JPS59163549A - 電子線回折像の自動分析方法 - Google Patents

電子線回折像の自動分析方法

Info

Publication number
JPS59163549A
JPS59163549A JP58038623A JP3862383A JPS59163549A JP S59163549 A JPS59163549 A JP S59163549A JP 58038623 A JP58038623 A JP 58038623A JP 3862383 A JP3862383 A JP 3862383A JP S59163549 A JPS59163549 A JP S59163549A
Authority
JP
Japan
Prior art keywords
diffraction
image
spot
ring
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58038623A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0522174B2 (enrdf_load_stackoverflow
Inventor
Moriyasu Tokiwai
常盤井　守泰
Sakuyoshi Moriguchi
森口　作美
Takao Shinkawa
隆朗 新川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Central Research Institute of Electric Power Industry
Nippon Telegraph and Telephone Corp
Original Assignee
Jeol Ltd
Central Research Institute of Electric Power Industry
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Central Research Institute of Electric Power Industry, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP58038623A priority Critical patent/JPS59163549A/ja
Publication of JPS59163549A publication Critical patent/JPS59163549A/ja
Publication of JPH0522174B2 publication Critical patent/JPH0522174B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58038623A 1983-03-09 1983-03-09 電子線回折像の自動分析方法 Granted JPS59163549A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58038623A JPS59163549A (ja) 1983-03-09 1983-03-09 電子線回折像の自動分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58038623A JPS59163549A (ja) 1983-03-09 1983-03-09 電子線回折像の自動分析方法

Publications (2)

Publication Number Publication Date
JPS59163549A true JPS59163549A (ja) 1984-09-14
JPH0522174B2 JPH0522174B2 (enrdf_load_stackoverflow) 1993-03-26

Family

ID=12530362

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58038623A Granted JPS59163549A (ja) 1983-03-09 1983-03-09 電子線回折像の自動分析方法

Country Status (1)

Country Link
JP (1) JPS59163549A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4148799B2 (ja) * 2003-03-04 2008-09-10 京セラ株式会社 電子回折パターンの解析方法及び解析装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5838624A (ja) * 1981-09-01 1983-03-07 Yamada Dobby Co Ltd トランスフア−フイ−ド装置におけるクラツチ装置
JPS5838622A (ja) * 1981-04-20 1983-03-07 Keiichiro Yamazaki 手摺等における中空縦枠と横枠の連結方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5838622A (ja) * 1981-04-20 1983-03-07 Keiichiro Yamazaki 手摺等における中空縦枠と横枠の連結方法
JPS5838624A (ja) * 1981-09-01 1983-03-07 Yamada Dobby Co Ltd トランスフア−フイ−ド装置におけるクラツチ装置

Also Published As

Publication number Publication date
JPH0522174B2 (enrdf_load_stackoverflow) 1993-03-26

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