JPS593022B2 - Sample tilting device for electron microscopes, etc. - Google Patents

Sample tilting device for electron microscopes, etc.

Info

Publication number
JPS593022B2
JPS593022B2 JP1648879A JP1648879A JPS593022B2 JP S593022 B2 JPS593022 B2 JP S593022B2 JP 1648879 A JP1648879 A JP 1648879A JP 1648879 A JP1648879 A JP 1648879A JP S593022 B2 JPS593022 B2 JP S593022B2
Authority
JP
Japan
Prior art keywords
sample
holding member
tilting device
sample holding
electron microscopes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1648879A
Other languages
Japanese (ja)
Other versions
JPS55109355A (en
Inventor
秀雄 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP1648879A priority Critical patent/JPS593022B2/en
Publication of JPS55109355A publication Critical patent/JPS55109355A/en
Publication of JPS593022B2 publication Critical patent/JPS593022B2/en
Expired legal-status Critical Current

Links

Description

【発明の詳細な説明】 本発明は高分解能電子顕微鏡に使用して有効な試料傾斜
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sample tilting device that is effective for use in high-resolution electron microscopy.

電子顕微鏡における試料傾斜装置としてはジンバル機構
を用いたものが広く使用されている。
A gimbal mechanism is widely used as a specimen tilting device in an electron microscope.

しかし乍ら斯かるジンバル機構を使用した場合には試料
保持部分(対物レンズの磁極片内部に挿入される部分)
が大型化し、試料傾斜を行う場合には対物レンズの上磁
極の穴径を大きくせざるを得なく々す、その結果試料の
傾斜状態を高分解能で観察することができない。
However, when using such a gimbal mechanism, the sample holding part (the part inserted inside the magnetic pole piece of the objective lens)
becomes larger, and when tilting the sample, the diameter of the hole in the upper magnetic pole of the objective lens must be increased.As a result, the tilted state of the sample cannot be observed with high resolution.

一方ジンバル機構に代えて、第1図に示すように試料筒
1の下部に球状の受部2を設け、該受部に試料3を内蔵
した球状の試料保持部材4を回動可能に保持させた試料
傾斜装置が提案されている。
On the other hand, instead of the gimbal mechanism, a spherical receiving part 2 is provided at the bottom of the sample tube 1 as shown in FIG. A sample tilting device has been proposed.

該試料傾斜装置では試料筒1の内側に遊嵌した筒体5に
て試料保持部材4の上面を押し下げることにより試料3
を傾斜させることができ、又筒体5を回転させることに
より試料3の傾斜方位を変えることができる。
In this sample tilting device, the sample 3 is tilted by pushing down the upper surface of the sample holding member 4 with the cylindrical body 5 loosely fitted inside the sample tube 1.
can be tilted, and by rotating the cylindrical body 5, the tilt direction of the sample 3 can be changed.

しかし乍ら斯かる装置においては傾斜した試料3を水平
に復帰させるために、筒体5の内側に遊嵌され且つスプ
リング(図示せずにて下方に押圧された円筒6を試料保
持部材4の上面に当接させなければならない。
However, in such an apparatus, in order to return the tilted sample 3 to the horizontal position, a cylinder 6 that is loosely fitted inside the cylinder body 5 and pressed downward by a spring (not shown) is connected to the sample holding member 4. It must be in contact with the top surface.

そのため装置全体が複雑化且つ三重筒を形成するため、
装置の小型には限界がある。
As a result, the entire device becomes complicated and a triple tube is formed.
There is a limit to the small size of the device.

本発明は斯かる欠点を解決することを目的とするもので
、以下図面に基づき詳説する。
The present invention aims to solve these drawbacks, and will be explained in detail below with reference to the drawings.

第2図は本発明の一実施例を示す断面図、第3図は第1
図のA−A断面図であり、7は試料筒である。
FIG. 2 is a sectional view showing one embodiment of the present invention, and FIG. 3 is a cross-sectional view showing one embodiment of the present invention.
It is an AA sectional view of the figure, and 7 is a sample tube.

該試料筒7は試料室内に移動可能に配置された試料移動
台(図示せず)に着脱自在に保持され、又該試料筒の下
部には球面状(又は円錐状)に形成された受部8が形成
してあり、該受部8には前記球面と対応する球面を有す
る試料保持部材9が回動可能に係合している。
The sample tube 7 is detachably held on a sample moving table (not shown) movably arranged in the sample chamber, and a spherical (or conical) receiving part is provided at the bottom of the sample tube. 8 is formed, and a sample holding member 9 having a spherical surface corresponding to the spherical surface is rotatably engaged with the receiving portion 8.

該試料保持部材9内には試料台10を介して試料11が
保持されており、この試料11は前記球面の中心に位置
するように配置されている。
A sample 11 is held within the sample holding member 9 via a sample stage 10, and this sample 11 is arranged so as to be located at the center of the spherical surface.

前記試料筒7の受部8の部分にバネ性をもたせるために
4つのスリ割12a乃至12dが試料筒の軸心を中心に
して90度おきに形成してあり、これによシ試料筒7と
試料保持部材9との間のガタをなくすることができる。
In order to impart springiness to the receiving portion 8 of the sample tube 7, four slots 12a to 12d are formed at 90 degree intervals around the axis of the sample tube. It is possible to eliminate looseness between the sample holding member 9 and the sample holding member 9.

13a及び13bは前記試料保持部材9に植設された傾
斜軸で、該両傾斜軸の軸心X及びyは試料筒7の中心上
で直交し、且つ前記試料を含む平面内又はそれに近接し
た平面内におかれている。
13a and 13b are inclined shafts installed in the sample holding member 9, and the axes X and y of both inclined axes are orthogonal to each other on the center of the sample cylinder 7, and are located within or close to the plane containing the sample. placed within a plane.

又該6傾斜軸13at13bの先端は前記スリ割12a
t12b内に夫々突出している。
Further, the tip of the six inclined shafts 13at13b is connected to the slot 12a.
They each protrude into t12b.

該突出した各傾斜軸13a及び13bには矩形状の案内
片14a及び14bが回動且つ移動可能に取シ付けであ
る。
Rectangular guide pieces 14a and 14b are rotatably and movably attached to each of the protruding inclined shafts 13a and 13b.

該案内片14aは第4図に示すようにピン15a、15
bを介して板体16aに回動自在に保授されており、又
他方の案内片14bも同様に板体16bにピン15c、
15aを介して回動自在に保持されている。
The guide piece 14a is connected to pins 15a, 15 as shown in FIG.
The other guide piece 14b is also rotatably supported on the plate 16a via the pin 15c,
It is rotatably held via 15a.

前記ピン15a及び15bの軸心は傾斜軸13aの軸心
Xと直交し且つ傾斜軸13bの軸心yと平行な直線上に
おかれ、他方のピン15c及び15dの軸心は傾斜軸1
3bの軸心yと直行し且つ傾斜軸13aの軸心Xと平行
な直線上におかれる。
The axes of the pins 15a and 15b are placed on a straight line that is perpendicular to the axis X of the tilting shaft 13a and parallel to the axis y of the tilting shaft 13b, and the axes of the other pins 15c and 15d are aligned with the axis X of the tilting shaft 13b.
3b and parallel to the axis X of the tilting shaft 13a.

前記板体16a及び1’6bはビス等を介して試料筒7
の上部に移動可能に挿入された駆動棒17a及び17b
に夫々固定されている。
The plates 16a and 1'6b are connected to the sample tube 7 via screws etc.
Drive rods 17a and 17b movably inserted into the upper part of the
are fixed respectively.

該一方の駆動棒17aの軸心は試料筒7の中心及び傾斜
軸13aの軸心Xを含む平面内におかれており、又他方
の駆動棒17bは試料筒7の中心及び傾斜軸13bの軸
心yを含む平面内におかれており、又各駆動棒はスプリ
ング18a。
The axial center of one of the drive rods 17a is located within a plane that includes the center of the sample cylinder 7 and the axis X of the tilting shaft 13a, and the other drive rod 17b is located within a plane that includes the center of the sample cylinder 7 and the axis X of the tilting shaft 13b. It is placed in a plane containing the axis y, and each drive rod is provided with a spring 18a.

18b(18bは図示せず)によシ常に第1図中紙面に
対して上方に押圧されており、更に各駆動棒の側面には
棒19at 19b(19bは図示せず)が植設しであ
る。
18b (18b is not shown) is constantly pressed upward with respect to the plane of the paper in FIG. be.

斯かる装置において、図示外の駆動機構によシ棒19a
を第1図中上下に移動させれば、駆動棒17a及び板体
16aを介して案内片14aが同方向に移動するため、
傾斜軸13aを介して試料保持部材9が傾斜軸13bの
軸心yを中心にして傾動する。
In such a device, a driving mechanism (not shown) drives the rod 19a.
If the guide piece 14a is moved up and down in FIG. 1, the guide piece 14a moves in the same direction via the drive rod 17a and the plate 16a.
The sample holding member 9 is tilted about the axis y of the tilting shaft 13b via the tilting shaft 13a.

又他方の棒19bを上下に移動させれば、駆動棒17b
及び板体16bを介して案内片14bが同方向に移動す
るため、傾斜軸13bを介して試料保持部材9が傾斜軸
13aの軸心Xを中心にして傾動する。
Also, if the other rod 19b is moved up and down, the drive rod 17b
Since the guide piece 14b moves in the same direction via the plate body 16b, the sample holding member 9 tilts about the axis X of the tilting shaft 13a via the tilting shaft 13b.

その結果この試料保持部材9内の試料11が同方向に傾
動するため、該試料を光軸に対して任意方向に且つ任意
角度傾斜させることかできる。
As a result, the sample 11 in the sample holding member 9 is tilted in the same direction, so that the sample can be tilted in any direction and at any angle with respect to the optical axis.

以上詳述したように本発明においては試料保持部材の傾
動に際し第1図で示す従来装置のように押圧力を加える
駆動体を試料保持部材の上面に設けることなく、その側
方に設けであるため、試料筒の試料保持部材を保持して
いる部分の外径を非常に小さくすることができる。
As detailed above, in the present invention, when the sample holding member is tilted, the driving body that applies a pressing force is not provided on the upper surface of the sample holding member, as in the conventional device shown in FIG. 1, but is provided on the side thereof. Therefore, the outer diameter of the portion of the sample tube that holds the sample holding member can be made very small.

従って対物レンズの上磁極片の穴径が非常に小さい高分
解能磁極片内に組み込むことができる。
Therefore, the objective lens can be incorporated into a high-resolution magnetic pole piece in which the hole diameter of the upper magnetic pole piece is very small.

又試料を水平に復帰させるためのスプリングによシ押圧
された部材等を不要とすることができるため、構造を簡
素化することができる等、実用性大なる効果を有する。
In addition, since a member pressed by a spring for returning the sample to the horizontal position is not necessary, the structure can be simplified, which has great practical effects.

尚前述の説明は本発明の例示であり、実施にあたっては
幾多の変形が考えられる。
It should be noted that the above description is an illustration of the present invention, and many modifications can be made in implementing the present invention.

例えば前述の説明では押棒に連結されだ各板体16at
16bと試料保持部材9との連結手段として傾斜軸13
at13b及び案内片16a。
For example, in the above explanation, each plate 16at is connected to the push rod.
16b and the sample holding member 9.
at13b and guide piece 16a.

16bを用いたが、これに限定されることなく、第5図
に示すように試料保持部材9側に円錐状の溝20(又は
突起)を設ける共に板体17a側にボールや棒等の突起
21(又は溝)を設けてもよい。
16b, but the present invention is not limited to this, and as shown in FIG. 21 (or a groove) may be provided.

この場合板体17aは板バネ等によね常に試料保持部材
9側に押圧させる必要がある。
In this case, the plate 17a must be constantly pressed against the sample holding member 9 by a plate spring or the like.

又、試料筒を上下に分割して光軸方向における試料位置
を変化させるように構成することも可能である。
It is also possible to configure the sample tube to be divided into upper and lower sections to change the sample position in the optical axis direction.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来装置を説明するだめの断面図、第2図は本
発明の一実施例を示す断面図、第3図及び第4図は第2
図のA−A断面図及びB−B矢視図、第5図は本発明の
他の実施例を示す断面図である。 第2図乃至第4図において、7は試料筒、8は受面、9
は試料保持部材、11は試料、12a乃至12dはスリ
割、13a及び13bは傾斜軸、14a及び14bは案
内片、15a乃 15dはピン−116a及び16bは
板体、17a及び17bは駆動棒、18a及び18bは
スプリング、19a及び19bは棒である。
FIG. 1 is a sectional view for explaining a conventional device, FIG. 2 is a sectional view showing an embodiment of the present invention, and FIGS. 3 and 4 are sectional views for explaining a conventional device.
The AA sectional view and the BB arrow sectional view in the figure, and FIG. 5 are sectional views showing other embodiments of the present invention. In Figures 2 to 4, 7 is a sample tube, 8 is a receiving surface, and 9 is a sample tube.
is a sample holding member, 11 is a sample, 12a to 12d are slots, 13a and 13b are inclined shafts, 14a and 14b are guide pieces, 15a to 15d are pins, 116a and 16b are plates, 17a and 17b are drive rods, 18a and 18b are springs, and 19a and 19b are rods.

Claims (1)

【特許請求の範囲】 1 試料筒の下部に設けられた球状の受は部と、該受は
部に保持された試料保持部材とを備えた装置において、
前記試料筒の長手方向に沿って該筒壁の互いに略直角を
なす位置に設けられた2つの切り欠き部と、該切り欠き
部の各々に沿って移動可能に設けられた第1.第2の駆
動杆と、該第1第2の駆動杆の移動を前記試料保持部材
の回転に変換するため、該第1.第2の駆動杆の先端部
と該試料保持部材の略試料面の延長上にある側部とを係
合するだめの手段と、該両駆動杆を移動させるだめの手
段とを具備することを特徴とする電子顕微鏡等における
試料傾斜装置。 2 前記切り欠き部が試料を保持する部分に設けられた
スリ割りとなっている特許請求の範囲第1項記載の電子
顕微鏡等における試料傾斜装置。
[Scope of Claims] 1. An apparatus comprising a spherical receiver provided at the lower part of a sample tube and a sample holding member held by the receiver,
Two notches are provided along the longitudinal direction of the sample cylinder at positions substantially perpendicular to each other on the cylinder wall, and a first cutout is provided movably along each of the notches. a second drive rod, and the first and second drive rods in order to convert movement of the first and second drive rods into rotation of the sample holding member; Means for engaging the tip of the second driving rod and a side portion of the sample holding member that is substantially on an extension of the sample surface, and means for moving both driving rods. Features: Specimen tilting device for electron microscopes, etc. 2. A sample tilting device for an electron microscope or the like according to claim 1, wherein the notch is a slit provided in a portion that holds a sample.
JP1648879A 1979-02-15 1979-02-15 Sample tilting device for electron microscopes, etc. Expired JPS593022B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1648879A JPS593022B2 (en) 1979-02-15 1979-02-15 Sample tilting device for electron microscopes, etc.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1648879A JPS593022B2 (en) 1979-02-15 1979-02-15 Sample tilting device for electron microscopes, etc.

Publications (2)

Publication Number Publication Date
JPS55109355A JPS55109355A (en) 1980-08-22
JPS593022B2 true JPS593022B2 (en) 1984-01-21

Family

ID=11917668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1648879A Expired JPS593022B2 (en) 1979-02-15 1979-02-15 Sample tilting device for electron microscopes, etc.

Country Status (1)

Country Link
JP (1) JPS593022B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6389317U (en) * 1986-11-29 1988-06-10

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6389317U (en) * 1986-11-29 1988-06-10

Also Published As

Publication number Publication date
JPS55109355A (en) 1980-08-22

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