JPS59211283A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS59211283A JPS59211283A JP8615083A JP8615083A JPS59211283A JP S59211283 A JPS59211283 A JP S59211283A JP 8615083 A JP8615083 A JP 8615083A JP 8615083 A JP8615083 A JP 8615083A JP S59211283 A JPS59211283 A JP S59211283A
- Authority
- JP
- Japan
- Prior art keywords
- negative
- resistance
- negative resistance
- oscillation
- junction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 13
- 230000005684 electric field Effects 0.000 claims abstract description 5
- 230000010355 oscillation Effects 0.000 abstract description 9
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 2
- 235000019227 E-number Nutrition 0.000 description 1
- 239000004243 E-number Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Lasers (AREA)
Abstract
Description
【発明の詳細な説明】 本発明は半導体装置に関する。[Detailed description of the invention] The present invention relates to a semiconductor device.
従来のI′I¥1幌、発振、演鋤゛装置の多くは複雑な
回路を構成することか必要であり、又動作周波数もあま
り高くなかった。本発明はこれらの欠点に対処するもの
である。Most of the conventional I'I\1-fold, oscillation, and operation devices require the construction of complicated circuits, and their operating frequencies are not very high. The present invention addresses these shortcomings.
本発明は、半導体P、N接合に逆方向高電界をかけた場
合、雪崩現象によって印加高電界に垂直な方向に負抵抗
を生じる世故を有する半導体装置である。The present invention is a semiconductor device that has the disadvantage that when a reverse high electric field is applied to a semiconductor P, N junction, negative resistance occurs in a direction perpendicular to the applied high electric field due to an avalanche phenomenon.
以下実施例につき図面に従って説明する。Examples will be described below with reference to the drawings.
第1図はノリコン半導体P、N接合の接合面を平面接合
としP型半導体部分に設けた2個の平行なEWL4−5
間に負抵抗を有するようにしである。更に電極6を設は
負抵抗をより効果的に起すようにしである。Figure 1 shows two parallel EWL4-5s provided in the P-type semiconductor part, with the junction surfaces of the Noricon semiconductor P and N junctions as planar junctions.
This is done so that there is a negative resistance between them. Furthermore, the electrode 6 is provided to more effectively generate negative resistance.
第2図は、上に述べた実施例による回路例を示し、2個
の等しい抵抗R+を端子8−9間に並列に連結すること
にまり印加高電界に垂直な方向に存在する負抵抗及び発
振、双安定状態等の負抵抗、による特性を得ている。FIG. 2 shows an example of a circuit according to the embodiment described above, in which two equal resistors R+ are connected in parallel between terminals 8-9, resulting in a negative resistance and Characteristics due to negative resistance such as oscillation and bistable state are obtained.
第3図は、端子8−9間に存在する負抵抗(−1(N)
に並列に存在する正抵抗Rpを示し両抵抗による作用は
次に示すようになる。Figure 3 shows the negative resistance (-1 (N)) that exists between terminals 8 and 9.
shows a positive resistance Rp existing in parallel with , and the action of both resistances is as shown below.
P−N接合における雪崩現象によって生じた電流■か増
加するに従い負抵抗(−R,N )の絶対値RNは瀘少
し、正抵抗Rpと同じ値(RN =R,p)になったと
き双安定状態が生じ端子8及び9の電圧は正又は負の値
をとる。なおこの状態においては、第4図に示すように
電極12゜13を設けることによりフリップフロップと
しても作用させることができる。As the current ■ generated by the avalanche phenomenon in the P-N junction increases, the absolute value RN of the negative resistance (-R, N) decreases, and when it reaches the same value as the positive resistance Rp (RN = R, p), it becomes double. A stable state occurs and the voltage at terminals 8 and 9 assumes a positive or negative value. In this state, it can also function as a flip-flop by providing electrodes 12 and 13 as shown in FIG.
更に電流■が増加すると、負抵抗(−RN)の絶対値R
Nは正抵抗R,pより小さくなり(RN<Rp)発振可
能な状態が生じる。When the current ■ further increases, the absolute value R of the negative resistance (-RN)
N becomes smaller than the positive resistances R and p (RN<Rp), and a state in which oscillation is possible occurs.
以上の実施例において、E==78’Vて雪崩更。In the above example, the avalanche occurred at E==78'V.
象か開始される試料について、R+=IKΩ、R2=a
oonのときE= 11.8’V、 I = 5.3
m Aで双寄定吠0[シか開始され、双安定状態にお
ける端子8−9間の電圧はEの増加に伴ってlOVから
1.7Vまて、端子8−9を短絡したときの電流は2.
5 Ill Aから4.4 m Aまで増加した。更に
E= 137 V、’ = 10.8 +n Aで発振
状態か生じ、発振出力約20…W、効率約10%、最高
発振局e数約259ME1zが得られた。For the sample that starts with an electric current, R+=IKΩ, R2=a
When oon, E = 11.8'V, I = 5.3
m is 2.
5 Ill A increased to 4.4 mA. Furthermore, an oscillation state occurred at E=137 V, '=10.8 +n A, and an oscillation output of about 20 W, an efficiency of about 10%, and a maximum oscillation station e number of about 259 ME1z were obtained.
以上に述・\たように本発明によると従来まり簡単な回
路で色批抗による双安定、発振等の動作を高周波で行う
ことができる。As described above, according to the present invention, operations such as bistable, oscillating, etc. due to color contrast can be performed at high frequencies with a conventionally simple circuit.
第1図は実施例の斜視図、第2図は実施例による回路図
、第3図は負抵抗と正抵抗の関係図、第4図はフリップ
フロップの実施例である。
I P型半導体部分、2 N型半導体部分、3 、、、
P −N接合境界線、4,5,6,7,12゜13
電極、8,9,10,11..14.15・・・端子、
16・電源、R3,R2,R11,RN、 Rp ・抵
抗。FIG. 1 is a perspective view of an embodiment, FIG. 2 is a circuit diagram of the embodiment, FIG. 3 is a relationship diagram between negative resistance and positive resistance, and FIG. 4 is an embodiment of a flip-flop. I P-type semiconductor portion, 2 N-type semiconductor portion, 3.
P-N junction boundary line, 4, 5, 6, 7, 12゜13
Electrode, 8, 9, 10, 11. .. 14.15...terminal,
16・Power supply, R3, R2, R11, RN, Rp・Resistance.
Claims (1)
電界に垂直な方向の負抵抗を有する半導体装置。A semiconductor device having a negative resistance in a direction perpendicular to an applied reverse high electric field due to an avalanche event at a semiconductor PN junction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8615083A JPS59211283A (en) | 1983-05-16 | 1983-05-16 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8615083A JPS59211283A (en) | 1983-05-16 | 1983-05-16 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59211283A true JPS59211283A (en) | 1984-11-30 |
Family
ID=13878703
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8615083A Pending JPS59211283A (en) | 1983-05-16 | 1983-05-16 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59211283A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1987003426A1 (en) * | 1985-11-28 | 1987-06-04 | Tatsuji Masuda | Semiconductor device |
US5229636A (en) * | 1987-09-01 | 1993-07-20 | Tatsuji Masuda | Negative effective mass semiconductor device and circuit |
WO1999003204A1 (en) * | 1997-07-08 | 1999-01-21 | Tatsuji Masuda | Sr flip flop |
US8525553B1 (en) | 2012-04-30 | 2013-09-03 | Hewlett-Packard Development Company, L.P. | Negative differential resistance comparator circuits |
-
1983
- 1983-05-16 JP JP8615083A patent/JPS59211283A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1987003426A1 (en) * | 1985-11-28 | 1987-06-04 | Tatsuji Masuda | Semiconductor device |
US5229636A (en) * | 1987-09-01 | 1993-07-20 | Tatsuji Masuda | Negative effective mass semiconductor device and circuit |
WO1999003204A1 (en) * | 1997-07-08 | 1999-01-21 | Tatsuji Masuda | Sr flip flop |
US6239638B1 (en) | 1997-07-08 | 2001-05-29 | Tatsuji Masuda | SR flip flop |
US8525553B1 (en) | 2012-04-30 | 2013-09-03 | Hewlett-Packard Development Company, L.P. | Negative differential resistance comparator circuits |
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