JPS59145587A - Direct current bias circuit for semiconductor laser - Google Patents

Direct current bias circuit for semiconductor laser

Info

Publication number
JPS59145587A
JPS59145587A JP24874083A JP24874083A JPS59145587A JP S59145587 A JPS59145587 A JP S59145587A JP 24874083 A JP24874083 A JP 24874083A JP 24874083 A JP24874083 A JP 24874083A JP S59145587 A JPS59145587 A JP S59145587A
Authority
JP
Japan
Prior art keywords
circuit
semiconductor laser
bias circuit
zener diode
bias
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24874083A
Other languages
Japanese (ja)
Inventor
Mitsuaki Nishie
光昭 西江
Soichi Otaki
大瀧 壮一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP24874083A priority Critical patent/JPS59145587A/en
Publication of JPS59145587A publication Critical patent/JPS59145587A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/06825Protecting the laser, e.g. during switch-on/off, detection of malfunctioning or degradation

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To prevent overcurrents, and to obviate a breakdown by overcurrents of a semiconductor laser by connecting a Zener diode between a control terminal and an output terminal for a constant-current circuit. CONSTITUTION:A DC bias circuit 5 is formed in constitution in which a Zener diode 53 is connected between a base of a transistor 51 constituting a constant- current circuit and negative power supply voltage and a control signal (a) from a comparison circuit 3 is inputted to the base of the transistor 51 through an operational amplifier 52. Since the Zener diode 53 protects so that the base voltage of the transistor 51 does not reach a fixed value or more at that time, high currents do not flow through a semiconductor laser 1 even when a large signal is applied to the DC bias circuit 5 due to a short circuit, etc., and the breakdown of an element can be prevented. The DC bias circuit is very effective when it is applied to an APC circuit.

Description

【発明の詳細な説明】 本発明は半導体レーザ用直流バイアス回路に関する。[Detailed description of the invention] The present invention relates to a DC bias circuit for a semiconductor laser.

半導体レーザ(LD)は非線形性発光素子で閾値電流を
持っておシ、然もその閾値は温度によって変化する為、
半導体レーザを用いてディジタル変調等された出力光を
得る場合、現在のところAPC(Auto Power
 Control )回路が必要である。
Semiconductor lasers (LDs) are nonlinear light-emitting devices that have a threshold current, but the threshold value changes depending on the temperature.
When obtaining digitally modulated output light using a semiconductor laser, currently APC (Auto Power
Control) circuit is required.

このAPC回路は、レーザ出力光が安定になるように半
導体レーザの直流バイアス値を変更するもので、通常第
1図及び第2図に示すような回路構成が採用されている
。第1図示回路は、半導体レザ駆動回路4のモニタ電気
41号と比較することにより制御信号8を得、この制御
信号8を直流バイアス回路5の制御端子に加えて半導体
レーザ1の直流バイアス値を変更するように構成したも
のである。この方法は、モニタ光の%11信号と駆動用
電気信号とがその平均値またはピーク価に於いて直接比
較されるので、いかなる信号形態でも制限を受けること
はない。一方、第2図示回路は、半導体レーザ1のモニ
タ光をモニタ回路2で電気信号に変換し、そのピーク値
をピーク検出回路6で検出してこのピーク値と基準電圧
V0とを比較することにより制御信号8を得るもので、
ピーク値を基準電圧と比較するものであるから・0”の
信号が連続するような場合に問題があp1佃号形態によ
つて制限を受けるが比較的構成が単純になる。
This APC circuit changes the direct current bias value of a semiconductor laser so that the laser output light becomes stable, and usually has a circuit configuration as shown in FIGS. 1 and 2. The first illustrated circuit obtains a control signal 8 by comparing it with the monitor electric No. 41 of the semiconductor laser drive circuit 4, and adds this control signal 8 to the control terminal of the DC bias circuit 5 to control the DC bias value of the semiconductor laser 1. It is configured to change. This method is not limited by any signal format since the %11 signal of the monitor light and the driving electrical signal are directly compared at their average or peak values. On the other hand, the second illustrated circuit converts the monitor light of the semiconductor laser 1 into an electric signal by the monitor circuit 2, detects its peak value by the peak detection circuit 6, and compares this peak value with the reference voltage V0. It obtains the control signal 8,
Since the peak value is compared with the reference voltage, the problem is limited by the p1 code format when there are continuous 0'' signals, but the configuration is relatively simple.

ところで、半導体レーザは過電流によシ容易に破壊する
、そのため、半導体レーザの駆動にあたってはその点に
充分注意しなければならない。しかし、従来のAPC回
路には過電流等に対する対策が全く為されていなかった
ので、例えば制御信号8を生成する回路部分たとえば比
較器3でショート等が起とシ大信号が直流バイアス回路
5に入力されると、半導体レーザ1に大電流が流れ、素
子の破壊を引き起こしてしまう欠点があった。
Incidentally, semiconductor lasers are easily destroyed by overcurrent, so sufficient care must be taken when driving semiconductor lasers. However, since conventional APC circuits have no countermeasures against overcurrents, for example, if a short circuit occurs in the circuit section that generates the control signal 8, such as the comparator 3, a large signal may be applied to the DC bias circuit 5. When inputted, a large current flows through the semiconductor laser 1, which has the drawback of causing destruction of the device.

本発明はこのような従来の欠点を改善したものであシ、
その目的は、半導体レーザの素子破壊につながる過電流
を防止することができる半導体レーザ用直流バイアス回
路を提供することにある。
The present invention improves these conventional drawbacks.
The purpose is to provide a DC bias circuit for a semiconductor laser that can prevent overcurrent that could lead to element destruction of the semiconductor laser.

以下実施例について詳細に説明する。Examples will be described in detail below.

第3図は本発明の実施例を表わす電気回路図であシ、5
1は定電流回路を構成する例えばトランジスタ、52は
演it >V幅器、53はツェナダイオード、54は抵
抗、−f。は電源であって第1図及び第2図と同一符号
は同一部分を示す。
FIG. 3 is an electrical circuit diagram representing an embodiment of the present invention.
1 is a transistor constituting a constant current circuit, 52 is a voltage amplifier, 53 is a Zener diode, 54 is a resistor, and -f. 1 is a power source, and the same reference numerals as in FIGS. 1 and 2 indicate the same parts.

本実施例の直流バイアス回路5は、同図に示すように、
定電流回路を構成するトランジスタ51のベースと負電
源電圧間にツェナダイオード53を接続し、比較回路6
からの制御信号8を演p−増幅器52を介してトランジ
スタ51のペースに入力する構成としたものである。こ
の場合、ツェナダイオード56はトランジスタ51のベ
ース電圧が一定値以上にならないよう保護するものであ
シ、これによシショート等により大信号が直流バイアス
回路5に印加されても半導体レーザ1を大電流が流れる
ことはなくなり、素子の破壊を防ぐことができる。
As shown in the figure, the DC bias circuit 5 of this embodiment has the following features:
A Zener diode 53 is connected between the base of the transistor 51 constituting the constant current circuit and the negative power supply voltage, and a comparison circuit 6 is connected.
The control signal 8 is inputted to the transistor 51 via a p-amplifier 52. In this case, the Zener diode 56 protects the base voltage of the transistor 51 from exceeding a certain value, so that even if a large signal is applied to the DC bias circuit 5 due to a short circuit or the like, the Zener diode 56 will not cause the semiconductor laser 1 to become Current will no longer flow, and destruction of the element can be prevented.

このように本発明は、半導体レーザ用直流バイアス回路
において、定電流回路の制御端子と出力端子間にツェナ
ダイオードを接続する構成としたものであシ、ツェナダ
イオードの世1きによって過電流が防止できるので、半
導体し〜ザが過電流によって破壊するのを防ぐ効果があ
る。従って、本発明の直流バイアス回路をAPC’回路
に適用すれば非常に有効である。
As described above, the present invention has a structure in which a Zener diode is connected between the control terminal and the output terminal of a constant current circuit in a DC bias circuit for a semiconductor laser, and the superiority of the Zener diode prevents overcurrent. This has the effect of preventing the semiconductor device from being destroyed by overcurrent. Therefore, it is very effective to apply the DC bias circuit of the present invention to an APC' circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図はAPC回路の一般的構成を表わす知
、気回路図、第3図は本発明の実施例を表わす電気回路
図である。 1は半導体レーザ、2はモニタ回路、6は比較器、4は
半導体レーザ駆動回路、5は直流バイアス回路、6はピ
ーク検出回路、51はトランジスタ、52は演算増幅器
、53はツェナダイオード、54は抵抗である。 %駆出願人 住友電気工業株式会社 代理人弁理士玉蟲久五部
1 and 2 are electrical circuit diagrams showing the general structure of an APC circuit, and FIG. 3 is an electrical circuit diagram showing an embodiment of the present invention. 1 is a semiconductor laser, 2 is a monitor circuit, 6 is a comparator, 4 is a semiconductor laser drive circuit, 5 is a DC bias circuit, 6 is a peak detection circuit, 51 is a transistor, 52 is an operational amplifier, 53 is a Zener diode, 54 is a It is resistance. Applicant: Sumitomo Electric Industries Co., Ltd. Patent attorney Gobe Tamamushi

Claims (1)

【特許請求の範囲】[Claims] 半導体レーザのモニタ光を処理して得た制御信号に基づ
きレーザ出力光が安定になるようにその直流バイアスを
変更する直流バイアス回路に於いて、半導体レーザに直
流バイアスを与える定電流回路の制御端子と負電源箱、
正端子間にツェナダイオードを接続して前記制御信号を
前記制御端子に入力する構成としたことを%徴とする半
導体レーザ用直流バイアス回路。
In a DC bias circuit that changes the DC bias to stabilize the laser output light based on the control signal obtained by processing the semiconductor laser's monitor light, the control terminal of the constant current circuit that applies DC bias to the semiconductor laser. and negative power box,
A DC bias circuit for a semiconductor laser, characterized in that a Zener diode is connected between the positive terminals and the control signal is input to the control terminal.
JP24874083A 1983-12-27 1983-12-27 Direct current bias circuit for semiconductor laser Pending JPS59145587A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24874083A JPS59145587A (en) 1983-12-27 1983-12-27 Direct current bias circuit for semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24874083A JPS59145587A (en) 1983-12-27 1983-12-27 Direct current bias circuit for semiconductor laser

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP4300880A Division JPS56140685A (en) 1980-04-02 1980-04-02 Dc bias circuit for semiconductor laser

Publications (1)

Publication Number Publication Date
JPS59145587A true JPS59145587A (en) 1984-08-21

Family

ID=17182655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24874083A Pending JPS59145587A (en) 1983-12-27 1983-12-27 Direct current bias circuit for semiconductor laser

Country Status (1)

Country Link
JP (1) JPS59145587A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4884280A (en) * 1987-09-25 1989-11-28 Kabushiki Kaisha Toshiba Semiconductor laser driving device for stabilizing the optical output thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53116794A (en) * 1977-03-23 1978-10-12 Mitsubishi Electric Corp Laser device for optical communication

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53116794A (en) * 1977-03-23 1978-10-12 Mitsubishi Electric Corp Laser device for optical communication

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4884280A (en) * 1987-09-25 1989-11-28 Kabushiki Kaisha Toshiba Semiconductor laser driving device for stabilizing the optical output thereof

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