JPS59121746A - 表面分析装置 - Google Patents
表面分析装置Info
- Publication number
- JPS59121746A JPS59121746A JP57227437A JP22743782A JPS59121746A JP S59121746 A JPS59121746 A JP S59121746A JP 57227437 A JP57227437 A JP 57227437A JP 22743782 A JP22743782 A JP 22743782A JP S59121746 A JPS59121746 A JP S59121746A
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- anode
- ion
- hole
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57227437A JPS59121746A (ja) | 1982-12-28 | 1982-12-28 | 表面分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57227437A JPS59121746A (ja) | 1982-12-28 | 1982-12-28 | 表面分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59121746A true JPS59121746A (ja) | 1984-07-13 |
JPH0135469B2 JPH0135469B2 (enrdf_load_stackoverflow) | 1989-07-25 |
Family
ID=16860844
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57227437A Granted JPS59121746A (ja) | 1982-12-28 | 1982-12-28 | 表面分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59121746A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5150010A (en) * | 1990-03-14 | 1992-09-22 | Kabushiki Kaisha Toshiba | Discharge-in-magnetic-field type ion generating apparatus |
-
1982
- 1982-12-28 JP JP57227437A patent/JPS59121746A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5150010A (en) * | 1990-03-14 | 1992-09-22 | Kabushiki Kaisha Toshiba | Discharge-in-magnetic-field type ion generating apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPH0135469B2 (enrdf_load_stackoverflow) | 1989-07-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Kruit et al. | Magnetic field paralleliser for 2π electron-spectrometer and electron-image magnifier | |
JPH09500967A (ja) | 超感度分子識別装置 | |
Kisker et al. | Electron spectrometer for spin‐polarized angle‐and energy‐resolved photoemission from ferromagnets | |
US3644731A (en) | Apparatus for producing an ion beam by removing electrons from a plasma | |
US6985553B2 (en) | Ultra-short ion and neutron pulse production | |
JPS6110844A (ja) | 質量分析計および質量分析法 | |
Gibson et al. | Collision-induced dissociation of 10 keV H2+ ions | |
Booth et al. | Space charge lens for high current ion beams | |
US4455486A (en) | Method and apparatus for detecting magnetism by means of electron spin polarization measurements through dielectronic transition | |
JPS59121746A (ja) | 表面分析装置 | |
US4500787A (en) | Method and a device for furnishing an ion stream | |
US3534385A (en) | Process and apparatus for micro-machining and treatment of materials | |
US3141975A (en) | Pulsed neutron generator with high vacuum and control grid between ion source and target | |
JPH04505828A (ja) | 真空装置のリーク検出のための、冷陰極イオン源を用いる分圧ゲージ | |
Krishnakumar et al. | Dissociative attachment studies by negative‐ion time‐of‐flight mass spectrometry | |
US3379968A (en) | Method and means for detection of gases and vapors | |
US3417238A (en) | Gas chromatographic detector utilizing radioactivity | |
Purser | A future AMS/chromatography instrument for biochemical and environmental measurements | |
JPH0355934B2 (enrdf_load_stackoverflow) | ||
JP2777614B2 (ja) | 質量分析方法および質量分析計 | |
Kruger et al. | Ionization of a polarized deuterium beam in a penning discharge | |
Nishihashi et al. | Negative ion source for the tandem accelerator | |
Okano | Preliminary Report on an Electromagnetic Isotope Separator | |
Hammon et al. | Ionization of a polarized atomic beam in a high magnetic field by use of charge exchange reactions | |
JP2001343364A (ja) | 固体中の特定原子の検出装置 |