JPS5940242A - Device for checking scuff of bottles - Google Patents

Device for checking scuff of bottles

Info

Publication number
JPS5940242A
JPS5940242A JP15237882A JP15237882A JPS5940242A JP S5940242 A JPS5940242 A JP S5940242A JP 15237882 A JP15237882 A JP 15237882A JP 15237882 A JP15237882 A JP 15237882A JP S5940242 A JPS5940242 A JP S5940242A
Authority
JP
Japan
Prior art keywords
light
bottle
acid
scuff
scuffs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15237882A
Other languages
Japanese (ja)
Other versions
JPH0612344B2 (en
Inventor
Michiaki Kameda
亀田 道昭
Kenji Miyagawa
宮川 研二
Yuji Sawa
澤 祐二
Katsuyuki Murakami
克之 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suntory Ltd
Original Assignee
Suntory Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suntory Ltd filed Critical Suntory Ltd
Priority to JP57152378A priority Critical patent/JPH0612344B2/en
Publication of JPS5940242A publication Critical patent/JPS5940242A/en
Publication of JPH0612344B2 publication Critical patent/JPH0612344B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents

Abstract

PURPOSE:To make it possible to detect scuffs of bottles even whose surface is wet accurately, by projecting light on the bottle, transmitting the light through the bottle, receiving the transmitted light, which is refracted at a specified angle, by a CCD camera, and selecting the bottles, on which a specified amount of scuffs (abrasions) is yielded, based on the output signal. CONSTITUTION:Light from a light source 7 is projected on a bottle 2 through a gap between light screening plates 10 and 10. The light 9 is transmitted through the bottle 2. The light 9, which is refracted by scuffs at a specified angle, among the transmitted light 9 is received by a CCD camera 8 (which is provided with a one dimensional image pickup element and sequentially scans a specified width in association with the movement of the bottle 2). The data is sent to a control circuit 13 and a monitor 12 from a controller 11. The monitor 12 displays the data for every scanning bit. The circuit 13 reads said data, performs integrating operation, and compares the result with a preset reference level. When the result exceeds the reference, a signal is outputted to a rejector 14, and the defective bottle is rejected. Thus, the scuffs can be detected accurately even though the surface of the bottle 2 is wet.

Description

【発明の詳細な説明】 この発明は、酸類の表面に生じるスカッフを検査する酸
類のスカッフ検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an acid scuff inspection device for inspecting scuff generated on the surface of acids.

一般に、ビール瓶などの酸類は一度使用した後回収して
再び使用するようにしている。これらの酸類は、運搬時
や工場内でのコンベヤ移送時において表面にスカッフ(
すシ傷)が生じ、長期間使用すると、無数に生じてその
スカッフ部分が白く看視されることになる。これでは酸
類の強度や内容物に何らの支障はないものの、外観が悪
く商品価値が著しく減殺されるという問題がある。
Generally, acids such as beer bottles are used once and then collected and used again. These acids form scuffs (
If the scuff is used for a long period of time, countless scratches will occur, leaving the scuff area looking white. Although this does not affect the strength of the acids or the contents, there is a problem in that the appearance is poor and the commercial value is significantly reduced.

そこで、スカッフが所定量生じた酸類は破棄するように
しておシ、このスカッフの検査は目視によっている。ま
た目視に代わるものとして次のような光学的検査装置が
提案されている。
Therefore, acids that have produced a predetermined amount of scuff are discarded, and the scuff is visually inspected. Furthermore, the following optical inspection device has been proposed as an alternative to visual inspection.

すなわち、第1図に示すように、従来、光源nよシ光す
を遮光板Cの間隙を介して酸類dの表面に照射し、この
酸類dの表面で反射した光すを一次元撮像手段e(CC
Dカメラ)で受光し、酸類dを回転させて全表面の反射
光を受光して、制御回路で演算し、この演算値が基準レ
ベル以」二になると信号を出力し、所定量のスカッフが
生じた酸類を除去するようにしている。
That is, as shown in FIG. 1, conventionally, a light beam from a light source n is irradiated onto the surface of an acid d through a gap in a light shielding plate C, and the light beam reflected from the surface of the acid d is captured by a one-dimensional imaging means. e(C.C.
Acid d is rotated to receive the reflected light from the entire surface, and the control circuit calculates the light.When this calculated value is equal to or higher than the standard level, a signal is output and a predetermined amount of scuff is removed. The resulting acids are removed.

このスカッフ検査装置においては、酸類dの表面で反射
した反射光すを利用しているため、酸類dの表面が濡れ
ていると、光すが酸類dで反射されないことになる。こ
れでは多数のスカッフが生じているにも拘らず良質の酸
類dと判定してし丑うことになシ、信頼性が低いという
問題があった。
This scuff inspection device uses the reflected light beam reflected from the surface of the acid d, so if the surface of the acid d is wet, the light beam will not be reflected by the acid d. In this case, there was a problem in that the acid d was determined to be of good quality even though a large number of scuffs were generated, and the reliability was low.

この発明はかかる点に鑑み、光源よシ酸類に照射されて
その酸類を透過した光のうち所定角度へ屈折した透過光
を一次元撮像手段で受光し、この受光した透過光よシヌ
カツフ量を検査することにより、濡れた酸類でもそのス
カッフ量を正確に検査できるようにした酸類のスカッフ
検査装置を提供するものである。
In view of this point, the present invention uses a one-dimensional imaging means to receive the transmitted light that is refracted at a predetermined angle among the light that is irradiated from a light source to a silicic acid and transmitted through the acid, and the amount of synucatogia is examined using the received transmitted light. This provides an acid scuff inspection device that can accurately inspect the amount of scuff even in wet acids.

以下1図面に示す実施例に基づいてこの発明の詳細な説
明する。
The present invention will be described in detail below based on an embodiment shown in one drawing.

第2図及び第6図に示すように、1はビール瓶などの各
種酸類2のスカッフを検査するスカッフ検査装置であっ
て、光学系統6と制御系統4とより(1G成されている
As shown in FIGS. 2 and 6, 1 is a scuff inspection device for inspecting the scuff of various acids 2 such as beer bottles, and is composed of an optical system 6 and a control system 4 (1G).

酸類2は、搬送路6を移送するように構成されている。The acids 2 are configured to be transported through the conveyance path 6.

光学系統3は、搬送路6の片側に光源7が1片側にCC
Dカメラ8(−次元撮像手段)がそれぞれ設置されて成
シ、光源7より酸類2に光9が照射される。搬送路乙の
光源Z側には遮光板1oが立設されており、この遮光板
10の間隙より光9が酸類2に照射され、余分な光9が
遮断されるようになっている。
The optical system 3 includes a light source 7 on one side of the conveyance path 6 and a CC on one side.
A D camera 8 (-dimensional imaging means) is installed, and light 9 is irradiated from the light source 7 onto the acid 2. A light shielding plate 1o is provided upright on the light source Z side of the transport path B, and light 9 is irradiated onto the acid 2 through the gap between the light shielding plates 10, and excess light 9 is blocked.

CCDカメラ8は、光源7よりルイ1類2に照射されこ
の酸類2を透過した光9のうちスカッフによって所定角
度へ屈折した透過光9を受光するように設置されている
。このCCDカメラ8は一次元撮像素子を備え、Wi類
2の移動に伴い一定の幅を順に走査するように構成され
、カメラコン1−ローラ11に連繋されている。
The CCD camera 8 is installed so as to receive the transmitted light 9 which is refracted to a predetermined angle by the scuff out of the light 9 that is irradiated onto the acid 2 from the light source 7 and transmitted through the acid 2. This CCD camera 8 is equipped with a one-dimensional image sensor, is configured to sequentially scan a fixed width as the Wis 2 moves, and is linked to the camera controller 1 and the roller 11.

このコントローラ11は制御系統4とモニタ12に連繋
され、それぞれにカメラデータを供給している。モニタ
12はカメラからの出力、即ち、CCDカメラ8が受光
した透過光9を表示するもので、酸類2の移動に伴って
走査の各ピッ1−出力レベルを順に表示するようになっ
ている。
This controller 11 is connected to a control system 4 and a monitor 12, and supplies camera data to each of them. The monitor 12 displays the output from the camera, that is, the transmitted light 9 received by the CCD camera 8, and is designed to sequentially display the output level of each scan as the acid 2 moves.

制御系統4は、演算機能を備えた制御回路13(マイク
ロプロセッサ)とりジェツタ14(セレクト手段)とよ
多構成されている。
The control system 4 is composed of a control circuit 13 (microprocessor) having an arithmetic function and a jetter 14 (select means).

制御回路13はCCDカメラ8が走査したカメラデータ
を演算しすなわち全走査分の各ビット出力レベルを積分
演算し、予め設定された基準レベルと積分演算値を比較
して、基準レベル以上になるとリジエク1〜信号を出力
するようになっている。
The control circuit 13 calculates the camera data scanned by the CCD camera 8, that is, performs an integral calculation on each bit output level for all scans, compares the integral calculation value with a preset reference level, and performs re-execution when the value exceeds the reference level. 1 to output a signal.

リジェクタ14はブツシュシリンダなどで構成されてお
9.制御回路13のりジエクト信号に基づいて作動し、
所定量のスカッフを有する酸類2を除去するようになっ
ている。
9. The rejector 14 is composed of a bushing cylinder or the like. operates based on the control circuit 13 glue direct signal,
The acid 2 having a predetermined amount of scuff is removed.

15は酸類2の位置検知手段であり、一対の投受光器よ
りなる2個の位置センサ15a、15bで構成され、制
御回路13に連繋されている。この第1の位置セン瓶類
5aK′瓶類2が到達すると検知信号が制御回路13に
出力され、第2の位置センサ15bを通過すると検知信
号がクリヤされるようになっている。この2組のセンサ
15a。
Reference numeral 15 denotes a position detection means for the acid 2, which is composed of two position sensors 15a and 15b consisting of a pair of light emitters and receivers, and is connected to the control circuit 13. When this first position sensor bottle 5aK' bottle 2 arrives, a detection signal is output to the control circuit 13, and when it passes the second position sensor 15b, the detection signal is cleared. These two sets of sensors 15a.

151)の間隔が通過する酸類2の肌表面での検査範囲
を決める。
151) Determine the inspection range on the skin surface of acid 2 that passes through the interval.

次に、スカッフの検査動作を第4図に示す制御フローに
基づいて説明する。
Next, the scuff inspection operation will be explained based on the control flow shown in FIG.

酸類2は搬送路6を移送され、光源7の前方に移動して
くる。
The acids 2 are transported along the conveyance path 6 and move in front of the light source 7.

そこで、先ず、ステップ17において酸類2が来たか否
かが判定され、つまり第1の位置センサ15aが酸類2
の検出信号を制御回路13に出力していないときは判定
がNoとなってステップ17で待状態とな9.酸類2が
移動して位置センサ15aが検出すると9判定がYES
となり、ステップ18に移る。
Therefore, first, in step 17, it is determined whether or not the acid 2 has arrived, that is, the first position sensor 15a detects the acid 2.
If the detection signal is not output to the control circuit 13, the determination becomes No and the process goes into a waiting state in step 17.9. If the acid 2 moves and the position sensor 15a detects it, the 9 judgment is YES.
Then, the process moves to step 18.

酸類2が光源7の前方にくると、光源7からの光9が遮
光板10の間隙より酸類2に照射されることになる。こ
の光9は酸類2を透過することになるが、酸類2の表面
にスカッフが生じていると。
When the acid 2 comes in front of the light source 7, the light 9 from the light source 7 is irradiated onto the acid 2 through the gap between the light shielding plates 10. This light 9 will pass through the acid 2, but scuffs have formed on the surface of the acid 2.

透過光9はスカッフによって屈折することになる。The transmitted light 9 will be refracted by the scuff.

この屈折した透過光9をCCDカメラ8が受光すること
になる。CCDカメラ8は酸類2の移動にともない肌表
面の一定幅を順に走査し、受光した透過光9を走査ビッ
ト毎に電気信号に変換する。
The CCD camera 8 receives this refracted transmitted light 9. The CCD camera 8 sequentially scans a certain width of the skin surface as the acid 2 moves, and converts the received transmitted light 9 into an electrical signal for each scanning bit.

つまシ、スカッフ量が透過光9によって検出され。The amount of pickling and scuffing is detected by transmitted light 9.

電気信号に変換されてカメラデータとしてコントローラ
11より制御回路13とモニタ12に供給される。
It is converted into an electrical signal and supplied as camera data from the controller 11 to the control circuit 13 and monitor 12.

モニタ12はこのビット毎のデータを表示する一方、制
御回路13はこのデータを読み込むことになる。
The monitor 12 displays this bit-by-bit data, while the control circuit 13 reads this data.

次にステップ18よりステップ19に移る。このステッ
プ19において酸類2が去ったか否かが判定され、酸類
2が去るまでステップ19の判定がNoとなってステッ
プ18に戻シ、データの読み込みが順次行なわれる。つ
まり、第2の位置センサ15I)が酸類2の通過を検出
するまで、移動している酸類2の一定幅の肌表面におけ
る透過光9iCCDカメラ8が走査し、そのビット毎の
データを読み込むことになる。
Next, the process moves from step 18 to step 19. In this step 19, it is determined whether or not the acid 2 has left, and until the acid 2 has left, the determination in step 19 becomes No, the process returns to step 18, and the data is sequentially read. In other words, until the second position sensor 15I) detects the passage of the acid 2, the transmitted light 9i CCD camera 8 scans the skin surface of the moving acid 2 over a certain width, and reads the data bit by bit. Become.

この第2の位置センサ15))が酸類2の通過を検出す
ると、ステップ19の判定がYESとなp。
When this second position sensor 15)) detects passage of the acid 2, the determination in step 19 becomes YES.

ステップ20に移ることになる。このステップ20にお
いて、制御回路13は取込んだビットデータを積分演算
し、続いて、ステップ21において予め設定された基準
レベルと演算値とを比較し、良瓶か否かを判定する。即
ち、演算値が基準レベル以下のときはステップ21の判
定がYESとなり。
The process will move on to step 20. In step 20, the control circuit 13 performs an integral operation on the bit data taken in, and then in step 21, it compares the calculated value with a preset reference level to determine whether the bottle is of good quality. That is, when the calculated value is below the reference level, the determination in step 21 is YES.

ステップ17に戻って次の酸類2を待機し、他方。Return to step 17 and wait for the next acid 2, the other.

Mlレベル以」二のときはステップ21の判定がNOと
なり、ステップ22に移り、制御回路15がりジエクト
信号を出力する。
If the level is below the M1 level, the determination in step 21 is NO, and the process moves to step 22, where the control circuit 15 outputs a direct signal.

このリジェクト信号によってリジェクタ14が作動し、
スカッフが所定i以」二有する酸類2を除去することに
なる。
This reject signal activates the rejector 14,
The acids 2 which the scuff has more than a predetermined number i are removed.

尚、リジェクト信号を出力すると、ステップ17に戻り
9次の酸類を待機する。
Incidentally, when the reject signal is output, the process returns to step 17 and waits for the ninth acid.

第5図はスカッフ検査装置1によって得たスカッフ度S
と目視による酸類2の品質の順番との関係を示すもので
ある。この第5図に示すように。
FIG. 5 shows the scuff degree S obtained by the scuff inspection device 1.
This shows the relationship between the order of quality of acids 2 and the order of visual quality of acids 2. As shown in this Figure 5.

ヌカラフ度Sと目視による順番とはほぼ比例関係にあシ
、看者による外観の印象が悪くなるに従ってヌカラフ度
Sも上昇することになる。よって。
There is a nearly proportional relationship between the degree of roughness S and the order by visual inspection, and as the impression of appearance to the viewer worsens, the degree of roughness S also increases. Therefore.

目視の順番に対応するヌカラフ度S′f:制御回路16
の基準レベルに設定する。例えば、目視による許容限界
の順番を7とすると、スカッフ反Sが6.0以」二の酸
類2を除去することになる。
Nucara roughness S'f corresponding to the order of visual observation: control circuit 16
set to the standard level. For example, if the order of visual tolerance limits is set to 7, acids 2 with scuff anti-S of 6.0 or higher will be removed.

尚、スカッフ度Sは次式で得られる。Incidentally, the scuff degree S is obtained by the following formula.

S= 10/3X (、(Joglo(rX103))
r:ヌカラフ部の面積比 第6図は遮光板26の他の設置例を示すもので。
S= 10/3X (, (Joglo(rX103))
r: Area ratio of the hollow rough portion FIG. 6 shows another example of installing the light shielding plate 26.

遮光板23を搬送路6の両側にほぼ対角線上に設け、C
CDカメラ8が遮光板23の裏面に位置するようになっ
ている。要するに、光源7からの光9のうち酸類2を透
過した光9がCCDカメラ8に受光されるようになって
いる。
Light shielding plates 23 are provided on both sides of the conveyance path 6 approximately diagonally, and C
A CD camera 8 is positioned on the back surface of the light shielding plate 23. In short, out of the light 9 from the light source 7, the light 9 that has passed through the acid 2 is received by the CCD camera 8.

尚、実施例において、制御回路13はCCDカメラ8が
走査したデータを全て積分演算して基準レベルと比較す
るようにしたが、各走査したピッl−データごとに予め
設定した基準レベルと比較し。
In the embodiment, the control circuit 13 performs an integral operation on all the data scanned by the CCD camera 8 and compares it with the reference level. .

その差を演算して良瓶か否かを判定するようにしてもよ
い。
The difference may be calculated to determine whether or not the bottle is of good quality.

また、制御回路13はリジェクト信号を出力するように
したが、良瓶としての信号全出力するようにし、一方、
リジェクタ14に代えてセレクト手段として良瓶を他系
統に移動させるように構成してもよい。また積分演算を
した結果を外部よシモニタできる出力端子を設けること
によジオンラインでのスカッフ度に関するデータ収集が
可能となる。
In addition, the control circuit 13 was configured to output a reject signal, but it was configured to output all signals indicating a good bottle.
The rejector 14 may be replaced with a selection means that moves good bottles to another system. Furthermore, by providing an output terminal that can externally monitor the result of the integral calculation, it becomes possible to collect data regarding the degree of scuffing in the geoline.

以上のようにこの発明は、光源から発する光を酸類に照
射し、この瓶゛類を透過し且つ所定角度屈折した透過光
を受光する一次元撮像手段を設け。
As described above, the present invention includes a one-dimensional imaging means that irradiates light emitted from a light source onto acids and receives transmitted light that is transmitted through the bottles and refracted at a predetermined angle.

この−次元撮像手段の出力信号を制御回路が演算して基
準レベ/L/LJ、上のとき信号を発し、この信号によ
って所定量のスカッフが生じた酸類をセレクト手段によ
って選別するように構成している。
A control circuit calculates the output signal of the -dimensional imaging means to generate a signal when it is above the reference level /L/LJ, and the selection means selects acids with a predetermined amount of scuff based on this signal. ing.

したがって、酸類の透過光に基づいてスカッフを検出す
るようにしているので、酸類が濡れていてもそのスカッ
フを確実に検出できるから、信頼性の高い検査を行うこ
とができる。
Therefore, since the scuff is detected based on the transmitted light of the acid, the scuff can be reliably detected even if the acid is wet, so that highly reliable inspection can be performed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のスカッフ検査装置の要部を示す概略平面
図、第2図乃至第6図はこの発明の実施態様を示し、第
2図はスカッフ検査装置の要部の概略平面図、第3図は
スカッフ検査装置の概略構成図、第4図は量制御フロー
図、第5図は瓶類のスカッフ度と目視による順番との関
係を示す図。 第6図は他のスカッフ検査装置の要部の概略平面図であ
る。 1:スカッフ検査装置、 2:瓶類。 3=光学系統、 4:制御系統、 6:搬送路。 7:光源、  B:CCDカメラ、  9:光。 10・23:遮光板、  11:カメラコントローラ、
 12:モニタ、 13:制御回路。 14:リジエクタ、 15:位置検知手段。 15a・15b=位置センサ。 特許出願人     サン) IJ−株式会社代理人 
 弁理士  中 村 茂 信 (11) 第1図
FIG. 1 is a schematic plan view showing the main parts of a conventional scuff inspection device, FIGS. 2 to 6 show embodiments of the present invention, and FIG. FIG. 3 is a schematic configuration diagram of a scuff inspection device, FIG. 4 is a quantity control flow diagram, and FIG. 5 is a diagram showing the relationship between the degree of scuffing of bottles and the order by visual inspection. FIG. 6 is a schematic plan view of the main parts of another scuff inspection device. 1: Scuff inspection device, 2: Bottles. 3 = optical system, 4: control system, 6: transport path. 7: Light source, B: CCD camera, 9: Light. 10/23: Light shielding plate, 11: Camera controller,
12: Monitor, 13: Control circuit. 14: Rejector, 15: Position detection means. 15a, 15b = position sensor. Patent applicant Sun) IJ-Co., Ltd. Agent
Patent Attorney Shigeru Nakamura (11) Figure 1

Claims (1)

【特許請求の範囲】[Claims] (1)  検査対象物である酸類に光を照射する光源と
。 この光源よシ照射されて酸類を透過し且つ所定角度屈折
した透過光を受ける一次元撮象手段と。 この−次元撮像手段の出力信号を演算してその演算値が
予め設足された基準レベル以上になると信号を出力する
制御回路と、この制御回路の出力信号によって所定量の
スカッフが生じた酸類をセレクトするセレクト手段とよ
シなることを特徴とする酸類のスカッフ検査装置。
(1) A light source that irradiates light onto the acid being inspected. a one-dimensional imaging means for receiving transmitted light irradiated by the light source, transmitted through the acid, and refracted at a predetermined angle; A control circuit that calculates the output signal of this -dimensional imaging means and outputs a signal when the calculated value exceeds a preset reference level, and a control circuit that outputs a signal when the calculated value exceeds a preset reference level; An acid scuff inspection device characterized by a selection means.
JP57152378A 1982-08-31 1982-08-31 Inspection device for scuffing bottles Expired - Lifetime JPH0612344B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57152378A JPH0612344B2 (en) 1982-08-31 1982-08-31 Inspection device for scuffing bottles

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57152378A JPH0612344B2 (en) 1982-08-31 1982-08-31 Inspection device for scuffing bottles

Publications (2)

Publication Number Publication Date
JPS5940242A true JPS5940242A (en) 1984-03-05
JPH0612344B2 JPH0612344B2 (en) 1994-02-16

Family

ID=15539212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57152378A Expired - Lifetime JPH0612344B2 (en) 1982-08-31 1982-08-31 Inspection device for scuffing bottles

Country Status (1)

Country Link
JP (1) JPH0612344B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01262448A (en) * 1988-04-13 1989-10-19 Kirin Brewery Co Ltd Method and equipment for inspecting body of bottle
JPH01299444A (en) * 1988-05-27 1989-12-04 Kirin Brewery Co Ltd Detecting apparatus of defect of barrel part of bottle
JPH03163340A (en) * 1989-11-22 1991-07-15 Toyo Glass Co Ltd Method and apparatus for detecting defect at drum part of bottle
WO2017144634A1 (en) * 2016-02-24 2017-08-31 Becton Dickinson France System and method for inspecting a transparent cylinder

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5214994A (en) * 1975-07-28 1977-02-04 Toyoda Mach Works Ltd Multi-stage feed device for grindstone stock
JPS52138186A (en) * 1976-05-14 1977-11-18 Mitsubishi Electric Corp Inspecting apparatus for glass bottle or the like
JPS5317516A (en) * 1976-07-31 1978-02-17 Ishikawajima Harima Heavy Ind Co Ltd Extraction apparatus in reducing furnace
JPS5627641A (en) * 1979-08-14 1981-03-18 Suntory Ltd Method for inspecting glass bottle and the like

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5214994A (en) * 1975-07-28 1977-02-04 Toyoda Mach Works Ltd Multi-stage feed device for grindstone stock
JPS52138186A (en) * 1976-05-14 1977-11-18 Mitsubishi Electric Corp Inspecting apparatus for glass bottle or the like
JPS5317516A (en) * 1976-07-31 1978-02-17 Ishikawajima Harima Heavy Ind Co Ltd Extraction apparatus in reducing furnace
JPS5627641A (en) * 1979-08-14 1981-03-18 Suntory Ltd Method for inspecting glass bottle and the like

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01262448A (en) * 1988-04-13 1989-10-19 Kirin Brewery Co Ltd Method and equipment for inspecting body of bottle
JPH01299444A (en) * 1988-05-27 1989-12-04 Kirin Brewery Co Ltd Detecting apparatus of defect of barrel part of bottle
JPH03163340A (en) * 1989-11-22 1991-07-15 Toyo Glass Co Ltd Method and apparatus for detecting defect at drum part of bottle
WO2017144634A1 (en) * 2016-02-24 2017-08-31 Becton Dickinson France System and method for inspecting a transparent cylinder
JP2019506616A (en) * 2016-02-24 2019-03-07 ベクトン ディキンソン フランス System and method for inspecting a transparent cylinder
US10663409B2 (en) 2016-02-24 2020-05-26 Becton Dickinson France System and method for inspecting a transparent cylinder
US11125699B2 (en) 2016-02-24 2021-09-21 Becton Dickinson France System and method for inspecting a transparent cylinder

Also Published As

Publication number Publication date
JPH0612344B2 (en) 1994-02-16

Similar Documents

Publication Publication Date Title
US5085510A (en) Pharmaceutical tablet vision inspection system
KR0126401B1 (en) Apparatus for detecting cut-edge flaws in glass plates
JP3041090B2 (en) Appearance inspection device
JPH08201313A (en) Defect inspection method for transparent plate-like body and device thereof
JP2002062267A (en) Device for inspecting defect
JP3677133B2 (en) Transparency inspection device
JPS5940242A (en) Device for checking scuff of bottles
JP3977503B2 (en) Film inspection method and film inspection apparatus using the same
JP3886006B2 (en) Gloss inspection equipment for fruits and vegetables
JP3224083B2 (en) Method and apparatus for detecting defects in sheet glass
JPH07104290B2 (en) Bottle inspection equipment
JPH05215694A (en) Method and apparatus for inspecting defect of circuit pattern
JP2895773B2 (en) Inspection equipment for transparent articles
JP3007849B2 (en) Shape detection method and shape detection device for object surface
JP2789606B2 (en) Tablet appearance defect detection method and device
JPH0682103B2 (en) Visual inspection system for copper-clad wiring boards
JPH08338815A (en) Method and apparatus for inspecting bottle
JPH0763699A (en) Flaw inspection apparatus
JPH0755720A (en) Defect inspecting apparatus for transparent and opaque films
JP3191175B2 (en) Liquid level detector in can
JPH10160676A (en) Rice grain inspection device
JPH05346319A (en) Surface examiner for plate-like continuous object
JPH07107713B2 (en) Paper sheet inspection device
JPH04286944A (en) Flaw detector
JPS6166952A (en) Inspecting method of outward surface of article