JPS59101100A - Data comparing system - Google Patents

Abstract

PURPOSE:To execute the comparison test without noticing a write data at the comparison of data by writing the data of an optional repetitive pattern as a write data and comparing a part of the data and other readout data at readout. CONSTITUTION:A data pattern written in a write data memory 4 is written from a processor MPU7 at WRITE. As the data pattern, for example, a repetitive data of ''1234'' is used. A data is written from the memory 4 to a test device 1. The repetitive pattern of 16-Byte is written by using a low-cost 4-bit of a Byte counter 3 as an address. The 1st 16-Byte of a READ data is written in a comparison data memory 5 at READ. Data after the next and succeeding data are written in an READ data memory 6 and compared with the data written in the memory 5 at the same time by a comparator circuit 8. The repetitive data in 16-Byte attains the comparison by using a low-order 4-bit of the Byte counter as the address data of the memory 5 in this case.

Description

DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a data comparison method, particularly to a data comparison method in a data write/read test of a storage device.

(2) Prior Art and Problems Conventionally, in data writing and reading tests of storage devices, comparison data has only been compared with data prepared in advance by a testing machine. For this reason, either the test content was insufficient because only a specific data pattern could be tested, or it was necessary to provide data for comparison on the testing machine side. (3) Purpose of the Invention The present invention In view of the above conventional drawbacks, the purpose of this invention is to provide a data comparison method that allows writing/reading tests to be performed using arbitrary data patterns and making it possible to perform comparison tests without having to be aware of scrapped data when comparing data. be.

(4) Structure and object of the invention According to the present invention, in a data writing/reading test of a storage device, there is provided a means for using data of an arbitrary repeating pattern as data for writing, and a means for using data of an arbitrary repeating pattern when reading data. This is achieved by providing a data comparison method characterized in that it has a comparison means for comparing a part of the stored data with the other read data, and performs a reading test.

(5) Examples of inventions Embodiments of the present invention will be described in detail below with reference to the drawings.

FIG. 1 is a block diagram for realizing the data comparison method according to the present invention, and FIG. 2 is an explanatory diagram of the data comparison method according to the present invention.

In FIG. 1, reference numeral 1 denotes a test device, which commands execution of data write and read test operations to the storage device.

2 is a bit-byte conversion circuit, 3 is a byte counter, 4
is a write data memory, a memory in which all the honorary write data patterns are written, 5 is a comparison data memory, a memory in which the first 16 bytes of read data are written in advance, 6 is a read data memory, and 7 1 is the open side processor, and 8 is the comparison circuit. Below, using the means of the present invention, data swarming and data surfacing of a storage device will be explained.

(At the time of WRITE, the control processor 7 first warns the data pattern to be written to the write data memory 4 via the data bus.The data pattern is, for example, 12341.
234...... 1234'' of 1234'' repetition data is used. Next, the data is saved from the save data memory 4 to the test device. At this time, by using the lower 4 bits of the Byte counter 3 as an address, a 16-byte repeating pattern can be written.

(+D At the time of READ, the first 16 Bytes of READ data are saved to the comparison data memory 5. From the next READ data, RE
At the same time as writing into the AD data memory 6, a comparison circuit 8 compares the data with the data previously written into the comparison data memory 5. At this time, by using the lower 4 bits of the Byte counter as the address data of the comparison data memory 5, the comparison can be made with 516 bytes of green return data.

Furthermore, when the comparison results do not match, the Byte counter is notified to the control processor 7 so that the error Byte can be detected.
You can learn about e-rank cooperation. Further, by accessing the comparison data memory 5 and the indulgence data memory 6 from the value, the comparison data error data can be known.

In this embodiment, 256 bytes of data are used in one sector unit as WRITE/READ data.

(6) Effects of the Invention As explained in detail above, according to the data comparison method of the present invention, the data to be read as test data may be any data pattern, and the data can be read by the testing machine at the time of data reading. Data comparison tests can be performed without being aware of patterns. Furthermore, there is no need to provide data for comparison on the testing machine side, and the configuration of the testing machine becomes simpler, which is a great advantage.

4. Brief Description of the Drawings FIG. 1 is a block diagram for realizing the data comparison method according to the present invention, and FIG. 2 is a diagram illustrating an example of repeated data used as read data.

In the drawings, 1 is a trial sales device, 2 is a bit-byte conversion circuit, 3 is a byte counter, 4 is a write data memory, 5 is a comparison data memory 18, 6 is a reward data memory, 7 is a control processor, 8 indicate comparison circuits, respectively.

Claims (1)

[Claims] In a data write/read test of a storage device, there is a method for writing data using any number of repeated turns of data as the write data, and when reading data, a part of the written data is compared with other read data. A patented data comparison method that includes comparison means and performs write and read tests.