JPS5972748A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5972748A
JPS5972748A JP18383082A JP18383082A JPS5972748A JP S5972748 A JPS5972748 A JP S5972748A JP 18383082 A JP18383082 A JP 18383082A JP 18383082 A JP18383082 A JP 18383082A JP S5972748 A JPS5972748 A JP S5972748A
Authority
JP
Japan
Prior art keywords
conductive
semiconductor device
cover
affected
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18383082A
Other languages
Japanese (ja)
Inventor
Kazuya Satake
佐竹 和也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP18383082A priority Critical patent/JPS5972748A/en
Publication of JPS5972748A publication Critical patent/JPS5972748A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/60Protection against electrostatic charges or discharges, e.g. Faraday shields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To obtain a highly reliable device which is not affected by external electric fields and external noises, by providing a conductive protecting cover on the main surface of a semiconductor pellet. CONSTITUTION:A conductive protecting cover 1 is provided on the main surface of a semiconductor pellet 2. In this way, even though the surface of a molded package is charged, it is not affected by electric fields. Especially, when the conductive cover 1 is connected to a GND (grounding) pin, the charge induced in the conductive cover 1 is discharged to the ground thereby the condition becomes more favorable.

Description

【発明の詳細な説明】 本発明は半導体装置に係シ、特にMOS(metalo
xide semiconductor)形のIC(集
積回路)の保護構造に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to semiconductor devices, particularly MOS (metallo
The present invention relates to a protection structure for an IC (integrated circuit) of the xide semiconductor type.

従来のMOS形のICでは、外部摩擦等によってそ−ル
ドパッケージ表面が帯電した場合、ゲート保護のトラン
ジスタが働きにくいという現象がある。例えば、第1図
に示すように、Nchanne 10MO8形ICのモ
ールドパッケージ表面3がプラスに帯電した場合、半導
体プレットに形成された保護トランジスタのゲートGは
マイナスに誘起され、ソースSとドレインD間のチャン
ネル表面5にはプラス電荷が誘起される。この為、保護
トランジスタのしきい値電圧(VT)は高くなシ、ON
(導通)しにくい状態となる。したがって、過電圧がか
かっても、保護回路は働かず、このため入出力トランジ
スタ(図示せず)のゲートへの直接負担がかかシ、入出
力端子が破壊されてしまうことがある。このように、N
channel形ではモールドパッケージ表面3がプラ
スに帯電した時、Pchannel形ではモールドパッ
ケージ表面3がマイナスに帯電した時、いずれも静電気
等の過電圧に対して極めて弱い状態となってしまう(〔
表〕参照)。
In conventional MOS type ICs, when the surface of the cold package becomes electrically charged due to external friction or the like, there is a phenomenon in which the gate protection transistor does not work easily. For example, as shown in FIG. 1, when the mold package surface 3 of the Nchanne 10MO8 type IC is positively charged, the gate G of the protection transistor formed on the semiconductor plate is induced to be negative, and the voltage between the source S and drain D is A positive charge is induced on the channel surface 5. Therefore, the threshold voltage (VT) of the protection transistor is not high, and the ON
(conductivity) becomes difficult. Therefore, even if an overvoltage is applied, the protection circuit does not work, and this places a direct load on the gate of an input/output transistor (not shown), which may destroy the input/output terminal. In this way, N
When the mold package surface 3 of the channel type is positively charged, and when the mold package surface 3 of the Pchannel type is negatively charged, both become extremely vulnerable to overvoltage such as static electricity ([
(see table).

〔表〕〔table〕

本発明の目的は、以上のような問題を改善し、外部電界
および雑音が半導体ペレットに影響をおよぼさないよう
にした半導体装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems and provide a semiconductor device in which external electric fields and noise do not affect semiconductor pellets.

本発明は、半導体ペレットの主面上に導電性の保護カバ
ーを設けたことを特徴とする半導体装置にある。
The present invention resides in a semiconductor device characterized in that a conductive protective cover is provided on the main surface of a semiconductor pellet.

次に図面を参照して本発明の詳細な説明する。Next, the present invention will be described in detail with reference to the drawings.

第2図は本発明の実施例の半導体装置を示した断面図で
ある。本実施例に示すように、半導体ペレット2が導電
体カバー1で覆われている為、たとえモールドパッケー
ジ表面が帯電しても電界の影響はまったく受けないこと
になる。特に、導電体カバー1をリード4のGND(接
地)ビンと接合されれば、導電体カバー1に誘起された
電荷が接地へ逃げる為さらに好ましい状態となる0本構
造は、ICの外部雑音に対しても有効な手段と々る0 以上のように、本発明によれば、外部電界や外部雑音に
影響されることない極めて信頼性の高い半導体装置が得
られる。
FIG. 2 is a sectional view showing a semiconductor device according to an embodiment of the present invention. As shown in this embodiment, since the semiconductor pellet 2 is covered with the conductor cover 1, even if the surface of the mold package is charged, it will not be affected by the electric field at all. In particular, if the conductor cover 1 is connected to the GND (ground) pin of the lead 4, the electric charge induced in the conductor cover 1 will escape to the ground, so the zero-wire structure will be in a more favorable state. As described above, according to the present invention, an extremely reliable semiconductor device that is not affected by external electric fields or external noise can be obtained.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の半導体装置の断面図、第2図は本発明の
実施例の半導体装置を示す断面図である。 面図において、 1・・・・・・導電性カバー、2・・・・・・半導体ベ
レット、3・・・・・・モールドパッケージ表面、4・
・・・・・リード、5・・・・・・チャンネル、S・・
・・・・ソース、G・・・・・・ゲート、D・・・・・
・ドレイン〇
FIG. 1 is a sectional view of a conventional semiconductor device, and FIG. 2 is a sectional view of a semiconductor device according to an embodiment of the present invention. In the top view, 1... Conductive cover, 2... Semiconductor pellet, 3... Molded package surface, 4...
...Lead, 5...Channel, S...
...Source, G...Gate, D...
・Drain〇

Claims (1)

【特許請求の範囲】[Claims] 半導体ペレットの主面上に導電性の保設カックーを設け
たことを特徴とする半導体装置。
A semiconductor device characterized in that a conductive storage cuckoo is provided on the main surface of a semiconductor pellet.
JP18383082A 1982-10-20 1982-10-20 Semiconductor device Pending JPS5972748A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18383082A JPS5972748A (en) 1982-10-20 1982-10-20 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18383082A JPS5972748A (en) 1982-10-20 1982-10-20 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS5972748A true JPS5972748A (en) 1984-04-24

Family

ID=16142586

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18383082A Pending JPS5972748A (en) 1982-10-20 1982-10-20 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5972748A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62183545A (en) * 1986-02-07 1987-08-11 Rohm Co Ltd Electronic parts
JPS6437043A (en) * 1987-07-31 1989-02-07 Nec Corp Resin-sealed semiconductor device
JPH02119166A (en) * 1988-10-27 1990-05-07 Nec Corp Resin-sealed semiconductor device
JPH02278752A (en) * 1989-04-19 1990-11-15 Mitsubishi Electric Corp Semiconductor device
US5350943A (en) * 1992-04-18 1994-09-27 Temic Telefunken Microelectronic Gmbh Semiconductor assembly, in particular a remote control reception module
FR2707798A1 (en) * 1993-07-12 1995-01-20 Telecommunications Elect A method of encapsulating a power semiconductor device and encapsulation made by this method.
US5394014A (en) * 1990-11-28 1995-02-28 Mitsubishi Denki Kabushiki Kaisha Semiconductor device improved in light shielding property and light shielding package
JPH08236652A (en) * 1995-02-28 1996-09-13 Nec Corp Hybrid integrated circuit device
DE4143494C2 (en) * 1990-11-28 1998-05-14 Mitsubishi Electric Corp Semiconductor device with reduced housing thickness and wt.

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62183545A (en) * 1986-02-07 1987-08-11 Rohm Co Ltd Electronic parts
JPS6437043A (en) * 1987-07-31 1989-02-07 Nec Corp Resin-sealed semiconductor device
JPH0567069B2 (en) * 1987-07-31 1993-09-24 Nippon Electric Co
JPH02119166A (en) * 1988-10-27 1990-05-07 Nec Corp Resin-sealed semiconductor device
JPH02278752A (en) * 1989-04-19 1990-11-15 Mitsubishi Electric Corp Semiconductor device
US5394014A (en) * 1990-11-28 1995-02-28 Mitsubishi Denki Kabushiki Kaisha Semiconductor device improved in light shielding property and light shielding package
DE4143494C2 (en) * 1990-11-28 1998-05-14 Mitsubishi Electric Corp Semiconductor device with reduced housing thickness and wt.
US5350943A (en) * 1992-04-18 1994-09-27 Temic Telefunken Microelectronic Gmbh Semiconductor assembly, in particular a remote control reception module
FR2707798A1 (en) * 1993-07-12 1995-01-20 Telecommunications Elect A method of encapsulating a power semiconductor device and encapsulation made by this method.
JPH08236652A (en) * 1995-02-28 1996-09-13 Nec Corp Hybrid integrated circuit device

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