JPS59131113A - 電子写真用感光体の感光層膜厚測定装置 - Google Patents

電子写真用感光体の感光層膜厚測定装置

Info

Publication number
JPS59131113A
JPS59131113A JP573183A JP573183A JPS59131113A JP S59131113 A JPS59131113 A JP S59131113A JP 573183 A JP573183 A JP 573183A JP 573183 A JP573183 A JP 573183A JP S59131113 A JPS59131113 A JP S59131113A
Authority
JP
Japan
Prior art keywords
photosensitive layer
photoreceptor
probe
film thickness
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP573183A
Other languages
English (en)
Japanese (ja)
Other versions
JPH029685B2 (enExample
Inventor
Yoshiki Yokoyama
横山　芳樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP573183A priority Critical patent/JPS59131113A/ja
Publication of JPS59131113A publication Critical patent/JPS59131113A/ja
Publication of JPH029685B2 publication Critical patent/JPH029685B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
    • G01B5/066—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP573183A 1983-01-17 1983-01-17 電子写真用感光体の感光層膜厚測定装置 Granted JPS59131113A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP573183A JPS59131113A (ja) 1983-01-17 1983-01-17 電子写真用感光体の感光層膜厚測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP573183A JPS59131113A (ja) 1983-01-17 1983-01-17 電子写真用感光体の感光層膜厚測定装置

Publications (2)

Publication Number Publication Date
JPS59131113A true JPS59131113A (ja) 1984-07-27
JPH029685B2 JPH029685B2 (enExample) 1990-03-05

Family

ID=11619251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP573183A Granted JPS59131113A (ja) 1983-01-17 1983-01-17 電子写真用感光体の感光層膜厚測定装置

Country Status (1)

Country Link
JP (1) JPS59131113A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102384733A (zh) * 2011-08-25 2012-03-21 铜陵三佳山田科技有限公司 塑封体厚度区分检测装置
CN105043210A (zh) * 2015-05-07 2015-11-11 嘉兴斯达微电子有限公司 一种物体表面镀层厚度的检测装置及过程管控方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102384733A (zh) * 2011-08-25 2012-03-21 铜陵三佳山田科技有限公司 塑封体厚度区分检测装置
CN105043210A (zh) * 2015-05-07 2015-11-11 嘉兴斯达微电子有限公司 一种物体表面镀层厚度的检测装置及过程管控方法

Also Published As

Publication number Publication date
JPH029685B2 (enExample) 1990-03-05

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