JPS5930052A - 内部欠陥検査装置 - Google Patents
内部欠陥検査装置Info
- Publication number
- JPS5930052A JPS5930052A JP13984782A JP13984782A JPS5930052A JP S5930052 A JPS5930052 A JP S5930052A JP 13984782 A JP13984782 A JP 13984782A JP 13984782 A JP13984782 A JP 13984782A JP S5930052 A JPS5930052 A JP S5930052A
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- infrared
- coil
- temperature
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title claims description 37
- 238000007689 inspection Methods 0.000 title claims description 10
- 239000000945 filler Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 9
- 239000004020 conductor Substances 0.000 description 6
- 238000012360 testing method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000007769 metal material Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13984782A JPS5930052A (ja) | 1982-08-13 | 1982-08-13 | 内部欠陥検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13984782A JPS5930052A (ja) | 1982-08-13 | 1982-08-13 | 内部欠陥検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5930052A true JPS5930052A (ja) | 1984-02-17 |
| JPH0213737B2 JPH0213737B2 (enExample) | 1990-04-05 |
Family
ID=15254907
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13984782A Granted JPS5930052A (ja) | 1982-08-13 | 1982-08-13 | 内部欠陥検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5930052A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1069430A1 (de) * | 1999-07-16 | 2001-01-17 | Mtu Motoren- Und Turbinen-Union MàNchen Gmbh | Verfahren und Vorrichtung zum Nachweis von Fehlern in metallischen Bauteilen |
| JP2017507487A (ja) * | 2014-02-06 | 2017-03-16 | シーメンス アクチエンゲゼルシヤフトSiemens Aktiengesellschaft | インダクタ |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50120679A (enExample) * | 1974-03-07 | 1975-09-22 |
-
1982
- 1982-08-13 JP JP13984782A patent/JPS5930052A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50120679A (enExample) * | 1974-03-07 | 1975-09-22 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1069430A1 (de) * | 1999-07-16 | 2001-01-17 | Mtu Motoren- Und Turbinen-Union MàNchen Gmbh | Verfahren und Vorrichtung zum Nachweis von Fehlern in metallischen Bauteilen |
| JP2017507487A (ja) * | 2014-02-06 | 2017-03-16 | シーメンス アクチエンゲゼルシヤフトSiemens Aktiengesellschaft | インダクタ |
| US10217560B2 (en) | 2014-02-06 | 2019-02-26 | Siemens Aktiengesellschaft | Inductor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0213737B2 (enExample) | 1990-04-05 |
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