JPS59119826A - Vapor growth apparatus - Google Patents

Vapor growth apparatus

Info

Publication number
JPS59119826A
JPS59119826A JP22836482A JP22836482A JPS59119826A JP S59119826 A JPS59119826 A JP S59119826A JP 22836482 A JP22836482 A JP 22836482A JP 22836482 A JP22836482 A JP 22836482A JP S59119826 A JPS59119826 A JP S59119826A
Authority
JP
Japan
Prior art keywords
pipe
tube
reaction
external
purging gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22836482A
Other languages
Japanese (ja)
Inventor
Takaaki Kimura
記村 隆章
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP22836482A priority Critical patent/JPS59119826A/en
Publication of JPS59119826A publication Critical patent/JPS59119826A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)

Abstract

PURPOSE:To easily realize the purging process within a short period of time by providing a purging gas supply pipe which is capable of supplying a purging gas in the clearance between the external and internal pipes of a double-pipe type vapor growth apparatus. CONSTITUTION:An external pipe 1 of reaction pipe has a cap 11 of external pipe of reaction pipe which opens or closes the reaction pipe, inlet hole 12 and exhausting hole 13 of external pipe of reaction pipe. A substrate 4 to be processed placed on a base material board 3 is sealed within the inside of internal pipe 2 prepared as the protection pipe. A source chamber 5 accommodating sources 61, 62 is provided with the inlet holes 51, 52. A purging gas is supplied to the clearance between the external pipe 1 and internal pipe 2 through a branching pipe 7 by the purging gas supply pipe 7. The number of purging gas supply pipes 7 is not limited to two.

Description

【発明の詳細な説明】 (1)  発明の技術分野 本発明は気相成長装置に関する。特に二重管方式の気相
成長静置の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a vapor phase growth apparatus. In particular, it relates to improvements in vapor phase growth and standing in a double tube system.

(2)技術の背景 気相成長装置〃とは、石英硝子等化学的に安定な材料よ
1)な畳べその内部圧力が減圧しである容器(反応管)
の中に半導体基板等の基材を封入しておき、その基材上
に堆積成長させる半導体等を構成する各組成要素物質を
気体状にして送入し、その組成%素物質の送入路及び堆
積成長軸域1ある基材領域の温度を所期反応の発生に適
する温度に制御しておき、上記の基材上に所望の物質特
に化合物半導体等を堆積成長させる装置をいう。気相成
長装置において、堆積成長は基材上の心になされること
力1望ましいが、現実には、基材の支持架台はもとより
、反応管内壁上にも堆積成長することが避は雌い。その
ため、反応管は二重管としておき、内管1ある保護管内
においてのみ堆積成長をなさしめる二重管方式が多く使
用されている。
(2) Background of the technology A vapor phase growth apparatus is a container (reaction tube) made of chemically stable materials such as quartz glass.
A base material such as a semiconductor substrate is sealed in the base material, and each constituent element substance constituting the semiconductor etc. to be deposited and grown on the base material is fed in gaseous form, and the composition % elementary substance is introduced into the feed path. Deposition growth axis region 1 An apparatus for depositing and growing a desired substance, particularly a compound semiconductor, etc., on the base material by controlling the temperature of a certain base material region to a temperature suitable for the occurrence of a desired reaction. In a vapor phase growth apparatus, it is desirable that the deposition growth occur centrally on the base material, but in reality, it is unavoidable that deposition growth occurs not only on the support frame of the base material but also on the inner wall of the reaction tube. . For this reason, a double-tube system is often used in which the reaction tube is a double-tube structure and the deposition and growth is allowed to occur only in the protective tube with the inner tube 1.

(3)  従来技術と問題点 従来技術における二M管方式の気相成長装置の代表的な
2例を図示すると第1図(a)、(b)の如くなる。図
において、lは反応管外管であり、Ifは反応管外管キ
ャップ〒あり反応管外管を開閉可iこする。12.13
は反応管外管の入気孔と排気孔である。2は内管である
保favであり、その内部に基材架台3に乗せられた被
処理基板4が封入される。
(3) Prior Art and Problems Two typical examples of a two-M tube type vapor phase growth apparatus in the prior art are shown in FIGS. 1(a) and 1(b). In the figure, l is the reaction tube outer tube, If is a reaction tube outer tube cap, and the reaction tube outer tube can be opened and closed. 12.13
are the inlet and exhaust holes of the outer tube of the reaction tube. Reference numeral 2 denotes a storage fav which is an inner tube, and a substrate to be processed 4 placed on a substrate mount 3 is sealed inside the storage fav.

5は組成要素物質(ソース)61.62を収容するソー
スチェンノ9−であす、51.52はソースチェンノ々
−の入気孔である。図(a)と図(b)とのちがいは、
図(11)において、保護管2の被処理基板収容領域の
断面精がせばめられているこ七である。
Reference numeral 5 denotes a source chamber 9 for containing constituent element substances (sources) 61,62, and 51,52 are inlet holes for the source chambers. The difference between figure (a) and figure (b) is
In FIG. 11, the cross section of the processing target substrate accommodating area of the protection tube 2 is narrowed.

かかる従来技術における二爪管方式の気相成長9置にあ
っては、被処理基板4やソース61,62を交換したk
き、反応管内は一旦真空が破れ空気が充満するので、堆
積成長に先立ち、反応管温度を低下し反応発生の中性を
満たさないようにして、入気孔12.51.52から水
素(N2)等のキャリヤーガスや窒素(N2)等の不活
性ガスを供給して反応管内部から好ましくない気体を駆
逐する。しかし、特に反応管外管1と保護管2とに挾ま
れた領域に滞留している酸素(02)や水分(N20)
等の除去が困難であり、上記のパージ工程に1〜2時間
を要している。換言すれば、1〜2時間を要して十分に
ノξ−ジをなすことなく堆積成長工程を開始すると、堆
積成長する半導体等堆積物の品位が安定しない。反応管
外管の内壁と保護管外壁との間隙が0.5〜2 (rn
m )  程度と小さいためである。
In such a conventional two-claw tube type vapor phase growth system, the substrate 4 to be processed and the sources 61 and 62 are replaced.
At this time, the vacuum inside the reaction tube is temporarily broken and air is filled. Therefore, prior to the deposition growth, the temperature of the reaction tube is lowered so as not to satisfy the neutrality of the reaction, and hydrogen (N2) is injected from the inlet hole 12, 51, 52. A carrier gas such as , or an inert gas such as nitrogen (N2) is supplied to expel undesirable gases from inside the reaction tube. However, especially the oxygen (02) and moisture (N20) remaining in the area sandwiched between the reaction tube outer tube 1 and the protection tube 2
It is difficult to remove such substances, and the above purging process takes 1 to 2 hours. In other words, if the deposition growth process is started without forming a sufficient nozzle for 1 to 2 hours, the quality of the deposits such as semiconductors to be deposited and grown will not be stable. The gap between the inner wall of the reaction tube outer tube and the outer wall of the protection tube is 0.5 to 2 (rn
This is because it is as small as .m).

(4)  発明の目的 本発明の目的はこの欠点を解消することにあI)、基材
、ソース等を交換した後堆積成長工程の開始に先立って
なすパージ工程を容易1′−、かつ、短時間をもってな
しうる利益を有する、二重管方式の気相成長装置を提供
することにある。
(4) Purpose of the Invention The purpose of the present invention is to eliminate this drawback.1) The purpose of the present invention is to facilitate the purging step which is performed after exchanging the substrate, source, etc. and prior to the start of the deposition growth step. It is an object of the present invention to provide a double-tube type vapor phase growth apparatus that has advantages that can be achieved in a short period of time.

(5) 発明の構成 上記の目的は、反応管外管内に保護管を有する二重管方
式の気相成長装置において、前記外管と内管との間隙に
パージガスを供給しうるノe−ジガス供給管を設けるこ
とにより達成される。
(5) Structure of the Invention The above object is to provide a nozzle gas which can supply purge gas to the gap between the outer tube and the inner tube in a double tube type vapor phase growth apparatus having a protection tube inside the outer tube of the reaction tube. This is achieved by providing a supply pipe.

上記のパージガス供給管の数量、配置される位置、形状
等は下記する実施例に述べるとおり、多種・多様である
が、下記する実施例に制限されるもの1はない。
The quantity, position, shape, etc. of the above-mentioned purge gas supply pipes vary widely as described in the examples below, but are not limited to the examples described below.

(6)発明の実施例 以下図面を参照しつつ、本発明の二・三の実施例に係る
気相成長装置について、更に説明する。
(6) Embodiments of the Invention Hereinafter, vapor phase growth apparatuses according to a few embodiments of the present invention will be further described with reference to the drawings.

第2図参照 図は本発明の一実施例に係る気相成長装置の概念的断面
図を示す。図において、1は反応管外管であり、11は
反応管外管キャップであI)反応管を開閉可能にする。
Referring to FIG. 2, a conceptual sectional view of a vapor phase growth apparatus according to an embodiment of the present invention is shown. In the figure, 1 is an outer tube of the reaction tube, and 11 is a cap of the outer tube of the reaction tube, which enables the reaction tube to be opened and closed.

12.13は反応管外管の人気孔と排気孔とである。2
は内管〒ある保護管fあり、その内部に基材架台3に乗
せられた被処理基板4が封入される。5はソース61.
62を収容するソースチェンノ々−でアリ、51.52
はソースチェンノζ−の入気孔〒ある。7が本発明の要
旨にかかるパージガス供給管であり、71の如き支管を
介して外管と内管との間隙にパージガスを供給する。ノ
ξ−ジガス供給管7の数量は図においては2個が示され
ているが、2個に限ることはない。
Reference numerals 12 and 13 are the popular hole and exhaust hole of the outer tube of the reaction tube. 2
There is an inner tube f, in which a substrate 4 to be processed placed on a substrate mount 3 is sealed. 5 is sauce 61.
62, 51.52
is the inlet hole of the source Cheno ζ−. Reference numeral 7 denotes a purge gas supply pipe according to the gist of the present invention, which supplies purge gas to the gap between the outer pipe and the inner pipe through branch pipes such as 71. In the figure, two gas supply pipes 7 are shown, but the number is not limited to two.

第3図参照 図は本発明の他の実施例に係る気相成長装置の概念的断
面図である。第2図に示す物と異なるところは、・ξ−
ジガス供給管7′が間隙に沿う方向にノに一ジガスを吹
き出すように複数個設けられており、間隙の・ξ−ジ効
果を向上していることにある。
3 is a conceptual sectional view of a vapor phase growth apparatus according to another embodiment of the present invention. The difference from the one shown in Figure 2 is: ・ξ−
A plurality of di-gas supply pipes 7' are provided so as to blow out di-gas at once in the direction along the gap, thereby improving the .xi.-di effect of the gap.

第4図参照 図は本発明の更に他の実施例に係る気相成長装置の概念
的断面図1ある。第2図、第3図に示す実施例と異なる
ところは、ノクージガス供給管7′の先端に保護管2を
囲ん1リング状のパージガス分配部71′が設けられ、
このリング状のA−ジガス分配部71″の間隙に対面す
る領域に複数のパージガス放出管71が設けられている
ことにある。
Referring to FIG. 4, there is a conceptual sectional view 1 of a vapor phase growth apparatus according to still another embodiment of the present invention. The difference from the embodiment shown in FIGS. 2 and 3 is that a ring-shaped purge gas distribution section 71' is provided at the tip of the nocuzi gas supply pipe 7' surrounding the protection tube 2.
A plurality of purge gas discharge pipes 71 are provided in an area facing the gap of this ring-shaped A-di gas distribution section 71''.

以上いずれの実施例においても、従来技術においては酸
素(0□)、水分(N20)等が滞留しやすい、外管と
内管との間隙に/e−ジガスが強制的に供給されるので
、極めて短時間で容易にかかる望ましくない気体が除去
され、堆積成長工程の能率向上に寄与することとなる。
In any of the above embodiments, in the prior art, the /e-di gas is forcibly supplied to the gap between the outer tube and the inner tube, where oxygen (0□), moisture (N20), etc. tend to accumulate. Such undesirable gases can be easily removed in a very short time, contributing to improved efficiency of the deposition growth process.

なお、上記いずれの実施例においても保護管の形状は円
筒状とされているが、これが−側受あることはいうまで
もない。
Incidentally, in any of the above embodiments, the shape of the protective tube is cylindrical, but it goes without saying that this has a negative side support.

(7)発明の詳細 な説明せるとおり、本発明によれば、基材、ソース等を
交換した後堆積成長工程の開始に先立ってなす/e−ジ
工程が容易に短時間をもってなしうる利益を有する二重
管方式の気相成長装置を提供することが1きる。
(7) As described in detail, the present invention provides benefits that can be achieved easily and in a short period of time by the e-direction step performed after exchanging the substrate, source, etc. and prior to the start of the deposition growth step. It is possible to provide a double tube type vapor phase growth apparatus having the following.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)、(b)は従来技術における二重管方式の
気相成長装置の概念的断面図fある。第2.3、4圀は
それぞれ、本発明の実施例にかかる二重管方式の気相成
長装置の概念的断面図である。 1・・・反応管外管、11・・・反応管外管のキャップ
、12・・・反応管外管の入気孔、13・・・反応管外
管の排気孔、2・・・4M護管、3・・・基材架台、4
・・・被処理基板、5・・・ソースチェンノ々−151
,52・・・ソースチェンノ々−の入気孔、61.62
・・・ソース、7・・・ノξ−ジガス供給管、71・・
・支管、7′・・・パージガス供給管、7′・・・・ぞ
−ジガス供給管、71′・・・パージガス分配部、71
・・・ノに一ジガス放出部。
FIGS. 1(a) and 1(b) are conceptual cross-sectional views of a conventional double tube type vapor phase growth apparatus. 2.3 and 4 are conceptual cross-sectional views of a double tube type vapor phase growth apparatus according to an embodiment of the present invention. 1...Reaction tube outer tube, 11...Reaction tube outer tube cap, 12...Reaction tube outer tube inlet hole, 13...Reaction tube outer tube exhaust hole, 2...4M protection Pipe, 3...Base material frame, 4
...Substrate to be processed, 5...Source chain-151
, 52...Inlet hole of source chain, 61.62
...Source, 7...Noξ-di gas supply pipe, 71...
・Branch pipe, 7'... Purge gas supply pipe, 7'... Digas supply pipe, 71'... Purge gas distribution section, 71
...Niji gas discharge part.

Claims (1)

【特許請求の範囲】[Claims] 反応管外管内に保護管を有する二重管方式の気相成長装
置において、前記外管と内管との間隙にパージガスを供
給するパージガス供給管を有することを特徴とする気相
成長静置。
A double tube type vapor phase growth apparatus having a protection tube inside the outer tube of the reaction tube, characterized in that it has a purge gas supply tube for supplying purge gas to the gap between the outer tube and the inner tube.
JP22836482A 1982-12-27 1982-12-27 Vapor growth apparatus Pending JPS59119826A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22836482A JPS59119826A (en) 1982-12-27 1982-12-27 Vapor growth apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22836482A JPS59119826A (en) 1982-12-27 1982-12-27 Vapor growth apparatus

Publications (1)

Publication Number Publication Date
JPS59119826A true JPS59119826A (en) 1984-07-11

Family

ID=16875297

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22836482A Pending JPS59119826A (en) 1982-12-27 1982-12-27 Vapor growth apparatus

Country Status (1)

Country Link
JP (1) JPS59119826A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60182723A (en) * 1984-02-29 1985-09-18 Nec Corp Vapor growth device for semiconductor
JPH07254570A (en) * 1995-03-02 1995-10-03 Tokyo Electron Tohoku Ltd Heat treatment method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60182723A (en) * 1984-02-29 1985-09-18 Nec Corp Vapor growth device for semiconductor
JPH07254570A (en) * 1995-03-02 1995-10-03 Tokyo Electron Tohoku Ltd Heat treatment method

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