JPS594828B2 - 化学イオン化質量分析装置 - Google Patents
化学イオン化質量分析装置Info
- Publication number
- JPS594828B2 JPS594828B2 JP50018286A JP1828675A JPS594828B2 JP S594828 B2 JPS594828 B2 JP S594828B2 JP 50018286 A JP50018286 A JP 50018286A JP 1828675 A JP1828675 A JP 1828675A JP S594828 B2 JPS594828 B2 JP S594828B2
- Authority
- JP
- Japan
- Prior art keywords
- mass spectrometer
- chemical ionization
- ion
- pressure
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000451 chemical ionisation Methods 0.000 title claims description 18
- 239000000126 substance Substances 0.000 claims description 10
- 238000009792 diffusion process Methods 0.000 claims description 8
- 150000002500 ions Chemical class 0.000 description 32
- 239000007789 gas Substances 0.000 description 14
- 239000012495 reaction gas Substances 0.000 description 8
- 230000035945 sensitivity Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000000605 extraction Methods 0.000 description 4
- 238000004949 mass spectrometry Methods 0.000 description 4
- 238000005192 partition Methods 0.000 description 4
- 238000005086 pumping Methods 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000005342 ion exchange Methods 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50018286A JPS594828B2 (ja) | 1975-02-12 | 1975-02-12 | 化学イオン化質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50018286A JPS594828B2 (ja) | 1975-02-12 | 1975-02-12 | 化学イオン化質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5192679A JPS5192679A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1976-08-13 |
| JPS594828B2 true JPS594828B2 (ja) | 1984-02-01 |
Family
ID=11967377
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50018286A Expired JPS594828B2 (ja) | 1975-02-12 | 1975-02-12 | 化学イオン化質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS594828B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012104247A (ja) * | 2010-11-08 | 2012-05-31 | Hitachi High-Technologies Corp | 質量分析装置 |
| JP2014123577A (ja) * | 2014-03-06 | 2014-07-03 | Hitachi High-Technologies Corp | 質量分析装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113748488B (zh) * | 2019-05-15 | 2024-12-10 | 株式会社岛津制作所 | 离子分析装置 |
-
1975
- 1975-02-12 JP JP50018286A patent/JPS594828B2/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012104247A (ja) * | 2010-11-08 | 2012-05-31 | Hitachi High-Technologies Corp | 質量分析装置 |
| US8866070B2 (en) | 2010-11-08 | 2014-10-21 | Hitachi High-Technologies Corporation | Mass spectrometer |
| US9171704B2 (en) | 2010-11-08 | 2015-10-27 | Hitachi High-Technologies Corporation | Mass spectrometer |
| JP2014123577A (ja) * | 2014-03-06 | 2014-07-03 | Hitachi High-Technologies Corp | 質量分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5192679A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1976-08-13 |
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