を受光する受光素子群と、第2の領域からの光を受光す
る受光素子群とKそれぞれ形成される物体像の横ずれを
検出して上記結像光学系によって形成される物体像の焦
点状態を検出するようにしたことを特徴とするものであ
る。
(Summary) The focus detection device of the present invention includes a light receiving element array disposed at or near a predetermined focal plane of an imaging optical system, and an optical path between this light receiving element array and the imaging optical system. Is the phase in the first light Raiko row dark? -+W child W Toki It has an aperture formed so that light from the first and second regions bounded by the plane including the optical axis of the imaging optical system is mainly incident, and unnecessary light rays are prevented. Equipped with a light-shielding member that has the function of absorbing light,
A lateral shift of an object image formed by a light receiving element group that receives light from the first area of the imaging optical system of the light receiving element array and a light receiving element group that receives light from the second area, respectively. The present invention is characterized in that the focal state of the object image formed by the imaging optical system is detected.

(実施例) 以下、本発明を図示の実施例によって説明する。(Example) Hereinafter, the present invention will be explained with reference to illustrated embodiments.

第3図は一眼し7レツクスカメラに適用した本−発明の
合焦検出装置の光学的配置を示す図であり、第1図に示
す符号と同一符号は同一部材を表わし、その説明は省略
する。本例では、撮影光学系2に対し℃フィルム6とほ
ぼ共役な面に受光素子列旦を配置すると共に、その受光
面側に遮光部材ぜ−を配置して、全反射ミラー8で反射
された光束を上記遮光部材Uを経て上記受光素子列Uに
入射させる。
FIG. 3 is a diagram showing the optical arrangement of the focus detection device of the present invention applied to a single-lens 7-lens camera, and the same reference numerals as those shown in FIG. 1 represent the same members, and their explanations will be omitted. In this example, in the photographing optical system 2, a light-receiving element array is arranged on a surface that is almost conjugate with the °C film 6, and a light-shielding member is arranged on the light-receiving surface side. The light flux is made to enter the light receiving element array U through the light shielding member U.

次に、第4図(4)〜但)k示す本発明の第1の実施例
に基づいて本発明の詳細な説明する。
Next, the present invention will be described in detail based on a first embodiment of the present invention shown in FIGS. 4(4) to 4(k).

第4回置は上記受光素子月旦および遮光部材亘の構成を
示す斜視図である。上記受光素子列■は同一基板13に
一直線上に等間隔に形成した多数の受光素子から成る。
The fourth view is a perspective view showing the structure of the light receiving element and the light shielding member. The light-receiving element array (2) consists of a large number of light-receiving elements formed on the same substrate 13 in a straight line at equal intervals.

本例では、その配列方向に対して奇数番目の受光素子1
4A−1〜14A−nおよび偶数番目の受光素子14B
−1〜14B−nでそれぞれ受光素子群14Aおよび1
4Bを構成すると共に、両群の相隣る1個ずつの素子で
受光素子対(14A−1゜14B−1);・・弓(14
A−n 、 14B−n)を構成する。上記遮光部材旦
は、ガラス、高分子フィルム等の透明基板15上K、各
受光素子対に対応してn個のストライプマスク16−1
〜16−nを次に述べる手段により形成し、これらスト
ライプマスクにより第4図(B)および(C1にも示す
ように各受光素子一対を構成する2個の受光素子に、こ
の受光素子の配列方向に垂直で撮影光学系2の光軸な含
む平面を境とする第1および第2の領域、すなわち第3
図では光軸を境とする射出瞳面の上側および下側部分を
透過した光束をそれぞれ主として入射させるような開口
17を形成する。
In this example, the odd-numbered light receiving element 1 with respect to the arrangement direction is
4A-1 to 14A-n and even numbered light receiving elements 14B
-1 to 14B-n are light receiving element groups 14A and 1, respectively.
4B, and a pair of light receiving elements (14A-1゜14B-1); one adjacent element in both groups;
A-n, 14B-n). The light shielding member is provided with n striped masks 16-1 on a transparent substrate 15 such as glass or polymer film, corresponding to each pair of light receiving elements.
~16-n are formed by the means described below, and these stripe masks are used to form two light-receiving elements constituting each pair of light-receiving elements, as shown in FIGS. 4(B) and (C1). The first and second regions, which are perpendicular to the direction and bounded by a plane containing the optical axis of the photographing optical system 2, are
In the figure, an aperture 17 is formed so that the light beams that have passed through the upper and lower portions of the exit pupil plane bordering on the optical axis mainly enter therein.

このように構成すれば、上記各受光素子対を構成する2
個の受光素子、例えば受光素子14A−1。
With this configuration, the two light-receiving elements constituting each pair of light-receiving elements are
light receiving element, for example, light receiving element 14A-1.

14B−1は、第5図に示すように互いに異なる方向に
指向性を持つようになり、上記受光素子群14Aの受光
素子14A−1〜14A−nには、第3図において撮影
光学系2の光軸を境とする主として上側を透過した光束
が入射し、上記受光素子群14Bの受光素子14B−1
〜14B−nには主として下側を透過した光束が入射す
ることになる。したがって、これら受光素子群14A 
、 14Bにそれぞわ形成される像の照度分布は、合焦
時において一致し、非合焦時においてはそのずれの方向
に応じて互いに反対方向にずれるから、その鍬の横ずれ
方向を検出することにより合焦、前ビンおよび後ビンの
各焦点状態を検出することができる。
14B-1 have directivity in mutually different directions as shown in FIG. The light flux that has mainly passed through the upper side with the optical axis as the boundary enters the light receiving element 14B-1 of the light receiving element group 14B.
~14B-n mainly receives the light beam that has passed through the lower side. Therefore, these light receiving element groups 14A
, 14B, the illuminance distributions of the images formed on each of them match when in focus, and shift in opposite directions depending on the direction of the shift when out of focus, so the direction of lateral shift of the hoe can be detected. By doing this, it is possible to detect the in-focus state, the front bin focus state, and the back bin focus state.

ここで、上記ストライプマスク16−1〜16−nは1
所正 一 本実施例においては、次のよう ている。即ち第4図(
qに示すように透明基板15(例えばガラス)の上面に
、先ず光吸収材である酸化クロム(Cr203)を膜厚
250μmに蒸着し、さらKその上に遮光材であるクロ
ム(Cr )を膜厚700μmに蒸着する。そして硝酸
第2セリウムアンモニウムを用いてエツチングを行ない
上記開口17を形成する。つまり、上記ストライプマス
ク16−1〜16−nは上記ガラスに接して光吸収体1
6b−1〜16b−nが形成され、さらにその上に遮光
体16a−1〜16a−nが形成されている。上記クロ
ムはその薄膜が丈夫なのでキズ等がつきにくいこと、あ
るいは上記ガラスと密着性が良好なので上述のような目
的には広く用いられており、また上記酸化クロムだけで
遮光体と光吸収体との両方を兼ねれば好ましいのである
が、機械的強度が弱いため、実用化はできず、従って上
記の光吸収体と遮光体の両者で形成しである。なお、上
記酸化クロムの膜厚は可視光の光吸収材に用いる場合に
は上述のように250μm程度が良く、光の反射は数優
に減少し、上記クロムだけを用いる場合の3゜になる。
Here, the stripe masks 16-1 to 16-n are 1
Tokomasa: In this example, it is as follows. That is, Fig. 4 (
As shown in q, chromium oxide (Cr203), which is a light absorbing material, is first deposited on the upper surface of the transparent substrate 15 (for example, glass) to a thickness of 250 μm, and then chromium (Cr), which is a light blocking material, is deposited on top of it. Vapor deposition is performed to a thickness of 700 μm. Then, etching is performed using ceric ammonium nitrate to form the opening 17. That is, the stripe masks 16-1 to 16-n are in contact with the glass and the light absorber 1
6b-1 to 16b-n are formed, and furthermore, light shielding bodies 16a-1 to 16a-n are formed thereon. The above-mentioned chromium is widely used for the above purposes because its thin film is strong and does not easily get scratched, and because it has good adhesion to the above-mentioned glass, and the above-mentioned chromium oxide alone can be used as a light shielding material and a light absorbing material. Although it would be preferable to serve both of the above, it is not practical due to its weak mechanical strength, and therefore it is necessary to form it with both the light absorber and the light shield. In addition, when using the above-mentioned chromium oxide as a light absorbing material for visible light, the film thickness is preferably about 250 μm as mentioned above, and the reflection of light is reduced by several degrees, to 3° when only the above-mentioned chromium is used. .

次に第6,7図は、本発明の合焦検出装置に用いる遮光
部材の第2の構成例を示すものである。
Next, FIGS. 6 and 7 show a second configuration example of a light shielding member used in the focus detection device of the present invention.

εの遮光部材二は、透明基板15の結像光学系側の面上
に第1の遮光部材として上述した実施例と同様の手段お
よび材料により光吸収体(酸化クロム) 24b−1〜
24b−n 、 m光体(クロム)24a−1〜24a
−nの2層からなる、各受光素子対に対応したn個のス
トライプマスク24−1〜24−nを設けて比較的大き
な開口25を形成し、また上記受光素子一対側の面上に
は第2の遮光部材として2n+1個のストライプマスク
26−1〜26−(2n+1)を上述と同様の手段によ
り形成して、これらストライプマスク26−1〜26−
(2n+1)により、第7図にも示すように各受光素子
に対向し、かつその配列方向の長さよりも幅が比較的小
さな開口27を形成したものである。上記遮光部材互な
用いれば、この遮光部材η−と受光素子一対との光学的
調整が、受光素子の配列方向に多少ずれても、第7図か
ら明らかなように各開口27に対向する各受光素子の受
光面積は変らず、したがって前記受光素子群14A。
The light-shielding member 2 of ε is a light absorber (chromium oxide) 24b-1 to 24b-1 on the surface of the transparent substrate 15 on the imaging optical system side using the same means and material as the first light-shielding member in the embodiment described above.
24b-n, m light body (chromium) 24a-1 to 24a
- n stripe masks 24-1 to 24-n corresponding to each light-receiving element pair are provided to form a relatively large opening 25, and on the surface on the side of the light-receiving element pair. As the second light shielding member, 2n+1 stripe masks 26-1 to 26-(2n+1) are formed by the same means as described above, and these stripe masks 26-1 to 26-
(2n+1), as shown in FIG. 7, an opening 27 is formed which faces each light receiving element and whose width is relatively smaller than the length in the arrangement direction. If the light shielding members are used interchangeably, even if the optical adjustment between the light shielding member η- and the pair of light receiving elements is slightly deviated in the arrangement direction of the light receiving elements, each of the light shielding members facing each opening 27 can The light-receiving area of the light-receiving element does not change, so the light-receiving element group 14A.

14Bに入射する光量のバランスは変わらないから、上
記遮光部材22と上記受光素子列11と−の光学的調整
が簡単で、しかも常に高精度の焦点検出を行なうことが
できる。ちなみに、上述した実施例に用いた遮光部材風
においては、これが受光素子列口に対してその列方向、
例えば第4図(ト)および(Qにおいて右側に若干ずれ
て配置されると、前記受光素子14A−1〜14A−n
の受光面積が一様に拡がり、逆に前記受光素子14B−
1〜14B−nの受光面積が一様に狭くなって、前記受
光素子群14Aと14Bとの出力のアンバランスがひど
くなり高精度の焦点検出ができなくなる場合があるため
、上記受光素子列υ−と遮光部材風と゛の光学的調整に
比較的高n度が要求される。
Since the balance of the amount of light incident on the light receiving element 14B does not change, optical adjustment between the light shielding member 22 and the light receiving element array 11 is easy, and moreover, highly accurate focus detection can be performed at all times. Incidentally, in the light-shielding member used in the above-mentioned embodiment, it is
For example, if the light receiving elements 14A-1 to 14A-n are arranged slightly to the right in FIGS.
The light-receiving area of the light-receiving element 14B-
The light receiving areas of the light receiving element groups 1 to 14B-n are uniformly narrowed, and the imbalance between the outputs of the light receiving element groups 14A and 14B may become severe, making it impossible to perform highly accurate focus detection. A relatively high n degree is required for optical adjustment between - and light shielding member wind.

次に、遮光部材の第6の構成例を第8図に示す。Next, a sixth configuration example of the light shielding member is shown in FIG.

この例では、透明基板15の上下両面に先づそれぞれ光
吸収体(酸化クロム) 28b−1〜28b−n 、 
29b−1〜29b−(2n+ 1 )を設け、その上
に遮光体(クロム)28a−1〜28a −n 、 2
9a−1〜29a−(2n+1)、さらにその上に光吸
収体(酸化クロム) 28cm1〜28cmn。
In this example, light absorbers (chromium oxide) 28b-1 to 28b-n are placed on both upper and lower surfaces of the transparent substrate 15, respectively.
29b-1 to 29b-(2n+1) are provided, and light shielding bodies (chromium) 28a-1 to 28a-n, 2 are provided thereon.
9a-1 to 29a-(2n+1), and furthermore a light absorber (chromium oxide) 28cm1 to 28cmn.

29cm1〜29cm(2n +1 )を蒸着して、ス
トライプマスク28−1 ”−28−n 、 29−1
〜29−(2n+ 1 )と開口25゜27を形成した
ものである。
29cm1~29cm(2n+1) is deposited to form stripe masks 28-1''-28-n, 29-1
~29-(2n+1) and an opening 25°27.

第9図は、兜に遮光部材の第4の構成例を示すものであ
る。この構成例は遮光と光吸収の両機能を合せ持ってい
るテルル化カドミウム(ca’re )の遮光部材65
−1〜55−n、56−1〜36−(2n+1)を透明
基板15の上下両面に蒸着し、これによりストライプマ
スクを形成したものである。
FIG. 9 shows a fourth configuration example of a light shielding member on a helmet. This configuration example shows a light shielding member 65 made of cadmium telluride (ca're) that has both light shielding and light absorption functions.
-1 to 55-n and 56-1 to 36-(2n+1) are vapor-deposited on both upper and lower surfaces of the transparent substrate 15, thereby forming a stripe mask.

なお、上記第6および第4構成例における開口25.2
7の大きさは、前記第6.7図に示し?、−第2構成例
のものと同様に形成されている。
Note that the opening 25.2 in the sixth and fourth configuration examples above
The size of 7 is shown in Figure 6.7 above. , - formed similarly to that of the second configuration example.

以上のように本発明による光吸収機能を有する遮光部材
を用いると、次のような極めて顕著な効果が得られる。
As described above, when the light shielding member having a light absorption function according to the present invention is used, the following extremely remarkable effects can be obtained.

即ち、第10図に示すように透明基板15の上下両面に
クロムのような反射率の高い遮光体のみで、ストライプ
マスク37−1〜57−nと38−1〜38−nを蒸着
により形成すると、遮光部材担に入射する光線のうち、
あるものは光線51a、51bに示すようにそれぞれ受
光素子14A−3、14B−2n に入射して正しく受
光されるが、光線52のように受光素子14A−1によ
ってその一部が反射されて遮光体68−2に到達するも
のがあり、するとこの遮光体38−2でさらに反射され
て迷光となりてしまい受光素子枠AあるいはBのどこか
の素子に受光されることになる。また光線53のように
、受光素子14A−2によって一部反射され、これが右
方上にある遮光体37−2に到り、ここで再び反射され
て受光素子14B−2で受光されてしまう。この場合は
本来Aの受光素子群で受光されるべき上記光線55が、
Bの受光素子群で受光されてしまったことになる。さら
に光線54のように遮光体68−6と遮光体67−3と
で折返し反射され、そして受光素子14B−5で受光さ
れてしまうもの、さらにまた光線55のように遮光体3
7−(n−1)の表面で反射され、図示しない光学系の
構成体で反射され迷光となってしまうもの等、それぞれ
乱反射を生じる。
That is, as shown in FIG. 10, stripe masks 37-1 to 57-n and 38-1 to 38-n are formed by vapor deposition on both upper and lower surfaces of the transparent substrate 15 using only a light shielding material with high reflectivity such as chromium. Then, among the light rays incident on the light shielding member,
Some light rays enter the light receiving elements 14A-3 and 14B-2n and are correctly received as shown by the light rays 51a and 51b, respectively, but some of them are reflected by the light receiving element 14A-1 and are blocked, as shown by the light ray 52. Some light reaches the body 68-2, and is further reflected by the light shielding body 38-2 to become stray light, which is received by some element of the light-receiving element frame A or B. Also, like the light ray 53, it is partially reflected by the light receiving element 14A-2 and reaches the light shielding body 37-2 located on the upper right side, where it is reflected again and is received by the light receiving element 14B-2. In this case, the light ray 55 that should originally be received by the light receiving element group A is
This means that the light has been received by the light receiving element group B. Furthermore, light rays like the light ray 54 are reflected back by the light shield 68-6 and the light shield 67-3 and are received by the light receiving element 14B-5, and light rays like the light ray 55 are reflected by the light shield
7-(n-1), which is reflected by a component of an optical system (not shown), and becomes stray light, each of which causes diffuse reflection.

このように光線によっては反射体であるクロムによって
形成されているストライプマスクの上面てはならない光
線を受光素子が受光してしまうことになる。そのため正
しい照度分布が得られなかったり、像のコントラストが
落ちてしまったりする。特に近くにきわめて明るい隊の
部分があると、像の劣化が著しくなり、合焦検出能力が
低下してしまう。即ち、具体的な障害としては、合焦検
出精度が悪くなったり、合焦位置でないにもかかわらす
合焦信号が出てしまったり、あるいは方向検出できる範
囲が狭くなったりしてしまう。
In this way, depending on the light ray, the light receiving element may receive light that should not be on the upper surface of the stripe mask formed of chromium, which is a reflector. As a result, the correct illuminance distribution may not be obtained or the contrast of the image may deteriorate. In particular, if there is a very bright part of the image nearby, the image will deteriorate significantly and the focus detection ability will deteriorate. That is, specific failures include poor focus detection accuracy, a focus signal being output even though it is not in the focus position, or a narrowing of the range in which direction can be detected.

このような欠点、即ちストライプマスクを用いた欠点を
本発明では光吸収体が解決する。即ち、第1の構成例(
第4図)によれば光線53(第10図参照)の〕うな反
射光を前記光吸収体16b−1〜16b−nが吸収し、
第2の構成例(第6.7図)によれば、同様に光線53
.54を吸収し、第3,4の構成例(第8,9図)によ
れば、同様に光線52〜55す吸収してしまうので上述
のよ5な迷光による合焦検出の不安定さを防げるから、
正しい合焦検出をすることができる。
In the present invention, the light absorber solves this drawback, that is, the drawback of using a striped mask. That is, the first configuration example (
According to FIG. 4), the light absorbers 16b-1 to 16b-n absorb such reflected light of the light ray 53 (see FIG. 10),
According to the second configuration example (Fig. 6.7), the light ray 53
.. According to the third and fourth configuration examples (Figs. 8 and 9), the light rays 52 to 55 are similarly absorbed, which prevents the instability of focus detection due to the above-mentioned stray light. Because it can be prevented,
Correct focus detection can be performed.

以上のように光吸収体を用いた遮光手段により得られた
焦点情報は、第11図に示すような信号処理回路で処理
される。本例では、前記受光素子月旦の多数の受光素子
の出方をその配列方向に順次読出し、これをA/D変換
回路18で順次アナログ−デジタル変換して演算回路1
9に取込み、ここで受光素子14A−kおよび14B−
k (但し1 <k <n )の出力をそれぞれA、お
よび飄として、例えはを演算する。この演算値Sは、上
記受光素子列−υ。
The focus information obtained by the light shielding means using the light absorber as described above is processed by a signal processing circuit as shown in FIG. In this example, the appearance of a large number of light-receiving elements of the above-mentioned light-receiving element month/day is sequentially read out in the arrangement direction, and this is sequentially converted from analog to digital by the A/D conversion circuit 18 to the arithmetic circuit 1.
9, and here the light receiving elements 14A-k and 14B-
Let the outputs of k (where 1<k<n) be A and A, respectively, and calculate the following. This calculated value S is the above-mentioned light receiving element array -υ.

に対する前記撮影光学系2の位置に対応して第12図に
示すように、前ビン状態では正、合焦状態では零、後ピ
ン状態では負となるから、この演算値Sに基いて表示回
路20において前ビン、合焦、後ピンを表示する。なお
、上記受光素子列υ−1A/D変換回路18、演算回路
19および表示回路2oの動作は制御回路21で制御す
る。
As shown in FIG. 12, the value is positive in the front focus state, zero in the in-focus state, and negative in the rear focus state, as shown in FIG. At 20, front focus, focus, and back focus are displayed. The operations of the light-receiving element array υ-1 A/D conversion circuit 18, arithmetic circuit 19, and display circuit 2o are controlled by a control circuit 21.

(効果) 本発明によれば、結像光学系の射出瞳の像を結像する微
小な補助光学系を用いることなく、受光素子列の受光面
側に開口を有する遮光部材を設け、これにより相隣る2
個の受光素子に結像光学系の光軸な含む面を境とする第
1および第2の領域からの光がそれぞれ主として入射す
るように指向性を持たせるようにし、かつ上記遮光部材
には不必要な光を吸収する処置を施しであるので、正確
な合焦判定ができ、構成が簡単で容易に製作することが
できると共に1安価で小形にできる。また、受光素子列
と遮光部材とを一体に形収することができるから、両者
の光学的調整を容易かつ高精度に行なうことができる。
(Effects) According to the present invention, a light shielding member having an opening on the light receiving surface side of the light receiving element array is provided without using a minute auxiliary optical system for forming an image of the exit pupil of the imaging optical system, and thereby 2 adjacent
The light-receiving element is made to have directivity so that light from the first and second regions bounded by the plane containing the optical axis of the imaging optical system mainly enters the light-receiving element, and the light-shielding member is provided with directivity. Since it is treated to absorb unnecessary light, accurate focus judgment can be made, the structure is simple and easy to manufacture, and it can be made inexpensive and compact. Further, since the light-receiving element array and the light-shielding member can be housed in one piece, optical adjustment of both can be performed easily and with high precision.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、従来の合焦検出装置の構成図、第2図は、上
記第1図に示す補助光学系と受光素子列との配置関係を
示す平面図、 第3図は、−眼レフレックスカメラに適用した、本発明
の合焦検出装置の光学的配置図、第4図囚、但)および
(Qは、本発明の一実施例を示す合焦検出装置の斜視図
、要部平面図および要部断面図、 第5図は、本発明における対を改す受光素子の指向特性
図、 第6〜9図は、本発明の合焦検出装置における遮光部材
の構成例をそれぞれ示す断面および平面図、 第10図は、光吸収機能をもたない遮光一部材による弊
害を説明するための遮光部材の断面図、第11図は、本
発明の合焦検出装置の信号処理回路の一例を示すブロッ
ク図、 第12図は、焦点状態を表わす検出信号の態様を示す図
である。 1・・・嘩・・・被写体 2・・・・・・・結像(撮影)光学系 3・・・・・・・可動反射ミラー 6−−−−−・・フィルム 7・・−−トハーフミラー 8・・・・−・・全反射ミラー ji*@@@*@受光素子列 12m*@a@@遮光部材 14A、14B・・・受光素子群 14A−1〜14A−n、 14B−1〜14B−n 
・・−受光素子15・・・・・・透明基板 17−−@φ・−開 口 18・・・・・・A/D変換回路 19・・・・・・演算回路 20・・・・・自表示回路 21・・・・・・制御回路 22・・・・・・遮光部材 25−・働1・開 口 27・・・・・・開 口 16−1〜16−1−争・・−・・・ストライプマスク
24−1〜24−n−・・・・・・ストライプマスク2
6−1〜26−(2n+1)・噌・ストライプマスク2
8−1〜28−n・・・e・・・1111ストライブマ
スク52.55−−−−−光 線 纂1 区 端′2区 倦′4区(A) 力、4区(B) 傭4区(C) 外5区 嶌 ゐ6図 /hh11区 倦12区
FIG. 1 is a configuration diagram of a conventional focus detection device, FIG. 2 is a plan view showing the arrangement relationship between the auxiliary optical system and the light receiving element array shown in FIG. 1, and FIG. FIG. 4 is an optical layout diagram of the focus detection device of the present invention applied to a flex camera, and (Q is a perspective view of the focus detection device according to an embodiment of the present invention, a plan view of the main part. FIG. 5 is a directional characteristic diagram of the light receiving element that changes the pair in the present invention. FIGS. 6 to 9 are cross sections showing examples of the structure of the light shielding member in the focus detection device of the present invention. and a plan view; FIG. 10 is a sectional view of a light shielding member for explaining the adverse effects caused by a light shielding member that does not have a light absorption function; FIG. 11 is an example of a signal processing circuit of the focus detection device of the present invention. FIG. 12 is a diagram showing the form of a detection signal representing the focus state. 1. Subject 2. Imaging (photography) optical system 3. ......Movable reflection mirror 6----- Film 7... Half mirror 8... Total reflection mirror ji*@@@*@Photodetector array 12m*@ a@@ Light shielding members 14A, 14B... Light receiving element groups 14A-1 to 14A-n, 14B-1 to 14B-n
--- Light receiving element 15 --- Transparent substrate 17 --@φ.-- Aperture 18 --- A/D conversion circuit 19 --- Arithmetic circuit 20 --- Self-display circuit 21... Control circuit 22... Light shielding member 25-・Work 1・Aperture 27...Opening 16-1 to 16-1-Conflict...- ... Stripe mask 24-1 to 24-n- ... Stripe mask 2
6-1~26-(2n+1)・Sao・Stripe Mask 2
8-1 ~ 28-n...e...1111 Strive Mask 52.55-----Light Line 1 Ward'2 Ward'4 Ward (A) Power, 4 Ward (B) Ward 4 (C) Outer 5 wards Shima 6/hh 11 wards 12 wards

Claims (2)

【特許請求の範囲】[Claims] (1)結像光学系の予定焦平面、またはその近傍に配置
した受光素子列と、 この受光素子列と上記結像光学系との間の光路中に配置
され、受光素子列の相隣なる受光素子に上記結像光学系
の光軸な含む面を境とする第1および第2の領域からの
光を、それぞれ主として入射させるように形成した開口
を有する遮光部材と、 この遮光部材に光吸収物質による反射防止機能を持たせ
る反射防止手段と、 を具備し、 上記受光素子列の上記結像光学系の第1の領域からの光
を受光する受光素子群と、第2の領域からの光を受光す
る受光素子群とにそれぞれ形成される物体像の横ずれを
検出しで上記結像光栄系によって形戊六れる物体像の値
占汁能を検出するようKしたことを特徴とする合焦検出
装置。
(1) A light-receiving element array arranged at or near the predetermined focal plane of the imaging optical system, and a light-receiving element array arranged in the optical path between this light-receiving element array and the imaging optical system, and adjacent to the light-receiving element array. a light-shielding member having an aperture formed so that light from first and second regions bounded by a plane including the optical axis of the imaging optical system is mainly incident on the light-receiving element; an anti-reflection means that has an anti-reflection function using an absorbing substance, and a light-receiving element group that receives light from a first region of the imaging optical system of the light-receiving element array; The system is characterized in that it detects the lateral shift of the object image formed in each of the light receiving element groups that receive light, and detects the value estimation ability of the object image formed by the imaging optical system. Focus detection device.
(2)上記遮光部材はクロム(Cr)膜で構成されてい
て、上記光吸収物質は酸化クロム(Cr、0.)膜で形
成されていることを特徴とする特許請求の範囲第1項記
載の合焦検出装置。
(2) The light shielding member is made of a chromium (Cr) film, and the light absorbing material is made of a chromium oxide (Cr, 0.) film. Focus detection device.
JP23462483A 1983-12-13 1983-12-13 Focusing detector Pending JPS60125814A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23462483A JPS60125814A (en) 1983-12-13 1983-12-13 Focusing detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23462483A JPS60125814A (en) 1983-12-13 1983-12-13 Focusing detector

Publications (1)

Publication Number Publication Date
JPS60125814A true JPS60125814A (en) 1985-07-05

Family

ID=16973953

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23462483A Pending JPS60125814A (en) 1983-12-13 1983-12-13 Focusing detector

Country Status (1)

Country Link
JP (1) JPS60125814A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8848096B2 (en) 2011-04-19 2014-09-30 Canon Kabushiki Kaisha Image-pickup apparatus and control method therefor
US9025060B2 (en) 2011-04-01 2015-05-05 Canon Kabushiki Kaisha Solid-state image sensor having a shielding unit for shielding some of photo-electric converters and image capturing apparatus including the solid-state image sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9025060B2 (en) 2011-04-01 2015-05-05 Canon Kabushiki Kaisha Solid-state image sensor having a shielding unit for shielding some of photo-electric converters and image capturing apparatus including the solid-state image sensor
US8848096B2 (en) 2011-04-19 2014-09-30 Canon Kabushiki Kaisha Image-pickup apparatus and control method therefor

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