JPS60102684U - semiconductor integrated circuit - Google Patents

semiconductor integrated circuit

Info

Publication number
JPS60102684U
JPS60102684U JP19392083U JP19392083U JPS60102684U JP S60102684 U JPS60102684 U JP S60102684U JP 19392083 U JP19392083 U JP 19392083U JP 19392083 U JP19392083 U JP 19392083U JP S60102684 U JPS60102684 U JP S60102684U
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
state
circuit
tests
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19392083U
Other languages
Japanese (ja)
Inventor
魚住 智彦
Original Assignee
横河電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 横河電機株式会社 filed Critical 横河電機株式会社
Priority to JP19392083U priority Critical patent/JPS60102684U/en
Publication of JPS60102684U publication Critical patent/JPS60102684U/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図は本考案の一実施例を示す構成説明−である。 10・・・半導体集積回路IC,11・・・機能回路、
・12・・・不揮発スイッチ回路、13・・・制御面路
、2−0・・・テスト装置、21・・・信号源、22・
・・スーイッチ駆動回路、23・・・測定回路、24・
・・制御装置。
The figure is a configuration explanation showing one embodiment of the present invention. 10... Semiconductor integrated circuit IC, 11... Functional circuit,
12... Non-volatile switch circuit, 13... Control surface path, 2-0... Test device, 21... Signal source, 22...
...Switch drive circuit, 23...Measurement circuit, 24.
··Control device.

Claims (1)

【実用新案登録請求の範囲】 所定の動作機能を有する機能回路部と、外部か。 ら加えられる信号に従って動作する不揮発スイッチ回路
と、この不揮発スイッチ回−の出力信号に従って機能回
路の状態を変更しながう機能回路のテストを実行する制
御回路とを具備味一連のテストが完了した状態で不揮発
スイッチ回路により出荷状態が設定されることを特徴と
する半導体集積面路。
[Scope of Claim for Utility Model Registration] A functional circuit section having a predetermined operational function and an external device. A series of tests have been completed. A semiconductor integrated surface circuit characterized in that a shipping state is set by a nonvolatile switch circuit in a state.
JP19392083U 1983-12-16 1983-12-16 semiconductor integrated circuit Pending JPS60102684U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19392083U JPS60102684U (en) 1983-12-16 1983-12-16 semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19392083U JPS60102684U (en) 1983-12-16 1983-12-16 semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS60102684U true JPS60102684U (en) 1985-07-12

Family

ID=30416968

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19392083U Pending JPS60102684U (en) 1983-12-16 1983-12-16 semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS60102684U (en)

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