JPS5952552U - 走査電子顕微鏡等における試料装置 - Google Patents
走査電子顕微鏡等における試料装置Info
- Publication number
- JPS5952552U JPS5952552U JP14809382U JP14809382U JPS5952552U JP S5952552 U JPS5952552 U JP S5952552U JP 14809382 U JP14809382 U JP 14809382U JP 14809382 U JP14809382 U JP 14809382U JP S5952552 U JPS5952552 U JP S5952552U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- scanning electron
- tilting body
- optical axis
- sample stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14809382U JPS5952552U (ja) | 1982-09-30 | 1982-09-30 | 走査電子顕微鏡等における試料装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14809382U JPS5952552U (ja) | 1982-09-30 | 1982-09-30 | 走査電子顕微鏡等における試料装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5952552U true JPS5952552U (ja) | 1984-04-06 |
JPS6336925Y2 JPS6336925Y2 (enrdf_load_stackoverflow) | 1988-09-29 |
Family
ID=30329131
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14809382U Granted JPS5952552U (ja) | 1982-09-30 | 1982-09-30 | 走査電子顕微鏡等における試料装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5952552U (enrdf_load_stackoverflow) |
-
1982
- 1982-09-30 JP JP14809382U patent/JPS5952552U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6336925Y2 (enrdf_load_stackoverflow) | 1988-09-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0207106B1 (de) | Durchlicht- und/oder auflichtmikroskop | |
JPS6141216U (ja) | 顕微鏡台の自動位置ぎめ装置 | |
JPS5952552U (ja) | 走査電子顕微鏡等における試料装置 | |
SE8604651D0 (sv) | Microtome | |
JPS5796527A (en) | Device for adjusting specimen position for electron beam exposure apparatus | |
JPH0463314A (ja) | 顕微鏡用試料保持具 | |
JPH059701Y2 (enrdf_load_stackoverflow) | ||
ES266901Y (es) | "dispositivo de cambio automatico de herramienta para maquina herramienta". | |
JPS606995Y2 (ja) | 走査電子顕微鏡の試料装置 | |
JPS60121249U (ja) | 走査電子顕微鏡等における試料装置 | |
JPH073773B2 (ja) | 電子顕微鏡等の試料微動装置 | |
JPS6065967U (ja) | 走査電子顕微鏡 | |
JPS5837940B2 (ja) | 試料微動装置 | |
JPH05142121A (ja) | マーキング装置 | |
JPS614348U (ja) | カソ−ドルミネツセンス装置 | |
JPS5952513B2 (ja) | 走査形電子顕微鏡の試料微動装置 | |
JPS6136954U (ja) | 電子顕微鏡等における試料移動装置 | |
JPS58109149U (ja) | 試料微動装置 | |
JPS63200447A (ja) | 走査型電子顕微鏡等における試料交換装置 | |
JPS63200446A (ja) | 走査型電子顕微鏡等における試料交換装置 | |
JPS60105056U (ja) | 走査電子顕微鏡等における試料装置 | |
JPS62134931A (ja) | 表面検査装置の基板固定機構 | |
JPS59123150A (ja) | 電子線装置における試料移動装置 | |
JPH0584014U (ja) | 走査電子顕微鏡 | |
JPS60163664U (ja) | 電子顕微鏡等の試料微動装置 |