JPS59222774A - 発光素子用試験装置 - Google Patents

発光素子用試験装置

Info

Publication number
JPS59222774A
JPS59222774A JP9851983A JP9851983A JPS59222774A JP S59222774 A JPS59222774 A JP S59222774A JP 9851983 A JP9851983 A JP 9851983A JP 9851983 A JP9851983 A JP 9851983A JP S59222774 A JPS59222774 A JP S59222774A
Authority
JP
Japan
Prior art keywords
light
light receiving
light emitting
receiving element
emitting element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9851983A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0429987B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Koji Morimoto
森本　紘二
Shigeyuki Nitsuta
仁田　重之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Shin Nihon Denko Co Ltd
Original Assignee
Mitsubishi Electric Corp
Shin Nihon Denko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp, Shin Nihon Denko Co Ltd filed Critical Mitsubishi Electric Corp
Priority to JP9851983A priority Critical patent/JPS59222774A/ja
Publication of JPS59222774A publication Critical patent/JPS59222774A/ja
Publication of JPH0429987B2 publication Critical patent/JPH0429987B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP9851983A 1983-06-02 1983-06-02 発光素子用試験装置 Granted JPS59222774A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9851983A JPS59222774A (ja) 1983-06-02 1983-06-02 発光素子用試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9851983A JPS59222774A (ja) 1983-06-02 1983-06-02 発光素子用試験装置

Publications (2)

Publication Number Publication Date
JPS59222774A true JPS59222774A (ja) 1984-12-14
JPH0429987B2 JPH0429987B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-05-20

Family

ID=14221896

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9851983A Granted JPS59222774A (ja) 1983-06-02 1983-06-02 発光素子用試験装置

Country Status (1)

Country Link
JP (1) JPS59222774A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62169064A (ja) * 1986-01-21 1987-07-25 Chino Corp 光半導体試験装置
JPS62274274A (ja) * 1986-05-23 1987-11-28 Chino Corp 光半導体素子試験装置
JPS63281078A (ja) * 1987-05-13 1988-11-17 Daito Denshi Kogyo Kk 半導体素子のエ−ジング検査装置
JPH0199071U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1987-12-23 1989-07-03
JPH06317629A (ja) * 1993-05-10 1994-11-15 Sumitomo Electric Ind Ltd 半導体レーザのエージング方法およびエージング用ボード
EP0628830A3 (en) * 1993-06-11 1995-11-22 Sumitomo Electric Industries Device for reliability testing of semiconductor lasers.
JP2008128935A (ja) * 2006-11-24 2008-06-05 Mitsubishi Electric Corp バーイン装置槽内ラック

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4511434Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1966-06-04 1970-05-21
JPS5128190A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-07-01 1976-03-09 Snam Progetti
JPS5184372U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-12-27 1976-07-06
JPS5311959U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1976-07-12 1978-01-31
JPS5641272U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1979-09-05 1981-04-16

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4511434Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1966-06-04 1970-05-21
JPS5128190A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-07-01 1976-03-09 Snam Progetti
JPS5184372U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-12-27 1976-07-06
JPS5311959U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1976-07-12 1978-01-31
JPS5641272U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1979-09-05 1981-04-16

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62169064A (ja) * 1986-01-21 1987-07-25 Chino Corp 光半導体試験装置
JPS62274274A (ja) * 1986-05-23 1987-11-28 Chino Corp 光半導体素子試験装置
JPS63281078A (ja) * 1987-05-13 1988-11-17 Daito Denshi Kogyo Kk 半導体素子のエ−ジング検査装置
JPH0199071U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1987-12-23 1989-07-03
JPH06317629A (ja) * 1993-05-10 1994-11-15 Sumitomo Electric Ind Ltd 半導体レーザのエージング方法およびエージング用ボード
EP0628830A3 (en) * 1993-06-11 1995-11-22 Sumitomo Electric Industries Device for reliability testing of semiconductor lasers.
JP2008128935A (ja) * 2006-11-24 2008-06-05 Mitsubishi Electric Corp バーイン装置槽内ラック

Also Published As

Publication number Publication date
JPH0429987B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-05-20

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