JPH0213737B2 - - Google Patents

Info

Publication number
JPH0213737B2
JPH0213737B2 JP57139847A JP13984782A JPH0213737B2 JP H0213737 B2 JPH0213737 B2 JP H0213737B2 JP 57139847 A JP57139847 A JP 57139847A JP 13984782 A JP13984782 A JP 13984782A JP H0213737 B2 JPH0213737 B2 JP H0213737B2
Authority
JP
Japan
Prior art keywords
coil
inspected
infrared
temperature
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57139847A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5930052A (ja
Inventor
Takashi Nakanishi
Hisakazu Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Avionics Co Ltd
Original Assignee
Nippon Avionics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Avionics Co Ltd filed Critical Nippon Avionics Co Ltd
Priority to JP13984782A priority Critical patent/JPS5930052A/ja
Publication of JPS5930052A publication Critical patent/JPS5930052A/ja
Publication of JPH0213737B2 publication Critical patent/JPH0213737B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP13984782A 1982-08-13 1982-08-13 内部欠陥検査装置 Granted JPS5930052A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13984782A JPS5930052A (ja) 1982-08-13 1982-08-13 内部欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13984782A JPS5930052A (ja) 1982-08-13 1982-08-13 内部欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS5930052A JPS5930052A (ja) 1984-02-17
JPH0213737B2 true JPH0213737B2 (enExample) 1990-04-05

Family

ID=15254907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13984782A Granted JPS5930052A (ja) 1982-08-13 1982-08-13 内部欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS5930052A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19933446C1 (de) * 1999-07-16 2001-03-22 Mtu Muenchen Gmbh Verfahren und Vorrichtung zum Nachweis von Fehlern in metallischen Bauteilen
DE102014202128A1 (de) * 2014-02-06 2015-08-06 Siemens Aktiengesellschaft Induktor

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50120679A (enExample) * 1974-03-07 1975-09-22

Also Published As

Publication number Publication date
JPS5930052A (ja) 1984-02-17

Similar Documents

Publication Publication Date Title
JP6474343B2 (ja) 渦電流探傷検査装置のプローブ及び渦電流探傷検査装置
US5161413A (en) Apparatus and method for guided inspection of an object
EP0775917A2 (en) Superconducting quantum interference device fluxmeter and nondestructive inspection apparatus
CN110514734B (zh) 一种复合磁场磁光成像无损检测系统及方法
US3873830A (en) Method and apparatus for monitoring the quality of welds in seamed tubes
US5434506A (en) Eddy current inspection with stationary magnetic fields and scanning sensor arrays
Trimm An overview of nondestructive evaluation methods
JP2008175638A (ja) 構造材の欠陥検出装置及び方法
US6343874B1 (en) Method for the inspection of a part by thermal imaging
JPH0213737B2 (enExample)
JP3944068B2 (ja) 鋼板の突き合わせ溶接部の検査方法
US3629584A (en) Method and apparatus for the nondestructive testing of materials
CN109764800A (zh) 一种基于涡流热成像阵列的管道腐蚀壁厚检测系统
JPH05296956A (ja) 表面探傷装置
JPH0552816A (ja) パルス式渦流探傷用内挿型プローブ
CN210626394U (zh) 一种复合磁场磁光成像无损检测系统
JP2004077426A (ja) 駆動用ベルトの欠陥検査方法
KR200204290Y1 (ko) 와전류탐상장치의 자계발생기
US20130088707A1 (en) Method and system for crack detection
RU2304766C1 (ru) Способ неразрушающего контроля состояния объекта
JP2005164438A (ja) 遠隔誘導型交流電位を用いた非破壊検査装置
JP2007163263A (ja) 渦電流探傷センサ
Chaia et al. C-Scan Eddy Current Magneto-Optical Imaging Defect Detection System
Joubert et al. A linear magneto-optical imager for non-destructive evaluation
JPH0510893A (ja) 異材金属境界部の判定方法