JPS59184534A - エ−ジング装置 - Google Patents

エ−ジング装置

Info

Publication number
JPS59184534A
JPS59184534A JP58057814A JP5781483A JPS59184534A JP S59184534 A JPS59184534 A JP S59184534A JP 58057814 A JP58057814 A JP 58057814A JP 5781483 A JP5781483 A JP 5781483A JP S59184534 A JPS59184534 A JP S59184534A
Authority
JP
Japan
Prior art keywords
aging
loading
electrode
power supply
handling cover
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58057814A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0429989B2 (enExample
Inventor
Tatsuo Hayashida
林田　辰雄
Takeshi Fukushiro
福代　毅
Ryuichi Takagi
隆一 高木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58057814A priority Critical patent/JPS59184534A/ja
Publication of JPS59184534A publication Critical patent/JPS59184534A/ja
Publication of JPH0429989B2 publication Critical patent/JPH0429989B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P95/80—

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58057814A 1983-04-04 1983-04-04 エ−ジング装置 Granted JPS59184534A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58057814A JPS59184534A (ja) 1983-04-04 1983-04-04 エ−ジング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58057814A JPS59184534A (ja) 1983-04-04 1983-04-04 エ−ジング装置

Publications (2)

Publication Number Publication Date
JPS59184534A true JPS59184534A (ja) 1984-10-19
JPH0429989B2 JPH0429989B2 (enExample) 1992-05-20

Family

ID=13066384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58057814A Granted JPS59184534A (ja) 1983-04-04 1983-04-04 エ−ジング装置

Country Status (1)

Country Link
JP (1) JPS59184534A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61123982U (enExample) * 1985-01-23 1986-08-04
JPS6363779U (enExample) * 1986-10-15 1988-04-27

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS441520Y1 (enExample) * 1966-05-13 1969-01-21
JPS56131476U (enExample) * 1980-03-06 1981-10-06
JPS5872672U (ja) * 1981-11-11 1983-05-17 日本電気株式会社 加速寿命試験装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS441520Y1 (enExample) * 1966-05-13 1969-01-21
JPS56131476U (enExample) * 1980-03-06 1981-10-06
JPS5872672U (ja) * 1981-11-11 1983-05-17 日本電気株式会社 加速寿命試験装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61123982U (enExample) * 1985-01-23 1986-08-04
JPS6363779U (enExample) * 1986-10-15 1988-04-27

Also Published As

Publication number Publication date
JPH0429989B2 (enExample) 1992-05-20

Similar Documents

Publication Publication Date Title
KR100852620B1 (ko) 전자소자의 온도 신뢰성 테스트장치
JPH1131724A (ja) サーモチャック及び回路板検査装置
JPS59184534A (ja) エ−ジング装置
CN111551839B (zh) 半导体存储器高低温老化测试设备
WO2003014753A2 (en) Methods and apparatus for testing a semiconductor with temperature desoak
JPH07111995B2 (ja) プローブ装置
JP2003008275A (ja) 電子機器の冷却構造及びその冷却方式
US20050269308A1 (en) Ergonomic, rotatable electronic component testing apparatus
JP2008170179A (ja) オートハンドラ
CN119394029A (zh) 一种燃料电池测试用温控炉
JP2740387B2 (ja) 環境試験装置
JP3339607B2 (ja) Ｉｃ試験装置
JPH01158372A (ja) プローブ装置
JP2000162269A (ja) 電子部品試験装置
CN218158208U (zh) 一种半导体分立器件高、低温测试装置
CN207839198U (zh) 一种半导体控温离心器
JPS58196025A (ja) 半導体等のエ−ジング装置
CN222283336U (zh) 一种摄像模组高温测试治具及装置
RU2129745C1 (ru) Термоэлектрический холодильник для хроматографа
CN223092086U (zh) 一种集成电路封装检测装置
JPS637629B2 (enExample)
CN223179115U (zh) 冷却装置
CN221926512U (zh) 一种光电子器件用测试设备
TWI881515B (zh) 溫控結構、測試機構及作業設備
CN221977074U (zh) 一种动力电池测试辅助装置