JPS59160148A - Manufacture of photoconductive cadmium sulfide - Google Patents

Manufacture of photoconductive cadmium sulfide

Info

Publication number
JPS59160148A
JPS59160148A JP3508083A JP3508083A JPS59160148A JP S59160148 A JPS59160148 A JP S59160148A JP 3508083 A JP3508083 A JP 3508083A JP 3508083 A JP3508083 A JP 3508083A JP S59160148 A JPS59160148 A JP S59160148A
Authority
JP
Japan
Prior art keywords
cadmium sulfide
cds
particles
flux
sulfuric acid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3508083A
Other languages
Japanese (ja)
Inventor
Takeshi Ikeda
武志 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP3508083A priority Critical patent/JPS59160148A/en
Publication of JPS59160148A publication Critical patent/JPS59160148A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic

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  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Abstract

PURPOSE:To enhance crystallinity of cadmium sulfide and uiforty of the particles by burning a mixture of cadmium sulfide and a flux at a specified temp. and treating the surface of the obtanined cadmium sulfide with sulfuric acid specified in concn. CONSTITUTION:A mixture of CdS and >=20wt% flux is burned at temp. >=50 deg.C higher than the m.p. of the flux, such as 500 deg.C. After the burning, its surface is treated with 0.5-5.0 N sulfuric acid. The CdS thus obtained is high in crystallinity, it is found to consist of nonagglomerated single particles to each other and to have smooth surfaces by shape observation with a scanning type electron microscope. Since the particles are uniform in shape and size, the face of the coated photoconductive layer is dense and smooth, and an image good in quality is obtained.

Description

【発明の詳細な説明】 本発明は光導電性硫化カドミウムの製造方法に関するも
ので、特に非常に結晶性が高く、かつ均一な単一粒子を
製造するためのものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing photoconductive cadmium sulfide, particularly for producing highly crystalline and uniform single particles.

電子写真感光材料を代表例として用いられる光導電性硫
化カドミウム(CdS )の製造の最も一般的な方法は
、硫酸カドミウム、塩化カドミウム、などのカドミウム
の水溶性塩に硫化水素を作用させて硫化カドミウム粒子
の沈澱を得、次いでこの硫化カドミウム粒子に活性剤を
ドーピングするために高温焼成して得るものである。即
ち、光導電性硫化カドミウムは、硫化カドミウム粒子に
活性剤どしてCuCl2. CuSO4等また、融剤と
してCdC/ 2 。
The most common method for producing photoconductive cadmium sulfide (CdS), which is typically used in electrophotographic materials, is to react hydrogen sulfide with water-soluble salts of cadmium, such as cadmium sulfate or cadmium chloride, to produce cadmium sulfide. The cadmium sulfide particles are precipitated and then calcined at a high temperature to dope the cadmium sulfide particles with an activator. That is, photoconductive cadmium sulfide is produced by adding an activator to cadmium sulfide particles to form CuCl2. Also CdC/2 as a fluxing agent such as CuSO4.

ZnCl2等のハロゲン化物を混入して焼成を行うこと
により、Cu、C11等を硫化カドミウム中にドープさ
せ製造するのが一般である。しかしながらこのような従
来の方法においては、焼成工程を経て生成されたCd8
は、沈澱生成時にCd8の表面付近に非常に多くの欠陥
を有している。
It is generally manufactured by doping Cu, C11, etc. into cadmium sulfide by mixing a halide such as ZnCl2 and firing. However, in such conventional methods, Cd8 produced through the firing process
has a large number of defects near the surface of Cd8 during precipitate formation.

この表面欠陥は、光キャリアーのトラップ準位となるた
め、Cd8の元メモリーを増大し、即ち、ピーにおける
明部と暗部の静電コントラストが不十分となる。
Since this surface defect becomes a trap level for photocarriers, it increases the original memory of Cd8, that is, the electrostatic contrast between the bright and dark areas in P becomes insufficient.

また、上記の様な方法で製造されたCd8の粒子形状は
、粒子が互いに集合し合って形成された強い凝集体であ
る2次粒子からなっており、この2次粒子は6次元的に
集合して団塊状であったりあるいは2次元的に集合して
平板状であったり様々であるが、その中には大きなもの
は10数ミクロンから数10ミクロンに及ぶものがある
In addition, the particle shape of Cd8 produced by the method described above consists of secondary particles, which are strong aggregates formed by particles aggregating together, and these secondary particles aggregate six-dimensionally. They vary in size, such as in the form of nodules, or in the form of two-dimensional plates, and some of them are large, ranging in size from more than 10 microns to several tens of microns.

この様な粗大粒子を多数含むCdSを用いて作成される
感光体は、その表面状態が劣悪となり、その結果得られ
る画像はガサつきが激しく、解像力も不十分となる。ま
た、さらに絶縁層を設ける感光体の場合には、絶縁層の
CdS層へのしみ込み等がおこり、良好な感光体を得る
ことが困難となる。
A photoreceptor made using CdS containing a large number of such coarse particles has a poor surface condition, resulting in images that are extremely rough and have insufficient resolution. Furthermore, in the case of a photoreceptor further provided with an insulating layer, the insulating layer may seep into the CdS layer, making it difficult to obtain a good photoreceptor.

前記欠点については特開昭57−129825号公報に
記載されてV−るような方法によって、克服されている
The above-mentioned drawbacks have been overcome by the method described in Japanese Patent Application Laid-Open No. 57-129825.

而して本発明は前記方法を改良したCdSの製造方法を
提供することを目的とするものである。即ち、光メモリ
ーが小さく暗電位がより十分にとれる高抵抗CdSが製
造できること、また製造されるCdSのカサ(md/g
 : JIS K−5101)が増加するので、光導電
層としたときに空隙率を大きくでき、その結果、光導電
層の静電容量が小さくなって帯電電位が高くとれるCd
8が製造できること、さらにはCdSの洗浄工程のとき
に、CdS粒子の沈降速度が速いため洗浄処理時間が短
縮できるCdSを製造できる製造方法を提供することを
目的とする。
Therefore, an object of the present invention is to provide a method for producing CdS that is an improvement on the above-mentioned method. In other words, it is possible to manufacture high-resistance CdS with a small optical memory and a sufficient dark potential, and the bulk of the manufactured CdS (md/g
: JIS K-5101) increases, so the porosity can be increased when used as a photoconductive layer, and as a result, the capacitance of the photoconductive layer decreases and the charged potential can be high.
It is an object of the present invention to provide a manufacturing method capable of manufacturing CdS, which can produce CdS No. 8, and furthermore, can shorten the cleaning process time during the CdS cleaning process due to the high sedimentation rate of CdS particles.

本発明の方法は、CdSに対して20wt%以上の融剤
を混ぜて、融剤の融点よりも50℃以上高い温度で焼成
後、0.5〜5.0  の硫酸中で表面処理することを
特徴とするものである。
The method of the present invention involves mixing 20 wt% or more of a flux with CdS, firing at a temperature 50°C or more higher than the melting point of the flux, and then surface-treating the mixture in 0.5 to 5.0% sulfuric acid. It is characterized by:

本発明により製造されるCdSは結晶性が高く、また、
走査型電子顕微鏡による形状観察では粒子が互いに凝集
していない単粒子であり、かつその表面が滑らかになっ
ている。
CdS produced by the present invention has high crystallinity, and
Observation of the shape using a scanning electron microscope shows that the particles are single particles that do not aggregate with each other, and the surface is smooth.

本発明により得られたCdS粒子は粒子形状が均一でか
つ粒径がそろっているため、作成される光導電層の塗面
は密で平滑なため、非常に良質の画イ3;が得られろ。
Since the CdS particles obtained by the present invention have a uniform particle shape and a uniform particle size, the coated surface of the photoconductive layer created is dense and smooth, resulting in a very high quality image. reactor.

本発明で焼成後、CdSの表面処理に用いる硫酸の濃度
は0.5〜5.ONが効果的であり、この効果は処理時
間との相関がある。即ち、低濃度では長時間の処理が必
要となり、高濃度では比較的短時間で効果が出る。しか
し0.5N以下では、長時間処理を行ってもその効果が
′少なく製造上の効率が悪い。また5N以上の濃度の処
理は、感度が低下する傾向を示すことから不適当である
In the present invention, the concentration of sulfuric acid used for surface treatment of CdS after firing is 0.5 to 5. ON is effective, and this effect is correlated with processing time. That is, at low concentrations, long-term treatment is required, whereas at high concentrations, effects can be achieved in a relatively short time. However, if the pressure is less than 0.5N, even if the treatment is carried out for a long time, the effect will be small and manufacturing efficiency will be poor. Further, processing at a concentration of 5N or more is inappropriate because it tends to reduce sensitivity.

また、銅は予め、カドミウム塩水溶液中に添加して共沈
させて、CdS中に含ませることも出来るし、焼成前、
CdSと混合した後焼成を行うことによりCdS中に含
ませることも出来る。CdSに添加する銅化合物として
は、銅の塩化物、硫化物、硫酸化物などが用いられ、特
に、塩化銅、硫酸銅が好ましい。
In addition, copper can be added in advance to a cadmium salt aqueous solution and co-precipitated to be included in CdS, or before firing,
It can also be included in CdS by mixing it with CdS and then firing it. As the copper compound added to CdS, copper chloride, sulfide, sulfide, etc. are used, and copper chloride and copper sulfate are particularly preferred.

焼成前に銅化合物を添加する方法は銅化合物を固体のま
ま添加混合してCよいし、銅化合物が水溶性の場合はこ
れを一度水溶液にしCdSに添加後、水分を蒸発させる
湿式法のいずれも良好な結果か得られるが、均一性の面
では湿式方法がよい。
The copper compound can be added before firing by adding and mixing the copper compound as a solid, or if the copper compound is water-soluble, it can be made into an aqueous solution and added to CdS, and then the water can be evaporated. Although good results can also be obtained using the wet method, the wet method is better in terms of uniformity.

本発明に使用する融剤は、活性剤をCdS中に拡散する
際に一般的に用いられている融剤で、Cd(J’2゜Z
nCl2 + KCl+ NaCl+ NH4C1) 
+ caso4  等の1つあるいはV種類を適当な比
率に混合し1こものである。混合して用いる場合の好適
例として、CdCl2とアルカリ金属の塩化物との混合
物が挙げられるアルカリ金属の塩化物としては、NaC
6とKCIが代表的なものである。アルカリ金属の塩化
物の融剤全体における含有量は、90モルチ以下で10
モルチ以上が好適である。
The fluxing agent used in the present invention is a fluxing agent that is generally used when diffusing an activator into CdS.
nCl2 + KCl+ NaCl+ NH4C1)
+ caso4 etc. or V types are mixed in an appropriate ratio. A suitable example of a mixture of CdCl2 and an alkali metal chloride is a mixture of CdCl2 and an alkali metal chloride.As an alkali metal chloride, NaC
6 and KCI are representative ones. The content of alkali metal chloride in the entire flux is 90 molti or less and 10
More than molty is suitable.

本発明においては、この融剤量は、20%以上、特に好
ましくは30〜50係が好まし〜・。20チ以下では、
製造されるCd8粒子は焼結して粗大粒子になり、また
表面形状も不均一で、電位保持性が十分でなく、まfこ
、解像性に欠ける悪〜・Cd8になる。また、焼成を融
剤の融点よりも50℃高〜・温度に及ばない温度で行っ
た場合には、製造されるCd8$Q子は粒径が大きく、
解像性や塗工性が悪い。
In the present invention, the amount of the flux is preferably 20% or more, particularly preferably 30 to 50%. Below 20 inches,
The produced Cd8 particles are sintered to become coarse particles, and have a non-uniform surface shape, resulting in poor Cd8 with insufficient potential retention and poor resolution. In addition, when calcination is performed at a temperature 50°C higher than the melting point of the flux, the particle size of the produced Cd8$Q particles is large;
Poor resolution and coating properties.

なお、本発明の製造方法において、焼成温度は、600
°C以下が好適である。また、融剤のCdSに対する添
加量は、収率の点からは65%以下が好適である。
In addition, in the manufacturing method of the present invention, the firing temperature is 600
°C or less is suitable. Further, the amount of fluxing agent added to CdS is preferably 65% or less from the viewpoint of yield.

(実施例1) 硫酸カドミウム1 mol、硫酸銅3X10mol を
含む一硫酸酸性水溶液21の温度を60℃に保ち、硫化
水素を300 cc/r11i nの流量で95分間通
じた。
(Example 1) The temperature of a monosulfuric acid aqueous solution 21 containing 1 mol of cadmium sulfate and 3×10 mol of copper sulfate was maintained at 60° C., and hydrogen sulfide was passed through the solution at a flow rate of 300 cc/r11in for 95 minutes.

この反応で生じた硫化カドミウムを純水を用いて水洗し
、過剰に粒子表面に存在する不純物を除去した後、口過
100 ’Cの温度で1晩乾燥した。この硫化カドミウ
ム100gに対しCdCd 2を20gとNaC1を3
0g添加し、よく混合した上で、石英ルツボに充填し、
500℃で30分焼成した(なお、CdCl2とNaC
1の混合融剤の融点は、状態図からCdCl2 ・2N
aC1の融点の426℃に相当する)。
The cadmium sulfide produced in this reaction was washed with pure water to remove excessive impurities present on the particle surface, and then dried overnight at a temperature of 100'C. For 100g of this cadmium sulfide, add 20g of CdCd2 and 3g of NaC1.
Add 0g, mix well, and fill in a quartz crucible.
Calcined at 500℃ for 30 minutes (note that CdCl2 and NaC
From the phase diagram, the melting point of the mixed flux No. 1 is CdCl2 ・2N
aC1 melting point of 426°C).

この様にして得られたCdSを4N硫酸水溶液中に入れ
、攪拌しながら3時間放置した。その後硫酸を除去する
ために純水にて水洗を行ったが、その際粒子の沈降速度
は極めて速く、短時間で水洗が完了した。これを70℃
で乾燥した。
The CdS thus obtained was placed in a 4N sulfuric acid aqueous solution and left to stand for 3 hours while stirring. Thereafter, the particles were washed with pure water to remove the sulfuric acid, but the sedimentation rate of the particles was extremely fast and the washing was completed in a short time. This is 70℃
It was dried.

このCd8を塩化ビニル/酢酸ビニル共重合体中に分散
させた後アルミニウム基板上に4oμの厚さに塗布乾燥
させて得た感光板に15μ厚のポリエステルフィルムを
はりつけ三層構成の感光体を得たところ、表面が非常に
平滑であった。この感光板に一次帯電、次いで光像露光
AC除電、次いで全面露光の高速電子写真プロセスを適
用したところ、650Vの静電コントラストと、十分な
感度に基づく良質の画像が得られた。特に解像力は、6
i以上あり、シャープな画像が得られた。さらにこの感
光板を温度35℃、湿度85%の高温・高湿中て、24
時間放置後、再び複写機にお〜・て画像出しを行った結
果明暗部のコントラストの低下も認められず、良質の画
像が得られた。
This Cd8 was dispersed in a vinyl chloride/vinyl acetate copolymer, and then coated on an aluminum substrate to a thickness of 4 μm and dried. A 15 μm thick polyester film was attached to the resulting photosensitive plate to obtain a three-layered photoreceptor. The surface was very smooth. When this photosensitive plate was subjected to a high-speed electrophotographic process of primary charging, photoimage exposure, AC static elimination, and then full-surface exposure, a high-quality image with an electrostatic contrast of 650 V and sufficient sensitivity was obtained. Especially the resolution is 6
i or more, and a sharp image was obtained. Furthermore, this photosensitive plate was heated at a high temperature of 35°C and a humidity of 85% for 24 hours.
After leaving it for a while, the image was produced again using a copying machine. As a result, no decrease in contrast between bright and dark areas was observed, and a good quality image was obtained.

(実施例2) 硫酸カドミウム1 moeを含む6N硫酸水溶液から実
施例1と同様な方法により硫化カドミウムを沈澱生成し
た。この硫化カドミウム100gに銅が硫化カドミウム
1molに対して4X10mol硫酸銅の形で添加し、
湿式法により均一混合後100℃で乾燥した。CdC7
1!240 g 、 NaC110g から成る混合融
剤を混入し、充分混合後530℃で60分焼成した。
(Example 2) Cadmium sulfide was precipitated from a 6N sulfuric acid aqueous solution containing 1 moe of cadmium sulfate in the same manner as in Example 1. Copper was added to 100 g of this cadmium sulfide in the form of 4×10 mol copper sulfate per 1 mol of cadmium sulfide,
After uniform mixing using a wet method, the mixture was dried at 100°C. CdC7
A mixed flux consisting of 1.240 g of NaC and 110 g of NaC was mixed, and after thorough mixing, it was fired at 530° C. for 60 minutes.

この様に作成された硫化カドミウムを1N硫酸水溶液中
に添加、攪拌しながら8時間放置した。
The cadmium sulfide thus prepared was added to a 1N sulfuric acid aqueous solution and left to stand for 8 hours while stirring.

水洗2口過、乾燥後実施例1と同様に得られたCdSを
感光体化して評価したところ、実施例1と同様の良好の
結果を得た。
After washing with water, passing through two mouths, and drying, the obtained CdS was made into a photoreceptor and evaluated in the same manner as in Example 1, and the same good results as in Example 1 were obtained.

比較例1 実施例1において、硫酸処理を除いて全く同様の方法で
作成された硫化カドミウム粒子について実施例1と同様
の方法で感光体を作成した。
Comparative Example 1 A photoreceptor was produced in the same manner as in Example 1 using cadmium sulfide particles produced in exactly the same manner as in Example 1 except for the sulfuric acid treatment.

比較例2 実施例2において硫酸処理を除いて全く同様な方法で製
造した硫化カドミウム粒子を用いて実施例2と同様にし
て感光体を製造した。
Comparative Example 2 A photoreceptor was manufactured in the same manner as in Example 2 using cadmium sulfide particles manufactured in exactly the same manner as in Example 2 except for the sulfuric acid treatment.

以上の実施例及び比較例で製造した感光体について第1
図に示す測定装置を用いて感光体の特性を測定した。
Regarding the photoreceptors manufactured in the above Examples and Comparative Examples, the first
The characteristics of the photoreceptor were measured using the measuring device shown in the figure.

即ち、感光体9の絶縁層面に透明電極4をもつガラス板
6を押しつけた。透明電極4はリレースイッチ5を介し
て高圧直流電源乙に接続される。
That is, a glass plate 6 having a transparent electrode 4 was pressed against the insulating layer surface of the photoreceptor 9. The transparent electrode 4 is connected to a high voltage DC power supply B via a relay switch 5.

測定はりレーメイツチ5を0.2秒間とじて高電圧(V
a)  を印加し、0.2秒間放置(オープン)後光を
0.2秒間照射しその時の電圧変化(Vp)を感光体と
同電圧にある金属板7と表面電位計8で測定した。尚、
Vpは光導電層に印加されている電圧である。
The measurement beam meter 5 is closed for 0.2 seconds and the high voltage (V
a) was applied, left for 0.2 seconds (open), and then light was irradiated for 0.2 seconds, and the voltage change (Vp) at that time was measured using the metal plate 7 and the surface electrometer 8, which were at the same voltage as the photoreceptor. still,
Vp is the voltage applied to the photoconductive layer.

更に前露光としてハロゲンランプ1の白色光をシャッタ
ー2により0.2 sec照射し、0.2 sec放置
した後、■a印加し、0.2SeC放置後再び光を0.
2 sec照射しその時の電圧変化■p′を測定したっ
vaミニ−2000V  とした場合のvp及び■p′
またVaを+2000 V  とした場合のVpの値を
測定しVaミニ−2000印加時の■p−■p′から元
メモリーの大小が判断できる。
Further, as a pre-exposure, white light from the halogen lamp 1 is irradiated for 0.2 seconds by the shutter 2, and after being left for 0.2 seconds, ■a is applied, and after being left for 0.2 SeC, the light is irradiated again for 0.2 seconds.
Irradiated for 2 seconds and measured the voltage change ■p' when va mini-2000V vp and ■p'
Further, the value of Vp is measured when Va is set to +2000 V, and the size of the original memory can be determined from ■p−■p' when Va mini-2000 is applied.

次に感光体の感度を測定した。Next, the sensitivity of the photoreceptor was measured.

即ち、感光体9の絶縁層面て透明電極4をもつガラス板
6を押しつげた。透明電極4はリレースイッチ5を介し
て高圧直流電源6に接続される。
That is, the glass plate 6 having the transparent electrode 4 was pressed against the insulating layer surface of the photoreceptor 9. The transparent electrode 4 is connected to a high voltage DC power source 6 via a relay switch 5.

測定は前露光としてハロゲンランプ1の白色光をシャッ
ター2により3.2sec照射し、0.2 sec放置
した後、リレースイッチ5を0.2秒間とじて高電圧(
Va)を感光体に印加し、0.2秒間放置後十分に強い
光を0.2秒間照射後、感光体表面(即ち、絶縁層表面
)における電圧(Va’)を感光体と同電圧にある金属
板7と表面電位計8で測定した。高電圧印加時における
光導電層への印加電圧(Vp)はVa−Va’により算
出できるので、Vpが600VになるVa (以下Va
−600という)を定めて以下の方法で感度を測定した
。即ち、感光体にVa−600を印加した状態で測定光
(520nm)を照射する光照射後0.2秒間放置後、
上記と同様に十分に強い元を0.2秒間照射して感光体
表面における電圧(Va“)を上記と同様にして測定す
る。Va−600印加と同時測定光照射時におけるyo
導電層への印加電圧(Vp“)はVa−600−Va“
により算出できるから、■fが6oo’yになる必要な
測定光の露ブ0量の)が半減源i量(El/2)  で
あり、惑うt体の感度を表示することができる。
The measurement was performed by irradiating white light from a halogen lamp 1 for 3.2 seconds with the shutter 2 as a pre-exposure, leaving it for 0.2 seconds, then closing the relay switch 5 for 0.2 seconds and applying a high voltage (
Va) is applied to the photoconductor, left for 0.2 seconds, and then irradiated with sufficiently strong light for 0.2 seconds, the voltage (Va') on the photoconductor surface (i.e., the surface of the insulating layer) is set to the same voltage as the photoconductor. It was measured using a certain metal plate 7 and a surface potential meter 8. The voltage (Vp) applied to the photoconductive layer when applying a high voltage can be calculated by Va - Va', so Va (hereinafter Va
-600) and measured the sensitivity using the following method. That is, after irradiating measurement light (520 nm) with Va-600 applied to the photoreceptor and leaving it for 0.2 seconds after light irradiation,
Irradiate a sufficiently strong source for 0.2 seconds in the same manner as above and measure the voltage (Va'') on the surface of the photoreceptor in the same manner as above.
The voltage applied to the conductive layer (Vp") is Va-600-Va"
Since it can be calculated as follows, the amount of exposure (0) of the measurement light necessary for f to be 6oo'y is the half-reduction source i amount (El/2), and the confusing sensitivity of the t-body can be displayed.

下表にそれらの特性を記す。Their characteristics are listed in the table below.

上記表において、vp  Vp’の差が実施例は比較例
に比べて小さい。このことは前露光による影響がより少
ないこと、換言すれば光減衰の速さが実施例の感光板の
方が速いことを示している。
In the above table, the difference in vp Vp' is smaller in the example than in the comparative example. This shows that the influence of pre-exposure is smaller, in other words, the speed of light attenuation is faster in the photosensitive plate of the example.

従って、硫酸処理を行ったものについては■p′が大き
くなっており、元メモリーもさらに小さくなっており、
比較例に比して高抵抗化し電位がとれる方向に変化して
いる。一方感度は比較例と同等であり、高抵抗化してい
るにもかかわらず感度低下はしていない。
Therefore, for those treated with sulfuric acid, ■p' becomes larger, and the original memory becomes even smaller.
Compared to the comparative example, the resistance is higher and the potential is higher. On the other hand, the sensitivity was the same as that of the comparative example, and there was no decrease in sensitivity despite the increased resistance.

尚、比較例で製造された硫化カドミウム粒子のものは、
この際焼成後の水洗工程において粒子の沈降速度は遅く
効率的ではなかった。
In addition, the cadmium sulfide particles manufactured in the comparative example were
In this case, the sedimentation rate of particles in the water washing step after firing was slow and not efficient.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は感光体の感度を測定するための装置を示す図で
ある。
FIG. 1 is a diagram showing an apparatus for measuring the sensitivity of a photoreceptor.

Claims (1)

【特許請求の範囲】[Claims] 1、硫化カドミウムに対して20重量%以上の融剤を混
ぜて、融剤の融点よりも50℃以上高い温度で焼成した
後、得られた硫化カドミウムを0.5〜5Nの硫酸で表
面処理することを特徴とする光導電性硫化カドミウムの
製造方法。
1. Mix cadmium sulfide with 20% by weight or more of a fluxing agent and sinter at a temperature 50°C or more higher than the melting point of the fluxing agent, then surface treat the resulting cadmium sulfide with 0.5-5N sulfuric acid. A method for producing photoconductive cadmium sulfide.
JP3508083A 1983-03-03 1983-03-03 Manufacture of photoconductive cadmium sulfide Pending JPS59160148A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3508083A JPS59160148A (en) 1983-03-03 1983-03-03 Manufacture of photoconductive cadmium sulfide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3508083A JPS59160148A (en) 1983-03-03 1983-03-03 Manufacture of photoconductive cadmium sulfide

Publications (1)

Publication Number Publication Date
JPS59160148A true JPS59160148A (en) 1984-09-10

Family

ID=12432001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3508083A Pending JPS59160148A (en) 1983-03-03 1983-03-03 Manufacture of photoconductive cadmium sulfide

Country Status (1)

Country Link
JP (1) JPS59160148A (en)

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