JPS5952552U - 走査電子顕微鏡等における試料装置 - Google Patents
走査電子顕微鏡等における試料装置Info
- Publication number
- JPS5952552U JPS5952552U JP14809382U JP14809382U JPS5952552U JP S5952552 U JPS5952552 U JP S5952552U JP 14809382 U JP14809382 U JP 14809382U JP 14809382 U JP14809382 U JP 14809382U JP S5952552 U JPS5952552 U JP S5952552U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- scanning electron
- tilting body
- optical axis
- sample stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14809382U JPS5952552U (ja) | 1982-09-30 | 1982-09-30 | 走査電子顕微鏡等における試料装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14809382U JPS5952552U (ja) | 1982-09-30 | 1982-09-30 | 走査電子顕微鏡等における試料装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5952552U true JPS5952552U (ja) | 1984-04-06 |
| JPS6336925Y2 JPS6336925Y2 (enrdf_load_stackoverflow) | 1988-09-29 |
Family
ID=30329131
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14809382U Granted JPS5952552U (ja) | 1982-09-30 | 1982-09-30 | 走査電子顕微鏡等における試料装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5952552U (enrdf_load_stackoverflow) |
-
1982
- 1982-09-30 JP JP14809382U patent/JPS5952552U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6336925Y2 (enrdf_load_stackoverflow) | 1988-09-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6141216U (ja) | 顕微鏡台の自動位置ぎめ装置 | |
| DE3447128A1 (de) | Durchlicht- und/oder auflichtmikroskop | |
| JPS5952552U (ja) | 走査電子顕微鏡等における試料装置 | |
| SE8604651D0 (sv) | Microtome | |
| US5172265A (en) | Microscope with salient hand-support | |
| JPH0463314A (ja) | 顕微鏡用試料保持具 | |
| JPH059701Y2 (enrdf_load_stackoverflow) | ||
| ATE12601T1 (de) | Automatische werkzeugwechselvorrichtung fuer eine werkzeugmaschine. | |
| JPH1187474A (ja) | 試料ステージ | |
| JPS6343444Y2 (enrdf_load_stackoverflow) | ||
| JPS5920752Y2 (ja) | 試料微動装置 | |
| JPS606995Y2 (ja) | 走査電子顕微鏡の試料装置 | |
| JPS60121249U (ja) | 走査電子顕微鏡等における試料装置 | |
| JPS6065967U (ja) | 走査電子顕微鏡 | |
| JPS5837940B2 (ja) | 試料微動装置 | |
| JPH05142121A (ja) | マーキング装置 | |
| JPS6114129Y2 (enrdf_load_stackoverflow) | ||
| JPS614348U (ja) | カソ−ドルミネツセンス装置 | |
| JPS5860851U (ja) | 電子顕微鏡における試料ホルダ− | |
| JPS5952513B2 (ja) | 走査形電子顕微鏡の試料微動装置 | |
| JPS6136954U (ja) | 電子顕微鏡等における試料移動装置 | |
| JPH04196149A (ja) | 半導体ウエハの認識方法 | |
| JPS60147152U (ja) | 走査電子顕微鏡等における試料装置 | |
| JPH03187143A (ja) | 試料ステージ | |
| JPS63200446A (ja) | 走査型電子顕微鏡等における試料交換装置 |