JPS5896258A - Docking mechanism for parts case in autohandler for electronic parts tester - Google Patents

Abstract

PURPOSE:To enable automatic testing of IC, etc. through the prescribed processes of a shutter unit, a measuring unit and a descriminating unit, by sending IC, etc. to be tested onto parts guide rails in a testing jig by the effect of gravity. CONSTITUTION:A number of parts cases 14 arranged and held in a supplying- side fixture 13 and a receiving-side fixture 18 are pressed downward sequentially by presser bars 22 of a supplying-side docking mechanism unit 20 and a receiving-side docking mechanism unit 21, and thereby they can be put onto and connected to docking guide rails 11 and 12 provided at the upper and lower ends of a parts guide rail 7 of a testing jig 7, respectively. Since supplying-side and receiving-side parts cases 14 are connected directly to both end parts of the parts guide rail 7 of the testing jig 5, the test of electronic parts can be performed within the length of the parts guide rail 7 and the length of the parts cases 14 connected to the upper and lower ends thereof, and thus the entire form of an autohandler can be made small-sized.

Description

DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a method for testing the characteristics of electronic components such as integrated circuits (hereinafter referred to as "IC") and determining the quality of the test results by using an electronic component tester Km. In an electronic component tester autohandler that automatically processes ◆, this invention relates to a docking mechanism that sequentially connects component cases housing electronic components to component guide rails built into a test jig.

(Force Technology Background IC%4!K 'J = A IC has different mounting positions, shapes, dimensions, etc. of heat sinks depending on the manufacturer, and the shape and dimensions of the entire linear IC are different from each other.) This is the current situation. Conventionally, I have various shapes and dimensions.
J When testing the characteristics of a linear IC, etc.,
is automatically supplied to the measuring section, or after measurement IJ = A
There are almost no devices that automatically store the C in a predetermined location, and tests are conducted by manually inserting and removing C into the measuring section one by one. For this reason, there is a need for an autohandler for electronic component testers that can automatically process electronic components such as linear ICs of various shapes and dimensions as described above. There is a demand for a docking mechanism that sequentially connects the two.

(3) Purpose of the Invention The present invention has been made in response to the above-mentioned circumstances, and is used to test a component case for storing electronic components in an autopanodrator for an electronic component tester that automatically processes electronic components of various shapes and sizes. It is an object of the present invention to provide a docking mechanism that can be sequentially connected to component guide rails built into a jig.

(4) Structure and object of the invention According to the present invention, there is provided a nine-table which is installed on a frame and is inclined to one side adjacent to nine control parts, and a nine-table which is provided in the center of this table and which is provided inside the table. The table has a component guide rail along the inclination direction and is replaceable, and a test jig and a component case installed on the top of the table and containing electronic components to be tested are aligned so as to be vertically movable. An automatic hand for an electronic component tester having a supply-side yatoi stored therein, and a side yatoi provided at the bottom of the table and containing component cases arranged so as to be movable up and down for storing electronic components after testing. 2
In this method, docking guide rails are provided at the upper and lower ends of the component guide rails of the test jig, respectively, into which the ends of the component cases of the supply side Yatoi and the receiving side Yatoi can be inserted, and the parts guide rails of the test jig and A supply side docking which is arranged on the same axis, and has a supply side docker and a receiver extending upwardly from the center of the upper and lower ends of the table, respectively, and a presser bar that protrudes to the lower side and presses down the component case. The mechanism part and the receiver are provided with a side docking mechanism part, and the supply side Yatoi and the receiver interlock the side Yatoi by a feeding mechanism and feed the side Yatoi in pitch in the lateral direction, and the respective component cases are sequentially moved by the presser bars of the above-mentioned both docking mechanism parts. This is achieved by providing a component case docking mechanism in an autohandler for an electronic component tester, characterized in that the component case is inserted and connected to a docking guide rail by pushing downward.

6) Embodiments of the invention Hereinafter, embodiments of the invention will be described in detail with reference to the accompanying drawings.

FIG. 1 is a perspective view showing the entire autohandler for an electronic component tester according to the present invention. A pedestal 1 serves as a pedestal for supporting the autohandler, and a control section 2 is installed on the top surface of the pedestal 1. This control section 2 controls the operation of the autohandler, and an operation panel 3 is provided on its upper surface.

A bf-pull 4 is provided on the side of the control section 2, in contact with the control section 2 and inclined to one side, and having an appropriate width and length. This table 4 is a round table for setting the test jig 5 and Yatoi 13.1g, which will be described later.
For example, the slope is approximately 456 so that electronic components such as C flow from the supply side to the receiver due to the action of gravity.

A test jig S and a signal transfer section 6 are provided adjacent to the test jig S. As shown in FIG. A component guide rail T is provided along the longitudinal direction of the table 4, that is, along the inclination direction, and a shutter for feeding and blocking ICs, etc. is provided downstream of the component guide rail T.
It has a measuring part 9 in the center where a contact bottle contacts the board of an IC or the like to test it, and in the downstream part it determines whether the test results are true or not and sorts out good products and defective products. It has a determination section 10. And the above part guide rail T
At the upper and lower ends, the supply side yatoi 13 and the receiver, which will be described later, are shaped so that the ends of the component cases 14% 14 stored in alignment with the yatoi 1s can be inserted thereinto, and nine-dot middle guide rails It and 12 are provided, respectively. It is provided. Note that this test jig 5 is removable at a predetermined position on the table 40, and can be replaced with another test jig 5 having a component guide rail T according to the shape and dimensions of the test plate 1kIc, etc. Dechiru. The signal transfer section 6 transmits and receives signals necessary for characteristic testing between the measurement section 9 of the test jig 5 and the electronic component tester. #The test result signal from the tester is sent to the control section 2, and an output signal is sent from this control section to the judgment drive section, and the judgment section 10 of the treatment As performs judgment work.

A supply side yatoi 13 is provided on the upper part of the table 4. This supply side yatoi 13 is one of the above test jig 5.
In addition, as shown in FIG. 1, the MK supplies ICs, etc. to be tested from now on, and component cases 14 containing ICs to be tested from now on are arranged along the longitudinal direction of the daple 40, that is, the inclined direction. and stored.

The component case 14 is formed into an elongated cylindrical shape, such as a rectangular cross section, depending on the shape and dimensions of the ICs to be stored.
6. As shown in the second WJ, the floating spring 15 provided on the inner bottom surface of the supply-side Yatoi 13 is aligned from above Is to the upper surface side of the Yatoi 13, and both ends O are pressed by the material 111, Ill. Above floating spring 15゜1
5 is stored with a little pressure. Therefore, the component case 14 is stored in the Yatoi 13 and can be moved up and down by the elastic action of the floating spring 15% IS in good condition. Then, the supply side Yatoi 13
The arrow mark, B
pitch feed] in the direction.

At the bottom of the table 4, a side support 18 is provided. This receiver 18 is sent out from the test F jig 5 after the test and receives the 9 ICs, etc., and the upper surface thereof has a mark as shown in FIG. 1 and FIG.
A component case 14 similar to the above-described one stores ICs and the like after the test is completed along the longitudinal direction of the table 4, that is, the inclination direction.
are stored in order. And this Uke is side yatoi 1
8 is arranged to be pitch-fed in the direction of arrow B by a feeding mechanism similar to that described above provided in the hole 1s of the table 4 shown in FIG.

From the center of the upper and lower ends of the table 4, as shown in FIG.
(See Figure 3) and docking guide rail 11.12
The supply-side docking mechanism 20 and the receiver are arranged parallel to the T-pull 4 above the component case 14.14 of the side gear 1s along its longitudinal direction. The side docking mechanism section 21 is protruding. On the bottom side of the above-mentioned double dot commanding mechanism Iku 2゜, 21,
As shown in FIGS. 3 and 4, a presser bar 22 is provided that projects downwardly therefrom and presses the upper surface of the component case 14, 14. This presser par 22 is projected downward by rotating a lever 23 shown in FIG. 4 by operating an air cylinder 25 provided in both docking mechanism parts 20% 21, for example. In addition, the 211th
In FIGS. 4 to 4, reference numeral 24 denotes an end plate provided with both end plates 13 and IIIK so as to have openings KiI at both ends thereof when the component case 14 moves up and down.

Next, the operation of the component case docking mechanism in the electronic component tester autohand 2 according to the present invention will be explained. As a preparation stage for testing, the nine parts case 14 containing the ICs to be tested is placed on the supplier's side 13.
Align and store on the top surface. On the other hand, the receiver aligns and stores empty component cases 14 having the same shape and dimensions as the supply-side component cases 14 on the upper surface KFi of the Confucian Yatoi 18.

In this state, the supply-side Yatoi 13 and the receiver move the Confucian Yatoi 18 fully backward in the direction of arrow B as shown in FIG. A test jig S containing a built-in component guide rail 1 having a shape and dimensions corresponding to the shape and dimensions of an IC, etc. to be tested that is housed in a case 14 is set at a predetermined position in the center of the table 4. When, test jig 5
It is inserted into the connector of the terminal company's signal transfer section 6 of the performance board (printed board). When the preparations are completed in this manner, the operation button 26 on the operation panel 3 of the control section 2 is operated to start. First, hole I? , 11
The supply side gear 13 and the side gear 18 are interlocked with each other by a pressure feeding mechanism provided therein, and the supply side gear 13 and the receiving gear are pitch-fed in the direction indicated by the arrow in FIG. In this way, the first component case 14.14 of each Yatoi 13.18 is
As shown in the figure, each supply side docking machine 4111
When the part 20 and the receiver stop directly below the side docking mechanism part 21, the presser par 22 provided on the lower surface of the docking mechanism part 20.21 is moved as shown by the arrow in Fig. 4 by the operation of the air cylinder 2S. Lever 2 is rotated to
It is projected downward by 3. As a result, the upper surface of the component case 14.14 is pressed by the presser par 226C, and the component case 14.14 is pushed down against the floating spring 15 provided on the inner bottom surface of each Yatoi 13.10, as shown in #I4. As shown in FIG. 1, the ends of the component guide rails T of one test jig 5 are inserted and connected to docking guide rails 11 and 12 provided at the upper and lower ends. When this is done, the IC to be tested is sent from the component case 14 of the supply side Yatoi 13 to the component guide rail 1 in the test jig 5 by the action of gravity.
The test is performed through predetermined steps in the shutter section, measurement section, and determination section.

In this way, ICs, etc. are tested one after another, and the number of the tested ICs, etc. is counted by a counter, and stored in the first supply-side parts case 14. When all the ICs, etc. have been tested, they are placed in their respective docks. Mechanism part 20.21
The presser par 22 is lifted up by the opposite rotation operation of the lever 23 due to the opposite operation of the air cylinder 25, and the corresponding part case 14% of each Yatoi 13 and 18 is lifted.
14 is lifted up by the elastic force of the bloating spring 150, and the ends of the docking guide rails It and 12 are pulled upward from each other, thereby breaking the connection. Next, both gears 13.18 are pitched in the direction of the arrow by their feeding mechanisms, and the next component cases 14.14 are stopped directly below their respective docking mechanisms 20.21. below,
By repeating the same operation as above, the parts cases 14.14 of the supply side yatoi 13 and the receiving side yatoi 18 are automatically pushed downward one after another, and the docking guide rail 11.1
2. Insert and connect the circle and release it. In this way, all parts stored in the supply side component case 14, such as the 71j IC, are automatically tested.

Effects of the Invention The present invention is constructed as described above, and the supply side Yatoi 1
3 and the receiver push down a large number of component cases 14 arranged and stored in the Confucian toy 18 by the presser pars 22 of the supply-side docking mechanism section 20 and the receiver-side docking mechanism section 21 in order to move the test jig 50 to the component guide rail. It can be inserted and connected to docking guide rails 11 and 12 provided at the upper and lower ends of the T. In addition, since the component cases 14 and 14 of the supply side and receiving equipment are directly connected to both ends of the component guide rail T of the test jig 5, the component guide rail T
The length of and parts case 1 connected above and below
Testing of electronic components can be performed within the length of 4.14, and the overall shape of the autohandler can be reduced in size.

[Brief explanation of the drawing]

Fig. 1 is a perspective view showing the entire autohandler for electronic component tester according to the present invention, Fig. 2 is a perspective view showing the supply side Yatoi (or receiving side Yatoi), and Figs. 3 and 4 are the present invention. FIG. 1 is a cross-sectional view taken along the line 0A-A in FIG. 1 showing the operating state of the component case docking mechanism, FIG. 3 shows the state before connection, and FIG. 4 shows the state after connection. 1... Frame 2... Control unit 4... Table S... Test jig T... Parts guide rail 11.12...・・・Dotsking guide rail 13・
...Supply side yatoi 14...Parts case 15...Floating spring 18...The receiver is on the side yatoi 20...Supply side docking mechanism section 21・・・・・・
...The receiver is the side docking mechanism part 22...Press bar 23...Lever 25...Air cylinder Applicant Fujitsu Ltd. Figure 1 Figure 2 13 (18)

Claims (1)

[Claims] It has a table that is inclined to one side adjacent to the control unit installed on the pedestal, and a component guide rail that is installed in the center of this table and runs along the direction of inclination of the table, and is replaceable. There are nine test jigs, a supply-side yatoi installed on the top of the table that stores the electronic components to be tested and nine component cases arranged in a vertically movable manner, and a supply side yatoi installed on the bottom of the table. An autohandler WC1t for an electronic component tester is equipped with an autohandler WC1t for an electronic component tester, which has a side rack in which component cases for storing electronic components after a test are arranged so as to be movable up and down, and the upper and lower ends of the component guide rail of the test jig. A docking guide rail that can be inserted into the end of the component case of the side Yato is provided on the supply side Yato and the receiver respectively, and the docking guide rail is arranged on the same axis as the component guide rail of the test jig, and is located at the center of the upper and lower ends of the table. The supply side docking mechanism section and the support section respectively have a presser par that protrudes from above the supply side and parallel to the table and protrudes from the bottom side to press down the component case. When the supply side gear and the receiver are interlocked with the feed mechanism and feed the side gear in pitch in the lateral direction, the presser bars of both docking mechanisms press down each component case sequentially to create a docking guide. A component case docking mechanism in an autohandler for an electronic component tester, characterized in that it is inserted and connected to a rail.