JPS59224546A - 欠陥検出装置 - Google Patents
欠陥検出装置Info
- Publication number
- JPS59224546A JPS59224546A JP9988583A JP9988583A JPS59224546A JP S59224546 A JPS59224546 A JP S59224546A JP 9988583 A JP9988583 A JP 9988583A JP 9988583 A JP9988583 A JP 9988583A JP S59224546 A JPS59224546 A JP S59224546A
- Authority
- JP
- Japan
- Prior art keywords
- output
- comparator
- pulse
- circuit
- differentiation circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title claims abstract description 24
- 230000001960 triggered effect Effects 0.000 claims abstract description 7
- 230000004069 differentiation Effects 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 9
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 3
- 230000001934 delay Effects 0.000 claims description 2
- 238000005336 cracking Methods 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 11
- 239000003990 capacitor Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000003111 delayed effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- TUWJQNVAGYRRHA-UHFFFAOYSA-N Menadiol dibutyrate Chemical compound C1=CC=C2C(OC(=O)CCC)=CC(C)=C(OC(=O)CCC)C2=C1 TUWJQNVAGYRRHA-UHFFFAOYSA-N 0.000 description 1
- BWRHOYDPVJPXMF-UHFFFAOYSA-N cis-Caran Natural products C1C(C)CCC2C(C)(C)C12 BWRHOYDPVJPXMF-UHFFFAOYSA-N 0.000 description 1
- 210000004894 snout Anatomy 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Closed-Circuit Television Systems (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9988583A JPS59224546A (ja) | 1983-06-03 | 1983-06-03 | 欠陥検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9988583A JPS59224546A (ja) | 1983-06-03 | 1983-06-03 | 欠陥検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59224546A true JPS59224546A (ja) | 1984-12-17 |
| JPH0317088B2 JPH0317088B2 (enrdf_load_stackoverflow) | 1991-03-07 |
Family
ID=14259235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9988583A Granted JPS59224546A (ja) | 1983-06-03 | 1983-06-03 | 欠陥検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59224546A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62161043A (ja) * | 1985-11-22 | 1987-07-17 | Eisai Co Ltd | 容器に付着した汚れを検出する方法 |
| JPS62249038A (ja) * | 1986-04-22 | 1987-10-30 | Fuji Electric Co Ltd | 画像２値化処理回路 |
| JPH0479250U (enrdf_load_stackoverflow) * | 1990-11-22 | 1992-07-10 |
-
1983
- 1983-06-03 JP JP9988583A patent/JPS59224546A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62161043A (ja) * | 1985-11-22 | 1987-07-17 | Eisai Co Ltd | 容器に付着した汚れを検出する方法 |
| JPS62249038A (ja) * | 1986-04-22 | 1987-10-30 | Fuji Electric Co Ltd | 画像２値化処理回路 |
| JPH0479250U (enrdf_load_stackoverflow) * | 1990-11-22 | 1992-07-10 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0317088B2 (enrdf_load_stackoverflow) | 1991-03-07 |
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