JPS59222901A - Method of producing ceramic electronic part - Google Patents

Method of producing ceramic electronic part

Info

Publication number
JPS59222901A
JPS59222901A JP58098552A JP9855283A JPS59222901A JP S59222901 A JPS59222901 A JP S59222901A JP 58098552 A JP58098552 A JP 58098552A JP 9855283 A JP9855283 A JP 9855283A JP S59222901 A JPS59222901 A JP S59222901A
Authority
JP
Japan
Prior art keywords
solder
ceramic electronic
electronic part
plating film
producing ceramic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58098552A
Other languages
Japanese (ja)
Other versions
JPH0145961B2 (en
Inventor
高岡 祐一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP58098552A priority Critical patent/JPS59222901A/en
Publication of JPS59222901A publication Critical patent/JPS59222901A/en
Publication of JPH0145961B2 publication Critical patent/JPH0145961B2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は正特性サーミスタやコンデンサなどのセラミッ
ク電子部品の製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing ceramic electronic components such as positive temperature coefficient thermistors and capacitors.

従来この種のセラミック電子部品においては、NiやC
u等の無電解メッキ膜を電極として付与1゛ることが行
なわれている。ところがこのメッキ膜は、通常電極とし
ての安定性を得るために熱処理されることが多い。とこ
ろがろメッキ膜を酸化雰囲気中で熱処理すると、表面が
酸化され、後のリード端子の半田付けに大与り支障とな
っていた。
Conventionally, in this type of ceramic electronic components, Ni and C
It has been practiced to apply an electroless plating film such as U as an electrode. However, this plating film is usually heat-treated in order to obtain stability as an electrode. However, when the plated film is heat-treated in an oxidizing atmosphere, the surface becomes oxidized, which greatly affects the subsequent soldering of lead terminals.

そこで実際にリード端子を半田付けする際には、強力、
なフラクツクス(Cρ系)を用いることになるが、この
フラックスは電子部品としての耐電圧レベルを著しく低
下させたり、特性を劣化させるなどの問題があった。特
に正特性サーミスタの場合の抵抗温度特性の劣化は大き
な問題となっていた。
Therefore, when actually soldering the lead terminals, use a strong
However, this flux has problems such as significantly lowering the withstand voltage level as an electronic component and deteriorating its characteristics. In particular, deterioration of resistance-temperature characteristics in the case of positive temperature coefficient thermistors has been a major problem.

この問題点に鑑み、従来、熱処理を中性あるい設備や条
件などが特殊となるため、量産的でなく、コストも高く
なるという問題があるばかりか、電子部品が正特性サー
ミスタの場合には、この雰囲気中に晒すことにより、特
性が劣化するという問題も新に生じていた。また従来で
は、メッキ膜上に、リード端子の半田付性を考慮してA
g電極を付与することも行なわれているが、高価なAg
電極の使用により、製品コストが大幅に高くなり、実用
上これも大きな問題となっていた。
In view of this problem, in the past, the heat treatment was neutral or the equipment and conditions were special, making it difficult to mass produce and increasing costs. A new problem has arisen in that the characteristics deteriorate when exposed to this atmosphere. In addition, in the past, A
G electrodes have also been added, but expensive Ag
The use of electrodes significantly increases the product cost, which is also a major problem in practice.

そこで本発明の目的は、品質がすぐれ、恒産的で安価な
セラミック電子部品を製造する方法を提供することにあ
る。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a method for manufacturing ceramic electronic components of excellent quality, constant production, and low cost.

要約すれば、本発明は、セラミック基体表面にイ」与さ
れ熱処理された無電解メッキ膜の表面を、粒状半■]に
よってω1磨し、その表面の酸化膜を除去して、その後
リード端子を半田イ」けするレラミ明づる。以下の説明
では、セラミック単体として、ヂタン酸バリウム系半導
体基体を用いている。
In summary, the present invention polishes the surface of an electroless plating film that has been irradiated and heat-treated on the surface of a ceramic substrate by ω1 polishing with granular semi-finish, removes the oxide film on the surface, and then attaches the lead terminals. Akizuru Relami kicks Handa. In the following description, a barium ditanate-based semiconductor substrate is used as the ceramic element.

第1図はセラミック単体1の両平面にNiの無電解メッ
キ膜2,2を付与した状態が示されている。
FIG. 1 shows a state in which electroless Ni plating films 2, 2 are applied to both surfaces of a ceramic unit 1.

このメッキ膜2,2はセラミック基体1にオーミック接
触さけるため、300℃程度の温度で熱処理さ爪 図Zのように、酸化膜層(Ni Ox >  3.3が
形成材 せず)に研磨財とともに収納する。この研磨材は約0.
1〜2.5μm程度の粒径を有する粒状半田が基体1を
取り出す。取り出したセラミック基体は、第3図示のよ
うに、Niの酸化膜層3,3がrtll Ia材として
の粒状半田によって研削除去され、代りに粒状半田がN
iメッキ膜2,2上に残存した状態で4.4のように付
着されている。これは、研磨材としての粒状半田が、こ
すられている間に付着されるのである。またNiメッキ
膜2,2は、研磨されることによりその表面は粗面化さ
れる。
In order to avoid ohmic contact with the ceramic substrate 1, the plating films 2, 2 are heat-treated at a temperature of about 300°C. As shown in the nail diagram Z, an abrasive material is added to the oxide film layer (NiOx > 3.3 is not a forming material). Store with. This abrasive is approximately 0.
Particulate solder having a particle size of about 1 to 2.5 μm takes out the base body 1 . As shown in Figure 3, the taken out ceramic substrate has the Ni oxide film layers 3, 3 removed by grinding with the granular solder as the rtll Ia material, and the granular solder is replaced with N.
It is attached as shown in 4.4 while remaining on the i-plated films 2, 2. This is because the granular solder, which acts as an abrasive, is attached during rubbing. Further, the surfaces of the Ni plating films 2, 2 are roughened by being polished.

その後、第4図に示すように半田4,4が残存11着さ
れているNiメッキ膜2,2上にリード端子5.5を当
接し、新な半田により半田イ」けされる。この半田付け
は、たとえば溶融半田中への浸油により行なわれる。こ
の場合、N1メッキ膜2,2上に残存付着されていた半
田4.4は、当然溶融して新な半田中に混在されること
になるが、この際新な半田の付着性を良くする作用をも
つ。このことから研磨材としての半田と新な半田とは、
できるだり同質のものを用いることが望ましい。第4図
においては、リード端子5,5とNiメッキ膜2,2と
の間に半田4.4が介在されているように示しているが
、これは研磨により残存した半田により、リード端子5
,5が直接N1メッキ膜上に当接されるのが■げられる
ためである。これによればリード端子5.5が、実質的
に半田中に埋設されたようになるため、リード端子5.
5の固着強度が大きくなる。なおこのような状態は、残
存する半田の量を加減することによって容易に得られる
Thereafter, as shown in FIG. 4, the lead terminals 5.5 are brought into contact with the Ni plating films 2, 2 on which the remaining 11 pieces of solder 4, 4 are attached, and soldered with new solder. This soldering is performed, for example, by dipping oil into molten solder. In this case, the solder 4.4 remaining on the N1 plating films 2, 2 will naturally melt and be mixed into the new solder, but at this time, it is necessary to improve the adhesion of the new solder. It has an effect. From this, solder as an abrasive material and new solder are
It is desirable to use one that is available or of the same quality. In FIG. 4, solder 4.4 is shown to be interposed between the lead terminals 5, 5 and the Ni plating films 2, 2, but this is due to the solder remaining after polishing.
, 5 are prevented from coming into direct contact with the N1 plating film. According to this, the lead terminals 5.5 are essentially buried in the solder, so the lead terminals 5.5.
The fixation strength of No. 5 increases. Note that such a state can be easily obtained by adjusting the amount of remaining solder.

上記の実施例では、セラミック基体として半導体基体を
用いたもので示したが、その他の誘電体等であってもよ
く、またメッキ膜の材質や研磨の手段等も任意に選定さ
れる。
In the above embodiment, a semiconductor substrate is used as the ceramic substrate, but other dielectric materials may be used, and the material of the plating film, the polishing method, etc. can be arbitrarily selected.

以上のように本発明セラミック電子部品の製造方法にお
いては、メッキ膜上の酸化膜層を粒状半田によって研削
除去する工程を加えることにより、リード端子の半田付
けをフラックスを用いることなく良好に行なえ、特性の
安定なものが得られるのである。また本発明では、研磨
によりメッキ膜が粗面化されるので、リード端子の接着
強度が向上するばかりか、高価なAgの使用も必要でな
く、安価で省資源をも促せる等、実用上の効果は人さい
As described above, in the method for manufacturing ceramic electronic components of the present invention, by adding the step of polishing and removing the oxide film layer on the plating film with granular solder, the lead terminals can be soldered well without using flux. This makes it possible to obtain products with stable characteristics. In addition, in the present invention, since the surface of the plating film is roughened by polishing, it not only improves the adhesive strength of the lead terminal, but also eliminates the need for the use of expensive Ag, making it possible to save resources at low cost. The effect is human.

【図面の簡単な説明】[Brief explanation of drawings]

第1図〜第4図は本発明の製造過程を示づいずれも側断
面図である。 1・・・・・・セラミック基体、2・・・・・・メッキ
膜3・・・・・・酸化膜層、4・・・・・・半田5・・
・・・・リード端子 特  許  出  願  人 株式会社村田製作所
1 to 4 are side sectional views showing the manufacturing process of the present invention. 1...Ceramic base, 2...Plating film 3...Oxide film layer, 4...Solder 5...
...Lead terminal patent applicant Murata Manufacturing Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 表面に無電解メッキ膜を付与したセラミック基体を熱処
理した後、粒状半田によって前記メッキ膜の表面を研磨
除去し、その後、このメッキ股上にリード端子を半田付
けしてなることを特徴とするセラミック電子部品の製造
方法。
A ceramic electronic device characterized in that a ceramic substrate having an electroless plating film applied to its surface is heat-treated, the surface of the plating film is polished off with granular solder, and then a lead terminal is soldered to the top of the plating. How the parts are manufactured.
JP58098552A 1983-06-01 1983-06-01 Method of producing ceramic electronic part Granted JPS59222901A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58098552A JPS59222901A (en) 1983-06-01 1983-06-01 Method of producing ceramic electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58098552A JPS59222901A (en) 1983-06-01 1983-06-01 Method of producing ceramic electronic part

Publications (2)

Publication Number Publication Date
JPS59222901A true JPS59222901A (en) 1984-12-14
JPH0145961B2 JPH0145961B2 (en) 1989-10-05

Family

ID=14222847

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58098552A Granted JPS59222901A (en) 1983-06-01 1983-06-01 Method of producing ceramic electronic part

Country Status (1)

Country Link
JP (1) JPS59222901A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62205615A (en) * 1986-03-05 1987-09-10 株式会社村田製作所 Metallization of ceramics

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62205615A (en) * 1986-03-05 1987-09-10 株式会社村田製作所 Metallization of ceramics

Also Published As

Publication number Publication date
JPH0145961B2 (en) 1989-10-05

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