JPH0216071U - - Google Patents
Info
- Publication number
- JPH0216071U JPH0216071U JP9457288U JP9457288U JPH0216071U JP H0216071 U JPH0216071 U JP H0216071U JP 9457288 U JP9457288 U JP 9457288U JP 9457288 U JP9457288 U JP 9457288U JP H0216071 U JPH0216071 U JP H0216071U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor package
- rails
- test device
- section
- unloader
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 7
- 238000010583 slow cooling Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は本考案実施例のアンローダー部の斜視
図、第２図はコンテナステイツクの斜視図、第３
図はコンテナステイツクをコンテナガイドに取り
付けた図、第４図は第１図のアンローダ部の平面
図、第５図は第４図のアンローダ部の側面図、第
６図は第５図のストツパー部の拡大図、第７図は
従来の自由落下式の半導体パツケージハンドラー
の全体斜視図である。
図中、４は徐冷レール部、１１はアンローダー
部、１２はＤＩＰ型半導体パツケージ、１３はコ
ンテナステイツク、１４はアンローダー部本体、
１５は案内部、１６はストツパー部、１８は引張
りコイルバネ、を示す。
Fig. 1 is a perspective view of the unloader section of the embodiment of the present invention, Fig. 2 is a perspective view of the container stack, and Fig. 3 is a perspective view of the unloader section of the embodiment of the present invention.
The figure shows the container stake attached to the container guide, Figure 4 is a plan view of the unloader part in Figure 1, Figure 5 is a side view of the unloader part in Figure 4, and Figure 6 is the stopper in Figure 5. FIG. 7 is an overall perspective view of a conventional free-fall type semiconductor package handler. In the figure, 4 is a slow cooling rail part, 11 is an unloader part, 12 is a DIP type semiconductor package, 13 is a container stick, 14 is an unloader part main body,
15 is a guide portion, 16 is a stopper portion, and 18 is a tension coil spring.
Claims (1)
試験装置に供給し、この試験装置の試験結果に基
づいて前記半導体パツケージ１２を複数のレール
からなるレール部４のうちの１つのレールに供給
する自由落下式の半導体パツケージハンドラーに
おいて、 前記レール部４の延長線上に、半導体パツケー
ジ１２の収納部材１３を配設するアンローダー部
１１を設けたことを特徴とする半導体パツケージ
ハンドラー。[Claims for Utility Model Registration] The assembled semiconductor package 12 is automatically supplied to a test device, and based on the test results of the test device, the semiconductor package 12 is placed on one of the rail sections 4 consisting of a plurality of rails. 1. A free-fall type semiconductor package handler for supplying semiconductor packages to two rails, characterized in that an unloader section 11 is provided on an extension of the rail section 4, in which a storage member 13 for a semiconductor package 12 is disposed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9457288U JPH0216071U (en) | 1988-07-19 | 1988-07-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9457288U JPH0216071U (en) | 1988-07-19 | 1988-07-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0216071U true JPH0216071U (en) | 1990-02-01 |
Family
ID=31319119
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9457288U Pending JPH0216071U (en) | 1988-07-19 | 1988-07-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0216071U (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5896258A (en) * | 1981-12-03 | 1983-06-08 | Fujitsu Ltd | Docking mechanism for parts case in autohandler for electronic parts tester |
| JPS6169616A (en) * | 1984-09-08 | 1986-04-10 | Ikegami Tsushinki Co Ltd | Ic test device |
| JPS63166240A (en) * | 1986-12-27 | 1988-07-09 | Toshiba Seiki Kk | Sorting equipment for electronic parts |
-
1988
- 1988-07-19 JP JP9457288U patent/JPH0216071U/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5896258A (en) * | 1981-12-03 | 1983-06-08 | Fujitsu Ltd | Docking mechanism for parts case in autohandler for electronic parts tester |
| JPS6169616A (en) * | 1984-09-08 | 1986-04-10 | Ikegami Tsushinki Co Ltd | Ic test device |
| JPS63166240A (en) * | 1986-12-27 | 1988-07-09 | Toshiba Seiki Kk | Sorting equipment for electronic parts |
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