JPS5941766U - IC tester - Google Patents
IC testerInfo
- Publication number
- JPS5941766U JPS5941766U JP13675582U JP13675582U JPS5941766U JP S5941766 U JPS5941766 U JP S5941766U JP 13675582 U JP13675582 U JP 13675582U JP 13675582 U JP13675582 U JP 13675582U JP S5941766 U JPS5941766 U JP S5941766U
- Authority
- JP
- Japan
- Prior art keywords
- test signal
- connection lines
- input
- connection
- tester
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のＩＣテスタと被テストＩＣ素子の入出力
部との接続状態を示す図、第２図はこの考案によるＩＣ
テスタの一例を示す被テストＩＣ素子との接続図、第３
図はその一部の他の例を示す図である。
ｌ ｌ ：ＩＣテスタ、１２ニドライバー、１３゜１４
：入力接続線、１５．１６：被テストＩＣ素子、２４、
２５：入力接続部、２Ｂ、 ２９：接続線、３１．３２
，３３，３４：出力接続線、３５゜３６：出力接続部、
２６． ２７：終端素子、２１゜２２二判定用比較回路
。Fig. 1 is a diagram showing the connection state between a conventional IC tester and the input/output section of the IC device under test, and Fig. 2 is a diagram showing the connection state between the conventional IC tester and the input/output section of the IC device under test.
Connection diagram with the IC device under test showing an example of the tester, Part 3
The figure is a diagram showing another example of a part thereof. l l: IC tester, 12 driver, 13°14
: input connection line, 15.16: IC element under test, 24,
25: Input connection part, 2B, 29: Connection line, 31.32
, 33, 34: Output connection line, 35° 36: Output connection part,
26. 27: Terminal element, 21°22 comparison circuit for determination.
Claims (1)
の整数）の接続線の一端がそれぞれ接続され、これら接
続線の特性インピーダンスは上記テスト信号源の出力イ
ンピーダンスのｎ倍に選択され、これら各接続線はｎ個
め被テスト素子の入力端子と接続されるべき入力接続部
に接続され、これらｎ個の入力接続部には同一特性イン
ピーダンスの終端素子が接続されているＩＣテスタ。One end of 0 connection lines (n is an integer of 2 or more) is connected to a test signal source that generates a test signal, and the characteristic impedance of these connection lines is selected to be n times the output impedance of the test signal source, Each of these connection lines is connected to an input connection portion to be connected to an input terminal of an n-th device under test, and termination elements having the same characteristic impedance are connected to these n input connection portions.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13675582U JPS5941766U (en) | 1982-09-08 | 1982-09-08 | IC tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13675582U JPS5941766U (en) | 1982-09-08 | 1982-09-08 | IC tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5941766U true JPS5941766U (en) | 1984-03-17 |
| JPS6318933Y2 JPS6318933Y2 (en) | 1988-05-27 |
Family
ID=30307386
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13675582U Granted JPS5941766U (en) | 1982-09-08 | 1982-09-08 | IC tester |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5941766U (en) |
-
1982
- 1982-09-08 JP JP13675582U patent/JPS5941766U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6318933Y2 (en) | 1988-05-27 |
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