JPS5930052A - 内部欠陥検査装置 - Google Patents

内部欠陥検査装置

Info

Publication number
JPS5930052A
JPS5930052A JP13984782A JP13984782A JPS5930052A JP S5930052 A JPS5930052 A JP S5930052A JP 13984782 A JP13984782 A JP 13984782A JP 13984782 A JP13984782 A JP 13984782A JP S5930052 A JPS5930052 A JP S5930052A
Authority
JP
Japan
Prior art keywords
inspected
infrared
coil
temperature
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13984782A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0213737B2 (enExample
Inventor
Takashi Nakanishi
孝 中西
Hisakazu Kato
久和 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Avionics Co Ltd
Original Assignee
Nippon Avionics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Avionics Co Ltd filed Critical Nippon Avionics Co Ltd
Priority to JP13984782A priority Critical patent/JPS5930052A/ja
Publication of JPS5930052A publication Critical patent/JPS5930052A/ja
Publication of JPH0213737B2 publication Critical patent/JPH0213737B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/72Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP13984782A 1982-08-13 1982-08-13 内部欠陥検査装置 Granted JPS5930052A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13984782A JPS5930052A (ja) 1982-08-13 1982-08-13 内部欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13984782A JPS5930052A (ja) 1982-08-13 1982-08-13 内部欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS5930052A true JPS5930052A (ja) 1984-02-17
JPH0213737B2 JPH0213737B2 (enExample) 1990-04-05

Family

ID=15254907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13984782A Granted JPS5930052A (ja) 1982-08-13 1982-08-13 内部欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS5930052A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1069430A1 (de) * 1999-07-16 2001-01-17 Mtu Motoren- Und Turbinen-Union MàœNchen Gmbh Verfahren und Vorrichtung zum Nachweis von Fehlern in metallischen Bauteilen
JP2017507487A (ja) * 2014-02-06 2017-03-16 シーメンス アクチエンゲゼルシヤフトSiemens Aktiengesellschaft インダクタ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50120679A (enExample) * 1974-03-07 1975-09-22

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50120679A (enExample) * 1974-03-07 1975-09-22

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1069430A1 (de) * 1999-07-16 2001-01-17 Mtu Motoren- Und Turbinen-Union MàœNchen Gmbh Verfahren und Vorrichtung zum Nachweis von Fehlern in metallischen Bauteilen
JP2017507487A (ja) * 2014-02-06 2017-03-16 シーメンス アクチエンゲゼルシヤフトSiemens Aktiengesellschaft インダクタ
US10217560B2 (en) 2014-02-06 2019-02-26 Siemens Aktiengesellschaft Inductor

Also Published As

Publication number Publication date
JPH0213737B2 (enExample) 1990-04-05

Similar Documents

Publication Publication Date Title
US6585146B2 (en) Automated non-destructive weld evaluation method and apparatus
JP6474343B2 (ja) 渦電流探傷検査装置のプローブ及び渦電流探傷検査装置
US20040120383A1 (en) Non-destructive testing system and method using current flow thermography
JP2016501376A (ja) サーモグラフィを用いた試料の検査方法およびシステム
US4302678A (en) Fluorescent standard for scanning devices
JP4140218B2 (ja) レーザー溶接部の検査方法及びその装置
CN116559236A (zh) 一种焊接工件缺陷检测方法及装置
US6340817B1 (en) Inspection method for unpopulated printed circuit boards
US6343874B1 (en) Method for the inspection of a part by thermal imaging
US3629584A (en) Method and apparatus for the nondestructive testing of materials
JP3944068B2 (ja) 鋼板の突き合わせ溶接部の検査方法
JPS5930052A (ja) 内部欠陥検査装置
US5747989A (en) Apparatus for non-destructively detecting a nugget for spot welding
CN204945069U (zh) 一种浮空器囊体材料热合检测装置
TW200409914A (en) Method and device for the detection of defective printed circuit board blanks
JPH05296956A (ja) 表面探傷装置
JPH0552816A (ja) パルス式渦流探傷用内挿型プローブ
US4191920A (en) Instrument for detecting contamination on metallic surfaces by measuring surface potential differences
JP2008016778A (ja) 半導体検査装置および半導体検査方法
JP2529851B2 (ja) 高熱伝導性薄板の熱拡散率測定方法およびその装置
CN112197693A (zh) 一种点焊焊核形态的检测装置及方法
JPS61230053A (ja) 非接触剥離検査装置
JP2007163263A (ja) 渦電流探傷センサ
JPH05118822A (ja) プリント配線基板とその評価方法
JPH0339644A (ja) 探傷方法および探傷装置