JPS59157534A - 自動標本封入装置 - Google Patents
自動標本封入装置Info
- Publication number
- JPS59157534A JPS59157534A JP3090183A JP3090183A JPS59157534A JP S59157534 A JPS59157534 A JP S59157534A JP 3090183 A JP3090183 A JP 3090183A JP 3090183 A JP3090183 A JP 3090183A JP S59157534 A JPS59157534 A JP S59157534A
- Authority
- JP
- Japan
- Prior art keywords
- pendulum
- stand
- slide glass
- glass
- cover glass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/36—Embedding or analogous mounting of samples
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3090183A JPS59157534A (ja) | 1983-02-28 | 1983-02-28 | 自動標本封入装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3090183A JPS59157534A (ja) | 1983-02-28 | 1983-02-28 | 自動標本封入装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59157534A true JPS59157534A (ja) | 1984-09-06 |
| JPH0322932B2 JPH0322932B2 (enExample) | 1991-03-27 |
Family
ID=12316629
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3090183A Granted JPS59157534A (ja) | 1983-02-28 | 1983-02-28 | 自動標本封入装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59157534A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013171291A (ja) * | 2012-02-21 | 2013-09-02 | Leica Biosystems Nussloch Gmbh | 顕微鏡検査サンプルの調製方法、及び、サンプルのカバーガラス装着品質の検査装置 |
-
1983
- 1983-02-28 JP JP3090183A patent/JPS59157534A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013171291A (ja) * | 2012-02-21 | 2013-09-02 | Leica Biosystems Nussloch Gmbh | 顕微鏡検査サンプルの調製方法、及び、サンプルのカバーガラス装着品質の検査装置 |
| US9880079B2 (en) | 2012-02-21 | 2018-01-30 | Leica Biosystems Nussloch Gmbh | Method in the preparation of samples for microscopic examination and for checking coverslipping quality |
| US11519863B2 (en) | 2012-02-21 | 2022-12-06 | Leica Biosystems Nussloch Gmbh | Apparatus for checking the coverslipping quality of samples for microscopic examination |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0322932B2 (enExample) | 1991-03-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100304468B1 (ko) | 반도체 웨이퍼 반송용의 캐리어 및 캐리어내의 웨이퍼 검출방법 | |
| EP0510108B1 (en) | Devices and methods for reading identification marks on semiconductor wafers | |
| KR101606093B1 (ko) | 기판 결함 검사장치 및 방법 | |
| JPH0326343B2 (enExample) | ||
| KR102136085B1 (ko) | 웨이퍼의 에지 영역 검사장치 | |
| KR102136084B1 (ko) | 웨이퍼의 에지 영역 검사 시스템 | |
| US20100165326A1 (en) | Method and apparatus for detecting microscope slide coverslips | |
| JPS59175740A (ja) | ウエハ検出装置 | |
| US10466147B2 (en) | Methods and apparatuses for detecting microscope slide coverslips | |
| JPS59157534A (ja) | 自動標本封入装置 | |
| CN112326660B (zh) | 样本检测系统 | |
| US6183694B1 (en) | Spectrophotometric apparatus for reducing fluid carryover | |
| JPH0322933B2 (enExample) | ||
| US7568514B2 (en) | Device for mounting histological and biological specimens | |
| JPH0317241Y2 (enExample) | ||
| JP3365781B2 (ja) | 基板外観検査装置 | |
| JP2008215976A (ja) | 基板検査装置 | |
| US20020075478A1 (en) | Inspection device having wafer exchange stage | |
| JPH0248043B2 (ja) | Lsiyoeehanoheimendokensasochiniokerueehakakudoichiawase*isosochi | |
| JPH0317246Y2 (enExample) | ||
| JPH0350096Y2 (enExample) | ||
| JP2973251B2 (ja) | 血液標本自動作製装置 | |
| JP3638735B2 (ja) | 基板処理装置 | |
| JPH0235692Y2 (enExample) | ||
| KR102605457B1 (ko) | 슬라이드 자동 스캐닝 시스템 |