JPS59175751A - Resin seal type semiconductor device - Google Patents

Resin seal type semiconductor device

Info

Publication number
JPS59175751A
JPS59175751A JP58050844A JP5084483A JPS59175751A JP S59175751 A JPS59175751 A JP S59175751A JP 58050844 A JP58050844 A JP 58050844A JP 5084483 A JP5084483 A JP 5084483A JP S59175751 A JPS59175751 A JP S59175751A
Authority
JP
Japan
Prior art keywords
resin
semiconductor device
specular
marks
crape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58050844A
Other languages
Japanese (ja)
Inventor
Ryuichiro Mori
隆一郎 森
Toru Tachikawa
立川 透
Toshinobu Banjo
番條 敏信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP58050844A priority Critical patent/JPS59175751A/en
Publication of JPS59175751A publication Critical patent/JPS59175751A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/544Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54406Marks applied to semiconductor devices or parts comprising alphanumeric information
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54413Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54473Marks applied to semiconductor devices or parts for use after dicing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544Marks applied to semiconductor devices or parts
    • H01L2223/54473Marks applied to semiconductor devices or parts for use after dicing
    • H01L2223/54486Located on package parts, e.g. encapsulation, leads, package substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)

Abstract

PURPOSE:To increase the adhesive strength of ink, and to prevent the disappearance of marks for displaying quality by forming a smooth surface and a crape surface to the outer surface of a resin and shaping these marks on the smooth surface when the marks are put on the resin seal surface of a semiconductor element by a laser-marking method or a bar code. CONSTITUTION:When a large number of leads 3 for external connection are sealed by using a resin 1 while being projected to the outside, a die for a resin seal, sections thereof corresponding to the upper surface and side end surfaces of the resin 1 are formed to a crape shape through electrical discharge machining and a lower surface thereof is formed to a specular shape through grinding machining, is used. Printed marks 2 are formed on the crape surface of the upper surface obtained by the die, and bar codes 5 are marked to the specular surface 4 of the lower surface through a laser-marking method. Accordingly, beams perform irregular reflection only at the code sections 5 when beams are irradiated to the specular surface 4, and informations are read positively. That is, a process in which the specular surface is generated at the same time as the resin sealing and the process for forming specular surface again is omitted.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は樹脂封止形半導体装置に係り、特にその封止
樹脂表面の品種などの表示方式の改良に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a resin-sealed semiconductor device, and particularly to an improvement in the display method of the type of the surface of the sealing resin.

〔従来技術〕[Prior art]

第1図は従来から広く用いられている樹脂封止形半導体
装置の一例の外形を示し、第1図(a)はその平面図、
第1図(b)は側面図、第1図(C)は下面図である。
FIG. 1 shows the outline of an example of a conventionally widely used resin-sealed semiconductor device, and FIG. 1(a) is a plan view thereof;
FIG. 1(b) is a side view, and FIG. 1(C) is a bottom view.

図において、(1)は封止樹脂で、その全表面は、放電
加工などによって梨地状になされた樹脂封止用金型に対
応した梨地面をなしている。(2)はこの封止樹脂(1
)の表面□に印写されたマークで、マーク用インクで印
刷されており、当該樹脂封止形半導体装置の品槙名、ロ
ット番号などを示す。
In the figure, (1) is a sealing resin, the entire surface of which has a satin finish corresponding to a mold for resin sealing, which is made into a satin finish by electric discharge machining or the like. (2) is this sealing resin (1
) is printed on the surface □ with marking ink, and indicates the product name, lot number, etc. of the resin-sealed semiconductor device.

(3)は外部接続用リードである。(3) is a lead for external connection.

第1図(こ示したような樹脂封止形半導体装置では、全
表面が梨地面であるので、これを成形する樹脂封止用金
型が、全表面を鏡面(平滑面)の樹脂封止形半導体装置
を得るために全面を研磨加工によって鏡面状にした樹脂
封止金型に比して金型製作費用が安いこと、更には、樹
脂表面でのインク密着強度が大きく、マーク(2)が消
えにくいことなどの利点がある反面、次のような問題点
があった0 すなわち、封止づd脂(1)の表面にマーク(2)を印
刷するマーキング工程は、通常樹脂封止形半導体装置の
組立て工程の最後におかれるので、樹脂封止工程終了後
、マーキング工程までの間は、樹脂封止形半41本装置
は外観からたりではどの品種名。
Figure 1 (In the resin-sealed semiconductor device shown here, the entire surface is a matte surface, so the resin encapsulation mold for molding it has a mirror-like (smooth surface) resin encapsulation on the entire surface. In order to obtain a shaped semiconductor device, the manufacturing cost of the mold is lower than that of a resin-sealed mold whose entire surface is polished to a mirror-like finish, and furthermore, the adhesion strength of the ink to the resin surface is greater, and the mark (2) is obtained. Although it has the advantage of being difficult to erase, it does have the following problems. Namely, the marking process of printing the mark (2) on the surface of the sealing resin (1) is usually used for resin sealing. Since it is installed at the end of the semiconductor device assembly process, after the resin encapsulation process is completed and before the marking process, the resin encapsulation type semi-41 unit is not known based on its appearance.

ロット番号のものか区別できない。従って、組立て工程
の自動化を行うGこは、樹脂封止形半導体装置にライン
管理用マークとして品種名、ロット番号などの情報を印
したマークを刻印し、そのマークを自動読取することか
不可欠であるが、前記表面梨地の樹脂封止形半導体装置
では、−〔の梨地表面で生じる照明光の乱反射のため、
刻印したマークを光学的像により自動読取することは困
難であった。
I can't tell if it's a lot number or not. Therefore, in order to automate the assembly process, it is essential to imprint a mark with information such as the product name and lot number on the resin-encapsulated semiconductor device as a line management mark, and to automatically read the mark. However, in the resin-sealed semiconductor device with a matte surface, -[because of the diffuse reflection of the illumination light that occurs on the matte surface,
It has been difficult to automatically read the engraved marks using optical images.

〔発明の概要〕 この発明は以上のような問題を解決するためになされた
もので、制止樹脂の表面の一部に鏡面部分を設け、この
部分に上記マーク全刻印することによって、樹脂封止形
半導体装置の組立て工程の自動化のための自動読取の可
能なマークを有する樹脂封止形半導体装置を提供するも
のである。
[Summary of the Invention] This invention was made to solve the above-mentioned problems, and by providing a mirror surface part on a part of the surface of the restraining resin and fully imprinting the above marks on this part, the resin sealing The present invention provides a resin-sealed semiconductor device having an automatically readable mark for automating the assembly process of the semiconductor device.

〔発明の実施例〕[Embodiments of the invention]

第2図はこの発明の一実施例の外形を示し、第2図(a
)はその平面図、第2図(’b)は側面図、第2図(C
)は下面図である。この実施例では封止樹脂+11の上
面および側端面は放電加工によって梨地状になされた樹
脂封止用金型に対応した梨地面になっているが、下面(
4)のみは研磨加工によって鏡面状になされた樹脂封止
用金型に対応した鏡面になっている。そして、この実施
例ではこの鏡面状の下面(4)にレーザ・マーキング法
によって、バーコード(5)が刻印されている。
FIG. 2 shows the outline of an embodiment of the present invention, and FIG.
) is its plan view, Figure 2 ('b) is its side view, Figure 2 (C
) is a bottom view. In this example, the upper surface and side end surfaces of the sealing resin +11 have a satin finish corresponding to the resin sealing mold, which is made into a satin finish by electrical discharge machining, but the bottom surface (
Only 4) has a mirror surface that corresponds to a resin sealing mold that has been made into a mirror surface by polishing. In this embodiment, a bar code (5) is engraved on this mirror-like lower surface (4) by a laser marking method.

このような構成にすれは、下面(4)の鏡面状部と刻印
されたバーコード(5)の部分とでは表面状態が著しく
異なっており、この下面(4)に光を照射したとき乱反
射をするのはバー2−ド(5)の部分のみであるから、
バーコード(5)の情報は容易に読みとることができる
。従って、バーコード(5)を品種名。
The reason for this structure is that the mirror surface of the lower surface (4) and the engraved barcode (5) have significantly different surface conditions, which causes diffuse reflection when light is irradiated onto the lower surface (4). Since it is only the bar 2-bird (5) that needs to be done,
The information on the barcode (5) can be easily read. Therefore, the barcode (5) is the variety name.

ロット番号などの製造ライン管理用マークとして用いれ
ば、樹脂封止形半導体装置の組立て工程を自動化するの
に不可欠な情報を自動的に読み取り可能な形で提供でき
る。また、封止樹脂の表面を一部を除いて梨地状とした
ので、全面を鏡面状にする場合よシも対土用金型の製作
費用を安価にでき、かつ、マーク(2)が消え難いとい
う利点を保持させることができる。
If used as a manufacturing line management mark such as a lot number, information essential for automating the assembly process of resin-sealed semiconductor devices can be provided in an automatically readable form. In addition, since the surface of the sealing resin has a matte finish except for a part, the manufacturing cost of the soil mold can be reduced even when the entire surface is mirror-finished, and the mark (2) disappears. It is possible to maintain the advantage that it is difficult.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、この発明になる樹脂封止形半導体
装置では、封止樹脂表面の一部を鏡面状に、他の部分を
梨地状とし、上記鏡面状の部分に例えば、レーザ・マー
キング法で所要情報を示すバーコードを刻印したので、
樹脂封止形半導体装置の組立て工程の自動化に、このバ
ーコードを自動読み取って利用することができる。
As explained above, in the resin-sealed semiconductor device according to the present invention, a part of the surface of the encapsulating resin is mirror-finished, and the other part is satin-finished, and the mirror-finished part is marked, for example, with a laser marking method. I engraved a barcode showing the required information with
This barcode can be automatically read and used to automate the assembly process of resin-sealed semiconductor devices.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の樹脂封止形半導体装置の一例の外形を示
し、第1図(a)はその平面図、第1図(b)は側面図
、第1図(c)は下面図である。第2図はこの発明の一
実施例の外形を示し、第2図(a)はその平面図、第2
図(b)は側面図、第2図<c)は下面図である0 図において、(1)は封止樹脂、(2)は印刷マーク、
(3)は外部接続用リード、(4)は封止樹脂の−F面
、(6)は刻印されたバーコードである。 なお、図中同一符号は同一または相当部分を示す。 代理人  葛 野 信 −(外1名) \N 特許庁長官殿 1、事件の表示   特願昭58−50844号2・発
明の名称   樹脂封止形半導体装置3、補正をする者 5、補正の対象 明細書の発明の詳細な説明の欄 6、補正の内容 明細書をつぎのとおり訂正する。
Figure 1 shows the outline of an example of a conventional resin-sealed semiconductor device, with Figure 1 (a) being a top view, Figure 1 (b) a side view, and Figure 1 (c) a bottom view. be. FIG. 2 shows the outline of an embodiment of the present invention, FIG. 2(a) is a plan view thereof, and FIG.
Figure (b) is a side view, and Figure 2<c) is a bottom view. In the figure, (1) is a sealing resin, (2) is a printed mark,
(3) is a lead for external connection, (4) is the −F side of the sealing resin, and (6) is an engraved bar code. Note that the same reference numerals in the figures indicate the same or corresponding parts. Agent Makoto Kuzuno - (1 other person) \N Commissioner of the Japan Patent Office 1, Indication of the case: Japanese Patent Application No. 58-50844 2, Title of the invention: Resin-encapsulated semiconductor device 3, Person making the amendment 5, Amendment Column 6 of the detailed description of the invention in the subject specification, the description of the contents of the amendment, is amended as follows.

Claims (3)

【特許請求の範囲】[Claims] (1)封止樹脂の外表面の一部を平滑面に、他の部分を
梨地面にするとともに、上記封止樹脂の外表面の平滑部
分に尚該半導体装置の品種名、製造ロット番号などの情
報を示すマークが刻印されたことをq′+徴とする樹脂
封止形半導体装置。
(1) A part of the outer surface of the encapsulating resin is smooth and the other part is a satin surface, and the smooth part of the outer surface of the encapsulating resin is also marked with the product name and manufacturing lot number of the semiconductor device. A resin-sealed semiconductor device whose q'+ mark is engraved with a mark indicating information.
(2)  マークはレーザ・マーキング法によって刻印
されたものであることを特徴とする特許請求の範囲第1
項記載の樹脂封止形半導体装置。
(2) Claim 1, characterized in that the mark is engraved by a laser marking method.
The resin-sealed semiconductor device described in Section 1.
(3)  マークはバーコードの形で刻印されているこ
とを特徴とする特許請求の範囲第1項または第2項に記
載の樹脂封止形半導体装置。
(3) The resin-sealed semiconductor device according to claim 1 or 2, wherein the mark is engraved in the form of a bar code.
JP58050844A 1983-03-26 1983-03-26 Resin seal type semiconductor device Pending JPS59175751A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58050844A JPS59175751A (en) 1983-03-26 1983-03-26 Resin seal type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58050844A JPS59175751A (en) 1983-03-26 1983-03-26 Resin seal type semiconductor device

Publications (1)

Publication Number Publication Date
JPS59175751A true JPS59175751A (en) 1984-10-04

Family

ID=12870037

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58050844A Pending JPS59175751A (en) 1983-03-26 1983-03-26 Resin seal type semiconductor device

Country Status (1)

Country Link
JP (1) JPS59175751A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4965642A (en) * 1985-04-22 1990-10-23 U.S. Philips Corporation Semiconductor device having a laser printable envelope
US5445271A (en) * 1992-11-17 1995-08-29 Kabushiki Kaisha Kakizaki Seisakusho Resin-made basket for thin sheets
WO1997020136A1 (en) * 1995-11-27 1997-06-05 Siemens Automotive Corporation Bar coding for fuel injector performance data
US6602430B1 (en) * 2000-08-18 2003-08-05 Micron Technology, Inc. Methods for finishing microelectronic device packages
WO2004055894A1 (en) * 2002-12-17 2004-07-01 Infineon Technologies Ag Integrated semiconductor module comprising an identification region
EP1478022A1 (en) * 2003-05-13 2004-11-17 Infineon Technologies AG Integrated circuit package marked with product tracking information
US7186945B2 (en) * 2003-10-15 2007-03-06 National Starch And Chemical Investment Holding Corporation Sprayable adhesive material for laser marking semiconductor wafers and dies

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4965642A (en) * 1985-04-22 1990-10-23 U.S. Philips Corporation Semiconductor device having a laser printable envelope
US5445271A (en) * 1992-11-17 1995-08-29 Kabushiki Kaisha Kakizaki Seisakusho Resin-made basket for thin sheets
WO1997020136A1 (en) * 1995-11-27 1997-06-05 Siemens Automotive Corporation Bar coding for fuel injector performance data
US6602430B1 (en) * 2000-08-18 2003-08-05 Micron Technology, Inc. Methods for finishing microelectronic device packages
WO2004055894A1 (en) * 2002-12-17 2004-07-01 Infineon Technologies Ag Integrated semiconductor module comprising an identification region
EP1478022A1 (en) * 2003-05-13 2004-11-17 Infineon Technologies AG Integrated circuit package marked with product tracking information
US7186945B2 (en) * 2003-10-15 2007-03-06 National Starch And Chemical Investment Holding Corporation Sprayable adhesive material for laser marking semiconductor wafers and dies

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