JPS59224546A - 欠陥検出装置 - Google Patents

欠陥検出装置

Info

Publication number
JPS59224546A
JPS59224546A JP9988583A JP9988583A JPS59224546A JP S59224546 A JPS59224546 A JP S59224546A JP 9988583 A JP9988583 A JP 9988583A JP 9988583 A JP9988583 A JP 9988583A JP S59224546 A JPS59224546 A JP S59224546A
Authority
JP
Japan
Prior art keywords
output
comparator
pulse
circuit
differentiation circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9988583A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0317088B2 (https=
Inventor
Satoshi Furukawa
聡 古川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP9988583A priority Critical patent/JPS59224546A/ja
Publication of JPS59224546A publication Critical patent/JPS59224546A/ja
Publication of JPH0317088B2 publication Critical patent/JPH0317088B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP9988583A 1983-06-03 1983-06-03 欠陥検出装置 Granted JPS59224546A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9988583A JPS59224546A (ja) 1983-06-03 1983-06-03 欠陥検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9988583A JPS59224546A (ja) 1983-06-03 1983-06-03 欠陥検出装置

Publications (2)

Publication Number Publication Date
JPS59224546A true JPS59224546A (ja) 1984-12-17
JPH0317088B2 JPH0317088B2 (https=) 1991-03-07

Family

ID=14259235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9988583A Granted JPS59224546A (ja) 1983-06-03 1983-06-03 欠陥検出装置

Country Status (1)

Country Link
JP (1) JPS59224546A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62161043A (ja) * 1985-11-22 1987-07-17 Eisai Co Ltd 容器に付着した汚れを検出する方法
JPS62249038A (ja) * 1986-04-22 1987-10-30 Fuji Electric Co Ltd 画像2値化処理回路
JPH0479250U (https=) * 1990-11-22 1992-07-10

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62161043A (ja) * 1985-11-22 1987-07-17 Eisai Co Ltd 容器に付着した汚れを検出する方法
JPS62249038A (ja) * 1986-04-22 1987-10-30 Fuji Electric Co Ltd 画像2値化処理回路
JPH0479250U (https=) * 1990-11-22 1992-07-10

Also Published As

Publication number Publication date
JPH0317088B2 (https=) 1991-03-07

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