JPS59217936A - 大気圧イオン化質量分析計 - Google Patents

大気圧イオン化質量分析計

Info

Publication number
JPS59217936A
JPS59217936A JP59083723A JP8372384A JPS59217936A JP S59217936 A JPS59217936 A JP S59217936A JP 59083723 A JP59083723 A JP 59083723A JP 8372384 A JP8372384 A JP 8372384A JP S59217936 A JPS59217936 A JP S59217936A
Authority
JP
Japan
Prior art keywords
gas
atmospheric pressure
mass spectrometer
concentration
carrier gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59083723A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0115985B2 (https=
Inventor
Hideki Kanbara
秀記 神原
Yasuhiro Mitsui
泰裕 三井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59083723A priority Critical patent/JPS59217936A/ja
Publication of JPS59217936A publication Critical patent/JPS59217936A/ja
Publication of JPH0115985B2 publication Critical patent/JPH0115985B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP59083723A 1984-04-27 1984-04-27 大気圧イオン化質量分析計 Granted JPS59217936A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59083723A JPS59217936A (ja) 1984-04-27 1984-04-27 大気圧イオン化質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59083723A JPS59217936A (ja) 1984-04-27 1984-04-27 大気圧イオン化質量分析計

Publications (2)

Publication Number Publication Date
JPS59217936A true JPS59217936A (ja) 1984-12-08
JPH0115985B2 JPH0115985B2 (https=) 1989-03-22

Family

ID=13810431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59083723A Granted JPS59217936A (ja) 1984-04-27 1984-04-27 大気圧イオン化質量分析計

Country Status (1)

Country Link
JP (1) JPS59217936A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01311554A (ja) * 1988-06-10 1989-12-15 Hitachi Ltd プラズマイオン化質量分析計

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01311554A (ja) * 1988-06-10 1989-12-15 Hitachi Ltd プラズマイオン化質量分析計

Also Published As

Publication number Publication date
JPH0115985B2 (https=) 1989-03-22

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