JPS594045A - Vacuum attracting and fixing means - Google Patents
Vacuum attracting and fixing meansInfo
- Publication number
- JPS594045A JPS594045A JP11314182A JP11314182A JPS594045A JP S594045 A JPS594045 A JP S594045A JP 11314182 A JP11314182 A JP 11314182A JP 11314182 A JP11314182 A JP 11314182A JP S594045 A JPS594045 A JP S594045A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- chuck table
- circumferential part
- chuck
- air
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Jigs For Machine Tools (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
【発明の詳細な説明】
(])発明の技゛術分野
本発明は真空吸着固定装置、詳しくは半導体ウェハの如
き薄い基板の切削工程において真空で基板を吸着固着す
るチャックテーブルに関する。Detailed Description of the Invention (1) Technical Field of the Invention The present invention relates to a vacuum suction and fixing device, and more particularly to a chuck table for suctioning and fixing a thin substrate such as a semiconductor wafer in a process of cutting it under vacuum.
(2)技術の背景
半導体装置の製造工程において、露光、熱処(1)
理、蒸着、化学気相成長(CVD )等のウェハ・プロ
セスの施された例えば厚さ625μm程度のウェハを、
最終的なアセンブリイ(組立)の前に例えば490μm
の厚さにまで切削することが行われ、かかる切削は各種
デバイスの作られた表面とは反対側の裏面に対してなさ
れる。(2) Background of the technology In the manufacturing process of semiconductor devices, wafers with a thickness of, for example, about 625 μm are subjected to wafer processes such as exposure, heat treatment (1), vapor deposition, and chemical vapor deposition (CVD).
e.g. 490 μm before final assembly.
The cutting is performed on the back side of the various devices opposite the surface on which they are made.
ウェハ切削°をなすための真空吸着固定装置を第1図の
模式的断面図を参照して説明すると、同図において、1
2は切削されるべきウェハで、それは裏面を上にして真
空吸着固定装置IOの多孔質材料で作られたチャックテ
ーブル11上に置かれ、装置10は回転するターンテー
ブル1上に搭載されている。切削用のカップホイール(
砥石)6はターンテーブル1の上方に配置され矢印に示
す方向に高速回転する。なお同図において、3はモータ
、2はスピンドル、4はスピンドル2を上下さすための
駆動手段、5は台を示す。スピンドル2内にはモータ3
の回転をカップホイール6に伝導するための機構が内蔵
されている。なお同図の1点鎖線はターンテーブルlの
中心線を示す。A vacuum suction and fixing device for cutting a wafer will be explained with reference to the schematic cross-sectional view of Fig. 1.
2 is a wafer to be cut, which is placed with its back side up on a chuck table 11 made of porous material of a vacuum suction fixing device IO, and the device 10 is mounted on a rotating turntable 1. . Cup wheel for cutting (
A grindstone 6 is placed above the turntable 1 and rotates at high speed in the direction shown by the arrow. In the figure, 3 is a motor, 2 is a spindle, 4 is a driving means for moving the spindle 2 up and down, and 5 is a stand. Motor 3 is inside spindle 2.
A mechanism for transmitting the rotation to the cup wheel 6 is built-in. Note that the dashed-dotted line in the figure indicates the center line of the turntable l.
(2)
ターンテーブル1は第2図の模式的平面図に示される如
き構成のもので、その上に複数個の真空吸着固定装置l
Oが搭載され、ターンテーブル1およびカップホイール
6はそれぞれ矢印に示す方向に回転する。なお第2図以
下において既に示されたものと同じ部分は同じ符号を付
して示す。(2) The turntable 1 has a structure as shown in the schematic plan view of FIG.
The turntable 1 and the cup wheel 6 rotate in the directions shown by the arrows. Note that in FIG. 2 and subsequent figures, the same parts as those already shown are designated by the same reference numerals.
真空吸着固定装置10は第3図の断面図に示される構成
のもので、固定手段17によって一体的に固定された下
方テーブル16と上方テーブル18がら成り、上方テー
ブル18上には多孔質チャックテーブルが配置され、ウ
ェハ12は、排気ダクト15がら図に矢印で示す方向に
排気し真空室19を真空にすることによってチャックテ
ーブル11上に吸着固定される。真空を保つため、チャ
ックテーブル11の外周にはプラスチックカベ−13が
塗ってあり、加えて、チャックテーブル11の外縁に沿
って密封用のプラスチック14が含浸されている。The vacuum suction fixing device 10 has the configuration shown in the cross-sectional view of FIG. 3, and consists of a lower table 16 and an upper table 18 that are integrally fixed by a fixing means 17, and a porous chuck table is placed on the upper table 18. The wafer 12 is suctioned and fixed onto the chuck table 11 by evacuating the vacuum chamber 19 by evacuating the exhaust duct 15 in the direction shown by the arrow in the figure. In order to maintain a vacuum, the outer periphery of the chuck table 11 is coated with a plastic wall 13, and in addition, a sealing plastic 14 is impregnated along the outer edge of the chuck table 11.
(3)従来技術と問題点
従来技術におけるウェハの切削を第4図の断面図を参照
して説明すると、ウェハ12は図に見て(3)
上面が切削されるべき裏面であり、矢印の示す方向に動
かされ、カップホイール6の歯先7がウェハを例えば2
00μm程度切削する。このとき、ウェハ12の12′
で示す部分は破砕され、面12 が鏡面仕上げに近い
程度に平坦に形成される。なお同図に8で示す部分は歯
先7を保持するカップで、カップホイール6は軸9を介
してスピンドル2に連結される。1点鎖線はカップホイ
ールの中心線を示す。第1図に戻って、真空排気によっ
て■なる力が矢印方向に働くとき、■は横方向(水平方
向)力F2と上方向力Flと−に分解される。図示の装
置を用いた実験において、F2> Flであることが確
認されているが、かかる力関係が成立するため第4図に
示す如きウェハの切削が可能である。(3) Prior Art and Problems Wafer cutting in the prior art will be explained with reference to the cross-sectional view in Fig. 4.As seen in the figure, (3) the top surface of the wafer 12 is the back surface to be cut, and it is indicated by the arrow. When the cup wheel 6 is moved in the direction shown, the tooth tip 7 of the cup wheel 6 picks up the wafer, e.g.
Cut approximately 00μm. At this time, 12' of the wafer 12
The portion indicated by is fractured, and the surface 12 is formed flat to a degree close to mirror finish. Note that the portion indicated by 8 in the figure is a cup that holds the tooth tips 7, and the cup wheel 6 is connected to the spindle 2 via a shaft 9. The one-dot chain line indicates the center line of the cup wheel. Returning to FIG. 1, when the force ``■'' acts in the direction of the arrow due to evacuation, the force ``■'' is decomposed into a lateral (horizontal) force F2, an upward force Fl, and -. In experiments using the illustrated apparatus, it has been confirmed that F2>Fl, and since such a force relationship holds, it is possible to cut a wafer as shown in FIG. 4.
上記したカップホイールの長期にわたる使用(ウェハの
切削)があると、切削に際し使用する研摩液のチャック
テーブル11内へのしみ込みがあり、また、ウェハ12
とチャックテーブル11の接触によるチャックテーブル
11の外縁部分の磨耗または脱落があり、それが原因と
なって、チャソクテ(4)
−プル11の外周が変形し、ウェハが割れたり欠けたり
すること、および、チャックテーブルの外縁部分にはプ
ラスチックが含浸させであるにもかかわらず、真空漏れ
(バキュームリーク)があり、ウェハの吸着が十分でな
くなる例が経験された。When the above-mentioned cup wheel is used for a long period of time (wafer cutting), the polishing liquid used for cutting may seep into the chuck table 11, and the wafer 12
The outer edge of the chuck table 11 may be worn out or fall off due to contact between the chuck table 11 and the chuck table 11, which may cause the outer circumference of the pull 11 to deform and crack or chip the wafer. Even though the outer edge of the chuck table was impregnated with plastic, there was a vacuum leak, which resulted in insufficient wafer suction.
これら障害中で、ウェハの割れまたは欠けは、当該ウェ
ハに対して既にウェハプロセスが終了しているのである
から、その損失は大である。Among these failures, if the wafer is cracked or chipped, the loss is significant because the wafer process has already been completed for the wafer.
(4)発明の目的
本発明は上記従来の問題点に鑑み、ウェハに対する吸着
力が十分であり、ウェハに対する損傷を与えることなく
、またそれ自体の磨耗または欠落のないチャックテーブ
ルを具備した真空吸着固定装置を提供するにある。(4) Purpose of the Invention In view of the above-mentioned conventional problems, the present invention provides a vacuum suction system that has a chuck table that has sufficient suction force to the wafer, does not damage the wafer, and does not wear out or break itself. To provide a fixation device.
(5)発明の構成
そしてこの目的は本発明によれば、空気を通さない強度
の高い金属またはセラミック材料の外周部でその周囲を
密接に囲んだチャックテーブルを用意し、この外周部が
チャックテーブルおよび装置の上方テーブルと係合する
構成とした真空吸(5)
着手段を提供することによって達成される。(5) Structure and object of the invention According to the present invention, a chuck table is provided whose periphery is closely surrounded by an outer periphery of a high-strength metal or ceramic material that does not allow air to pass through. This is accomplished by providing a vacuum suction (5) means configured to engage the upper table of the device.
(6)発明の実施例 以下本発明の実施例を図面によって詳述する。(6) Examples of the invention Embodiments of the present invention will be described in detail below with reference to the drawings.
第5図に本発明にかかる真空吸着固定装置が断面で示さ
れ、この装置30は、チャックテーブル21を除(他の
部分は第3図に示された従来の装置と同様であるので、
既に示した部分と同じ部分は同一符号を付して示し、ま
た各部の構成、機能は従来装置の場合と全く同様である
のでその詳細な説明は省略する。FIG. 5 shows a vacuum suction fixing device according to the present invention in cross section, and this device 30 has the following features except for the chuck table 21 (the other parts are similar to the conventional device shown in FIG. 3).
The same parts as those already shown are designated by the same reference numerals, and since the configuration and function of each part are exactly the same as in the conventional device, detailed explanation thereof will be omitted.
図示の実施例において、多孔質材料(例えばセラミック
)で形成したチャックテーブル21の周縁は、強度の高
い、かつ、十分に密で空気を通さない金属で作られた外
周部20で囲む。外周部20はチャックテーブル21と
きわめて密に隣接するよう形成する。外周部20の材料
は上記の条件を満たすものであればよく、空気を通さな
いセラミックも使用可能である。同図から理解され得る
如く、チャックテーブル21と外周部20との密接性を
保鉦するため、外周部20の下方部分は上方テーブル1
8と(6)
かみ合い、またその中央部分は内方に段差を形成しこの
段差部分が2チヤツクテーブル21の下方部分とかみ合
う構成とする。また、チャックテーブル21の上に置か
れるウェハは、その外周が外周部20の上表面のほぼ中
央にのるよう外周部の寸法を前辺て設定する。In the illustrated embodiment, the periphery of the chuck table 21, which is made of porous material (e.g. ceramic), is surrounded by an outer periphery 20 made of a strong, sufficiently dense and airtight metal. The outer peripheral portion 20 is formed so as to adjoin the chuck table 21 very closely. The material for the outer peripheral portion 20 may be any material that satisfies the above conditions, and ceramics that do not allow air to pass through may also be used. As can be understood from the figure, in order to maintain closeness between the chuck table 21 and the outer circumference 20, the lower part of the outer circumference 20 is connected to the upper table 20.
8 and (6) engage with each other, and the central portion thereof forms a step inward, and this step portion engages with the lower portion of the two-chuck table 21. Further, the dimensions of the outer periphery of the wafer placed on the chuck table 21 are set so that the outer periphery of the wafer rests on approximately the center of the upper surface of the outer periphery 20.
上記の如き外周部20を設けることにより、排気ダクト
15から排気するとき、チャックテーブル21は真空室
19によって吸着され、またチャックテーブル21は多
孔性であるので、ウェハ12はチャックテーブル21に
向は吸着され固定される。ウェハ12、チャックテーブ
ル21、外周部20の上記した構成により、研摩液がチ
ャックテーブルにしみ込むことは減少され、ウェハの外
縁は固い外周部20の表面上にのっているから、チャッ
クテーブルの磨耗、脱落はほとんど発生することなく、
ウェハは常に平坦なチャックテーブル21上に平に配置
され、吸着力はウェハ全体に対し均一に働き、ウェハの
割れ、欠落の危険は著しく減少せしめられた。By providing the outer peripheral portion 20 as described above, when exhausting from the exhaust duct 15, the chuck table 21 is attracted by the vacuum chamber 19, and since the chuck table 21 is porous, the wafer 12 is not directed toward the chuck table 21. It is absorbed and fixed. The above-described configuration of the wafer 12, chuck table 21, and outer circumferential portion 20 reduces the possibility of polishing liquid seeping into the chuck table, and since the outer edge of the wafer rests on the hard surface of the outer circumferential portion 20, wear of the chuck table is reduced. , almost no shedding occurs,
The wafer is always placed flat on the flat chuck table 21, and the suction force acts uniformly on the entire wafer, thereby significantly reducing the risk of cracking or chipping the wafer.
また、外周部の構造は段差2つを構成するだ(7)
けであり、材料も金属またはセラミックであるので、製
作上従来技術における場合に比べ特に難しい問題はない
。Furthermore, since the structure of the outer periphery consists of only two steps (7) and the material is metal or ceramic, there are no particularly difficult problems in manufacturing compared to the case of the prior art.
(7)発明の効果
以上、詳細に説明したように、本発明にかかる真空吸着
固定装置においては、チャックテーブルをそれと密接す
る金属またはセラミック製の外周部で囲むことによって
、チャックテーブルの磨耗が防止されるだけでなく、チ
ャ・2クチ−プルが常に平坦に完全な状態で保たれるの
でウェハの割れ等の損傷が回避され、半導体装置の製造
歩留りの向上に効果大である。なお、上記においてはウ
ェハの切削を例にとって説明したが、本発明の適用範囲
はそれに限定されるものではなく、ウェハ以外の基板に
対する加工に用いる装置にも及ぶものである。(7) Effects of the Invention As explained in detail above, in the vacuum suction fixing device according to the present invention, abrasion of the chuck table is prevented by surrounding the chuck table with an outer peripheral part made of metal or ceramic that is in close contact with the chuck table. In addition, since the chamfer and two-cut chip are always kept flat and perfect, damage such as cracking of the wafer is avoided, which is highly effective in improving the manufacturing yield of semiconductor devices. Note that although the above description has been made using cutting of a wafer as an example, the scope of application of the present invention is not limited thereto, and extends to apparatuses used for processing substrates other than wafers.
第1図はウェハの切削装置の概略断面図、第2図は第1
図の装置と共に用いられるターンテーブルの平面図、第
3図は従来の真空吸着固定装置(8)
の概略断面図、第4図はウェハの切削を示す概略断面図
、第5図は本発明にかかる真空吸着固定手段の断面図で
ある。
1−ターンテーブル、2−スピンドル、3−モータ、4
・−・駆動手段、5一台、6−カップホイール、7−歯
先、8−
カップ、9−軸、10.30−・真空吸着固定装置、1
1.21−・−チャックテーブル、12−・−ウェハ、
13・−プラスチックカバー、14・−・密封用プラス
チック、15−・排気ダクト、16−下方テーブル、1
7−固定手段、18−・上方テーブル、19−・−真空
室、2〇−外周部
201
第1図
第2図
第3図Figure 1 is a schematic cross-sectional view of a wafer cutting device, and Figure 2 is a schematic cross-sectional view of a wafer cutting device.
FIG. 3 is a schematic sectional view of a conventional vacuum suction and fixing device (8), FIG. 4 is a schematic sectional view showing wafer cutting, and FIG. 5 is a plan view of a turntable used with the device shown in the figure. FIG. 3 is a sectional view of such a vacuum suction fixing means. 1-turntable, 2-spindle, 3-motor, 4
・-・Drive means, 5 one unit, 6-cup wheel, 7-tooth tips, 8-cups, 9-shafts, 10.30-・vacuum suction fixing device, 1
1.21--Chuck table, 12--Wafer,
13--Plastic cover, 14--Sealing plastic, 15--Exhaust duct, 16-Lower table, 1
7-Fixing means, 18--Upper table, 19--Vacuum chamber, 20-Outer peripheral part 201 Fig. 1 Fig. 2 Fig. 3
Claims (1)
上方テーブルに形成した真空室を排気する構成とし、上
方テーブル上に設けた多孔質のチャックテーブル上に被
処理基板を吸着固定する真空吸着固定手段において、前
記チャックテーブルの外周は、空気を通し難い材料で作
られ、前記チャックテーブルおよび上方テーブルと係合
し、チャックテーブルに密接して設けられた外周部によ
り囲まれたことを特徴とする真空吸着固定装置。A vacuum suction and fixing means configured to evacuate a vacuum chamber formed on the upper table by an upper table and a lower table fixed together, and for suctioning and fixing a substrate to be processed on a porous chuck table provided on the upper table, The outer periphery of the chuck table is surrounded by an outer periphery that is made of a material that does not easily allow air to pass through, engages with the chuck table and the upper table, and is provided closely to the chuck table. Device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11314182A JPS594045A (en) | 1982-06-30 | 1982-06-30 | Vacuum attracting and fixing means |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11314182A JPS594045A (en) | 1982-06-30 | 1982-06-30 | Vacuum attracting and fixing means |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS594045A true JPS594045A (en) | 1984-01-10 |
JPS634938B2 JPS634938B2 (en) | 1988-02-01 |
Family
ID=14604600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11314182A Granted JPS594045A (en) | 1982-06-30 | 1982-06-30 | Vacuum attracting and fixing means |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS594045A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107414552A (en) * | 2017-08-22 | 2017-12-01 | 大连理工大学 | A kind of adjustable suction jig for Milling Process carbon fibre composite |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5961064B2 (en) * | 2012-07-31 | 2016-08-02 | 三星ダイヤモンド工業株式会社 | Suction table manufacturing method and suction table |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5390781A (en) * | 1977-01-20 | 1978-08-09 | Toshiba Corp | Semiconductor radiation detector |
JPS5390871A (en) * | 1977-01-21 | 1978-08-10 | Toyo Dengu Seisakushiyo Kk | Device for chucking semiconductor wafer |
JPS56172941U (en) * | 1980-05-23 | 1981-12-21 |
-
1982
- 1982-06-30 JP JP11314182A patent/JPS594045A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5390781A (en) * | 1977-01-20 | 1978-08-09 | Toshiba Corp | Semiconductor radiation detector |
JPS5390871A (en) * | 1977-01-21 | 1978-08-10 | Toyo Dengu Seisakushiyo Kk | Device for chucking semiconductor wafer |
JPS56172941U (en) * | 1980-05-23 | 1981-12-21 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107414552A (en) * | 2017-08-22 | 2017-12-01 | 大连理工大学 | A kind of adjustable suction jig for Milling Process carbon fibre composite |
Also Published As
Publication number | Publication date |
---|---|
JPS634938B2 (en) | 1988-02-01 |
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