JPS5925726A - 診断用観測装置 - Google Patents

診断用観測装置

Info

Publication number
JPS5925726A
JPS5925726A JP57134330A JP13433082A JPS5925726A JP S5925726 A JPS5925726 A JP S5925726A JP 57134330 A JP57134330 A JP 57134330A JP 13433082 A JP13433082 A JP 13433082A JP S5925726 A JPS5925726 A JP S5925726A
Authority
JP
Japan
Prior art keywords
coil
coils
compensation
pickup
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57134330A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0334929B2 (OSRAM
Inventor
高木　幹雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57134330A priority Critical patent/JPS5925726A/ja
Publication of JPS5925726A publication Critical patent/JPS5925726A/ja
Publication of JPH0334929B2 publication Critical patent/JPH0334929B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring And Recording Apparatus For Diagnosis (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
  • Measuring Magnetic Variables (AREA)
JP57134330A 1982-07-31 1982-07-31 診断用観測装置 Granted JPS5925726A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57134330A JPS5925726A (ja) 1982-07-31 1982-07-31 診断用観測装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57134330A JPS5925726A (ja) 1982-07-31 1982-07-31 診断用観測装置

Publications (2)

Publication Number Publication Date
JPS5925726A true JPS5925726A (ja) 1984-02-09
JPH0334929B2 JPH0334929B2 (OSRAM) 1991-05-24

Family

ID=15125806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57134330A Granted JPS5925726A (ja) 1982-07-31 1982-07-31 診断用観測装置

Country Status (1)

Country Link
JP (1) JPS5925726A (OSRAM)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04357481A (ja) * 1991-05-13 1992-12-10 Hoxan Corp スクイドを用いた磁気雑音除去装置
JP2001281311A (ja) * 2000-03-28 2001-10-10 Mti:Kk 外乱磁界キャンセル装置
JP2007170880A (ja) * 2005-12-20 2007-07-05 Yokogawa Electric Corp 磁場検出装置
JP2009216424A (ja) * 2008-03-07 2009-09-24 Kobe Steel Ltd 磁石位置測定方法および磁場測定装置
JP2012215499A (ja) * 2011-04-01 2012-11-08 Seiko Epson Corp 磁場測定装置、磁場測定システムおよび磁場測定方法
JP2015087228A (ja) * 2013-10-30 2015-05-07 Tdk株式会社 磁界検出装置
JP2015212715A (ja) * 2015-08-26 2015-11-26 セイコーエプソン株式会社 磁場測定装置、磁場測定システムおよび磁場測定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53112468U (OSRAM) * 1977-02-15 1978-09-07

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53112468U (OSRAM) * 1977-02-15 1978-09-07

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04357481A (ja) * 1991-05-13 1992-12-10 Hoxan Corp スクイドを用いた磁気雑音除去装置
JP2001281311A (ja) * 2000-03-28 2001-10-10 Mti:Kk 外乱磁界キャンセル装置
JP2007170880A (ja) * 2005-12-20 2007-07-05 Yokogawa Electric Corp 磁場検出装置
JP2009216424A (ja) * 2008-03-07 2009-09-24 Kobe Steel Ltd 磁石位置測定方法および磁場測定装置
JP2012215499A (ja) * 2011-04-01 2012-11-08 Seiko Epson Corp 磁場測定装置、磁場測定システムおよび磁場測定方法
US9024634B2 (en) 2011-04-01 2015-05-05 Seiko Epson Corporation Magnetic field measurement apparatus, magnetic field measurement system and magnetic field measurement method
US9958514B2 (en) 2011-04-01 2018-05-01 Seiko Epson Corporation Magnetic field measurement apparatus, magnetic field measurement system and magnetic field measurement method
JP2015087228A (ja) * 2013-10-30 2015-05-07 Tdk株式会社 磁界検出装置
JP2015212715A (ja) * 2015-08-26 2015-11-26 セイコーエプソン株式会社 磁場測定装置、磁場測定システムおよび磁場測定方法

Also Published As

Publication number Publication date
JPH0334929B2 (OSRAM) 1991-05-24

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