JPS59170795A - Defferential thermal or scanning calorie analysis device - Google Patents
Defferential thermal or scanning calorie analysis deviceInfo
- Publication number
- JPS59170795A JPS59170795A JP58045157A JP4515783A JPS59170795A JP S59170795 A JPS59170795 A JP S59170795A JP 58045157 A JP58045157 A JP 58045157A JP 4515783 A JP4515783 A JP 4515783A JP S59170795 A JPS59170795 A JP S59170795A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- heat
- thermal
- thermocouple
- reference material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
(イ)産業上の利用分野
この発明は、試料と熱的に安定な基準物質(Tことえば
α−アルミナ粉末)とを並べて等価な条件の下、一定速
度で加熱して、試料の吸熱・発熱に起因する試料と基準
物質との温度差もしくはエネルギ差を測定することに誹
って一定性あるいは定量分析を行なう示差熱ま1こは示
差走査熱量分析装置に関する。DETAILED DESCRIPTION OF THE INVENTION (a) Industrial application field This invention is a method of heating a sample and a thermally stable reference material (T, ie, α-alumina powder) side by side at a constant rate under equivalent conditions. The present invention relates to a differential scanning calorimeter that performs constant or quantitative analysis by measuring the temperature difference or energy difference between a sample and a reference material due to heat absorption or heat generation in the sample.
(四 従来技術
示差熱分析(DTA)は、測定しようとする試料と熱的
に安定な基準物質を並べて、温度分布の良い炉の中V一
定速度で加熱して2両者の間の温度差ΔT (iCJと
試料の温度T CC)を測定し、それを記録することに
よって、試料の熱的性8へ・測定する方法で、古くから
用いられている方性である0つまりDTAでは、加熱の
過程で試料か吸熱し1こり1発熱したとき基準物質に比
べて生じた温度のアンバランス分を検出、測定している
。−万、示差走査熱量測定(DSCIには、試料への熱
収支が厳密に温度差に比例するように検出器を工夫した
熱流型と、熱電対の下部に薄い小形のヒータを設置して
、試料が吸熱や発熱の変化を起こしtことき、らようど
その分だけ小形ヒータで熱を補償する・つまり(DTA
と同様・試料と基準物質を同時に加熱するが)9両者の
間の温興差をいつもバランスさせて零にするよう小形ヒ
ータで熱を調節する熱量補償型とがある。蕪罫皐蟇恭毒
影ところで、従来使用されていた示差熱まfコは示差走
査熱量分析装置の熱電対薄板の形状を、第5図な1いし
第8図に各々平面図および正面断面図として示す。第5
図および第6図に示すようなダンベル型の今のは、熱電
対R板と炉との間の望間が熱障壁として作用し、薄板か
ら周囲に熱か拡散し難く、また試料側と基準物質側との
熱流入通路が狭小であり・その間で熱が伝わり難い1こ
め、試料の吸発□熱に伴う熱量変化を精度良く測定でき
る。しかも熱電対薄板の重量が少なく、従ってその系の
熱容量が小さいため、一層高感度の測定を行なえること
となる。しかしその特殊な形状の1こめ、熱流束を一定
に保つことが困難であり、ま1こ機構的にみて脆いとい
う欠点がある。−万、第7図および第8図に示すような
円盤型のものは、構造的に丈夫であるが、上記のような
意味での熱障壁がなく、また′、その形状からも解るよ
うに試料の吸発熱に伴う熱量変化が基準物質側に伝わり
易い。さらに熱電対薄板の熱容量が大きく・これらの結
果、感度が低下し、定量性が失なわれるおそれがある。(4) Prior art differential thermal analysis (DTA) involves arranging the sample to be measured and a thermally stable reference material and heating them at a constant rate in a furnace with good temperature distribution. By measuring (iCJ and sample temperature TCC) and recording it, the thermal properties of the sample can be determined. It detects and measures the temperature imbalance that occurs when the sample absorbs heat during the process and generates one heat per unit compared to the reference material. The heat flow type detector is designed to be strictly proportional to the temperature difference, and a small thin heater is installed below the thermocouple to detect changes in heat absorption or heat generation in the sample. Compensate the heat with a small heater, that is, (DTA
There is also a heat compensation type that uses a small heater to adjust the heat so that the temperature difference between the two is always balanced and zero (similar to that in which the sample and reference material are heated at the same time). By the way, the shape of the thin thermocouple plate of the differential scanning calorimeter used in the conventional differential thermometer is shown in a plan view and a front cross-sectional view, respectively, in Figures 5-1 to 8. Shown as Fifth
In the current dumbbell-shaped model shown in Fig. 6 and Fig. 6, the space between the thermocouple R plate and the furnace acts as a thermal barrier, making it difficult for heat to diffuse from the thin plate to the surroundings. Since the heat inflow path to the substance side is narrow and it is difficult for heat to be transferred between them, changes in the amount of heat caused by heat absorbed by the sample can be measured with high accuracy. Moreover, since the weight of the thin thermocouple plate is small, and therefore the heat capacity of the system is small, even more sensitive measurements can be performed. However, due to its special shape, it is difficult to maintain a constant heat flux, and it is mechanically fragile. -The disk-shaped ones shown in Figures 7 and 8 are structurally strong, but they do not have a thermal barrier in the sense mentioned above, and as can be seen from their shape. Changes in heat amount due to heat absorption and absorption of the sample are easily transmitted to the reference material side. Furthermore, the heat capacity of the thermocouple thin plate is large, and as a result, sensitivity may decrease and quantitative performance may be lost.
なお9図示したもののほかにも、セラi、 2tり基板
の上に蒸着熱電対を構成したようなものもあるが、これ
は試料と基準物質との開拓温度干渉ぽ・小さいが、試料
からセラミック基板へ熱が伝わり、試料の吸発熱に伴う
熱量変化の拡散化をもたらし、その結果、感度が低下す
ることとなる。In addition to what is shown in Figure 9, there is also a type of thermocouple that is constructed by vapor deposition on a ceramic substrate, but this produces a small amount of temperature interference between the sample and the reference material. Heat is transferred to the substrate, leading to diffusion of changes in heat amount due to heat absorption and heat absorption by the sample, resulting in a decrease in sensitivity.
T、!タ 目 的
この発明は、従来技術にみられると記問題点を解決し、
高感度に、定量的に、かつ安定に熱量変化を測定でき、
しかも構造的にも強固な示差熱または示差走査熱量分析
装置を提供することを目的としてなされた。T,! Purpose This invention solves the problems described above in the prior art.
Capable of measuring changes in calorific value with high sensitivity, quantitatively, and stably.
Furthermore, the purpose of this invention was to provide a structurally strong differential thermal or differential scanning calorimetry analyzer.
に)構成
この発明は、従来装置の長所をそれぞれ合せ持つような
構成を有する。すなわち1本発明に係る示差熱おまび示
差走査熱量分析装置は・熱電対材料で成型され、左右対
称位置のいずれか一重に試料、他方に基準物質の載置部
をもつ薄板と・試料側の温度ならびに試料側と基準物質
側との温″度差を測定するための熱電対と、これらを囲
繞し試料および基準物質を加熱するtコめの炉とを備え
てなる示差熱または示差走査熱量分析装置において、前
記薄板を円盤状とするとともに、薄板面上の載置部をそ
れぞれ取り囲むように円形スリットを設け、その各スリ
ットの2個所以上に熱流入通路を形成した。ことを特徴
とする。このように薄様を円盤状とすることにより所定
の強度を確保させ、それとともに試料および基準物質の
載置部をそれぞれ取り囲むように円形スリットを設けて
それらを熱障壁とし。B) Configuration The present invention has a configuration that combines the advantages of conventional devices. In other words, the differential thermometer and differential scanning calorimeter according to the present invention include: - A thin plate molded from thermocouple material and having a mounting part for the sample on one side and a reference material on the other side at symmetrical positions; and - On the sample side. Differential heating or differential scanning calorimetry, which is equipped with a thermocouple for measuring temperature and the temperature difference between the sample side and the reference material side, and a furnace surrounding the thermocouples and heating the sample and the reference material. The analyzer is characterized in that the thin plate is disk-shaped, circular slits are provided so as to surround each mounting portion on the thin plate surface, and heat inflow passages are formed at two or more locations in each of the slits. By making the thin disk shape in this way, a predetermined strength is ensured, and at the same time, circular slits are provided to surround the sample and reference material placement areas, respectively, and these serve as thermal barriers.
かつ系の熱容量を小さくした。そして熱は・各スリット
に形成された狭小な熱流入通路を通って流れることとな
り、このため熱が伝わり難い。And the heat capacity of the system was reduced. The heat then flows through the narrow heat inflow passages formed in each slit, making it difficult for the heat to be transferred.
(ホ)実施例 つぎに、この発明の実施例について説明する。(e) Examples Next, embodiments of the invention will be described.
17回は、2示差熱分析装置の正面断面図であり・第2
図は9本発明に係る装置における薄板部分の平面図、第
3図および第4図は、それぞれ〔3−3) 、 (4−
4’ )断面図である。薄板(111は、クロメル板、
ブ2チネル板、白金板(図示のものはクロメル板)のよ
うな熱電対材料を使用して。The 17th is a front sectional view of the 2nd differential thermal analyzer.
Figure 9 is a plan view of the thin plate part in the device according to the present invention, Figures 3 and 4 are respectively [3-3) and (4-
4') is a sectional view. Thin plate (111 is chromel plate,
Using thermocouple materials such as aluminum plate, platinum plate (the one shown is chromel plate).
例えは01〜0.15mmの厚さの円盤状に成型されて
いる。そして、薄板(111の左右対称位置には。For example, it is molded into a disk shape with a thickness of 01 to 0.15 mm. And the thin plate (at the symmetrical position of 111).
試料(121および基準物質(13)の載置部04!
、 +151が設けられ、それらの載置部114i、
(151を取り囲むように円形スリット叫が配設されて
いる。円形スリブ) +161の幅は9例えばO,l−
1mm 程度とする。円形スリット(161は図示のよ
うに一重としてもまいし、二重以上としてもよい。各円
形スリットf161には2 (1,1所以上(図示のも
のは4個所)に熱17jt入通路f171を設ける。円
形スlJ 、y l−(熱障壁空間」06)および熱流
入通路(171の幅寸法は・製作時にこれをトリミング
することによって、感度およびベースラインの安定性を
調整することができる。Placement section 04 for sample (121 and reference material (13))!
, +151 are provided, and their mounting portions 114i,
(A circular slit is arranged to surround 151.Circular slit) The width of +161 is 9, for example, O, l-
It should be about 1mm. The circular slits (161) may be single as shown in the figure, or may be double or more. Each circular slit f161 has two (1, 1 or more (the illustrated one has 4) heat 17jt entrance passages f171). The width dimensions of the circular slots lJ, y l- (thermal barrier space 06) and the heat inlet passages (171) can be trimmed during fabrication to adjust the sensitivity and baseline stability.
なお、薄板fi11.面上の載置部(141、(151
は!試料セル等の設Mを容易とするため、凹あるいは凸
に成型してもよい(第8図参照)。In addition, the thin plate fi11. Placement part (141, (151) on the surface
teeth! In order to facilitate the installation of the sample cell, etc., it may be formed into a concave or convex shape (see FIG. 8).
そして、薄板(111はその周縁を炉181の内壁に接
触保持されており1分析にあたっては、炉叫から薄板(
III f通って均一に伝わってきた熱は2円形スリッ
ト(熱障壁空間)叫に設けられた熱流入通路(]9を介
して試料u2)および基準物質(131に流れ込む。な
お、炉αB0)内部空間を流れる雰囲気ガスは1円形ス
リット(16)を通って上昇する。図中、 [19)は
熱電対であり、(A)はアルメル、(C)はクロメルを
示す。The thin plate (111) is held with its peripheral edge in contact with the inner wall of the furnace 181.
The heat uniformly transmitted through IIIF flows into the sample u2 and the reference material (131) through the heat inflow passage (]9 provided in the two circular slits (thermal barrier spaces).In addition, inside the furnace αB0) Atmospheric gas flowing through the space rises through one circular slit (16). In the figure, [19] is a thermocouple, (A) is alumel, and (C) is chromel.
(へ)効果
この発明は9以上述べたような構成をもちν熱電対部分
の熱容量が小さく、また炉と試料。(F) Effect This invention has the configuration as described above, the heat capacity of the ν thermocouple part is small, and the furnace and sample.
試料と基準物質の間の熱抵抗が大きい1こめ、感度が高
い。そして、Q、=KITにおける熱抵抗には、測定温
度域内でこれを一定とみなすことができるので、定量性
が向上する。まtこ熱障壁空間および熱流入通路の幅寸
法番調整すれば、ベース2インの安定化も達成できる。The higher the thermal resistance between the sample and the reference material, the higher the sensitivity. Since the thermal resistance at Q,=KIT can be regarded as constant within the measurement temperature range, quantitative properties are improved. By adjusting the width dimensions of the heat barrier space and the heat inflow passage, it is possible to stabilize the base 2-in.
さらに・構造的にみても充分な機械的強度をもった装置
を提供し得た。Furthermore, it was possible to provide a device with sufficient mechanical strength from a structural standpoint.
第1図は、示差熱分析装置の正面断面図であり第2図は
、この発明に係る装置における熱電対薄板部分の平面図
、第3図および第4図は、それぞれc 3−3′> 、
(4−4’l断面図である。まtこ第5図ないし第8
図は、従来装置の平面図および正面断面図をそれぞれ示
す。
11・−・・・・薄板 12・・・・・・試料 1
3・・・・・・基準物質14.15・・・・・・載置部
16・・・・・・円形スリット17・・−・・・熱
流入通路 18・・・・・・炉 19・−・・・熱
電対代理人 弁理士 間 宮 武 、電゛1][1・−
ミゲ二゛
第1図
第 5 図
第6図
第2図
第 3 図
第41.′1
第7 図
第8図
手続補正書
+1/+和58年8月3[1
持n庁長官 殿
1、事件の表示
1、lj相58 イ1 特許 願第 45157号2、
発明の名称
示差熱または示差走査熱量分析装置
3、補正をする者
’Jf件との関係 特許出願人
II +j1 京都市中京区河原町通二条下ルーツ
船人町378番地氏 名銘称) (199)株式会
社 島津製作所8、補正の内容−
(1)特許請求の範囲を別紙の通り補正する。
(2)明細書第5頁第11行目に「円ノしスリット」と
あるのを「スリット」と補正する。
(3)明細書第7頁第2〜3行目に「凹あるいは凸に成
型してもよい(第8図参照)。」とあるのに続いて、次
の文言を挿入する。
「また、この実施例ではス’J 7 )の形状を円形と
しているが、これを三角形、四角形、多角形等としても
本発明の要旨を変更するものではない。」
9 糸付書類の目録
訂正特許請求の範囲 ・・・1 通2、特許請
求の範囲(訂正)
熱電対材料で成型され、左右対称位置のいずれか一方に
試料、他方に基準物質の載一部をもつ薄板と、試料側の
温度ならびに試料側と基準物質側との温度差を測定する
ための熱電対と、これらを囲繞し試料および基準物質金
加熱するための炉とを備えてなる示差熱または示差走査
熱量分析装置において、前記薄板を円盤状とするととも
に、薄板面上の載置部をそhそれ取り囲むようにスリッ
トを設け、その各スリットの2個以上に熱流入通路を形
成したことを特徴とする示差熱または示差走査熱量分析
装置。FIG. 1 is a front cross-sectional view of a differential thermal analyzer, FIG. 2 is a plan view of a thermocouple thin plate portion in the device according to the present invention, and FIGS. 3 and 4 are c 3-3'> ,
(This is a 4-4'l sectional view.
The figures show a plan view and a front cross-sectional view of a conventional device, respectively. 11... Thin plate 12... Sample 1
3... Reference material 14.15... Placement part 16... Circular slit 17... Heat inflow passage 18... Furnace 19. −・・・Thermocouple agent Patent attorney Takeshi Mamiya, Electrician゛1] [1・−
Figure 2 Figure 1 Figure 5 Figure 6 Figure 2 Figure 3 Figure 41. '1 7 Figure 8 Procedural amendment +1/+ August 3, 1995 [1 Director General of the Office of the Chief Justice 1, Indication of the case 1, Phase 58 I1 Patent Application No. 45157 2,
Name of the invention Differential thermal or differential scanning calorimetry analyzer 3, Person making the amendment Relationship to the matter Patent applicant II +j1 378 Roots Funatocho, Kawaramachi-dori Nijo, Nakagyo-ku, Kyoto City Name) (199) Shimadzu Corporation 8, Contents of amendment - (1) The scope of claims is amended as shown in the attached sheet. (2) The phrase "circular slit" on page 5, line 11 of the specification is corrected to "slit." (3) In the 2nd and 3rd lines of page 7 of the specification, following the statement ``It may be molded in a concave or convex manner (see Fig. 8),'' the following phrase is inserted. "In addition, in this embodiment, the shape of the square is circular, but it does not change the gist of the present invention if it is made into a triangle, quadrilateral, polygon, etc." 9 Correction of catalog of documents with threads Claims...1 Circular 2, Claims (revised) A thin plate molded from thermocouple material and having a sample on one side and a reference material on the other side in symmetrical positions, and a thin plate on the sample side. In a differential thermal or differential scanning calorimetry analyzer, which is equipped with a thermocouple for measuring the temperature of the sample and the temperature difference between the sample side and the reference material side, and a furnace surrounding the thermocouples and heating the sample and the reference material gold. , wherein the thin plate is disk-shaped, slits are provided so as to surround the mounting portion on the surface of the thin plate, and heat inflow passages are formed in two or more of the slits, or Differential scanning calorimeter.
Claims (1)
試料、他方に基準物質の載置部をもつ薄板と、試料側の
温度ならびに試料側と基準物質側との温度差を測定する
ための熱電対と、これらを囲繞し試料および基準物質を
加熱するための炉とを備えてなる示差熱または示差走査
熱量分析装置において、前記薄板を円盤状とするととも
に、薄板面上の載置部をそれぞれ取り囲むように円形ス
リットを設け、その各スリットの2個以上に熱副人通路
を形成し1こことを特徴とする示差熱または示差走査熱
量分析装置。A thin plate made of thermocouple material with a sample on one side and a reference material on the other side at symmetrical positions, and for measuring the temperature on the sample side and the temperature difference between the sample side and the reference material side. In a differential thermal or differential scanning calorimetry analyzer comprising a thermocouple and a furnace surrounding the thermocouple and heating a sample and a reference material, the thin plate is disk-shaped and a mounting portion on the surface of the thin plate is provided. A differential thermal or differential scanning calorimetry analyzer characterized in that circular slits are provided so as to surround each slit, and two or more thermal secondary passages are formed in each of the slits.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58045157A JPS59170795A (en) | 1983-03-16 | 1983-03-16 | Defferential thermal or scanning calorie analysis device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58045157A JPS59170795A (en) | 1983-03-16 | 1983-03-16 | Defferential thermal or scanning calorie analysis device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59170795A true JPS59170795A (en) | 1984-09-27 |
Family
ID=12711427
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58045157A Pending JPS59170795A (en) | 1983-03-16 | 1983-03-16 | Defferential thermal or scanning calorie analysis device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59170795A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62189936A (en) * | 1986-02-14 | 1987-08-19 | Kawasaki Heavy Ind Ltd | Portable generator |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57104847A (en) * | 1980-11-03 | 1982-06-30 | Du Pont | Differential heat analysis method of and apparatus for measuring heat value |
-
1983
- 1983-03-16 JP JP58045157A patent/JPS59170795A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57104847A (en) * | 1980-11-03 | 1982-06-30 | Du Pont | Differential heat analysis method of and apparatus for measuring heat value |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62189936A (en) * | 1986-02-14 | 1987-08-19 | Kawasaki Heavy Ind Ltd | Portable generator |
JPH0714264B2 (en) * | 1986-02-14 | 1995-02-15 | 川崎重工業株式会社 | Portable generator |
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