JPS59121745A - 表面分析装置 - Google Patents

表面分析装置

Info

Publication number
JPS59121745A
JPS59121745A JP57227414A JP22741482A JPS59121745A JP S59121745 A JPS59121745 A JP S59121745A JP 57227414 A JP57227414 A JP 57227414A JP 22741482 A JP22741482 A JP 22741482A JP S59121745 A JPS59121745 A JP S59121745A
Authority
JP
Japan
Prior art keywords
sample
anode
cathode
hollow part
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57227414A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0355934B2 (enrdf_load_stackoverflow
Inventor
Katsuhiro Kageyama
影山 賀都鴻
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP57227414A priority Critical patent/JPS59121745A/ja
Publication of JPS59121745A publication Critical patent/JPS59121745A/ja
Publication of JPH0355934B2 publication Critical patent/JPH0355934B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
JP57227414A 1982-12-28 1982-12-28 表面分析装置 Granted JPS59121745A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57227414A JPS59121745A (ja) 1982-12-28 1982-12-28 表面分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57227414A JPS59121745A (ja) 1982-12-28 1982-12-28 表面分析装置

Publications (2)

Publication Number Publication Date
JPS59121745A true JPS59121745A (ja) 1984-07-13
JPH0355934B2 JPH0355934B2 (enrdf_load_stackoverflow) 1991-08-26

Family

ID=16860464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57227414A Granted JPS59121745A (ja) 1982-12-28 1982-12-28 表面分析装置

Country Status (1)

Country Link
JP (1) JPS59121745A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0355934B2 (enrdf_load_stackoverflow) 1991-08-26

Similar Documents

Publication Publication Date Title
US5481107A (en) Mass spectrometer
JP2674603B2 (ja) 環境走査電子顕微鏡の対物レンズ組立体
CA2045484C (en) Plasma mass spectrometer having a hollow tapered member
JPH09500967A (ja) 超感度分子識別装置
US5223711A (en) Plasma sources mass spectrometry
Okano et al. A helium-jet type ISOL at the Kyoto University reactor
JPS6110844A (ja) 質量分析計および質量分析法
US3644731A (en) Apparatus for producing an ion beam by removing electrons from a plasma
JP3500323B2 (ja) サイクロイド質量分析計に使用されるイオナイザー
JP2015511704A (ja) 質量分析計装置のための改良されたインタフェース
US4476392A (en) Photoelectron source for use in a gas chromatograph detector and mass spectrometer ion source
US4845364A (en) Coaxial reentrant ion source for surface mass spectroscopy
JPH01296558A (ja) 質量分析計
JPS59121745A (ja) 表面分析装置
Clausnitzer A source of polarized protons
JPH11160280A (ja) イオン化検出器
US3379968A (en) Method and means for detection of gases and vapors
US3277296A (en) Detection of electronegative compositions by means of electron capture detection
Bayly et al. A Positive Ion Source
JPH0135469B2 (enrdf_load_stackoverflow)
Purser A future AMS/chromatography instrument for biochemical and environmental measurements
EP1170587A1 (en) Total impurity monitor for gases
JP2005502067A (ja) 元素の質量分析のための装置および方法
Bernius et al. Pulsed, high‐current, in‐line reversal electron attachment detector
SU642650A1 (ru) Электронозахватный детектор