JPS5934106A - 放射線厚み測定装置 - Google Patents

放射線厚み測定装置

Info

Publication number
JPS5934106A
JPS5934106A JP14445682A JP14445682A JPS5934106A JP S5934106 A JPS5934106 A JP S5934106A JP 14445682 A JP14445682 A JP 14445682A JP 14445682 A JP14445682 A JP 14445682A JP S5934106 A JPS5934106 A JP S5934106A
Authority
JP
Japan
Prior art keywords
radiation
thickness
measured
signal
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14445682A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0125005B2 (enExample
Inventor
Yukio Matsuda
行雄 松田
Yorio Mukaikubo
向窪　順生
Junichi Murakami
純一 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Nippon Steel Corp
Original Assignee
Toshiba Corp
Sumitomo Metal Industries Ltd
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Sumitomo Metal Industries Ltd, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP14445682A priority Critical patent/JPS5934106A/ja
Publication of JPS5934106A publication Critical patent/JPS5934106A/ja
Publication of JPH0125005B2 publication Critical patent/JPH0125005B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP14445682A 1982-08-20 1982-08-20 放射線厚み測定装置 Granted JPS5934106A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14445682A JPS5934106A (ja) 1982-08-20 1982-08-20 放射線厚み測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14445682A JPS5934106A (ja) 1982-08-20 1982-08-20 放射線厚み測定装置

Publications (2)

Publication Number Publication Date
JPS5934106A true JPS5934106A (ja) 1984-02-24
JPH0125005B2 JPH0125005B2 (enExample) 1989-05-16

Family

ID=15362668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14445682A Granted JPS5934106A (ja) 1982-08-20 1982-08-20 放射線厚み測定装置

Country Status (1)

Country Link
JP (1) JPS5934106A (enExample)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934350A (enExample) * 1972-07-28 1974-03-29

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934350A (enExample) * 1972-07-28 1974-03-29

Also Published As

Publication number Publication date
JPH0125005B2 (enExample) 1989-05-16

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