JPS59121745A - 表面分析装置 - Google Patents
表面分析装置Info
- Publication number
- JPS59121745A JPS59121745A JP57227414A JP22741482A JPS59121745A JP S59121745 A JPS59121745 A JP S59121745A JP 57227414 A JP57227414 A JP 57227414A JP 22741482 A JP22741482 A JP 22741482A JP S59121745 A JPS59121745 A JP S59121745A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- anode
- cathode
- hollow part
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005211 surface analysis Methods 0.000 title description 9
- 150000002500 ions Chemical class 0.000 abstract description 50
- 239000007789 gas Substances 0.000 abstract description 12
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 abstract description 5
- 230000004927 fusion Effects 0.000 abstract description 5
- 239000002245 particle Substances 0.000 abstract description 5
- 229910052786 argon Inorganic materials 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract description 3
- 230000005672 electromagnetic field Effects 0.000 abstract description 2
- 230000001678 irradiating effect Effects 0.000 abstract description 2
- 230000035945 sensitivity Effects 0.000 abstract description 2
- 125000004429 atom Chemical group 0.000 description 6
- 230000007935 neutral effect Effects 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000004949 mass spectrometry Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- -1 argon Chemical class 0.000 description 1
- 238000009412 basement excavation Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 235000011389 fruit/vegetable juice Nutrition 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57227414A JPS59121745A (ja) | 1982-12-28 | 1982-12-28 | 表面分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57227414A JPS59121745A (ja) | 1982-12-28 | 1982-12-28 | 表面分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59121745A true JPS59121745A (ja) | 1984-07-13 |
JPH0355934B2 JPH0355934B2 (enrdf_load_stackoverflow) | 1991-08-26 |
Family
ID=16860464
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57227414A Granted JPS59121745A (ja) | 1982-12-28 | 1982-12-28 | 表面分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59121745A (enrdf_load_stackoverflow) |
-
1982
- 1982-12-28 JP JP57227414A patent/JPS59121745A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0355934B2 (enrdf_load_stackoverflow) | 1991-08-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5481107A (en) | Mass spectrometer | |
JP2674603B2 (ja) | 環境走査電子顕微鏡の対物レンズ組立体 | |
CA2045484C (en) | Plasma mass spectrometer having a hollow tapered member | |
JPH09500967A (ja) | 超感度分子識別装置 | |
US5223711A (en) | Plasma sources mass spectrometry | |
Okano et al. | A helium-jet type ISOL at the Kyoto University reactor | |
JPS6110844A (ja) | 質量分析計および質量分析法 | |
US3644731A (en) | Apparatus for producing an ion beam by removing electrons from a plasma | |
JP3500323B2 (ja) | サイクロイド質量分析計に使用されるイオナイザー | |
JP2015511704A (ja) | 質量分析計装置のための改良されたインタフェース | |
US4476392A (en) | Photoelectron source for use in a gas chromatograph detector and mass spectrometer ion source | |
US4845364A (en) | Coaxial reentrant ion source for surface mass spectroscopy | |
JPH01296558A (ja) | 質量分析計 | |
JPS59121745A (ja) | 表面分析装置 | |
Clausnitzer | A source of polarized protons | |
JPH11160280A (ja) | イオン化検出器 | |
US3379968A (en) | Method and means for detection of gases and vapors | |
US3277296A (en) | Detection of electronegative compositions by means of electron capture detection | |
Bayly et al. | A Positive Ion Source | |
JPH0135469B2 (enrdf_load_stackoverflow) | ||
Purser | A future AMS/chromatography instrument for biochemical and environmental measurements | |
EP1170587A1 (en) | Total impurity monitor for gases | |
JP2005502067A (ja) | 元素の質量分析のための装置および方法 | |
Bernius et al. | Pulsed, high‐current, in‐line reversal electron attachment detector | |
SU642650A1 (ru) | Электронозахватный детектор |