JPS60125546A - 赤熱物体の表面疵検出装置 - Google Patents

赤熱物体の表面疵検出装置

Info

Publication number
JPS60125546A
JPS60125546A JP58232964A JP23296483A JPS60125546A JP S60125546 A JPS60125546 A JP S60125546A JP 58232964 A JP58232964 A JP 58232964A JP 23296483 A JP23296483 A JP 23296483A JP S60125546 A JPS60125546 A JP S60125546A
Authority
JP
Japan
Prior art keywords
red
visible
radiation
flaw
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58232964A
Other languages
English (en)
Japanese (ja)
Other versions
JPH031619B2 (cg-RX-API-DMAC7.html
Inventor
Toru Yoshida
透 吉田
Mitsuo Yagi
八木　光夫
Shigeru Horii
滋 堀井
Hideo Nishiyama
西山　英夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Panasonic Holdings Corp
Original Assignee
Nippon Steel Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp, Matsushita Electric Industrial Co Ltd filed Critical Nippon Steel Corp
Priority to JP58232964A priority Critical patent/JPS60125546A/ja
Publication of JPS60125546A publication Critical patent/JPS60125546A/ja
Publication of JPH031619B2 publication Critical patent/JPH031619B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP58232964A 1983-12-09 1983-12-09 赤熱物体の表面疵検出装置 Granted JPS60125546A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58232964A JPS60125546A (ja) 1983-12-09 1983-12-09 赤熱物体の表面疵検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58232964A JPS60125546A (ja) 1983-12-09 1983-12-09 赤熱物体の表面疵検出装置

Publications (2)

Publication Number Publication Date
JPS60125546A true JPS60125546A (ja) 1985-07-04
JPH031619B2 JPH031619B2 (cg-RX-API-DMAC7.html) 1991-01-11

Family

ID=16947628

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58232964A Granted JPS60125546A (ja) 1983-12-09 1983-12-09 赤熱物体の表面疵検出装置

Country Status (1)

Country Link
JP (1) JPS60125546A (cg-RX-API-DMAC7.html)

Also Published As

Publication number Publication date
JPH031619B2 (cg-RX-API-DMAC7.html) 1991-01-11

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