JPS59222930A - 電子ビ−ム露光におけるマ−ク位置検出方法及び装置 - Google Patents
電子ビ−ム露光におけるマ−ク位置検出方法及び装置Info
- Publication number
- JPS59222930A JPS59222930A JP58095801A JP9580183A JPS59222930A JP S59222930 A JPS59222930 A JP S59222930A JP 58095801 A JP58095801 A JP 58095801A JP 9580183 A JP9580183 A JP 9580183A JP S59222930 A JPS59222930 A JP S59222930A
- Authority
- JP
- Japan
- Prior art keywords
- mark
- peak
- electron beam
- level
- detection signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 46
- 238000010894 electron beam technology Methods 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims abstract description 5
- 239000000758 substrate Substances 0.000 claims 4
- 238000010586 diagram Methods 0.000 description 6
- 235000012054 meals Nutrition 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 210000003323 beak Anatomy 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
- H01J37/3045—Object or beam position registration
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58095801A JPS59222930A (ja) | 1983-06-01 | 1983-06-01 | 電子ビ−ム露光におけるマ−ク位置検出方法及び装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58095801A JPS59222930A (ja) | 1983-06-01 | 1983-06-01 | 電子ビ−ム露光におけるマ−ク位置検出方法及び装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59222930A true JPS59222930A (ja) | 1984-12-14 |
| JPH047091B2 JPH047091B2 (enExample) | 1992-02-07 |
Family
ID=14147531
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58095801A Granted JPS59222930A (ja) | 1983-06-01 | 1983-06-01 | 電子ビ−ム露光におけるマ−ク位置検出方法及び装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59222930A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62145401A (ja) * | 1985-12-20 | 1987-06-29 | Komatsu Ltd | 無人車の誘導装置 |
| JPS62156817A (ja) * | 1985-12-28 | 1987-07-11 | Advantest Corp | 電子ビ−ム露光装置のマ−ク検出器 |
| JPS62298114A (ja) * | 1986-06-18 | 1987-12-25 | Hitachi Ltd | 電子ビ−ム露光装置におけるマ−ク位置検出装置 |
-
1983
- 1983-06-01 JP JP58095801A patent/JPS59222930A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62145401A (ja) * | 1985-12-20 | 1987-06-29 | Komatsu Ltd | 無人車の誘導装置 |
| JPS62156817A (ja) * | 1985-12-28 | 1987-07-11 | Advantest Corp | 電子ビ−ム露光装置のマ−ク検出器 |
| JPS62298114A (ja) * | 1986-06-18 | 1987-12-25 | Hitachi Ltd | 電子ビ−ム露光装置におけるマ−ク位置検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH047091B2 (enExample) | 1992-02-07 |
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