JPS59211283A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS59211283A
JPS59211283A JP8615083A JP8615083A JPS59211283A JP S59211283 A JPS59211283 A JP S59211283A JP 8615083 A JP8615083 A JP 8615083A JP 8615083 A JP8615083 A JP 8615083A JP S59211283 A JPS59211283 A JP S59211283A
Authority
JP
Japan
Prior art keywords
negative
resistance
negative resistance
oscillation
junction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8615083A
Other languages
Japanese (ja)
Inventor
Tatsuji Masuda
増田 達治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP8615083A priority Critical patent/JPS59211283A/en
Publication of JPS59211283A publication Critical patent/JPS59211283A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To enable to operate bistable oscillation in a high frequency with negative resistance in a simple circuit by providing a vertical negative resistor in an applied reverse high electric field by avalanche phenomenon in a semiconductor P-N junction. CONSTITUTION:Silicon semiconductor P-N junction surfaces are planely bonded, a negative resistor is provided between two parallel electrodes 4 and 5 provided in a P type semiconductor section, an electrode 6 is further provided to effectively produce the negative resistance. For example, two equal resistors R1 are connected in parallel between terminals 8 and 9, thereby obtaining characteristics of negative resistance existing in a vertical direction to the applied high electric field and negative resistance of oscillation, bistable state. As a current I generated by an avalanche phenomenon is increased in the P-N junction, the absolute value RN of negative resistance (-RN) is reduced, and when becoming the same value as the positive resistance RP, bistable state is produced, and the voltages of the terminals 8, 9 are positive or negative. When the current I further increases, the absolute value RN of the negative resistance (-R) becomes smaller than the positive resistance RP, and oscillation possible state is produced.

Description

【発明の詳細な説明】 本発明は半導体装置に関する。[Detailed description of the invention] The present invention relates to a semiconductor device.

従来のI′I¥1幌、発振、演鋤゛装置の多くは複雑な
回路を構成することか必要であり、又動作周波数もあま
り高くなかった。本発明はこれらの欠点に対処するもの
である。
Most of the conventional I'I\1-fold, oscillation, and operation devices require the construction of complicated circuits, and their operating frequencies are not very high. The present invention addresses these shortcomings.

本発明は、半導体P、N接合に逆方向高電界をかけた場
合、雪崩現象によって印加高電界に垂直な方向に負抵抗
を生じる世故を有する半導体装置である。
The present invention is a semiconductor device that has the disadvantage that when a reverse high electric field is applied to a semiconductor P, N junction, negative resistance occurs in a direction perpendicular to the applied high electric field due to an avalanche phenomenon.

以下実施例につき図面に従って説明する。Examples will be described below with reference to the drawings.

第1図はノリコン半導体P、N接合の接合面を平面接合
としP型半導体部分に設けた2個の平行なEWL4−5
間に負抵抗を有するようにしである。更に電極6を設は
負抵抗をより効果的に起すようにしである。
Figure 1 shows two parallel EWL4-5s provided in the P-type semiconductor part, with the junction surfaces of the Noricon semiconductor P and N junctions as planar junctions.
This is done so that there is a negative resistance between them. Furthermore, the electrode 6 is provided to more effectively generate negative resistance.

第2図は、上に述べた実施例による回路例を示し、2個
の等しい抵抗R+を端子8−9間に並列に連結すること
にまり印加高電界に垂直な方向に存在する負抵抗及び発
振、双安定状態等の負抵抗、による特性を得ている。
FIG. 2 shows an example of a circuit according to the embodiment described above, in which two equal resistors R+ are connected in parallel between terminals 8-9, resulting in a negative resistance and Characteristics due to negative resistance such as oscillation and bistable state are obtained.

第3図は、端子8−9間に存在する負抵抗(−1(N)
に並列に存在する正抵抗Rpを示し両抵抗による作用は
次に示すようになる。
Figure 3 shows the negative resistance (-1 (N)) that exists between terminals 8 and 9.
shows a positive resistance Rp existing in parallel with , and the action of both resistances is as shown below.

P−N接合における雪崩現象によって生じた電流■か増
加するに従い負抵抗(−R,N )の絶対値RNは瀘少
し、正抵抗Rpと同じ値(RN =R,p)になったと
き双安定状態が生じ端子8及び9の電圧は正又は負の値
をとる。なおこの状態においては、第4図に示すように
電極12゜13を設けることによりフリップフロップと
しても作用させることができる。
As the current ■ generated by the avalanche phenomenon in the P-N junction increases, the absolute value RN of the negative resistance (-R, N) decreases, and when it reaches the same value as the positive resistance Rp (RN = R, p), it becomes double. A stable state occurs and the voltage at terminals 8 and 9 assumes a positive or negative value. In this state, it can also function as a flip-flop by providing electrodes 12 and 13 as shown in FIG.

更に電流■が増加すると、負抵抗(−RN)の絶対値R
Nは正抵抗R,pより小さくなり(RN<Rp)発振可
能な状態が生じる。
When the current ■ further increases, the absolute value R of the negative resistance (-RN)
N becomes smaller than the positive resistances R and p (RN<Rp), and a state in which oscillation is possible occurs.

以上の実施例において、E==78’Vて雪崩更。In the above example, the avalanche occurred at E==78'V.

象か開始される試料について、R+=IKΩ、R2=a
oonのときE= 11.8’V、  I = 5.3
 m Aで双寄定吠0[シか開始され、双安定状態にお
ける端子8−9間の電圧はEの増加に伴ってlOVから
1.7Vまて、端子8−9を短絡したときの電流は2.
5 Ill Aから4.4 m Aまで増加した。更に
E= 137 V、’ = 10.8 +n Aで発振
状態か生じ、発振出力約20…W、効率約10%、最高
発振局e数約259ME1zが得られた。
For the sample that starts with an electric current, R+=IKΩ, R2=a
When oon, E = 11.8'V, I = 5.3
m is 2.
5 Ill A increased to 4.4 mA. Furthermore, an oscillation state occurred at E=137 V, '=10.8 +n A, and an oscillation output of about 20 W, an efficiency of about 10%, and a maximum oscillation station e number of about 259 ME1z were obtained.

以上に述・\たように本発明によると従来まり簡単な回
路で色批抗による双安定、発振等の動作を高周波で行う
ことができる。
As described above, according to the present invention, operations such as bistable, oscillating, etc. due to color contrast can be performed at high frequencies with a conventionally simple circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は実施例の斜視図、第2図は実施例による回路図
、第3図は負抵抗と正抵抗の関係図、第4図はフリップ
フロップの実施例である。 I P型半導体部分、2 N型半導体部分、3 、、、
 P −N接合境界線、4,5,6,7,12゜13 
電極、8,9,10,11..14.15・・・端子、
16・電源、R3,R2,R11,RN、 Rp ・抵
抗。
FIG. 1 is a perspective view of an embodiment, FIG. 2 is a circuit diagram of the embodiment, FIG. 3 is a relationship diagram between negative resistance and positive resistance, and FIG. 4 is an embodiment of a flip-flop. I P-type semiconductor portion, 2 N-type semiconductor portion, 3.
P-N junction boundary line, 4, 5, 6, 7, 12゜13
Electrode, 8, 9, 10, 11. .. 14.15...terminal,
16・Power supply, R3, R2, R11, RN, Rp・Resistance.

Claims (1)

【特許請求の範囲】[Claims] 半導体P−N接合における雪崩事象による印加逆方向高
電界に垂直な方向の負抵抗を有する半導体装置。
A semiconductor device having a negative resistance in a direction perpendicular to an applied reverse high electric field due to an avalanche event at a semiconductor PN junction.
JP8615083A 1983-05-16 1983-05-16 Semiconductor device Pending JPS59211283A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8615083A JPS59211283A (en) 1983-05-16 1983-05-16 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8615083A JPS59211283A (en) 1983-05-16 1983-05-16 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS59211283A true JPS59211283A (en) 1984-11-30

Family

ID=13878703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8615083A Pending JPS59211283A (en) 1983-05-16 1983-05-16 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS59211283A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1987003426A1 (en) * 1985-11-28 1987-06-04 Tatsuji Masuda Semiconductor device
US5229636A (en) * 1987-09-01 1993-07-20 Tatsuji Masuda Negative effective mass semiconductor device and circuit
WO1999003204A1 (en) * 1997-07-08 1999-01-21 Tatsuji Masuda Sr flip flop
US8525553B1 (en) 2012-04-30 2013-09-03 Hewlett-Packard Development Company, L.P. Negative differential resistance comparator circuits

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1987003426A1 (en) * 1985-11-28 1987-06-04 Tatsuji Masuda Semiconductor device
US5229636A (en) * 1987-09-01 1993-07-20 Tatsuji Masuda Negative effective mass semiconductor device and circuit
WO1999003204A1 (en) * 1997-07-08 1999-01-21 Tatsuji Masuda Sr flip flop
US6239638B1 (en) 1997-07-08 2001-05-29 Tatsuji Masuda SR flip flop
US8525553B1 (en) 2012-04-30 2013-09-03 Hewlett-Packard Development Company, L.P. Negative differential resistance comparator circuits

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