JPS59152764U - printed board - Google Patents

printed board

Info

Publication number
JPS59152764U
JPS59152764U JP4775683U JP4775683U JPS59152764U JP S59152764 U JPS59152764 U JP S59152764U JP 4775683 U JP4775683 U JP 4775683U JP 4775683 U JP4775683 U JP 4775683U JP S59152764 U JPS59152764 U JP S59152764U
Authority
JP
Japan
Prior art keywords
printed board
patterns
sets
series
monitoring patterns
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4775683U
Other languages
Japanese (ja)
Inventor
晋 岡崎
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP4775683U priority Critical patent/JPS59152764U/en
Publication of JPS59152764U publication Critical patent/JPS59152764U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図のaはプリント板の斜視図、bは半導体素子の外
観を示す斜視図、第2図は本考案によるプリント板の一
実施例を示すaは斜視図、bは接続の説明図を示す。 図中において、1は半導体素子、1−1は接続バット、
1−2.1−3はスルホール、1−4゜1−5はモニタ
用パターン、2はプリント板、2−1〜2−n、2−1
1〜2−1n、2−21〜2−2n、2−31〜2−3
nはパターンを示す。
In FIG. 1, a is a perspective view of a printed board, b is a perspective view showing the external appearance of a semiconductor element, FIG. 2 is a perspective view of an embodiment of the printed board according to the present invention, and b is an explanatory diagram of connections. show. In the figure, 1 is a semiconductor element, 1-1 is a connection bat,
1-2.1-3 is a through hole, 1-4゜1-5 is a monitor pattern, 2 is a printed board, 2-1 to 2-n, 2-1
1-2-1n, 2-21-2-2n, 2-31-2-3
n indicates a pattern.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 基板の亀裂または層間ずれを検出する少なくとも2組の
モニタ用パターンを有する複数個の半導体素子を搭載す
るプリント板において、前記モニタ用パターンのそれぞ
れは格子状に検出されるよう隣接された該モニタ用パタ
ーンの一方はX方向に、他方はY方向にそれぞれ直列に
接続するパターンが設けられたことを特徴とするプリン
ト板。
In a printed board on which a plurality of semiconductor elements are mounted, each of which has at least two sets of monitoring patterns for detecting cracks or interlayer deviations in a substrate, each of the monitoring patterns has two sets of monitoring patterns adjacent to each other so as to be detected in a grid pattern. A printed board characterized in that one of the patterns is connected in series in the X direction, and the other pattern is connected in series in the Y direction.
JP4775683U 1983-03-31 1983-03-31 printed board Pending JPS59152764U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4775683U JPS59152764U (en) 1983-03-31 1983-03-31 printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4775683U JPS59152764U (en) 1983-03-31 1983-03-31 printed board

Publications (1)

Publication Number Publication Date
JPS59152764U true JPS59152764U (en) 1984-10-13

Family

ID=30178303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4775683U Pending JPS59152764U (en) 1983-03-31 1983-03-31 printed board

Country Status (1)

Country Link
JP (1) JPS59152764U (en)

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