JPS5961773A - Precise measurement of mass - Google Patents

Precise measurement of mass

Info

Publication number
JPS5961773A
JPS5961773A JP57172665A JP17266582A JPS5961773A JP S5961773 A JPS5961773 A JP S5961773A JP 57172665 A JP57172665 A JP 57172665A JP 17266582 A JP17266582 A JP 17266582A JP S5961773 A JPS5961773 A JP S5961773A
Authority
JP
Japan
Prior art keywords
mass
stored
peak
detector
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57172665A
Other languages
Japanese (ja)
Inventor
Takehiro Takeda
武弘 竹田
Masaru Ishida
勝 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57172665A priority Critical patent/JPS5961773A/en
Publication of JPS5961773A publication Critical patent/JPS5961773A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/025Detectors specially adapted to particle spectrometers

Abstract

PURPOSE:To perform rapid and precise measurement of mass number, by performing operation treatment after the peak profile from a detector and the data signal from a mass marker are stored. CONSTITUTION:The specimen molecule ionized in the mass separation means 2 of a mass analytical apparatus 1 is separaed and detected in a detector 3 by magnetic field scanning and the detected signal is passed through an AD converter to be inputted to a peak discrimination means 6 where the peak profile of a signal equal to or more than a threshold value is stored while a rough mass number from a mass maker 5 is stored. The stored data are subjected to operation treatment by a memory operation means 7 to rapidly calculate a precise mass number. This operation is repeated at every magnetic field scanning.

Description

【発明の詳細な説明】 方法に関する。[Detailed description of the invention] Regarding the method.

一般に、二重収束形質量分折装置などを使用して物質イ
オンの質量数を高精度に測定する精密質量測定方法は、
イオン化した試料に対して磁場を走査させることにより
、得られるマススペクトルを、コンピュータなどの記憶
演算手段に記憶させ、測定後にこれらのマススペクトル
の中から特定の検出ピークを取り出し、第2図に示すよ
うに、時間に対する強度の変化を記録するとともに、そ
の検出ピークが示す質量数を算出して、最終的にはとこ
ろで、従来の上記井丹靜葡質量測定方法においては、イ
オン検出器で得られるピークプロファイルのデータや、
マスマーカから求められる質量数のテ゛−夕はピークの
有無にかかわらず全て記憶演算手段に入力されており、
このため、バックグラウンドとして不必要なデータも記
憶され、限られた記憶容量の有効な活用ができず、また
、必要以上に大きな記憶容量をもつものを設置せねばな
らないという問題があった。
In general, accurate mass measurement methods that use a double convergence mass spectrometer to measure the mass number of material ions with high precision are:
By scanning the ionized sample with a magnetic field, the resulting mass spectra are stored in a storage/arithmetic means such as a computer, and after measurement, specific detected peaks are extracted from these mass spectra as shown in Figure 2. In this way, changes in intensity over time are recorded, and the mass number indicated by the detected peak is calculated, and in the end, by the way, in the conventional mass measurement method mentioned above, the mass number obtained with an ion detector is calculated. peak profile data,
All mass number data obtained from mass markers are input into the memory calculation means, regardless of the presence or absence of peaks.
For this reason, unnecessary data is also stored as background data, making it impossible to make effective use of the limited storage capacity, and posing the problem of having to install one with a larger storage capacity than necessary.

本発明は上記の問題点に鑑みてなされたものであって、
記憶演算手段を有効に利用することができ、これによっ
て質量数の算定を迅速に行うことができる精密質量測定
方法を提供することを目的とするものである。
The present invention has been made in view of the above problems, and includes:
It is an object of the present invention to provide an accurate mass measurement method that can effectively utilize a memory calculation means and thereby quickly calculate a mass number.

以下、本発明の構成を実施例について、図面に基づいて
説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The configuration of the present invention will be described below with reference to embodiments based on the drawings.

能質量分析装置、(2)はイオン化室、マグネットなど
を有する質量分離手段、(3)はイオンを検出する検出
器、(4)は検出器(3)で検出されたアナログの検出
信号をデジタル信号に変換するアナログ・デジタル変換
器、(5)は走査磁場の強さからその走査磁場での質量
数を検知するマスマーカ、(6)は上記アナログ・デジ
タル変換器(4)から入力される検出信号のうち、第2
図に示すようにピーク発生を決定するしきい値(a)以
上の強度か否かを判断して、しきい値(a)以上のピー
クプロファイル(Pi) (P2) (P3)・・・・
・・のみの検出信号を記憶するとともに、」二記と併行
して、マスマーカ(5)からの質量数の入力信号を記憶
するものである。(7)は質量分離手段(2)が1回の
磁場走査を終了すると、ピーク判別記憶手段(6)に記
憶されたピークプロファイル(PI )(P2 ) (
P3 )・・・・・と、質量数のデータ信号とを受信し
て高分解能質量数を演算処理する記憶演算手段である。
(2) is a mass separation means having an ionization chamber, a magnet, etc., (3) is a detector that detects ions, and (4) is a digital detector that converts analog detection signals detected by detector (3). An analog-to-digital converter that converts into a signal, (5) a mass marker that detects the mass number in the scanning magnetic field from the strength of the scanning magnetic field, and (6) a detection input from the analog-to-digital converter (4). Of the signals, the second
As shown in the figure, it is determined whether the intensity is above the threshold value (a) that determines peak occurrence, and the peak profile (Pi) (P2) (P3)...
. . . and in parallel with the second entry, the mass number input signal from the mass marker (5) is stored. In (7), when the mass separation means (2) completes one magnetic field scan, the peak profile (PI) (P2) (
P3)... and a data signal of a mass number, and is a storage/calculation means for processing a high-resolution mass number.

次に、上記奇分千七質量測定装置(1)を使用して精密
質量数を測定する方法について説明する。
Next, a method of measuring an accurate mass number using the above-mentioned odd-minute 1,700 mass measuring device (1) will be explained.

質量分離手段(2)でイオン化された試料分子は磁場走
査により検出器(3)で分離検出され、この検出信号は
アナログ・デジタル変換器(4)を経た後、ピーク判別
記憶手段(6)に入力される。このピーク判別記憶手段
(6)はこの入力信号のうち、しきいha (a)以上
の強度データかどうかを判別し、しきい値(a)以」二
ならピークプロファイル(Pl) (P2 ) (PI
 )・・・・をデータとして人力信号を記憶すると同時
にマスマーカ(5)から入力される概算の質量数をも記
憶する。
The sample molecules ionized by the mass separation means (2) are separated and detected by the detector (3) by magnetic field scanning, and this detection signal is sent to the peak discrimination storage means (6) after passing through the analog-to-digital converter (4). is input. This peak discrimination storage means (6) discriminates whether or not the intensity data of this input signal is equal to or higher than the threshold ha (a), and if it is equal to or greater than the threshold value (a), the peak profile (Pl) (P2) ( P.I.
)... are stored as data, and at the same time, the approximate mass number input from the mass marker (5) is also stored.

1回の磁場走査が終ると同時にピーク判別記憶手段(6
)の上記記憶データが記憶演算手段(7)に入力され、
記憶演算手段(7)は演算処理を行ない精密質量数を算
定する。そして、磁場走査ごとに上記動作が繰返される
At the same time as one magnetic field scan is completed, the peak discrimination storage means (6
) is inputted to the storage calculation means (7),
The storage calculation means (7) performs calculation processing and calculates the exact mass number. Then, the above operation is repeated for each magnetic field scan.

なお、ピーク判別記憶手段(6)がしきい値(a)以下
のデータ、たとえばバックグラウンド(1))などを記
憶しない場合であっても、データ処理に必要なタイマー
等は作動しており質量数測定に支障をきたすことはない
。なお、ピーク判別記憶手段(6)を低位コンピュータ
により、また記憶演算手段(7)を」−位コンピュータ
により構成し、低位コンピュータから伝送ラインを介し
て上述したデータを伝送し、上位コンピュータにおいて
、このデータを高級言語などを用いてデータ解析するよ
うにしてもよい。
Note that even if the peak discrimination storage means (6) does not store data below the threshold (a), such as background (1)), the timer etc. necessary for data processing are operating and the mass It does not interfere with numerical measurements. Note that the peak discrimination storage means (6) is constituted by a low-level computer, and the storage calculation means (7) is constituted by a ``-''-level computer. The data may be analyzed using a high-level language or the like.

以上のように本発明によれば、質量分離手段、検出器を
経て入力されるピークプロファイルのデータ信号と、マ
スマーカから入力される質量数のデータ信号とを一度ピ
ーク判別記憶手段に記憶させ、しかも、その際、従来の
ように入力データを全て記憶するのではなく、必要なピ
ークプロファイルの部分だけを記憶するようにし、1回
の磁場走査が終った後に、ピーク判別記憶手段で記憶さ
れた上記データ信号を記憶演算手段に出力するようにし
ているので、記憶演算手段はピーク判別記憶手段か質量
分離手段やマスマーカからのテーク信号を人力している
間はデータ信号が入力されないので、その間データ解析
を迅速に行なうことができ、また他のデータの演算処理
を行なうこともてきる。また、記憶演算手段へは必要な
測定結果のみが入力されるので記憶容量も従来に比べて
少なくてよいなどの優れた効果がある。
As described above, according to the present invention, the peak profile data signal inputted through the mass separation means and the detector and the mass number data signal inputted from the mass marker are once stored in the peak discrimination storage means, and At that time, instead of storing all the input data as in the past, only the necessary portion of the peak profile is stored, and after one magnetic field scan is completed, the above data stored in the peak discrimination storage means is stored. Since the data signal is output to the storage calculation means, no data signal is input while the storage calculation means is manually inputting the take signal from the peak discrimination storage means, mass separation means, or mass marker, so data analysis is performed during that time. can be performed quickly, and can also perform arithmetic processing on other data. In addition, since only necessary measurement results are input to the storage calculation means, the storage capacity can be reduced compared to the conventional method, which is an excellent advantage.

図面は本発明の実施例を示し、第1図は斉分幕。The drawings show an embodiment of the invention, and FIG. 1 shows a simultaneous curtain.

能質量分析装置のフロック図、第2図は作用説明(1)
・・・部分解葡質量分析装置、(2)・・・・質量分離
手段、(3)  ・検出器、(5)・・・・・・マスマ
ーカ、(6)  ・・ピーク判別記憶手段、(7)・・
 演算記憶手段、(a) −−しきい値、(Pl )(
P2)(P3) −・・ピークプロファイル。
A flow diagram of the active mass spectrometer, Figure 2 is an explanation of the action (1)
... Partially disassembled mass spectrometer, (2) ... Mass separation means, (3) - Detector, (5) ... Mass marker, (6) ... Peak discrimination storage means, ( 7)...
Arithmetic storage means, (a) --Threshold value, (Pl) (
P2) (P3) - Peak profile.

特許出願人  株式会社 島津製作所 代理人 弁理士岡田和秀 第1図 7 第2図 −一←CoυNTERPatent applicant: Shimadzu Corporation Agent: Patent attorney Kazuhide Okada Figure 1 7 Figure 2 −1←CoυNTER

Claims (1)

【特許請求の範囲】[Claims] (1)質量分離手段で質量分離されたイオンを検出器で
検出し、この検出したデータ信号とマスマーカからのデ
ータ信号とをピーク判別記憶手段に入力し、ピーク判別
記憶手段へはマスマーカからのデータ信号と、検出器か
らのデータ信号のうちしきい値以上のピークプロファイ
ルとを記憶させ、1回の磁場走査の終了ごとに前記ピー
ク判別記憶手段で記憶されたデータ信号を記憶演算手段
へ送信し、この記憶演算手段でこの送信されたデータ信
号を演□算処理して精密な質量数を算定するようにした
ことを特徴とする精密質量測定方法。
(1) Ions that have been mass separated by the mass separation means are detected by a detector, the detected data signal and the data signal from the mass marker are input to the peak discrimination storage means, and the data from the mass marker is input to the peak discrimination storage means. A signal and a peak profile of a data signal from the detector that is equal to or higher than a threshold value are stored, and the data signal stored in the peak discrimination storage means is transmitted to the storage calculation means every time one magnetic field scan is completed. An accurate mass measurement method characterized in that the stored data signal is subjected to arithmetic processing by the storage calculation means to calculate an accurate mass number.
JP57172665A 1982-09-30 1982-09-30 Precise measurement of mass Pending JPS5961773A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57172665A JPS5961773A (en) 1982-09-30 1982-09-30 Precise measurement of mass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57172665A JPS5961773A (en) 1982-09-30 1982-09-30 Precise measurement of mass

Publications (1)

Publication Number Publication Date
JPS5961773A true JPS5961773A (en) 1984-04-09

Family

ID=15946098

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57172665A Pending JPS5961773A (en) 1982-09-30 1982-09-30 Precise measurement of mass

Country Status (1)

Country Link
JP (1) JPS5961773A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63313059A (en) * 1987-06-16 1988-12-21 Shimadzu Corp Data processor for mass spectrometric instrument

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5744811A (en) * 1980-08-29 1982-03-13 Jeol Ltd Detecting method of areal center position of peak waveform

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5744811A (en) * 1980-08-29 1982-03-13 Jeol Ltd Detecting method of areal center position of peak waveform

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63313059A (en) * 1987-06-16 1988-12-21 Shimadzu Corp Data processor for mass spectrometric instrument

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