JPS59115502A - Thick film resistor - Google Patents

Thick film resistor

Info

Publication number
JPS59115502A
JPS59115502A JP57228165A JP22816582A JPS59115502A JP S59115502 A JPS59115502 A JP S59115502A JP 57228165 A JP57228165 A JP 57228165A JP 22816582 A JP22816582 A JP 22816582A JP S59115502 A JPS59115502 A JP S59115502A
Authority
JP
Japan
Prior art keywords
thick film
trimming
resistor
resistance value
film resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57228165A
Other languages
Japanese (ja)
Inventor
吉居 立
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57228165A priority Critical patent/JPS59115502A/en
Publication of JPS59115502A publication Critical patent/JPS59115502A/en
Pending legal-status Critical Current

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  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Non-Adjustable Resistors (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (シ))発明の技術分野 本発明は厚膜抵抗体にかかり、特に高信頼化した抵抗パ
ターンの形状に関する。
DETAILED DESCRIPTION OF THE INVENTION (c) Technical Field of the Invention The present invention relates to thick film resistors, and particularly relates to the shape of a highly reliable resistor pattern.

(bl  従来技術と問題点 周知の如く厚膜ハイブリッド集積回路(IC)では、絶
縁基板(セラミック基板)に抵抗体や導体が印刷して形
成される。配線用の導体は例えば銀パラジウム(^gP
d )系の材料で、抵抗体は例えば酸化ルテニウム(R
uO2)と絶縁物とを混合した材料であって、それらを
溶剤に溶かして数μmの厚さに印刷し焼成して、作成さ
れる。しかし、印刷の厚さにバラツキがあって一定しな
いため、抵抗体はそのままでは精度の良い抵抗値に形成
することが難しい。従って、予め低い抵抗値をもった(
換言すれば広い抵抗膜面をもった)抵抗体に形成した後
、トリミング(例えばレーザトリミングやサンドブラス
ト)によって抵抗膜面を線状に除去して抵抗値の調整を
行なっている。
(bl) Prior Art and Problems As is well known, in thick film hybrid integrated circuits (ICs), resistors and conductors are printed on an insulating substrate (ceramic substrate). Conductors for wiring are made of, for example, silver palladium (^gP).
d) type material, the resistor is made of, for example, ruthenium oxide (R
It is a material that is a mixture of uO2) and an insulator, and is created by dissolving them in a solvent, printing them to a thickness of several μm, and firing them. However, since the printing thickness varies and is not constant, it is difficult to form the resistor as it is to have an accurate resistance value. Therefore, it has a low resistance value in advance (
In other words, after forming a resistor (having a wide resistive film surface), the resistance value is adjusted by removing the resistive film surface linearly by trimming (for example, laser trimming or sandblasting).

第1図はこのようなトリミング後の抵抗体の平面図を示
しており、lは抵抗膜、2は導体膜、3はトリミングラ
インで、抵抗膜の広さは約1fl角程度、抵抗値は数Ω
〜数にΩ(抵抗値は絶縁物の混合比率を変えて所望の数
値にする)のものである。トリミングは、最近ではレー
ザトリミングが多り、ビーム径数10μmのレーザビー
ムで走査しトリミングラインを形成する。その走査速度
はステップモータで制御するためトリミング長さの誤差
は20μm以下と極めて精度が良い。
Figure 1 shows a plan view of the resistor after such trimming, where l is the resistance film, 2 is the conductor film, and 3 is the trimming line.The width of the resistance film is about 1 fl square, and the resistance value is several ohms
~ several Ω (the resistance value is set to the desired value by changing the mixing ratio of the insulators). As for trimming, laser trimming is often used recently, and a trimming line is formed by scanning with a laser beam having a beam diameter of several tens of micrometers. Since the scanning speed is controlled by a step motor, the trimming length error is 20 μm or less, which is extremely accurate.

しかしながら、トリミング工程においてはセラミック基
板はレーザの走査によって高温に加熱され、また急に冷
却されることになるため抵抗膜にマイクロクランクを発
生する。そして、更に動作中に高いサージ電流が流れる
とこのマイクロクラツクが原因となって抵抗体の欠損と
それに伴う抵抗値の変化が起こり、その抵抗値の変動が
10数%に及ぶことがある。
However, in the trimming process, the ceramic substrate is heated to a high temperature by laser scanning and cooled down rapidly, causing microcranks in the resistive film. Furthermore, when a high surge current flows during operation, this micro-cracking causes damage to the resistor and a corresponding change in resistance value, which can vary by more than 10%.

(cl  発明の目的 本発明はこのようなマイクロクラックの発生を解消した
厚膜抵抗体を提案するものである。
(cl) Purpose of the Invention The present invention proposes a thick film resistor that eliminates the occurrence of such microcracks.

(dl  発明の構成 その目的は、メソシュ状にした複数の窓が抵抗膜面に設
りられた厚膜抵抗体によって達成することができる。
(dl) Structure of the Invention The object can be achieved by a thick film resistor in which a plurality of mesh-shaped windows are provided on the resistive film surface.

(e)  発明の実施例 以下1図面を参照して実施例によって詳細に説明する。(e) Examples of the invention An embodiment will be described in detail below with reference to one drawing.

第2図は本発明にかかる抵抗体の平面図を示しており、
1は抵抗膜、2ば導体膜と第1図と同様であるが、抵抗
膜1の面に多数の窓11 (抵抗膜を塗布しないセラミ
ック基板の生地のままの窓)を設ける。第2図の例では
抵抗膜全面の60%の領域にこのような窓11をメツシ
ュ状に40個形成している。
FIG. 2 shows a plan view of a resistor according to the present invention,
1 is a resistive film, 2 is a conductive film, and is similar to that shown in FIG. 1, but a large number of windows 11 (windows in the raw material of the ceramic substrate without the resistive film coated thereon) are provided on the surface of the resistive film 1. In the example shown in FIG. 2, 40 such windows 11 are formed in a mesh shape over 60% of the entire surface of the resistive film.

かくして、トリミング工程でトリミングライン3を形成
し、このトリミングラインは従来と同様に鍵形(「形)
にしてもよいが、第3図の如(に直線状に多数のトリミ
ングラインを窓から窓へ描く形成方法が好ましい。そう
すると、精度良く細かく調整した抵抗値を形成すること
ができる。即ち、かようにして多数のトリミングライン
を描けば、最も長いラインは抵抗値に大きく影響を与え
、短いラインになるに従って抵抗値に影響が小さくなる
からこれらのラインを混合して、抵抗値を微細に調整で
きる。
Thus, a trimming line 3 is formed in the trimming process, and this trimming line has a key shape ("shape") as in the conventional method.
However, it is preferable to draw a large number of trimming lines in a straight line from window to window as shown in Fig. If you draw a large number of trimming lines in this way, the longest line will have a large effect on the resistance value, and the shorter the lines, the smaller the effect on the resistance value, so you can mix these lines and finely adjust the resistance value. can.

このようにしてトリミングを窓から窓にかけて走査し、
窓内を終止点にすると、マイクロクランクは極めて小さ
くなり、それに伴う抵抗体の欠損と抵抗値の変化が防止
される。従来、マイクロクラックの発生と成長はトリミ
ングラインの曲がり角部分と終止部分に特に多く発生し
ていたが、このようにすれば角部と終端部を窓内に設け
ることができるからその欠点は完全に除去される。
In this way, the crop is scanned from window to window,
By making the end point inside the window, the micro-crank becomes extremely small, and the accompanying damage to the resistor and change in resistance value are prevented. Conventionally, microcracks were most likely to occur and grow at the bends and ends of the trimming line, but with this method, the corners and ends can be placed inside the window, completely eliminating this drawback. removed.

この窓の大きさはレーザビームのビーム径の2倍以上が
妥当で、100〜200μm角が適している。あるいは
数100μm角としても上記のトリミング方法を採れば
従来と同様の精度で抵抗値の調整が可能である。しかし
、精度上は小面積が一層望ましく、また作成上は大きい
面積の窓の方が作りやすい。且つ、このような抵抗体は
導体方向の間隙幅とその数が抵抗値に影響するから、設
計の際にこれらを良く考慮して設計することが必要であ
る。
The appropriate size of this window is at least twice the beam diameter of the laser beam, and is suitably 100 to 200 μm square. Alternatively, if the above-mentioned trimming method is adopted even if the size is several hundred μm square, the resistance value can be adjusted with the same accuracy as in the conventional method. However, in terms of accuracy, a small area is more desirable, and in terms of fabrication, it is easier to create a window with a large area. In addition, since the resistance value of such a resistor is affected by the gap width in the direction of the conductor and the number thereof, it is necessary to take these into consideration when designing.

(fl  発明の効果 以上の説明から明らかなように、本発明よれば動作中に
抵抗値が変化しない厚膜抵抗体が形成されるから、ハイ
ブリッドICの高信頼化に著しく貢献するものである。
(fl) Effects of the Invention As is clear from the above description, according to the present invention, a thick film resistor whose resistance value does not change during operation is formed, which significantly contributes to higher reliability of hybrid ICs.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のトリミングした厚膜抵抗体の平面図、第
2図は本発明にかかる厚膜抵抗体の平面図、第3図はそ
れをトリミングした厚膜抵抗体の平面図である。 図中、1は抵抗膜、2は導体膜、3はトリミングライン
、11は窓を示す。 第1図 1 5B、4.14 特許庁長官殿 1す(f′1の表ボ 昭和!7 +1’ f、l’ll’l’馳第222yメ
!シJ3、 +ill it−を′すると ’I(1’l 、!: 〕閏f#      1=74
’l’71暫f1人11 所 神余用県川崎11川リエ
;ilK llI・11川り015音地(522)名称
富士通株式会社
FIG. 1 is a plan view of a conventional trimmed thick film resistor, FIG. 2 is a plan view of a thick film resistor according to the present invention, and FIG. 3 is a plan view of a trimmed thick film resistor. In the figure, 1 is a resistive film, 2 is a conductive film, 3 is a trimming line, and 11 is a window. Fig. 1 5B, 4.14 Mr. Commissioner of the Japan Patent Office 1 (f'1's front face Showa! 7 +1' f, l'll'l' 222nd year! Shi J3, +ill it-') I(1'l,!: ) leap f# 1=74
'l'71 temporary f1 person 11 location Kamiyayo Prefecture Kawasaki 11 Kawarie; ilK llI・11 Kawari 015 sound location (522) Name Fujitsu Ltd.

Claims (1)

【特許請求の範囲】[Claims] メソシュ状にした複数の窓が抵抗膜面に設けられたこと
を特徴とする厚膜抵抗体。
A thick film resistor characterized in that a plurality of mesoche-shaped windows are provided on a resistive film surface.
JP57228165A 1982-12-22 1982-12-22 Thick film resistor Pending JPS59115502A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57228165A JPS59115502A (en) 1982-12-22 1982-12-22 Thick film resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57228165A JPS59115502A (en) 1982-12-22 1982-12-22 Thick film resistor

Publications (1)

Publication Number Publication Date
JPS59115502A true JPS59115502A (en) 1984-07-04

Family

ID=16872246

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57228165A Pending JPS59115502A (en) 1982-12-22 1982-12-22 Thick film resistor

Country Status (1)

Country Link
JP (1) JPS59115502A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61157302U (en) * 1985-03-23 1986-09-30

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61157302U (en) * 1985-03-23 1986-09-30

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