JPS5933533B2 - Method for treating the inner surface of a mold for producing high-purity silicon - Google Patents

Method for treating the inner surface of a mold for producing high-purity silicon

Info

Publication number
JPS5933533B2
JPS5933533B2 JP13074881A JP13074881A JPS5933533B2 JP S5933533 B2 JPS5933533 B2 JP S5933533B2 JP 13074881 A JP13074881 A JP 13074881A JP 13074881 A JP13074881 A JP 13074881A JP S5933533 B2 JPS5933533 B2 JP S5933533B2
Authority
JP
Japan
Prior art keywords
mold
silicon
silicon nitride
nitride powder
purity silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13074881A
Other languages
Japanese (ja)
Other versions
JPS5832008A (en
Inventor
泰宏 金谷
裕樹 井本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Osaka Soda Co Ltd
Original Assignee
Osaka Soda Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osaka Soda Co Ltd filed Critical Osaka Soda Co Ltd
Priority to JP13074881A priority Critical patent/JPS5933533B2/en
Publication of JPS5832008A publication Critical patent/JPS5832008A/en
Publication of JPS5933533B2 publication Critical patent/JPS5933533B2/en
Expired legal-status Critical Current

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  • Mold Materials And Core Materials (AREA)
  • Moulds, Cores, Or Mandrels (AREA)
  • Silicon Compounds (AREA)

Description

【発明の詳細な説明】 本発明は高純度ケイ素製造用鋳型の内面処理方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for treating the inner surface of a mold for producing high-purity silicon.

半導体工業用級の高純度ケイ素を製造するにはあらかじ
め反応器内に設置した高純度ケイ素棒(以下単にケイ素
棒という)を通電加熱しクロロシランと水素との混合ガ
スを反応器内に導入してその分解反応によりケイ素棒上
に多結晶体のケイ素を析出させ、これを取出してさらに
ルツボ等で溶融し単結晶種子を加えてこれを成長させ単
結晶体を得る方法が行われている。
To produce high-purity silicon of semiconductor industry grade, a high-purity silicon rod (hereinafter simply referred to as a silicon rod) placed in a reactor is heated with electricity and a mixed gas of chlorosilane and hydrogen is introduced into the reactor. A method is used in which polycrystalline silicon is precipitated on a silicon rod through the decomposition reaction, which is then taken out and melted in a crucible or the like, and a single crystal seed is added thereto to grow it to obtain a single crystal.

この際使用されるケイ素棒は溶融されたケイ素を石英製
の管状鋳型に流し込み冷却後成型体を取り出すことによ
り製造されるが、この際ケイ素と鋳型が密着していると
両者の膨張係数の差によりケイ素成型体にヒビ割れが生
ずる。
The silicon rods used at this time are manufactured by pouring molten silicon into a quartz tubular mold, cooling it, and then taking out the molded body. At this time, if the silicon and the mold are in close contact, there will be a difference in the coefficient of expansion between the two. This causes cracks in the silicon molded body.

従来石英ルツボ等の鋳型内面をブラスト処理後、水等の
揮発性液体の沸点以上に加熱し、次いでこれら液体に分
散させた高純度窒化ケイ素粉末のスラリーを石英ルツボ
内面にスプレーし、液体を蒸発させることにより窒化ケ
イ素を鋳型内面に付着させる方法が提案されている(米
国特許第3041690号)。
Conventionally, after blasting the inner surface of a mold such as a quartz crucible, it is heated above the boiling point of a volatile liquid such as water, and then a slurry of high-purity silicon nitride powder dispersed in these liquids is sprayed onto the inner surface of the quartz crucible to evaporate the liquid. A method has been proposed in which silicon nitride is deposited on the inner surface of a mold by causing the silicon nitride to adhere to the inner surface of the mold (US Pat. No. 3,041,690).

窒化ケイ素粉末によりコーティングされた鋳型内に溶融
したケイ素を流し込んだ場合、窒化ケイ素と溶融ケイ素
とは濡れ難く、また窒化ケイ素は粉体であるため鋳型と
ケイ素との収縮の差により生ずる応力を緩衝する作用が
ありケイ素成型体にはヒビが入らない。
When molten silicon is poured into a mold coated with silicon nitride powder, silicon nitride and molten silicon do not easily get wet, and since silicon nitride is a powder, it buffers the stress caused by the difference in shrinkage between the mold and silicon. This has the effect of preventing cracks from forming in the silicon molded body.

しかしこの方法は前記のようなケイ素棒を製造するため
の細長い管状鋳型や複雑な形状の鋳型内面はブラスト処
理が不可能なため不適当である。
However, this method is not suitable for blasting the elongated tubular mold or the complex-shaped inner surface of the mold for manufacturing the silicon rods as described above.

また鋳型内面の窒化ケイ素粉末は脱落しやすい欠点があ
る。
Another disadvantage is that the silicon nitride powder on the inner surface of the mold easily falls off.

本発明者は以上のような問題点を解決す不ために鋭意検
討を重ねた結果、クロロシランまたはアルコキシシラン
の加水分解生成物またはコロイダルシリカにて窒化ケイ
素粉末を固定させると鋳型内面より剥離し難く、かつケ
イ素成型体にも損傷を与えない塗面が得られることを見
出し本発明法を完成したものである。
As a result of intensive studies to solve the above problems, the present inventor found that if silicon nitride powder is fixed with a hydrolyzed product of chlorosilane or alkoxysilane or colloidal silica, it will be difficult to peel off from the inner surface of the mold. The inventors have completed the method of the present invention by discovering that it is possible to obtain a coated surface that does not damage silicon molded bodies.

すなわち本発明は液状のクロロシラン、アルコキシシラ
ンまたはコロイダルシリカに窒化ケイ素粉末を加えてス
ラリー状となし、石英、アルミナ、黒鉛等の耐熱性材質
よりなる高純度ケイ素製造用鋳型の内面に塗布し、次い
で上記クロロシランもしくはアルコキシシランを加水分
解後、塗面な乾燥せしめることにより上記鋳型の内面に
加水分解生成物またはコロイダルシリカをバインダーと
した窒化ケイ素粉末を被着せしめることを特徴とする高
純度ケイ素製造用鋳型の内面処理方法である。
That is, in the present invention, silicon nitride powder is added to liquid chlorosilane, alkoxysilane, or colloidal silica to form a slurry, and the slurry is coated on the inner surface of a mold for manufacturing high-purity silicon made of a heat-resistant material such as quartz, alumina, or graphite. For manufacturing high-purity silicon, the method comprises hydrolyzing the chlorosilane or alkoxysilane and then drying the coated surface to coat the inner surface of the mold with a hydrolyzed product or silicon nitride powder containing colloidal silica as a binder. This is a method for treating the inner surface of a mold.

コロイダルシリカのみ使用する場合は加水分解工程が省
略される。
If only colloidal silica is used, the hydrolysis step is omitted.

本発明に使用される液状のクロロシランとしてはトリク
ロロシラン、テトラクロロシランが挙げられ、アルコキ
シシランとしてはテトラメトキシ7ラン、テトラエトキ
シシラン、テトラエトキシシラン等が挙げられる。
Examples of the liquid chlorosilane used in the present invention include trichlorosilane and tetrachlorosilane, and examples of the alkoxysilane include tetramethoxy 7rane, tetraethoxysilane, and tetraethoxysilane.

これに粒度が好ましくは100メツシユ以下の窒化ケイ
素粉末を加えてスラリー状とし鋳型内面に塗布する。
A silicon nitride powder having a particle size of preferably 100 mesh or less is added to this to form a slurry and applied to the inner surface of the mold.

スラリー濃度としては重量基準で30〜70%程度が好
ましい。
The slurry concentration is preferably about 30 to 70% by weight.

高純度ケイ素成型体を得るためには当然、窒化ケイ素、
クロロシラン、アルコキシシランまたコロイダルシリカ
は純度の高いものを使用しなければならない。
In order to obtain a high-purity silicon molded body, silicon nitride,
Chlorosilane, alkoxysilane and colloidal silica must be of high purity.

厚い塗布層を得るためには上記の操作を何度も繰返せば
よい。
In order to obtain a thick coating layer, the above operation may be repeated many times.

次にクロロシラン類を用いる場合は鋳型内面塗布層を湿
潤空気等と接触させて上記クロロシラン類の加水分解を
行う。
Next, when chlorosilanes are used, the inner coating layer of the mold is brought into contact with humid air or the like to hydrolyze the chlorosilanes.

またアルコキシシランを用いる場合には添加した塩酸に
より加水分解を行う。
In addition, when alkoxysilane is used, hydrolysis is performed with added hydrochloric acid.

加水分解生成物は主として無定形シリカと推定されるが
これらは酸素原子を介して重合体となっており窒化ケイ
素粉末のバインダーとして作用し同時に鋳型内面と強固
に接着する。
The hydrolysis product is presumed to be mainly amorphous silica, which forms a polymer through oxygen atoms, acts as a binder for the silicon nitride powder, and at the same time firmly adheres to the inner surface of the mold.

さらに鋳型を加熱乾燥させて水分と塩化水素を、またア
ルコキシシラン使用の場合は同時にアルコールをも除去
する。
Furthermore, the mold is heated and dried to remove moisture and hydrogen chloride, and if alkoxysilane is used, alcohol is also removed at the same time.

コロイダルシリカ使用の場合は単に加熱乾燥、または乾
燥させるのみで同様の結果が得られる。
When colloidal silica is used, similar results can be obtained by simply heating or drying it.

以上説明したように本発明法によれば無定形シリカを主
体とするバインダーが鋳型内面に形成されるので、窒化
ケイ素粉末を単に物理的に被着させる場合と異なり鋳型
内面のブラスト処理を要しない。
As explained above, according to the method of the present invention, a binder mainly composed of amorphous silica is formed on the inner surface of the mold, so unlike the case where silicon nitride powder is simply physically deposited, there is no need to blast the inner surface of the mold. .

それ故細長い管状鋳型、または複雑な形状の鋳型の内面
に容易に窒化ケイ素粉末を被着させることができる。
Therefore, silicon nitride powder can be easily deposited on the inner surface of elongated tubular molds or molds of complex shapes.

また窒化ケイ素粉末をバインダー作用により多層被着さ
せることができるので耐熱性鋳型にケイ素溶融体を流し
込んで成型する場合、鋳型とケイ素原料との収縮の差に
よる応力が積層された窒化ケイ素粒子相互のズレにより
緩衝される率が高くなり成型体のヒビ割れ等の現象がほ
とんど生じることがない。
In addition, since silicon nitride powder can be applied in multiple layers by the action of a binder, when a silicon molten material is poured into a heat-resistant mold and molded, stress due to the difference in shrinkage between the mold and the silicon raw material is applied to each layer of the laminated silicon nitride particles. The rate of buffering due to misalignment is high, and phenomena such as cracking of the molded product hardly occur.

また従来高純度ケイ素を製造する際に鋳型材質は同質の
石英等に限定されていたが本発明法によれば窒化ケイ素
粉末がシリカ質バインダーにより結合されて鋳型内面の
コーティング層を形成しているため鋳型材質が直接高純
度ケイ素と接触しないので黒鉛、アルミナ等異種材質の
鋳型を使用することができる管種々の工業的利点を有す
る。
Furthermore, conventionally, when manufacturing high-purity silicon, the mold material was limited to homogeneous quartz, etc., but according to the method of the present invention, silicon nitride powder is bound by a siliceous binder to form a coating layer on the inner surface of the mold. Therefore, since the mold material does not come into direct contact with high-purity silicon, molds made of different materials such as graphite and alumina can be used, which has various industrial advantages.

本発明方法は前述のごとく高純度ケイ素を製造する際に
必要であるケイ素棒成型用鋳型の内面処理法として特に
有用であるがルツボ等地のあらゆる鋳型に適用しうるも
のである。
As mentioned above, the method of the present invention is particularly useful as a method for treating the inner surface of a mold for molding a silicon rod, which is necessary when producing high-purity silicon, but it can also be applied to any mold such as a crucible.

実施例1、比較例 長さ1000mm、内径3.51n−厚さ0.5mmの
石英管内に、高純度窒化ケイ素粉末(平均粒度約150
メツシユ)2重量部に対してテトラクロロシラン3重量
部の割合よりなるスラリーを流し込み石英管内面を塗布
した。
Example 1, Comparative Example High-purity silicon nitride powder (average particle size of about 150
A slurry consisting of 2 parts by weight of mesh and 3 parts by weight of tetrachlorosilane was poured to coat the inner surface of the quartz tube.

次に湿潤空気を石英管の一端より吹き込んでテトラクロ
ロシランを加水分解すると生成する無定形シリカのバイ
ンダーにより窒化ケイ素粉末が固定された粗面塗膜が形
成される。
Next, moist air is blown into one end of the quartz tube to hydrolyze the tetrachlorosilane, forming a rough coating film to which the silicon nitride powder is fixed by the amorphous silica binder produced.

この操作を3回繰り返して厚さ約0.4 mmの塗膜が
得られた。
This operation was repeated three times to obtain a coating film with a thickness of about 0.4 mm.

次にこの石英管を約100℃に加熱し水分と塩化水素を
除去する。
Next, this quartz tube is heated to about 100° C. to remove moisture and hydrogen chloride.

このように内面処理を施した石英管の一端を温度約14
50℃の溶融ケイ素浴中に浸し減圧操作により溶融ケイ
素を吸引させた。
One end of the quartz tube with the inner surface treated in this way was heated to a temperature of about 14
It was immersed in a molten silicon bath at 50° C. and the molten silicon was sucked out by vacuum operation.

これを浴より引き上げ放冷後、石英管と分離させると径
2.7 mm、長さ600m111の高純度ケイ素棒が
得られヒビ割れは全く認められなかった。
When this was lifted from the bath and left to cool, it was separated from the quartz tube to obtain a high purity silicon rod with a diameter of 2.7 mm and a length of 600 m111, with no cracks observed at all.

比較のため高純度窒化ケー1″素粉末−テトラクロロシ
ランのスラリーを塗布しない石英管を用い、約1450
℃の溶融ケイ素を吸引したところ石英管にヒビが入り、
同時にケイ素棒は多数のヒビ割れを生じて折損し長さ約
10龍程度のケイ素棒しか得られなかった。
For comparison, a quartz tube without a slurry of high-purity silicon nitride 1" powder and tetrachlorosilane was used, and approximately 1450
When molten silicon at ℃ was sucked in, the quartz tube cracked.
At the same time, the silicon rod developed many cracks and broke, and only a silicon rod with a length of about 10 mm was obtained.

実施例 2 高純度窒化ケイ素粉末(平均粒度約150メツシユ)2
重量部に対してトリクロロシラン3重量部の割合よりな
るスラリーを内容積約100m1の石英ルツボ内面に塗
布する。
Example 2 High purity silicon nitride powder (average particle size approximately 150 mesh) 2
A slurry consisting of 3 parts by weight of trichlorosilane to parts by weight is applied to the inner surface of a quartz crucible having an internal volume of about 100 m1.

次いで塗布に湿潤空気を送ってトリクロロシランを加水
分解すると加水分解生成物のバインダーにより窒化ケイ
素粉末が固定された粗面塗膜が形成される。
Moist air is then sent through the coating to hydrolyze the trichlorosilane, forming a rough coating film in which the silicon nitride powder is fixed by the binder of the hydrolyzed product.

この操作を3回行って厚さ約0.4. mrrtの塗膜
が得られた。
Repeat this operation three times until the thickness is approximately 0.4. A coating of mrrt was obtained.

次にこの石英ルツボを約100℃に加熱し水分と塩化水
素を除去する。
Next, this quartz crucible is heated to about 100° C. to remove water and hydrogen chloride.

このように内面処理を施した石英ルツボに実施例1と同
じ溶融ケイ素を流しこみ放冷固化させた。
The same molten silicon as in Example 1 was poured into the quartz crucible whose inner surface had been treated in this way, and allowed to cool and solidify.

このようにして得られた高純度ケイ素塊は石英ルツボを
破損せずに容易に取り出されヒビ割れは全く認められな
かった。
The high-purity silicon ingot thus obtained was easily taken out without damaging the quartz crucible, and no cracks were observed.

実施例 3 テトラエトキシシラン2.5 mlKエチルアルコール
5mlを加え攪拌しながら濃度2.5重量%塩酸5ml
を加える。
Example 3 Add 2.5 ml of tetraethoxysilane and 5 ml of K ethyl alcohol and add 5 ml of hydrochloric acid with a concentration of 2.5% by weight while stirring.
Add.

さらに平均粒径約150メツシユの窒化ケイ素粉末40
2を加えスラリー状とし実施例1で用いた石英管内壁に
塗布する。
Furthermore, 40 pieces of silicon nitride powder with an average particle size of about 150 mesh
2 was added to form a slurry and applied to the inner wall of the quartz tube used in Example 1.

20分以内に塩酸による加水分解が完了する。Hydrolysis with hydrochloric acid is completed within 20 minutes.

次にこの石英管を100℃で乾燥し実施例1と同様の操
作で溶融ケイ素を吸引放冷するとヒビの入らない同型の
高純度ケイ素棒が得られた。
Next, this quartz tube was dried at 100° C., and the molten silicon was sucked and allowed to cool in the same manner as in Example 1. A high-purity silicon rod of the same type without any cracks was obtained.

実施例 4 固型分20重量%のコロイダルシリカ10グに対して平
均粒径約150メツシユの高純度窒化ケイ素粉末15グ
を加えてスラリー状となし容積100m7のアルミナ製
ルツボの内壁に塗布し室温で乾燥する。
Example 4 15 g of high-purity silicon nitride powder with an average particle size of about 150 mesh was added to 10 g of colloidal silica with a solid content of 20% by weight to form a slurry, which was coated on the inner wall of an alumina crucible with a volume of 100 m7 and kept at room temperature. Dry with.

この操作を2回行った後、実施例1と同じ溶融ケイ素を
流し込み冷却固化させたところ得られた高純度ケイ素塊
は容易に取り出されヒビ割れは全く認められなかった。
After performing this operation twice, the same molten silicon as in Example 1 was poured and cooled and solidified. The resulting high-purity silicon block was easily taken out and no cracks were observed.

Claims (1)

【特許請求の範囲】[Claims] 1 液状のクロロシラン、アルコキシシランまたはコロ
イダルシリカに窒化ケイ素粉末を加えてスラリー状とな
し、石英、アルミナ、黒鉛等の耐熱性材質よりなる高純
度ケイ素製造用鋳型の内面に塗布し、次いで上記クロロ
シランもしくはアルコキシシランを加水分解後、塗布を
乾燥せしめることにより上記鋳型の内面に加水分解生成
物またはコロイダルシリカをバインダーとした窒化ケイ
素粉末を被着せしめることを特徴とする高純度ケイ素製
造用鋳型の内面処理方法。
1. Add silicon nitride powder to liquid chlorosilane, alkoxysilane or colloidal silica to form a slurry, apply it to the inner surface of a mold for producing high purity silicon made of a heat-resistant material such as quartz, alumina, graphite, etc., and then add the above chlorosilane or colloidal silica. Inner surface treatment of a mold for manufacturing high-purity silicon, characterized in that after hydrolyzing alkoxysilane, the coating is dried to coat the inner surface of the mold with a hydrolysis product or silicon nitride powder with colloidal silica as a binder. Method.
JP13074881A 1981-08-19 1981-08-19 Method for treating the inner surface of a mold for producing high-purity silicon Expired JPS5933533B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13074881A JPS5933533B2 (en) 1981-08-19 1981-08-19 Method for treating the inner surface of a mold for producing high-purity silicon

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13074881A JPS5933533B2 (en) 1981-08-19 1981-08-19 Method for treating the inner surface of a mold for producing high-purity silicon

Publications (2)

Publication Number Publication Date
JPS5832008A JPS5832008A (en) 1983-02-24
JPS5933533B2 true JPS5933533B2 (en) 1984-08-16

Family

ID=15041688

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13074881A Expired JPS5933533B2 (en) 1981-08-19 1981-08-19 Method for treating the inner surface of a mold for producing high-purity silicon

Country Status (1)

Country Link
JP (1) JPS5933533B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007268572A (en) * 2006-03-31 2007-10-18 Nichias Corp Coating material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007268572A (en) * 2006-03-31 2007-10-18 Nichias Corp Coating material

Also Published As

Publication number Publication date
JPS5832008A (en) 1983-02-24

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