JPS5885140A - めつき液中の光沢剤濃度の測定方法 - Google Patents

めつき液中の光沢剤濃度の測定方法

Info

Publication number
JPS5885140A
JPS5885140A JP18328781A JP18328781A JPS5885140A JP S5885140 A JPS5885140 A JP S5885140A JP 18328781 A JP18328781 A JP 18328781A JP 18328781 A JP18328781 A JP 18328781A JP S5885140 A JPS5885140 A JP S5885140A
Authority
JP
Japan
Prior art keywords
brightener
plating solution
absorbance
wavelength
activated charcoal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18328781A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6251420B2 (OSRAM
Inventor
Hideo Kudo
工藤 英男
Michiko Morizaki
森崎 みち子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP18328781A priority Critical patent/JPS5885140A/ja
Publication of JPS5885140A publication Critical patent/JPS5885140A/ja
Publication of JPS6251420B2 publication Critical patent/JPS6251420B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP18328781A 1981-11-16 1981-11-16 めつき液中の光沢剤濃度の測定方法 Granted JPS5885140A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18328781A JPS5885140A (ja) 1981-11-16 1981-11-16 めつき液中の光沢剤濃度の測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18328781A JPS5885140A (ja) 1981-11-16 1981-11-16 めつき液中の光沢剤濃度の測定方法

Publications (2)

Publication Number Publication Date
JPS5885140A true JPS5885140A (ja) 1983-05-21
JPS6251420B2 JPS6251420B2 (OSRAM) 1987-10-29

Family

ID=16133006

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18328781A Granted JPS5885140A (ja) 1981-11-16 1981-11-16 めつき液中の光沢剤濃度の測定方法

Country Status (1)

Country Link
JP (1) JPS5885140A (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003076694A3 (en) * 2002-03-08 2004-09-30 Advanced Tech Materials Methods and apparatuses for analyzing solder plating solutions
US6913686B2 (en) 2002-12-10 2005-07-05 Advanced Technology Materials, Inc. Methods for analyzing solder plating solutions

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50155278A (OSRAM) * 1974-06-04 1975-12-15

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50155278A (OSRAM) * 1974-06-04 1975-12-15

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003076694A3 (en) * 2002-03-08 2004-09-30 Advanced Tech Materials Methods and apparatuses for analyzing solder plating solutions
US6913686B2 (en) 2002-12-10 2005-07-05 Advanced Technology Materials, Inc. Methods for analyzing solder plating solutions

Also Published As

Publication number Publication date
JPS6251420B2 (OSRAM) 1987-10-29

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