JPS5895253A - Ｘ線小角散乱測定装置 - Google Patents
Ｘ線小角散乱測定装置Info
- Publication number
- JPS5895253A JPS5895253A JP56193434A JP19343481A JPS5895253A JP S5895253 A JPS5895253 A JP S5895253A JP 56193434 A JP56193434 A JP 56193434A JP 19343481 A JP19343481 A JP 19343481A JP S5895253 A JPS5895253 A JP S5895253A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- rays
- sample
- scattered
- cut
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56193434A JPS5895253A (ja) | 1981-11-30 | 1981-11-30 | Ｘ線小角散乱測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56193434A JPS5895253A (ja) | 1981-11-30 | 1981-11-30 | Ｘ線小角散乱測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5895253A true JPS5895253A (ja) | 1983-06-06 |
| JPH0353577B2 JPH0353577B2 (enExample) | 1991-08-15 |
Family
ID=16307912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56193434A Granted JPS5895253A (ja) | 1981-11-30 | 1981-11-30 | Ｘ線小角散乱測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5895253A (enExample) |
-
1981
- 1981-11-30 JP JP56193434A patent/JPS5895253A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0353577B2 (enExample) | 1991-08-15 |
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