JPS5991307A - 光学式測定装置 - Google Patents
光学式測定装置Info
- Publication number
- JPS5991307A JPS5991307A JP20097782A JP20097782A JPS5991307A JP S5991307 A JPS5991307 A JP S5991307A JP 20097782 A JP20097782 A JP 20097782A JP 20097782 A JP20097782 A JP 20097782A JP S5991307 A JPS5991307 A JP S5991307A
- Authority
- JP
- Japan
- Prior art keywords
- base
- collimator lens
- light beam
- axis
- mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims description 52
- 239000000463 material Substances 0.000 claims description 6
- 229910001374 Invar Inorganic materials 0.000 claims description 3
- 230000008602 contraction Effects 0.000 abstract description 9
- 238000006073 displacement reaction Methods 0.000 description 4
- 239000013256 coordination polymer Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000000956 alloy Substances 0.000 description 2
- 239000006059 cover glass Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 238000011888 autopsy Methods 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0011—Arrangements for eliminating or compensation of measuring errors due to temperature or weight
- G01B5/0014—Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20097782A JPS5991307A (ja) | 1982-11-16 | 1982-11-16 | 光学式測定装置 |
US06/550,292 US4639141A (en) | 1982-11-12 | 1983-11-09 | Scanning ray beam generator for optical measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20097782A JPS5991307A (ja) | 1982-11-16 | 1982-11-16 | 光学式測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5991307A true JPS5991307A (ja) | 1984-05-26 |
JPH0514201B2 JPH0514201B2 (enrdf_load_stackoverflow) | 1993-02-24 |
Family
ID=16433457
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20097782A Granted JPS5991307A (ja) | 1982-11-12 | 1982-11-16 | 光学式測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5991307A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008064585A (ja) * | 2006-09-07 | 2008-03-21 | Mitsutoyo Corp | 光学式測定装置、光学式測定方法、及び光学式測定処理プログラム |
-
1982
- 1982-11-16 JP JP20097782A patent/JPS5991307A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008064585A (ja) * | 2006-09-07 | 2008-03-21 | Mitsutoyo Corp | 光学式測定装置、光学式測定方法、及び光学式測定処理プログラム |
Also Published As
Publication number | Publication date |
---|---|
JPH0514201B2 (enrdf_load_stackoverflow) | 1993-02-24 |
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